JP2020134216A - Inspection jig - Google Patents

Abstract

To provide an inspection jig capable of arranging a plurality of contact probes at a narrow pitch while securing insulation.SOLUTION: An inspection jig includes a housing H which houses a contact probe P, and a positioning member 1 which is arranged inside the housing H and positions a position of the contact probe P. The positioning member 1 has a plurality of storage sections 12 for storing the contact probes P, a partition D for insulating contact probes P from each other is provided between the plurality of storage sections 12.SELECTED DRAWING: Figure 1

Description

The present invention relates to an inspection jig for smoothly performing an inspection using a contact probe.

A contact probe is an electronic component mainly used for inspecting semiconductor parts such as integrated circuits, electrical characteristics of electronic boards such as printed wiring boards, and other electronic devices and electronic parts, and has springiness and contact reliability. It is equipped with a spring structure to secure the equipment and a plunger that comes into contact with the inspection object. Further, plungers are provided at both ends of the spring structure.

As an invention of such a contact probe, for example, in Patent Document 1, a first, which is integrally molded by a thin plate having conductivity and springiness, constitutes one end portion, and comes into contact with a predetermined first contact object. The length of the contact probe while connecting the contact portion (plunger), the second contact portion (plunger) that constitutes the other end portion and contacts a predetermined second contact object, the first contact portion and the second contact portion A contact probe provided with a deformed portion (spring structure) for deforming the contact probe in the direction is described. The deformed portion includes a first deformed portion connected to the first contact portion, a second deformed portion connected to the second contact portion, and a third deformed portion arranged between the first deformed portion and the second deformed portion. The spring constant of the third deformed portion is smaller than the spring constant of the first deformed portion and the spring constant of the second deformed portion.
With such a configuration, it is possible to bring the object into contact with a predetermined contact pressure, and the amount of deflection can be set to a predetermined amount or more.

Japanese Patent No. 5103566

By the way, Patent Document 1 describes an arrangement member for arranging a plurality of contact probes integrally molded by a thin plate and using them for inspection.

The plurality of arrangement holes provided in the arrangement member include a small diameter hole formed at the end and accommodating the plunger, a large diameter hole formed with an inner diameter larger than the small diameter hole and accommodating the spring structure, and the like. It is composed of.

Here, if the arrangement hole has such a configuration, it becomes difficult to perform measurement by arranging the contact probes at a narrow pitch such as Kelvin measurement.
That is, since the large-diameter hole has a substantially round hole shape having a diameter larger than the length in the width direction of the spring structure, it is difficult to arrange the contact probe close to the thickness direction thereof.

The present invention has been made in view of the above-mentioned actual conditions, and an object of the present invention is to provide an inspection jig capable of arranging a plurality of contact probes at a narrow pitch while ensuring insulation.

In order to solve the above problems, the present invention includes a housing for accommodating the contact probe and a positioning member arranged inside the housing for determining the position of the contact probe.
The positioning member has a plurality of accommodating portions for accommodating the contact probe.
A partition for insulating the contact probes from each other is provided between the plurality of accommodating portions.

According to the present invention, since the positioning member is provided with a partition that insulates the contact probes from each other, it is possible to position the contact probes while ensuring the insulation between the contact probes.

In a preferred embodiment of the present invention, the plurality of accommodating portions are characterized by being linear grooves.

With such a configuration, it is possible to form more accommodating portions in the positioning member.

In a preferred embodiment of the present invention, the plurality of accommodating portions have different groove depths.

With such a configuration, the distance between the plurality of contact probes can be adjusted in the depth direction of the accommodating portion according to the inspection target, and the versatility at the time of inspection is improved.

In a preferred embodiment of the present invention, the contact probe has a substantially flat plate shape.

With such a configuration, the width of the plurality of accommodating portions can be narrowed as much as possible, and more accommodating portions can be formed in the positioning member.

In a preferred embodiment of the present invention, the thickness of the partition is smaller than the width of the contact probe.

With such a configuration, it is possible to arrange a plurality of contact probes as close as possible in the thickness direction of the partition.

In a preferred embodiment of the present invention, the housing is characterized by having a positioning hole through which an end portion of the contact probe is inserted.

With such a configuration, it is possible to accurately position the contact probe while suppressing the destruction of the contact probe, and it is possible to perform highly accurate inspection.

According to the present invention, it is possible to provide an inspection jig capable of arranging contact probes at a narrow pitch while ensuring insulation.

It is a figure which shows the positioning member which concerns on embodiment of this invention, is (a) schematic perspective view, (b) top view. It is a figure which shows the housing which concerns on embodiment of this invention, is (a) schematic perspective view, (b) side view. It is a figure which shows the component part of the housing which concerns on embodiment of this invention, (a) top view of the first housing, (b) XX'line sectional view of the first housing, (c) top view of the second housing. , (D) YY'line sectional view of the second housing. It is a figure explaining the assembly procedure of the inspection jig which concerns on embodiment of this invention. It is a figure which shows the inspection jig which concerns on embodiment of this invention, (a) the schematic perspective view when the contact probe is incorporated, (b) the side view when the contact probe is incorporated. It is a figure which shows the positioning member which concerns on embodiment of this invention, is (a) top view when the contact probe is incorporated, (b) (a) partially enlarged view.

Hereinafter, the inspection jig according to the embodiment of the present invention will be described with reference to the drawings.
The embodiments shown below are examples of the present invention, and the present invention is not limited to the following embodiments. Further, in these figures, reference numeral 1 indicates a positioning member according to the present embodiment, and reference numeral 2 indicates an inspection jig according to the present embodiment.

As shown in FIG. 1, the positioning member 1 includes a substantially square columnar main body portion 11 formed of an insulating material, and a housing portion 12 for accommodating a contact probe. As the material of the positioning member 1, for example, resin is preferably used.

The accommodating portion 12 is a linear groove formed on one long side side surface of the main body portion 11, and is composed of a first accommodating portion 12a and a second accommodating portion 12b.
More specifically, the first accommodating portion 12a and the second accommodating portion 12b are formed so as to be substantially parallel to the long side direction of one long side side surface of the main body portion 11 and over the entire length of the long side. ing. That is, as shown in FIG. 1 (a), the first accommodating portion 12a and the second accommodating portion 12b are formed so as to penetrate from the upper surface to the bottom surface of the main body portion 11. Further, the groove depth of the second accommodating portion 12b is formed deeper than the groove depth of the first accommodating portion 12a. By forming the first accommodating portion 12a and the second accommodating portion 12b in this way, a thin plate-shaped partition D is formed between the first accommodating portion 12a and the second accommodating portion 12b.
The number of accommodating portions 12 is not limited to the two shown in the present embodiment, and may be any number, and the groove depth, width, and the like can be arbitrarily changed according to the contact probe to be used. Further, the plurality of accommodating portions 12 may be formed from different side surfaces of the main body portion 11.

As shown in FIG. 2, the housing H has a substantially rectangular plate-shaped first housing H1 and a substantially rectangular parallelepiped second housing H2, and the second housing H2 is located at an end of the first housing H1. As shown in FIG. 2 (a), they form a substantially L-shape as a whole in a side view.
The positioning member 1 housed inside the housing H is shown by a dotted line.

As shown in FIGS. 3A and 3B, the first housing H1 is provided with two substantially round hole-shaped positioning holes r1 penetrating in the thickness direction.
Further, a pair of connecting holes c1 for inserting a connecting tool B (see FIG. 4) that penetrates in the thickness direction and connects to the second housing H2 are provided at intervals in the short side direction.
Further, two substantially oval-shaped mounting holes a for inserting a mounting tool (not shown) that penetrates in the thickness direction and is mounted on the inspection target (not shown) are provided at intervals in the long side direction. Has been done.

As shown in FIGS. 3 (c) and 3 (d), the second housing H2 is provided with a mounting portion h hollowed out in a substantially H shape on which the positioning member 1 is mounted. Two substantially round hole-shaped positioning holes r2 are provided so as to penetrate from the bottom surface of the portion h toward the bottom surface of the second housing H2.
Further, a pair of connecting holes c2 for inserting a connecting tool B (see FIG. 4) that penetrates in the height direction and connects to the first housing H1 are provided at intervals in the long side direction. The length of the mounting portion h in the width direction is formed to be substantially the same as the length of the positioning member 1 in the width direction.

When the positioning member 1 and the housing H constituting the inspection jig 2 are in the state shown in FIG. 2, the central axes of the connecting holes c1 and c2 of each member are aligned, and the positioning holes r1 and r2 are aligned. The central axis of each of the housing portions 12 and the end portions of the accommodating portions 12 in the depth direction are configured to coincide with each other.

When performing an inspection using the inspection jig 2, the user first individually accommodates the two substantially flat contact probes P in the first accommodating portion 12a and the second accommodating portion 12b, and then accommodates the first accommodating portion 12a. It is positioned up to the depth direction end of 12a and the second accommodating portion 12b. (Arrow p1 in FIG. 4).

Next, the user places the positioning member 1 in which the contact probe P is housed on the mounting portion h so that the width direction of the positioning member 1 and the width direction of the mounting portion h are substantially parallel to each other. (Arrow p2 in FIG. 4). By doing so, one end of the contact probe P is inserted into the positioning hole r2.

Next, the user covers the first housing H1 from above the second housing H2 so that the short side end surface thereof coincides with the long side side surface of the second housing H2 (arrow p3 in FIG. 4). By doing so, the other end of the contact probe P is inserted into the positioning hole r1.

Finally, the user inserts a connecting tool B such as a bolt into the connecting holes c1 and c2 as appropriate to connect the first housing H1 and the second housing H2 (arrow p4 in FIG. 4).

By doing so, as shown in FIG. 5, each contact probe P is incorporated inside the inspection jig 2. Further, both ends of each contact probe P are in a state of protruding from the positioning holes r1 and r2.

Then, the user brings one end of each contact probe P into contact with a base (not shown) or the like made of a conductive material connected to an electronic device for analyzing the resistance value or the like, and the other end. Is brought into contact with the inspection target to perform measurement.

As shown in FIG. 6, each contact probe P has a first accommodating portion 12a and a second accommodating portion 12a so that the width direction thereof is substantially parallel to the depth direction of the first accommodating portion 12a and the second accommodating portion 12b. It is housed in part 12b.

Further, as shown in FIG. 6A, the thickness t of the partition D is formed to be smaller than the width w of each contact probe P.

In the present embodiment, the groove depth of the first accommodating portion 12a is 1.85 mm, the groove depth of the second accommodating portion 12b is 2.65 mm, and the widths of the first accommodating portion 12a and the second accommodating portion 12b are 0. It is designed to be .3 mm.

According to the present embodiment, a partition D for insulating the contact probes P from each other is provided between the first accommodating portion 12a and the second accommodating portion 12b of the positioning member 1, so that the contact probes P are separated from each other. It is possible to position the contact probe P while ensuring the insulating property.

Further, since the first accommodating portion 12a and the second accommodating portion 12b are linear grooves, it is possible to further form more accommodating portions in the positioning member 1 than the third accommodating portion and the like.

Further, since the first accommodating portion 12a and the second accommodating portion 12b have different groove depths, the distance between the contact probes P can be adjusted in the depth direction of the accommodating portion 12 according to the inspection target. This improves versatility during inspection.

Further, since the contact probe P has a substantially flat plate shape, the widths of the first accommodating portion 12a and the second accommodating portion 12b can be narrowed as much as possible, and more accommodating portions can be formed in the positioning member 1. It will be possible.

Further, since the thickness t of the partition D is smaller than the width w of the contact probe P, it is possible to arrange the plurality of contact probes P as close as possible in the thickness t direction of the partition D.

Further, since the housing H has the positioning holes r1 and r2 through which the end portion of the contact probe P is inserted, the contact probe P can be accurately positioned while suppressing the destruction of the contact probe P. , It is possible to perform highly accurate inspection.

The various shapes, dimensions, and the like of each component shown in the above embodiment are examples, and can be variously changed based on design requirements and the like.

1 Positioning member 11 Main body 12 Accommodating portion 12a First accommodating portion 12b Second accommodating portion D Partition 2 Inspection jig H housing H1 First housing a Mounting hole H2 Second housing h Mounting parts r1, r2 Positioning holes c1, c2 Connecting hole B Connecting tool

Claims (6)

A housing for accommodating the contact probe and a positioning member for determining the position of the contact probe arranged inside the housing are provided.
The positioning member has a plurality of accommodating portions for accommodating the contact probe.
An inspection jig characterized in that a partition for insulating the contact probes from each other is provided between the plurality of accommodating portions. The inspection jig according to claim 1, wherein the plurality of accommodating portions are linear grooves. The inspection jig according to claim 2, wherein the plurality of accommodating portions have different groove depths. The inspection jig according to any one of claims 1 to 3, wherein the contact probe has a substantially flat plate shape. The inspection jig according to claim 4, wherein the thickness of the partition is smaller than the width of the contact probe. The inspection jig according to claim 5, wherein the housing has a positioning hole through which an end portion of the contact probe is inserted.