JP2020204088A - 塗布装置 - Google Patents
塗布装置 Download PDFInfo
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- JP2020204088A JP2020204088A JP2019195052A JP2019195052A JP2020204088A JP 2020204088 A JP2020204088 A JP 2020204088A JP 2019195052 A JP2019195052 A JP 2019195052A JP 2019195052 A JP2019195052 A JP 2019195052A JP 2020204088 A JP2020204088 A JP 2020204088A
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05B—SPRAYING APPARATUS; ATOMISING APPARATUS; NOZZLES
- B05B13/00—Machines or plants for applying liquids or other fluent materials to surfaces of objects or other work by spraying, not covered by groups B05B1/00 - B05B11/00
- B05B13/02—Means for supporting work; Arrangement or mounting of spray heads; Adaptation or arrangement of means for feeding work
- B05B13/0221—Means for supporting work; Arrangement or mounting of spray heads; Adaptation or arrangement of means for feeding work characterised by the means for moving or conveying the objects or other work, e.g. conveyor belts
- B05B13/0242—Means for supporting work; Arrangement or mounting of spray heads; Adaptation or arrangement of means for feeding work characterised by the means for moving or conveying the objects or other work, e.g. conveyor belts the objects being individually presented to the spray heads by a rotating element, e.g. turntable
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05B—SPRAYING APPARATUS; ATOMISING APPARATUS; NOZZLES
- B05B13/00—Machines or plants for applying liquids or other fluent materials to surfaces of objects or other work by spraying, not covered by groups B05B1/00 - B05B11/00
- B05B13/02—Means for supporting work; Arrangement or mounting of spray heads; Adaptation or arrangement of means for feeding work
- B05B13/0285—Stands for supporting individual articles to be sprayed, e.g. doors, vehicle body parts
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05B—SPRAYING APPARATUS; ATOMISING APPARATUS; NOZZLES
- B05B13/00—Machines or plants for applying liquids or other fluent materials to surfaces of objects or other work by spraying, not covered by groups B05B1/00 - B05B11/00
- B05B13/02—Means for supporting work; Arrangement or mounting of spray heads; Adaptation or arrangement of means for feeding work
- B05B13/04—Means for supporting work; Arrangement or mounting of spray heads; Adaptation or arrangement of means for feeding work the spray heads being moved during spraying operation
- B05B13/0405—Means for supporting work; Arrangement or mounting of spray heads; Adaptation or arrangement of means for feeding work the spray heads being moved during spraying operation with reciprocating or oscillating spray heads
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05B—SPRAYING APPARATUS; ATOMISING APPARATUS; NOZZLES
- B05B13/00—Machines or plants for applying liquids or other fluent materials to surfaces of objects or other work by spraying, not covered by groups B05B1/00 - B05B11/00
- B05B13/02—Means for supporting work; Arrangement or mounting of spray heads; Adaptation or arrangement of means for feeding work
- B05B13/04—Means for supporting work; Arrangement or mounting of spray heads; Adaptation or arrangement of means for feeding work the spray heads being moved during spraying operation
- B05B13/0442—Installation or apparatus for applying liquid or other fluent material to separate articles rotated during spraying operation
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05B—SPRAYING APPARATUS; ATOMISING APPARATUS; NOZZLES
- B05B7/00—Spraying apparatus for discharge of liquids or other fluent materials from two or more sources, e.g. of liquid and air, of powder and gas
- B05B7/02—Spray pistols; Apparatus for discharge
- B05B7/04—Spray pistols; Apparatus for discharge with arrangements for mixing liquids or other fluent materials before discharge
- B05B7/0416—Spray pistols; Apparatus for discharge with arrangements for mixing liquids or other fluent materials before discharge with arrangements for mixing one gas and one liquid
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/24—Vacuum evaporation
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3464—Sputtering using more than one target
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/50—Substrate holders
- C23C14/505—Substrate holders for rotation of the substrates
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/6715—Apparatus for applying a liquid, a resin, an ink or the like
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67294—Apparatus for monitoring, sorting or marking using identification means, e.g. labels on substrates or labels on containers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68728—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a plurality of separate clamping members, e.g. clamping fingers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68764—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a movable susceptor, stage or support, others than those only rotating on their own vertical axis, e.g. susceptors on a rotating caroussel
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68771—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by supporting more than one semiconductor substrate
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Organic Chemistry (AREA)
- Metallurgy (AREA)
- Mechanical Engineering (AREA)
- Materials Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Manufacturing & Machinery (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Physical Vapour Deposition (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Spray Control Apparatus (AREA)
Abstract
Description
A10 プロセスチャンバ
A20 回転装置
A30 回転ホルダ
A40 蒸着装置
A50 ストレージ装置
A60 真空装置
A70 イオンアシスト蒸着(IAD)
AX1 主軸
AX2 中心軸
A 部分
B−B 線
D1、D2 方向
d1 距離
G1、G2 間隙
L1、L2、L4 長さ
L3 厚さ
M1 アライメントマーク
M2 識別マーク
P1 基準面
S1 底部空間
S2 収容空間
T1 対象物
T11 処理面
W1、W2、W3、W4 幅
10 メインベース
20 支持フレーム
21、31 側面
22、32 底面
23、33 上面
30 延伸要素
40 保持要素
41 底面
42 端部
50 ピン
60 支持部
Claims (10)
- プロセスチャンバ、
前記プロセスチャンバ内に配置された回転装置、および
前記回転装置に接続された回転ホルダを含み、
前記回転ホルダは、
中心軸の周りに配置されて、互いに離間された2つの延伸要素、
2つの保持要素、および
2つのピンを含み、
前記2つの延伸要素は、それぞれ側面を有し、
前記2つの保持要素は、それぞれ底面を有し、前記2つの保持要素のうち、一方は前記側面のうちの一方に接続され、他方は前記側面のうちの他方に接続され、
前記2つのピンのうち、一方は前記底面のうちの一方に接続され、他方は前記底面のうちの他方に接続される塗布装置。 - 対象物は前記2つのピンの上に配置され、前記2つの保持要素の間に配置され、前記中心軸は、前記対象物の中心を通過し、
前記2つの延伸要素、前記2つの保持要素、および前記2つのピンは前記中心軸を囲み、前記2つのピンは前記中心軸に向かって延伸する請求項1に記載の塗布装置。 - 前記2つのピンのうちの一方と前記中心軸の間の距離は、前記2つの保持要素のうちの一方と前記中心軸の間の距離より短く、
前記2つの保持要素のうちの一方の長さは、4mm〜10mmの範囲であり、前記2つの保持要素のうちの一方の前記長さは、前記中心軸に垂直な方向で測定され、
前記2つのピンのうちの一方の長さは、4mm〜10mmの範囲であり、前記2つのピンのうちの一方の前記長さは、前記中心軸に垂直な方向で測定される請求項2に記載の塗布装置。 - 前記2つのピンのうちの一方の厚さは、1mm〜3mmの範囲であり、前記2つのピンのうちの一方の前記厚さは、前記中心軸に平行な方向で測定され、
前記回転装置は、主軸の周りで前記回転ホルダを回転させるように構成され、前記回転ホルダは、前記主軸に実質的に垂直に延伸し、前記主軸は、前記中心軸に平行であり、前記中心軸から離間される請求項2に記載の塗布装置。 - 前記プロセスチャンバ内に配置され、前記回転ホルダの下方に配置された蒸着装置を更に含み、前記蒸着装置は、前記対象物に向かって塗布材料を塗布するように構成され、前記対象物は、アライメントマークおよび識別マークを有し、前記2つのピンのうちの一方は、前記アライメントマークまたは前記識別マークを覆う請求項2に記載の塗布装置。
- 前記回転ホルダは、
前記回転装置に接続されたメインベース、および
2つの支持フレームを更に含み、
前記2つの支持フレームのうちの一方は、前記メインベースと前記2つの延伸要素のうちの一方に接続され、前記2つの支持フレームのうちの他方は、前記メインベースと前記2つの延伸要素のうちの他方に接続され、
底部空間は前記2つの支持フレームの間に形成され、収容空間は前記2つの延伸要素の側面の間に形成され、前記底部空間と連通し、前記2つの保持要素と前記2つのピンは前記収容空間に配置される請求項2に記載の塗布装置。 - 前記中心軸は、前記底部空間の中心と前記収容空間の中心を通過し、前記底部空間の幅は、前記収容空間の幅より大きく、前記底部空間の前記幅と前記収容空間の前記幅は、前記中心軸に垂直な方向で測定され、
前記底部空間の前記幅は、前記収容空間の前記幅の1.01倍〜1.1倍であり、前記収容空間の前記幅は、前記対象物の幅に4mm〜20mmを加えた範囲であり、前記底部空間の前記幅は、前記対象物の前記幅に28mm〜64mmを加えた範囲である請求項6に記載の塗布装置。 - 前記2つの支持フレームのそれぞれは1つの側面を更に有し、前記2つの延伸要素のそれぞれは1つの底面を更に有し、前記底面のうちの一方は、前記2つの支持フレームの前記側面のうちの一方に接続され、前記底面のうち他方は、前記2つの支持フレームの前記側面のうちの他方に接続され、
前記2つの支持フレームの前記側面は、前記2つの延伸要素の前記底面に垂直に延伸し、
断面図において、前記2つの支持フレームの前記側面は曲面であり、前記2つの延伸要素の前記底面は平面であり、平面図において、前記2つの支持フレームの前記側面と前記2つの延伸要素の前記底面はC字形であり、
前記2つの支持フレームのそれぞれは、1つの側面を更に有し、前記2つの保持要素のうちの一方の端部と、前記2つの保持要素のうちの一方に近い前記2つの支持フレームの前記側面のうちの一方との間の距離は、18mm〜30mmの範囲であり、前記側面の1つに垂直な方向にある請求項6に記載の塗布装置。 - 前記プロセスチャンバに接続され、前記プロセスチャンバを真空引きするように構成された真空装置、および
前記プロセスチャンバ内に配置され、前記回転ホルダにイオンを放出するように構成されたイオンアシスト蒸着を更に含み、
間隙が前記2つの延伸要素の2つの隣接する端部の間に形成される請求項1に記載の塗布装置。 - 前記2つの延伸要素の前記側面は、前記2つの保持要素の前記底面に垂直に延伸し、
断面図において、前記2つの延伸要素の前記側面は曲面であり、前記2つの延伸要素の前記底面は平面であり、平面図において、前記2つの延伸要素の前記側面と前記2つの保持要素の前記底面はC字形である請求項1に記載の塗布装置。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US16/444,382 US11358168B2 (en) | 2019-06-18 | 2019-06-18 | Coating apparatus |
US16/444,382 | 2019-06-18 |
Publications (2)
Publication Number | Publication Date |
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JP2020204088A true JP2020204088A (ja) | 2020-12-24 |
JP6893545B2 JP6893545B2 (ja) | 2021-06-23 |
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Application Number | Title | Priority Date | Filing Date |
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JP2019195052A Active JP6893545B2 (ja) | 2019-06-18 | 2019-10-28 | 塗布装置 |
Country Status (4)
Country | Link |
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US (1) | US11358168B2 (ja) |
JP (1) | JP6893545B2 (ja) |
CN (1) | CN112095084B (ja) |
TW (1) | TWI711712B (ja) |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58128724A (ja) * | 1982-01-27 | 1983-08-01 | Hitachi Ltd | ウエハ反転装置 |
JPH05179428A (ja) * | 1991-05-23 | 1993-07-20 | Matsushita Electric Ind Co Ltd | 薄膜形成装置 |
US6126382A (en) * | 1997-11-26 | 2000-10-03 | Novellus Systems, Inc. | Apparatus for aligning substrate to chuck in processing chamber |
JP2001332513A (ja) * | 2000-05-25 | 2001-11-30 | Sony Corp | 蒸着装置 |
JP2011105983A (ja) * | 2009-11-16 | 2011-06-02 | Fujifilm Corp | ワーク連続反転装置 |
JP2018506177A (ja) * | 2015-01-21 | 2018-03-01 | エルジー イノテック カンパニー リミテッド | 発光素子及びこれを製造する電子ビーム蒸着装置 |
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CN112095084A (zh) | 2020-12-18 |
US11358168B2 (en) | 2022-06-14 |
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