JP2020077296A - プラント点検計画最適化装置及び方法 - Google Patents
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Abstract
Description
100a:プラント点検計画最適化部
100b:プラント点検計画最適化修正部
101:入力部
102:出力部
103:演算処理部
104:記憶部
105:プラント操業予測部
106:劣化確率分布予測部
107:点検計画最適化部
108:パラメータ修正部
109:観測モデル選択部
DB1:観測モデルデータベース
301最適化部
302:リスク計算部
303:モデル改善度計算部
304:コスト計算部
Claims (8)
- プラントの操業のバラツキを予測するプラント操業予測部と、前記プラントの操業のバラツキと、前回点検における劣化状態と予測モデルのパラメータの確率分布を用いて、プラントの複数の点検予定個所の劣化の確率分布を予測する劣化確率分布予測部と、前記複数の点検予定個所の劣化の確率分布を用いて、選択指標に応じて前記点検予定個所の中から選択した点検個所を選択する点検箇所最適化部と、選択した前記点検個所及び点検手法を提示する出力部とを備えていることを特徴とするプラント点検計画最適化装置。
- 請求項1に記載のプラント点検計画最適化装置であって、
前記プラント操業予測部は、プラントのセンサデータを用いてプラントの操業のバラツキを予測することを特徴とするプラント点検計画最適化装置。 - 請求項1または請求項2に記載のプラント点検計画最適化装置であって、
前記点検箇所最適化部は、前記複数の点検予定個所の劣化の確率分布を用いて、前記点検予定個所における点検実施時のコスト並びに点検対象となるプラントを構成する機器が故障した場合の影響度を求め、前記選択指標は前記コストと前記影響度のトレードオフ調整パラメータであることを特徴とするプラント点検計画最適化装置。 - 請求項1から請求項3のいずれか1項に記載のプラント点検計画最適化装置であって、
前記点検箇所最適化部は、前記複数の点検予定個所の劣化の確率分布を用いて、前記予測モデルの予測精度を求め、前記選択指標は前記予測精度であり予測精度の向上がの向上が期待できる点検予定個所を点検個所として選択することを特徴とするプラント点検計画最適化装置。 - 請求項1から請求項4のいずれか1項に記載のプラント点検計画最適化装置であって、
前記出力部に提示された前記点検個所及び点検手法に応じて点検員が実施した点検結果を入力する入力部と、前記出力部に提示された前記点検個所の特性を表す観測モデルと、前記入力部からの点検結果とを用いて前記劣化確率分布予測部を調整するパラメータ修正部を備えていることを特徴とするプラント点検計画最適化装置。 - 請求項5に記載のプラント点検計画最適化装置であって、
前記パラメータ修正部は、前記劣化確率分布予測部における劣化の確率分布やパラメータの確率分布を修正することを特徴とするプラント点検計画最適化装置。 - プラントの操業のバラツキを予測し、前記プラントの操業のバラツキと、前回点検における劣化状態と予測モデルのパラメータの確率分布を用いて、プラントの複数の点検予定個所の劣化の確率分布を予測し、前記複数の点検予定個所の劣化の確率分布を用いて、選択指標に応じて前記点検予定個所の中から選択した点検個所を選択し、選択した前記点検個所及び点検手法を提示することを特徴とするプラント点検計画最適化方法。
- 請求項7に記載のプラント点検計画最適化方法であって、
前記提示された前記点検個所及び点検手法に応じて点検員が実施した点検結果と、前記提示された前記点検個所の特性を表す観測モデルとを用いて前記劣化の確率分布を修正することを特徴とするプラント点検計画最適化方法。
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US16/575,534 US20200150639A1 (en) | 2018-11-09 | 2019-09-19 | Plant inspection planning optimization apparatus and method therefor |
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JP7475978B2 (ja) | 2020-06-12 | 2024-04-30 | 株式会社日立製作所 | 保全改善支援装置及び保全改善支援方法 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0778022A (ja) * | 1993-06-30 | 1995-03-20 | Toshiba Corp | 構造部品の劣化・損傷予測装置 |
JP2008191900A (ja) * | 2007-02-05 | 2008-08-21 | Toshiba Corp | プラントの信頼性重視保全運用支援システム及び運用支援方法 |
JP2016004523A (ja) * | 2014-06-19 | 2016-01-12 | 株式会社日立ビルシステム | エレベータ保守支援システムおよびエレベータ保守支援方法 |
JP2016177682A (ja) * | 2015-03-20 | 2016-10-06 | 株式会社東芝 | 設備評価装置、設備評価方法、コンピュータプログラム |
JP2017081685A (ja) * | 2015-10-27 | 2017-05-18 | 株式会社サイバー・ラボ | 点検案内システム |
JP2017187900A (ja) * | 2016-04-04 | 2017-10-12 | 三菱電機株式会社 | 情報処理装置、保守システム、情報処理方法及び情報処理プログラム |
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Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
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JPH0778022A (ja) * | 1993-06-30 | 1995-03-20 | Toshiba Corp | 構造部品の劣化・損傷予測装置 |
JP2008191900A (ja) * | 2007-02-05 | 2008-08-21 | Toshiba Corp | プラントの信頼性重視保全運用支援システム及び運用支援方法 |
JP2016004523A (ja) * | 2014-06-19 | 2016-01-12 | 株式会社日立ビルシステム | エレベータ保守支援システムおよびエレベータ保守支援方法 |
JP2016177682A (ja) * | 2015-03-20 | 2016-10-06 | 株式会社東芝 | 設備評価装置、設備評価方法、コンピュータプログラム |
JP2017081685A (ja) * | 2015-10-27 | 2017-05-18 | 株式会社サイバー・ラボ | 点検案内システム |
JP2017187900A (ja) * | 2016-04-04 | 2017-10-12 | 三菱電機株式会社 | 情報処理装置、保守システム、情報処理方法及び情報処理プログラム |
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JP7475978B2 (ja) | 2020-06-12 | 2024-04-30 | 株式会社日立製作所 | 保全改善支援装置及び保全改善支援方法 |
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