JP2021001905A5 - - Google Patents

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Publication number
JP2021001905A5
JP2021001905A5 JP2020159976A JP2020159976A JP2021001905A5 JP 2021001905 A5 JP2021001905 A5 JP 2021001905A5 JP 2020159976 A JP2020159976 A JP 2020159976A JP 2020159976 A JP2020159976 A JP 2020159976A JP 2021001905 A5 JP2021001905 A5 JP 2021001905A5
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JP
Japan
Prior art keywords
ray
probes
rays
working
probe
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2020159976A
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English (en)
Japanese (ja)
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JP2021001905A (ja
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Publication date
Priority claimed from GBGB1215546.1A external-priority patent/GB201215546D0/en
Application filed filed Critical
Publication of JP2021001905A publication Critical patent/JP2021001905A/ja
Publication of JP2021001905A5 publication Critical patent/JP2021001905A5/ja
Pending legal-status Critical Current

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JP2020159976A 2012-08-31 2020-09-24 複数プローブの検出及び作動 Pending JP2021001905A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GBGB1215546.1A GB201215546D0 (en) 2012-08-31 2012-08-31 Multiple probe detection and actuation
GB1215546.1 2012-08-31

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP2015529119A Division JP2015526739A (ja) 2012-08-31 2013-08-28 複数プローブの検出及び作動

Publications (2)

Publication Number Publication Date
JP2021001905A JP2021001905A (ja) 2021-01-07
JP2021001905A5 true JP2021001905A5 (https=) 2021-04-08

Family

ID=47075065

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2015529119A Pending JP2015526739A (ja) 2012-08-31 2013-08-28 複数プローブの検出及び作動
JP2020159976A Pending JP2021001905A (ja) 2012-08-31 2020-09-24 複数プローブの検出及び作動

Family Applications Before (1)

Application Number Title Priority Date Filing Date
JP2015529119A Pending JP2015526739A (ja) 2012-08-31 2013-08-28 複数プローブの検出及び作動

Country Status (5)

Country Link
US (1) US9739798B2 (https=)
EP (1) EP2891117B1 (https=)
JP (2) JP2015526739A (https=)
GB (1) GB201215546D0 (https=)
WO (1) WO2014033451A1 (https=)

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CN105008895B (zh) 2012-10-15 2019-02-15 纳诺赛莱克特生物医药股份有限公司 颗粒分选的系统、设备和方法
US9947118B2 (en) * 2014-05-28 2018-04-17 Indian Institute Of Technology Delhi Non-interferometric phase measurement
GB201610128D0 (en) 2016-06-10 2016-07-27 Infinitesima Ltd Scanning probe system with multiple probes
DE102017205528B4 (de) * 2017-03-31 2021-06-10 Carl Zeiss Smt Gmbh Vorrichtung und Verfahren für ein Rastersondenmikroskop
GB201710294D0 (en) * 2017-06-28 2017-08-09 Infinitesima Ltd Scanning probe microscope
US10564181B2 (en) * 2017-08-31 2020-02-18 Nanosurf Ag Atomic force microscope with optical guiding mechanism
CN111886505B (zh) * 2018-01-22 2024-03-05 理海大学 非轻敲模式的散射式扫描近场光学显微镜系统及方法
US11257657B2 (en) * 2020-02-18 2022-02-22 ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH Charged particle beam device with interferometer for height measurement
US11519935B2 (en) 2020-08-18 2022-12-06 Oxford Instruments Asylum Research, Inc. Atomic force microscope
GB202109549D0 (en) 2021-07-01 2021-08-18 Infinitesima Ltd Lighting system for multi-probe microscope

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JPS63222208A (ja) * 1987-03-11 1988-09-16 Japan Spectroscopic Co 凹部深さ測定装置
US5260824A (en) * 1989-04-24 1993-11-09 Olympus Optical Co., Ltd. Atomic force microscope
GB8910566D0 (en) 1989-05-08 1989-06-21 Amersham Int Plc Imaging apparatus and method
JP2661314B2 (ja) 1990-03-07 1997-10-08 松下電器産業株式会社 形状測定装置及び形状測定方法
US8087288B1 (en) * 1993-08-17 2012-01-03 Bruker Nano, Inc. Scanning stylus atomic force microscope with cantilever tracking and optical access
US5485231A (en) * 1994-01-31 1996-01-16 Nidek Co., Ltd. Apparatus for visual acuity test having an adjustable mirror
US5883387A (en) * 1994-11-15 1999-03-16 Olympus Optical Co., Ltd. SPM cantilever and a method for manufacturing the same
US5760755A (en) * 1995-08-16 1998-06-02 Engle; Craig D. Electrostatic light valve system configurations
US6330824B1 (en) * 1999-02-19 2001-12-18 The University Of North Carolina At Chapel Hill Photothermal modulation for oscillating mode atomic force microscopy in solution
JP2000266658A (ja) * 1999-03-16 2000-09-29 Seiko Instruments Inc マルチプローブ及び走査型プローブ顕微鏡
GB2369451B (en) 2000-07-27 2002-07-17 Michael John Downs Jamin-type interferometers
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US6779387B2 (en) * 2001-08-21 2004-08-24 Georgia Tech Research Corporation Method and apparatus for the ultrasonic actuation of the cantilever of a probe-based instrument
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WO2006129561A1 (ja) * 2005-05-31 2006-12-07 National University Corporation Kanazawa University 走査型プローブ顕微鏡およびカンチレバー駆動装置
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GB201215547D0 (en) * 2012-08-31 2012-10-17 Infinitesima Ltd Multiple probe actuation

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