JP2021025940A5 - - Google Patents

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Publication number
JP2021025940A5
JP2021025940A5 JP2019145527A JP2019145527A JP2021025940A5 JP 2021025940 A5 JP2021025940 A5 JP 2021025940A5 JP 2019145527 A JP2019145527 A JP 2019145527A JP 2019145527 A JP2019145527 A JP 2019145527A JP 2021025940 A5 JP2021025940 A5 JP 2021025940A5
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Japan
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detection device
capacitance
signal
detector
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JP2019145527A
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Japanese (ja)
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JP2021025940A (ja
JP7301667B2 (ja
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Priority to JP2019145527A priority Critical patent/JP7301667B2/ja
Priority claimed from JP2019145527A external-priority patent/JP7301667B2/ja
Priority to CN202010759507.0A priority patent/CN112351228B/zh
Priority to US16/985,940 priority patent/US11714000B2/en
Priority to EP20189822.8A priority patent/EP3772637B1/en
Publication of JP2021025940A publication Critical patent/JP2021025940A/ja
Publication of JP2021025940A5 publication Critical patent/JP2021025940A5/ja
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JP2019145527A 2019-08-07 2019-08-07 検出装置および検出システム Active JP7301667B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2019145527A JP7301667B2 (ja) 2019-08-07 2019-08-07 検出装置および検出システム
CN202010759507.0A CN112351228B (zh) 2019-08-07 2020-07-31 检测设备和检测系统
US16/985,940 US11714000B2 (en) 2019-08-07 2020-08-05 Detection device and detection system
EP20189822.8A EP3772637B1 (en) 2019-08-07 2020-08-06 Detection device and detection system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2019145527A JP7301667B2 (ja) 2019-08-07 2019-08-07 検出装置および検出システム

Publications (3)

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JP2021025940A JP2021025940A (ja) 2021-02-22
JP2021025940A5 true JP2021025940A5 (cg-RX-API-DMAC10.html) 2022-05-10
JP7301667B2 JP7301667B2 (ja) 2023-07-03

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JP2019145527A Active JP7301667B2 (ja) 2019-08-07 2019-08-07 検出装置および検出システム

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US (1) US11714000B2 (cg-RX-API-DMAC10.html)
EP (1) EP3772637B1 (cg-RX-API-DMAC10.html)
JP (1) JP7301667B2 (cg-RX-API-DMAC10.html)
CN (1) CN112351228B (cg-RX-API-DMAC10.html)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7301667B2 (ja) * 2019-08-07 2023-07-03 キヤノン株式会社 検出装置および検出システム
CN112229511B (zh) * 2020-09-03 2023-04-07 广东工业大学 一种基于肖特基接触光栅化结构的太赫兹探测器
CN112268616B (zh) * 2020-09-03 2024-04-05 广东工业大学 一种基于肖特基接触光栅化结构的n×m太赫兹探测器阵列成像系统
JP7706918B2 (ja) 2021-04-06 2025-07-14 キヤノン株式会社 検出システムおよび画像形成装置
CN115100830B (zh) * 2022-07-01 2023-05-16 中国人民解放军国防科技大学 基于等离子体及光敏二极管的高功率微波探测告警平台

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3275579B2 (ja) * 1994-10-24 2002-04-15 日産自動車株式会社 イメージセンサ
US5705807A (en) * 1994-10-24 1998-01-06 Nissan Motor Co., Ltd. Photo detecting apparatus for detecting reflected light from an object and excluding an external light componet from the reflected light
US6909094B2 (en) 2003-02-12 2005-06-21 Philip Norris Usa Inc. System and method for terahertz imaging using a single terahertz detector
JP4322721B2 (ja) * 2004-03-19 2009-09-02 シャープ株式会社 電荷検出回路およびそれを備えた画像センサ
JP5620693B2 (ja) * 2010-02-26 2014-11-05 パナソニック株式会社 固体撮像装置およびその駆動方法、カメラ
US9341687B2 (en) * 2011-02-22 2016-05-17 The Mitre Corporation Classifying and identifying materials based on permittivity features
WO2013082622A2 (en) * 2011-12-01 2013-06-06 California Institute Of Technology Integrated teraherts imaging systems
US20140117237A1 (en) 2012-10-30 2014-05-01 International Business Machines Corporation High responsivity device for thermal sensing in a terahertz radiation detector
JP5986524B2 (ja) * 2013-02-28 2016-09-06 キヤノン株式会社 放射線撮像装置および放射線撮像システム
JP6196787B2 (ja) 2013-03-08 2017-09-13 キヤノン株式会社 画像形成装置、及びイメージングシステム
JP6351404B2 (ja) 2014-07-02 2018-07-04 キヤノン株式会社 撮像装置及び撮像システム
JP6872956B2 (ja) 2017-04-13 2021-05-19 キヤノン株式会社 撮像システム及び撮像システムの制御方法
JP7288296B2 (ja) 2017-12-13 2023-06-07 キヤノン株式会社 テラヘルツ波カメラおよび検出モジュール
JP7301667B2 (ja) 2019-08-07 2023-07-03 キヤノン株式会社 検出装置および検出システム

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