RU2721153C1 - Детектирование рентгеновского излучения интерференционной картины в падающем рентгеновском излучении при фазово-контрастной и/или темнопольной рентгеновской визуализации - Google Patents

Детектирование рентгеновского излучения интерференционной картины в падающем рентгеновском излучении при фазово-контрастной и/или темнопольной рентгеновской визуализации Download PDF

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RU2721153C1
RU2721153C1 RU2019111467A RU2019111467A RU2721153C1 RU 2721153 C1 RU2721153 C1 RU 2721153C1 RU 2019111467 A RU2019111467 A RU 2019111467A RU 2019111467 A RU2019111467 A RU 2019111467A RU 2721153 C1 RU2721153 C1 RU 2721153C1
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ray
optical
layer
scintillation
structured
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Роджер СТЕДМЭН БУКЕР
Эвальд РЕССЛЬ
Вальтер РЮТТЕН
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Конинклейке Филипс Н.В.
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/20Measuring radiation intensity with scintillation detectors
    • G01T1/2018Scintillation-photodiode combinations
    • G01T1/20183Arrangements for preventing or correcting crosstalk, e.g. optical or electrical arrangements for correcting crosstalk
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/041Phase-contrast imaging, e.g. using grating interferometers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/20Measuring radiation intensity with scintillation detectors
    • G01T1/2008Measuring radiation intensity with scintillation detectors using a combination of different types of scintillation detectors, e.g. phoswich
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/20Measuring radiation intensity with scintillation detectors
    • G01T1/2018Scintillation-photodiode combinations
    • G01T1/20184Detector read-out circuitry, e.g. for clearing of traps, compensating for traps or compensating for direct hits
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/20Measuring radiation intensity with scintillation detectors
    • G01T1/208Circuits specially adapted for scintillation detectors, e.g. for the photo-multiplier section
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/24Measuring radiation intensity with semiconductor detectors

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  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Radiology & Medical Imaging (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
RU2019111467A 2017-08-23 2018-08-13 Детектирование рентгеновского излучения интерференционной картины в падающем рентгеновском излучении при фазово-контрастной и/или темнопольной рентгеновской визуализации RU2721153C1 (ru)

Applications Claiming Priority (3)

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EP17187475.3 2017-08-23
EP17187475.3A EP3447538A1 (en) 2017-08-23 2017-08-23 X-ray detection
PCT/EP2018/071847 WO2019038113A1 (en) 2017-08-23 2018-08-13 X-RAY DETECTION OF A FRICTION OF X-RAY INCIDENCE FRAGMENTS IN PHASE CONTRAST X-RAY IMAGING AND / OR SUD BLACK BACKGROUND

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RU2721153C1 true RU2721153C1 (ru) 2020-05-18

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US (1) US10539688B2 (https=)
EP (2) EP3447538A1 (https=)
JP (1) JP7221938B2 (https=)
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2858391C1 (ru) * 2025-11-11 2026-03-17 Федеральное государственное бюджетное учреждение науки Институт ядерной физики им. Г.И. Будкера Сибирского отделения Российской академии наук Координатный детектор прямого счета рентгеновских фотонов с измерением энергии

Families Citing this family (40)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20150117599A1 (en) 2013-10-31 2015-04-30 Sigray, Inc. X-ray interferometric imaging system
US10295485B2 (en) 2013-12-05 2019-05-21 Sigray, Inc. X-ray transmission spectrometer system
USRE48612E1 (en) 2013-10-31 2021-06-29 Sigray, Inc. X-ray interferometric imaging system
US11271660B2 (en) * 2018-05-17 2022-03-08 Institut National De La Recherche Scientifique Method and system for sampling and denoising amplification of a signal
US10845491B2 (en) 2018-06-04 2020-11-24 Sigray, Inc. Energy-resolving x-ray detection system
GB2591630B (en) 2018-07-26 2023-05-24 Sigray Inc High brightness x-ray reflection source
US10656105B2 (en) 2018-08-06 2020-05-19 Sigray, Inc. Talbot-lau x-ray source and interferometric system
US10962491B2 (en) 2018-09-04 2021-03-30 Sigray, Inc. System and method for x-ray fluorescence with filtering
DE112019004478T5 (de) 2018-09-07 2021-07-08 Sigray, Inc. System und verfahren zur röntgenanalyse mit wählbarer tiefe
EP3754382B1 (en) * 2019-06-17 2023-10-25 Detection Technology Oyj Radiation detector and method for manufacturing thereof
US11143605B2 (en) 2019-09-03 2021-10-12 Sigray, Inc. System and method for computed laminography x-ray fluorescence imaging
US12379331B2 (en) 2019-09-06 2025-08-05 The Board Of Trustees Of The Leland Stanford Junior University Single shot analyzer grating for differential phase contrast X-ray imaging and computed tomography
US20210088682A1 (en) * 2019-09-23 2021-03-25 Sino Canada Health Engineering Research Institute (Hefei) Ltd. Readout Board Muxing for PET Systems
EP3799787A1 (en) * 2019-10-01 2021-04-07 Koninklijke Philips N.V. Detector for a dark-field; phase-contrast and attenuation interferometric imaging system
US11175243B1 (en) 2020-02-06 2021-11-16 Sigray, Inc. X-ray dark-field in-line inspection for semiconductor samples
US11217357B2 (en) 2020-02-10 2022-01-04 Sigray, Inc. X-ray mirror optics with multiple hyperboloidal/hyperbolic surface profiles
US11389124B2 (en) * 2020-02-12 2022-07-19 General Electric Company X-ray phase contrast detector
US20230333215A1 (en) * 2020-04-14 2023-10-19 Technion Research & Development Foundation Ltd. Device and method for generating image and distance information
CN115667896B (zh) 2020-05-18 2024-06-21 斯格瑞公司 使用晶体分析器和多个检测元件的x射线吸收光谱的系统和方法
KR20230078684A (ko) * 2020-09-03 2023-06-02 더 리서치 파운데이션 포 더 스테이트 유니버시티 오브 뉴욕 결정체-채널 결합을 위한 시스템 및 방법
JP7640682B2 (ja) 2020-09-17 2025-03-05 シグレイ、インコーポレイテッド X線を用いた深さ分解計測および分析のためのシステムおよび方法
US12480892B2 (en) 2020-12-07 2025-11-25 Sigray, Inc. High throughput 3D x-ray imaging system using a transmission x-ray source
KR102927910B1 (ko) 2020-12-07 2026-02-19 시그레이, 아이엔씨. 투과 x-선 소스를 이용한 고처리량 3D x-선 이미징 시스템
JP7403517B2 (ja) * 2021-10-13 2023-12-22 日本電子株式会社 放射線検出装置および試料分析装置
CN114325805A (zh) * 2021-12-14 2022-04-12 无锡通透光电科技有限公司 辐射成像探测器及其通道压缩电路、通道压缩方法
US12360067B2 (en) 2022-03-02 2025-07-15 Sigray, Inc. X-ray fluorescence system and x-ray source with electrically insulative target material
US11860319B2 (en) * 2022-03-10 2024-01-02 GE Precision Healthcare LLC High-resolution detector having a reduced number of pixels
DE112023001408T5 (de) 2022-03-15 2025-02-13 Sigray, Inc. System und verfahren für die kompakte laminographie unter verwendung einer mikrofokus-transmissionsröntgenquelle und eines röntgendetektors mit variabler vergrösserung
DE112023002079T5 (de) 2022-05-02 2025-02-27 Sigray, Inc. Sequenzielles wellenlängendispersives röntgenspektrometer
WO2024124159A1 (en) * 2022-12-08 2024-06-13 Schlumberger Technology Corporation Downhole tools that include a radiation detector and processes for using same
CN115980819B (zh) * 2022-12-21 2026-04-21 中国科学院近代物理研究所 一种射线剂量横向分布测量装置及方法
US12585034B2 (en) * 2023-02-15 2026-03-24 Innocare Optoelectronics Corporation Electronic device comprising a filter, a scintillator, a sensor, and a substrate
WO2024173256A1 (en) 2023-02-16 2024-08-22 Sigray, Inc. X-ray detector system with at least two stacked flat bragg diffractors
US12181423B1 (en) 2023-09-07 2024-12-31 Sigray, Inc. Secondary image removal using high resolution x-ray transmission sources
CN116879326B (zh) * 2023-09-07 2023-12-19 浙江大学杭州国际科创中心 基于多频条纹的x射线光学相衬成像系统及方法
WO2025101530A1 (en) 2023-11-07 2025-05-15 Sigray, Inc. System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes
WO2025151383A1 (en) 2024-01-08 2025-07-17 Sigray, Inc. X-ray analysis system with focused x-ray beam and non-x-ray microscope
WO2025155719A1 (en) 2024-01-18 2025-07-24 Sigray, Inc. Sequential array of x-ray imaging detectors
WO2025174966A1 (en) 2024-02-15 2025-08-21 Sigray, Inc. System and method for generating a focused x‑ray beam
CN118799868B (zh) * 2024-06-17 2025-03-11 沈阳工业大学 一种光栅莫尔条纹智能细分方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011096584A1 (en) * 2010-02-04 2011-08-11 Fujifilm Corporation Radiation imaging system
US20120183124A1 (en) * 2011-01-17 2012-07-19 Fujifilm Corporation Grid for radiography, radiation image detector, radiation imaging system, and method for manufacturing grid
RU2584247C2 (ru) * 2011-02-01 2016-05-20 Конинклейке Филипс Электроникс Н.В. Формирование дифференциальных фазово-контрастных изображений с пластинами фокусирующих структур преломления
WO2017013153A1 (en) * 2015-07-21 2017-01-26 Koninklijke Philips N.V. X-ray detector for phase contrast and/or dark-field imaging

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102006037256B4 (de) * 2006-02-01 2017-03-30 Paul Scherer Institut Fokus-Detektor-Anordnung einer Röntgenapparatur zur Erzeugung projektiver oder tomographischer Phasenkontrastaufnahmen sowie Röntgensystem, Röntgen-C-Bogen-System und Röntgen-CT-System
DE102006017291B4 (de) * 2006-02-01 2017-05-24 Paul Scherer Institut Fokus/Detektor-System einer Röntgenapparatur zur Erzeugung von Phasenkontrastaufnahmen, Röntgensystem mit einem solchen Fokus/Detektor-System sowie zugehöriges Speichermedium und Verfahren
DE102006037281A1 (de) * 2006-02-01 2007-08-09 Siemens Ag Röntgenoptisches Durchstrahlungsgitter einer Fokus-Detektor-Anordnung einer Röntgenapparatur zur Erzeugung projektiver oder tomographischer Phasenkontrastaufnahmen von einem Untersuchungsobjekt
JP5844545B2 (ja) * 2010-05-31 2016-01-20 富士フイルム株式会社 放射線撮影装置
EP2633813B1 (en) * 2010-10-29 2015-02-25 FUJIFILM Corporation Phase contrast radiation imaging device
CN103648388B (zh) 2011-07-04 2017-05-03 皇家飞利浦有限公司 相位对比度成像设备
DE102011082878A1 (de) * 2011-09-16 2013-03-21 Siemens Aktiengesellschaft Röntgendetektor einer gitterbasierten Phasenkontrast-Röntgenvorrichtung und Verfahren zum Betreiben einer gitterbasierten Phasenkontrast-Röntgenvorrichtung
DE102012217286A1 (de) 2012-09-25 2014-03-27 Siemens Aktiengesellschaft Strahlungsdetektor
WO2014100063A1 (en) * 2012-12-21 2014-06-26 Carestream Health, Inc. Medical radiographic grating based differential phase contrast imaging
DE102012224258A1 (de) 2012-12-21 2014-06-26 Siemens Aktiengesellschaft Röntgenaufnahmesystem zur differentiellen Phasenkontrast-Bildgebung eines Untersuchungsobjekts mit Phase-Stepping sowie angiographisches Untersuchungsverfahren
US9357975B2 (en) * 2013-12-30 2016-06-07 Carestream Health, Inc. Large FOV phase contrast imaging based on detuned configuration including acquisition and reconstruction techniques
JP6529984B2 (ja) * 2014-05-01 2019-06-12 シグレイ、インコーポレイテッド X線干渉イメージングシステム
EP3143384B1 (en) * 2014-05-15 2020-03-04 Sigray Inc. X-ray system and method for measurement, characterization, and analysis of periodic structures
CN106404809A (zh) * 2016-07-27 2017-02-15 中国科学技术大学 一种用于x射线光栅相衬成像装置的图像校正方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011096584A1 (en) * 2010-02-04 2011-08-11 Fujifilm Corporation Radiation imaging system
US20120183124A1 (en) * 2011-01-17 2012-07-19 Fujifilm Corporation Grid for radiography, radiation image detector, radiation imaging system, and method for manufacturing grid
RU2584247C2 (ru) * 2011-02-01 2016-05-20 Конинклейке Филипс Электроникс Н.В. Формирование дифференциальных фазово-контрастных изображений с пластинами фокусирующих структур преломления
WO2017013153A1 (en) * 2015-07-21 2017-01-26 Koninklijke Philips N.V. X-ray detector for phase contrast and/or dark-field imaging

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2858391C1 (ru) * 2025-11-11 2026-03-17 Федеральное государственное бюджетное учреждение науки Институт ядерной физики им. Г.И. Будкера Сибирского отделения Российской академии наук Координатный детектор прямого счета рентгеновских фотонов с измерением энергии

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CN109863424B (zh) 2020-05-12
US10539688B2 (en) 2020-01-21
JP2020531825A (ja) 2020-11-05
CN109863424A (zh) 2019-06-07
EP3494415B1 (en) 2019-10-23
US20190219713A1 (en) 2019-07-18
JP7221938B2 (ja) 2023-02-14
WO2019038113A1 (en) 2019-02-28
EP3447538A1 (en) 2019-02-27
EP3494415A1 (en) 2019-06-12

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