JP2020530903A5 - - Google Patents

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JP2020530903A5
JP2020530903A5 JP2020507557A JP2020507557A JP2020530903A5 JP 2020530903 A5 JP2020530903 A5 JP 2020530903A5 JP 2020507557 A JP2020507557 A JP 2020507557A JP 2020507557 A JP2020507557 A JP 2020507557A JP 2020530903 A5 JP2020530903 A5 JP 2020530903A5
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JP
Japan
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strips
guard
gap
detector pixels
direction parallel
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JP2020507557A
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Japanese (ja)
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JP7118133B2 (ja
JP2020530903A (ja
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Priority claimed from EP17186194.1A external-priority patent/EP3444826A1/en
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JP2020507557A 2017-08-14 2018-08-14 光子カウントコンピュータ断層撮影のための薄型散乱防止及び電荷共有防止グリッド、当該グリッドを有する撮像装置、当該グリッドの製造方法 Expired - Fee Related JP7118133B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP17186194.1 2017-08-14
EP17186194.1A EP3444826A1 (en) 2017-08-14 2017-08-14 Low profile anti scatter and anti charge sharing grid for photon counting computed tomography
PCT/EP2018/072018 WO2019034650A1 (en) 2017-08-14 2018-08-14 ANTI-DISPERSAL GRID AND LOW PROFILE LOAD DISPERSION FOR TOMODENSITOMETRY WITH PHOTON COUNTING

Publications (3)

Publication Number Publication Date
JP2020530903A JP2020530903A (ja) 2020-10-29
JP2020530903A5 true JP2020530903A5 (enExample) 2021-09-24
JP7118133B2 JP7118133B2 (ja) 2022-08-15

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JP2020507557A Expired - Fee Related JP7118133B2 (ja) 2017-08-14 2018-08-14 光子カウントコンピュータ断層撮影のための薄型散乱防止及び電荷共有防止グリッド、当該グリッドを有する撮像装置、当該グリッドの製造方法

Country Status (5)

Country Link
US (1) US11152129B2 (enExample)
EP (2) EP3444826A1 (enExample)
JP (1) JP7118133B2 (enExample)
CN (1) CN111133532B (enExample)
WO (1) WO2019034650A1 (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11320545B2 (en) * 2020-07-07 2022-05-03 GE Precision Healthcare LLC Systems and methods for improved medical imaging

Family Cites Families (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4875227A (en) * 1986-12-06 1989-10-17 Rossi Remo J Anti-scatter grid system
FR2830976B1 (fr) 2001-10-17 2004-01-09 Ge Med Sys Global Tech Co Llc Grilles anti-diffusantes a faible attenuation et procede de fabrication de telles grilles
DE10202987A1 (de) 2002-01-26 2003-07-31 Philips Intellectual Property Gitter zur Absorption von Röntgenstrahlung
SE524731C2 (sv) * 2002-06-07 2004-09-21 Xcounter Ab Metod och apparat för detektering av joniserande strålning
US7072446B2 (en) 2003-05-13 2006-07-04 Analogic Corporation Method for making X-ray anti-scatter grid
DE10354808A1 (de) * 2003-11-21 2005-06-30 Siemens Ag Verfahren zur Abschattung von Streustrahlung vor einem Detektorarray
JP2008506945A (ja) * 2004-07-14 2008-03-06 オーボテック メディカル ソリューションズ リミティド 放射線検出器ヘッド
EP1779138A2 (en) 2004-08-12 2007-05-02 Philips Intellectual Property & Standards GmbH Anti-scatter-grid for a radiation detector
US8581200B2 (en) * 2006-11-17 2013-11-12 Koninklijke Philips N.V. Radiation detector with multiple electrodes on a sensitive layer
US7486764B2 (en) * 2007-01-23 2009-02-03 General Electric Company Method and apparatus to reduce charge sharing in pixellated energy discriminating detectors
US20090008564A1 (en) * 2007-07-05 2009-01-08 Cmt Medical Technologies Ltd. Modular X-Ray Detector With Single Photon Counting, Energy Sensitivity And Integration Capabilities
DE102009031481A1 (de) * 2008-07-03 2010-02-11 Ohnesorge, Frank, Dr. Konzept für optische (Fernfeld-/Fresnel-Regime aber auch Nahfeld-) Mikroskopie/Spektroskopie unterhalb/jenseits des Beugungslimits - Anwendungen für optisches (aber auch elektronisches) schnelles Auslesen von ultrakleinen Speicherzellen in Form von lumineszierenden Quantentrögen - sowie in der Biologie/Kristallographie
US8418348B2 (en) 2008-07-22 2013-04-16 Shimadzu Corporation Manufacturing method of scattered radiation removing grid
WO2010018617A1 (ja) 2008-08-11 2010-02-18 株式会社島津製作所 放射線グリッドおよびそれを備えた放射線撮影装置
US8183535B2 (en) * 2009-02-11 2012-05-22 Mats Danielsson Silicon detector assembly for X-ray imaging
CN103648388B (zh) * 2011-07-04 2017-05-03 皇家飞利浦有限公司 相位对比度成像设备
EP2751596B1 (en) * 2011-08-30 2017-07-19 Koninklijke Philips N.V. Photon counting detector
US20130168567A1 (en) * 2011-12-28 2013-07-04 General Electric Company Collimator for a pixelated detector
US9135728B2 (en) * 2012-04-04 2015-09-15 General Electric Company System and method for multi-energy computed tomography imaging
CN104569002B (zh) * 2013-10-23 2018-04-27 北京纳米维景科技有限公司 基于光子计数的x射线相衬成像系统、方法及其设备
CN106575533B (zh) * 2014-08-05 2018-11-27 皇家飞利浦有限公司 用于x射线成像设备的光栅设备
US20160206255A1 (en) * 2015-01-16 2016-07-21 Kabushiki Kaisha Toshiba Hybrid passive/active multi-layer energy discriminating photon-counting detector
JP6470986B2 (ja) * 2015-01-28 2019-02-13 ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー 放射線検出器及び放射線断層撮影装置
WO2016209138A1 (en) * 2015-06-26 2016-12-29 Prismatic Sensors Ab Scatter estimation and/or correction in x-ray imaging
US10267928B2 (en) * 2015-11-26 2019-04-23 Koninklijke Philips N.V. Dark current compensation
JP6721682B2 (ja) * 2015-12-03 2020-07-15 コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. 放射線検出器及び撮像装置
JP6456854B2 (ja) * 2016-01-12 2019-01-23 株式会社日立製作所 放射線撮像装置
EP3545534B1 (en) * 2016-11-24 2020-04-29 Koninklijke Philips N.V. Anti-scatter grid assembly for detector arrangement
US10222489B2 (en) * 2017-03-13 2019-03-05 General Electric Company Pixel-design for use in a radiation detector
US11224389B2 (en) * 2017-04-17 2022-01-18 The Regents Of The University Of Colorado, A Body Corporate Radiation transmission grid apparatus and methods for x-ray imaging detectors
US10779778B2 (en) * 2017-05-08 2020-09-22 General Electric Company Reference detector elements in conjunction with an anti-scatter collimator
US10610191B2 (en) * 2017-07-06 2020-04-07 Prismatic Sensors Ab Managing geometric misalignment in x-ray imaging systems
WO2020106197A1 (en) * 2018-11-19 2020-05-28 Prismatic Sensors Ab X-ray imaging system for phase contrast imaging using photon-counting events

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