JP2020515907A5 - - Google Patents

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JP2020515907A5
JP2020515907A5 JP2019554390A JP2019554390A JP2020515907A5 JP 2020515907 A5 JP2020515907 A5 JP 2020515907A5 JP 2019554390 A JP2019554390 A JP 2019554390A JP 2019554390 A JP2019554390 A JP 2019554390A JP 2020515907 A5 JP2020515907 A5 JP 2020515907A5
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JP
Japan
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phase plate
point
wavelength
spread function
light
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JP2019554390A
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Japanese (ja)
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JP2020515907A (ja
JP7144438B2 (ja
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Priority claimed from PCT/US2018/026010 external-priority patent/WO2018187419A1/en
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JP2019554390A 2017-04-04 2018-04-04 顕微鏡における高精度波長抽出用の位相板 Active JP7144438B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201762481505P 2017-04-04 2017-04-04
US62/481,505 2017-04-04
PCT/US2018/026010 WO2018187419A1 (en) 2017-04-04 2018-04-04 Phase plate for high precision wavelength extraction in a microscope

Publications (3)

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JP2020515907A JP2020515907A (ja) 2020-05-28
JP2020515907A5 true JP2020515907A5 (cg-RX-API-DMAC7.html) 2021-05-13
JP7144438B2 JP7144438B2 (ja) 2022-09-29

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JP2019554390A Active JP7144438B2 (ja) 2017-04-04 2018-04-04 顕微鏡における高精度波長抽出用の位相板

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US (1) US11422090B2 (cg-RX-API-DMAC7.html)
EP (1) EP3607365A1 (cg-RX-API-DMAC7.html)
JP (1) JP7144438B2 (cg-RX-API-DMAC7.html)
WO (1) WO2018187419A1 (cg-RX-API-DMAC7.html)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7144438B2 (ja) * 2017-04-04 2022-09-29 ザ ユニバーシティ オブ ユタ リサーチ ファウンデイション 顕微鏡における高精度波長抽出用の位相板
DE102019100184A1 (de) * 2019-01-07 2020-07-09 Carl Zeiss Microscopy Gmbh Hochauflösende Scanning-Mikroskopie
CN112762820A (zh) * 2020-12-11 2021-05-07 深圳市菲森科技有限公司 一种共聚焦三维测量系统的标定装置及标定方法

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