JP2020531825A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2020531825A5 JP2020531825A5 JP2020510552A JP2020510552A JP2020531825A5 JP 2020531825 A5 JP2020531825 A5 JP 2020531825A5 JP 2020510552 A JP2020510552 A JP 2020510552A JP 2020510552 A JP2020510552 A JP 2020510552A JP 2020531825 A5 JP2020531825 A5 JP 2020531825A5
- Authority
- JP
- Japan
- Prior art keywords
- ray
- optical
- signal
- detector
- layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP17187475.3A EP3447538A1 (en) | 2017-08-23 | 2017-08-23 | X-ray detection |
| EP17187475.3 | 2017-08-23 | ||
| PCT/EP2018/071847 WO2019038113A1 (en) | 2017-08-23 | 2018-08-13 | X-RAY DETECTION OF A FRICTION OF X-RAY INCIDENCE FRAGMENTS IN PHASE CONTRAST X-RAY IMAGING AND / OR SUD BLACK BACKGROUND |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2020531825A JP2020531825A (ja) | 2020-11-05 |
| JP2020531825A5 true JP2020531825A5 (https=) | 2021-09-24 |
| JP7221938B2 JP7221938B2 (ja) | 2023-02-14 |
Family
ID=59702559
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2020510552A Active JP7221938B2 (ja) | 2017-08-23 | 2018-08-13 | 位相コントラスト及び／又は暗視野ｘ線イメージングにおけるｘ線入射干渉縞パターンのｘ線検出 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US10539688B2 (https=) |
| EP (2) | EP3447538A1 (https=) |
| JP (1) | JP7221938B2 (https=) |
| CN (1) | CN109863424B (https=) |
| RU (1) | RU2721153C1 (https=) |
| WO (1) | WO2019038113A1 (https=) |
Families Citing this family (40)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20150117599A1 (en) | 2013-10-31 | 2015-04-30 | Sigray, Inc. | X-ray interferometric imaging system |
| US10295485B2 (en) | 2013-12-05 | 2019-05-21 | Sigray, Inc. | X-ray transmission spectrometer system |
| USRE48612E1 (en) | 2013-10-31 | 2021-06-29 | Sigray, Inc. | X-ray interferometric imaging system |
| WO2019220410A1 (en) * | 2018-05-17 | 2019-11-21 | Institut National De La Recherche Scientifique (Inrs) | Method and system for sampling and denoising amplification of a signal |
| US10845491B2 (en) | 2018-06-04 | 2020-11-24 | Sigray, Inc. | Energy-resolving x-ray detection system |
| GB2591630B (en) | 2018-07-26 | 2023-05-24 | Sigray Inc | High brightness x-ray reflection source |
| US10656105B2 (en) | 2018-08-06 | 2020-05-19 | Sigray, Inc. | Talbot-lau x-ray source and interferometric system |
| WO2020051061A1 (en) | 2018-09-04 | 2020-03-12 | Sigray, Inc. | System and method for x-ray fluorescence with filtering |
| WO2020051221A2 (en) | 2018-09-07 | 2020-03-12 | Sigray, Inc. | System and method for depth-selectable x-ray analysis |
| EP3754382B1 (en) * | 2019-06-17 | 2023-10-25 | Detection Technology Oyj | Radiation detector and method for manufacturing thereof |
| DE112020004169T5 (de) | 2019-09-03 | 2022-05-25 | Sigray, Inc. | System und verfahren zur computergestützten laminografieröntgenfluoreszenz-bildgebung |
| US12379331B2 (en) | 2019-09-06 | 2025-08-05 | The Board Of Trustees Of The Leland Stanford Junior University | Single shot analyzer grating for differential phase contrast X-ray imaging and computed tomography |
| US20210088682A1 (en) * | 2019-09-23 | 2021-03-25 | Sino Canada Health Engineering Research Institute (Hefei) Ltd. | Readout Board Muxing for PET Systems |
| EP3799787A1 (en) * | 2019-10-01 | 2021-04-07 | Koninklijke Philips N.V. | Detector for a dark-field; phase-contrast and attenuation interferometric imaging system |
| US11175243B1 (en) | 2020-02-06 | 2021-11-16 | Sigray, Inc. | X-ray dark-field in-line inspection for semiconductor samples |
| US11217357B2 (en) | 2020-02-10 | 2022-01-04 | Sigray, Inc. | X-ray mirror optics with multiple hyperboloidal/hyperbolic surface profiles |
| US11389124B2 (en) * | 2020-02-12 | 2022-07-19 | General Electric Company | X-ray phase contrast detector |
| US20230333215A1 (en) * | 2020-04-14 | 2023-10-19 | Technion Research & Development Foundation Ltd. | Device and method for generating image and distance information |
| JP7395775B2 (ja) | 2020-05-18 | 2023-12-11 | シグレイ、インコーポレイテッド | 結晶解析装置及び複数の検出器素子を使用するｘ線吸収分光法のためのシステム及び方法 |
| JP2023542627A (ja) * | 2020-09-03 | 2023-10-11 | ザ・リサーチ・ファウンデーション・フォー・ザ・ステイト・ユニヴァーシティ・オブ・ニューヨーク | 結晶とチャネルの結合のためのシステムおよび方法 |
| WO2022061347A1 (en) | 2020-09-17 | 2022-03-24 | Sigray, Inc. | System and method using x-rays for depth-resolving metrology and analysis |
| US12480892B2 (en) | 2020-12-07 | 2025-11-25 | Sigray, Inc. | High throughput 3D x-ray imaging system using a transmission x-ray source |
| KR20260030946A (ko) | 2020-12-07 | 2026-03-06 | 시그레이, 아이엔씨. | 투과 x-선 소스를 이용한 고처리량 3D x-선 이미징 시스템 |
| JP7403517B2 (ja) * | 2021-10-13 | 2023-12-22 | 日本電子株式会社 | 放射線検出装置および試料分析装置 |
| CN114325805A (zh) * | 2021-12-14 | 2022-04-12 | 无锡通透光电科技有限公司 | 辐射成像探测器及其通道压缩电路、通道压缩方法 |
| WO2023168204A1 (en) | 2022-03-02 | 2023-09-07 | Sigray, Inc. | X-ray fluorescence system and x-ray source with electrically insulative target material |
| US11860319B2 (en) * | 2022-03-10 | 2024-01-02 | GE Precision Healthcare LLC | High-resolution detector having a reduced number of pixels |
| WO2023177981A1 (en) | 2022-03-15 | 2023-09-21 | Sigray, Inc. | System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector |
| CN119173759A (zh) | 2022-05-02 | 2024-12-20 | 斯格瑞公司 | X射线顺序阵列波长色散光谱仪 |
| WO2024124159A1 (en) * | 2022-12-08 | 2024-06-13 | Schlumberger Technology Corporation | Downhole tools that include a radiation detector and processes for using same |
| CN115980819B (zh) * | 2022-12-21 | 2026-04-21 | 中国科学院近代物理研究所 | 一种射线剂量横向分布测量装置及方法 |
| US12585034B2 (en) * | 2023-02-15 | 2026-03-24 | Innocare Optoelectronics Corporation | Electronic device comprising a filter, a scintillator, a sensor, and a substrate |
| CN121013975A (zh) | 2023-02-16 | 2025-11-25 | 斯格瑞公司 | 具有至少两个堆叠的平面布拉格衍射器的x射线探测器系统 |
| CN116879326B (zh) * | 2023-09-07 | 2023-12-19 | 浙江大学杭州国际科创中心 | 基于多频条纹的x射线光学相衬成像系统及方法 |
| US12181423B1 (en) | 2023-09-07 | 2024-12-31 | Sigray, Inc. | Secondary image removal using high resolution x-ray transmission sources |
| US12429437B2 (en) | 2023-11-07 | 2025-09-30 | Sigray, Inc. | System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes |
| US12429436B2 (en) | 2024-01-08 | 2025-09-30 | Sigray, Inc. | X-ray analysis system with focused x-ray beam and non-x-ray microscope |
| WO2025155719A1 (en) | 2024-01-18 | 2025-07-24 | Sigray, Inc. | Sequential array of x-ray imaging detectors |
| WO2025174966A1 (en) | 2024-02-15 | 2025-08-21 | Sigray, Inc. | System and method for generating a focused x‑ray beam |
| CN118799868B (zh) * | 2024-06-17 | 2025-03-11 | 沈阳工业大学 | 一种光栅莫尔条纹智能细分方法 |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102006037256B4 (de) * | 2006-02-01 | 2017-03-30 | Paul Scherer Institut | Fokus-Detektor-Anordnung einer Röntgenapparatur zur Erzeugung projektiver oder tomographischer Phasenkontrastaufnahmen sowie Röntgensystem, Röntgen-C-Bogen-System und Röntgen-CT-System |
| DE102006017291B4 (de) * | 2006-02-01 | 2017-05-24 | Paul Scherer Institut | Fokus/Detektor-System einer Röntgenapparatur zur Erzeugung von Phasenkontrastaufnahmen, Röntgensystem mit einem solchen Fokus/Detektor-System sowie zugehöriges Speichermedium und Verfahren |
| DE102006037281A1 (de) * | 2006-02-01 | 2007-08-09 | Siemens Ag | Röntgenoptisches Durchstrahlungsgitter einer Fokus-Detektor-Anordnung einer Röntgenapparatur zur Erzeugung projektiver oder tomographischer Phasenkontrastaufnahmen von einem Untersuchungsobjekt |
| JP5702586B2 (ja) * | 2010-02-04 | 2015-04-15 | 富士フイルム株式会社 | 放射線撮影システム |
| JP5844545B2 (ja) * | 2010-05-31 | 2016-01-20 | 富士フイルム株式会社 | 放射線撮影装置 |
| WO2012056724A1 (ja) * | 2010-10-29 | 2012-05-03 | 富士フイルム株式会社 | 放射線位相画像撮影装置 |
| JP2012150144A (ja) * | 2011-01-17 | 2012-08-09 | Fujifilm Corp | 放射線画像撮影用グリッド、放射線画像検出器、放射線画像撮影システム及び放射線画像撮影用グリッドの製造方法。 |
| EP2671230B1 (en) * | 2011-02-01 | 2018-05-16 | Koninklijke Philips N.V. | Differential phase-contrast imaging with focussing deflection structure plates |
| JP6353361B2 (ja) | 2011-07-04 | 2018-07-04 | コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． | 位相コントラストイメージング装置 |
| DE102011082878A1 (de) * | 2011-09-16 | 2013-03-21 | Siemens Aktiengesellschaft | Röntgendetektor einer gitterbasierten Phasenkontrast-Röntgenvorrichtung und Verfahren zum Betreiben einer gitterbasierten Phasenkontrast-Röntgenvorrichtung |
| DE102012217286A1 (de) | 2012-09-25 | 2014-03-27 | Siemens Aktiengesellschaft | Strahlungsdetektor |
| DE102012224258A1 (de) | 2012-12-21 | 2014-06-26 | Siemens Aktiengesellschaft | Röntgenaufnahmesystem zur differentiellen Phasenkontrast-Bildgebung eines Untersuchungsobjekts mit Phase-Stepping sowie angiographisches Untersuchungsverfahren |
| WO2014100063A1 (en) * | 2012-12-21 | 2014-06-26 | Carestream Health, Inc. | Medical radiographic grating based differential phase contrast imaging |
| US9357975B2 (en) * | 2013-12-30 | 2016-06-07 | Carestream Health, Inc. | Large FOV phase contrast imaging based on detuned configuration including acquisition and reconstruction techniques |
| CN106535769B (zh) * | 2014-05-01 | 2020-03-13 | 斯格瑞公司 | X射线干涉成像系统 |
| EP3143384B1 (en) * | 2014-05-15 | 2020-03-04 | Sigray Inc. | X-ray system and method for measurement, characterization, and analysis of periodic structures |
| JP6581713B2 (ja) * | 2015-07-21 | 2019-09-25 | コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． | 位相コントラスト及び／又は暗視野撮像のためのｘ線検出器、該ｘ線検出器を有する干渉計、ｘ線撮像システム、位相コントラストｘ線撮像及び／又は暗視野ｘ線撮像を行う方法、コンピュータプログラム、コンピュータ読取可能な媒体 |
| CN106404809A (zh) * | 2016-07-27 | 2017-02-15 | 中国科学技术大学 | 一种用于x射线光栅相衬成像装置的图像校正方法 |
-
2017
- 2017-08-23 EP EP17187475.3A patent/EP3447538A1/en not_active Withdrawn
-
2018
- 2018-08-03 US US16/335,819 patent/US10539688B2/en not_active Expired - Fee Related
- 2018-08-13 WO PCT/EP2018/071847 patent/WO2019038113A1/en not_active Ceased
- 2018-08-13 JP JP2020510552A patent/JP7221938B2/ja active Active
- 2018-08-13 EP EP18750229.9A patent/EP3494415B1/en active Active
- 2018-08-13 RU RU2019111467A patent/RU2721153C1/ru active
- 2018-08-13 CN CN201880003957.8A patent/CN109863424B/zh not_active Expired - Fee Related
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP2020531825A5 (https=) | ||
| JP7661309B2 (ja) | モアレ要素及び回転対称配列を用いるイメージングオーバレイターゲット | |
| US9031189B2 (en) | X-ray imaging apparatus and X-ray imaging method | |
| JP2020531825A (ja) | 位相コントラスト及び／又は暗視野ｘ線イメージングにおけるｘ線入射干渉縞パターンのｘ線検出 | |
| KR102694697B1 (ko) | 모아레 효과를 디스플레이하는 디바이스 유사 오버레이 계측 타겟 | |
| JP2012526269A (ja) | 多波長偏光画像からシーンを識別するための方法 | |
| US10126709B2 (en) | Apparatus and method for performing in-line lens-free digital holography of an object | |
| JP6744005B2 (ja) | 分光測定装置 | |
| US20230010628A1 (en) | Imaging system and a method for imaging a sample | |
| CN110686777A (zh) | 一种光谱测量方法和装置 | |
| CN211121618U (zh) | 一种光谱测量装置 | |
| JP7163060B2 (ja) | 迅速な複合材製造の高速度低ノイズインプロセスハイパースペクトル非破壊評価のためのシステム及び方法 | |
| US8111396B2 (en) | Spectrometric measurement system and method for compensating for veiling glare | |
| US11035794B2 (en) | Scalable, large-area optical sensing platform with compact light delivery and imaging system | |
| US9086319B2 (en) | Recording a spectrally resolved image by reading out several partial arrays in a plurality of interferometer scans | |
| CN106841013B (zh) | 一种基于量子关联成像技术辨别微观生物体的方法 | |
| JP7825540B2 (ja) | 分光イメージングシステム、計測システム | |
| JP2009019893A (ja) | センシング方法及びセンシング装置 | |
| Koppelhuber et al. | Computational imaging, relighting and depth sensing using flexible thin-film sensors | |
| JPH03108687A (ja) | 放射線計測装置の放射線検出部 | |
| FR3092398A1 (fr) | Procédés et systèmes pour l’imagerie de contraste phase | |
| JP2025109080A (ja) | 処理装置、光学測定装置、光学測定方法、及び、光学測定プログラム | |
| RU2480718C2 (ru) | Устройство для спектрального анализа | |
| Le et al. | An empirical investigation of robust underwater computational ghost imaging | |
| KR20130039744A (ko) | 융합형 진주 분석 시스템 및 이를 이용한 진주 분석 방법 |