JP2019533197A - Euv放射を反射する多層膜ミラーおよびその製造方法 - Google Patents
Euv放射を反射する多層膜ミラーおよびその製造方法 Download PDFInfo
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- 230000005855 radiation Effects 0.000 title claims abstract description 18
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 14
- 229910052799 carbon Inorganic materials 0.000 claims abstract description 51
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims abstract description 49
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 claims abstract description 28
- 229910052796 boron Inorganic materials 0.000 claims abstract description 27
- 229910052746 lanthanum Inorganic materials 0.000 claims abstract description 12
- FZLIPJUXYLNCLC-UHFFFAOYSA-N lanthanum atom Chemical compound [La] FZLIPJUXYLNCLC-UHFFFAOYSA-N 0.000 claims abstract description 11
- 150000002604 lanthanum compounds Chemical class 0.000 claims abstract description 11
- 230000004888 barrier function Effects 0.000 claims description 20
- 238000001755 magnetron sputter deposition Methods 0.000 claims description 17
- 238000005477 sputtering target Methods 0.000 claims description 17
- 238000000034 method Methods 0.000 claims description 15
- 239000012528 membrane Substances 0.000 claims description 10
- MRELNEQAGSRDBK-UHFFFAOYSA-N lanthanum(3+);oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[La+3].[La+3] MRELNEQAGSRDBK-UHFFFAOYSA-N 0.000 claims description 8
- 230000003595 spectral effect Effects 0.000 claims description 8
- 230000000737 periodic effect Effects 0.000 claims description 5
- QCLQZCOGUCNIOC-UHFFFAOYSA-N azanylidynelanthanum Chemical compound [La]#N QCLQZCOGUCNIOC-UHFFFAOYSA-N 0.000 claims description 4
- ZKEYULQFFYBZBG-UHFFFAOYSA-N lanthanum carbide Chemical compound [La].[C-]#[C] ZKEYULQFFYBZBG-UHFFFAOYSA-N 0.000 claims description 4
- 239000000126 substance Substances 0.000 claims description 4
- 239000010408 film Substances 0.000 description 157
- 238000002310 reflectometry Methods 0.000 description 30
- 239000000463 material Substances 0.000 description 21
- 239000000758 substrate Substances 0.000 description 19
- 238000004544 sputter deposition Methods 0.000 description 11
- INAHAJYZKVIDIZ-UHFFFAOYSA-N boron carbide Chemical compound B12B3B4C32B41 INAHAJYZKVIDIZ-UHFFFAOYSA-N 0.000 description 9
- 125000004429 atom Chemical group 0.000 description 7
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 6
- 239000012535 impurity Substances 0.000 description 6
- 230000003287 optical effect Effects 0.000 description 6
- 230000008901 benefit Effects 0.000 description 4
- 239000003575 carbonaceous material Substances 0.000 description 4
- 238000000576 coating method Methods 0.000 description 4
- 230000000052 comparative effect Effects 0.000 description 4
- 239000013039 cover film Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 239000007789 gas Substances 0.000 description 4
- 238000010438 heat treatment Methods 0.000 description 4
- -1 Ar + Chemical class 0.000 description 3
- 229910052786 argon Inorganic materials 0.000 description 3
- 125000004432 carbon atom Chemical group C* 0.000 description 3
- 238000000151 deposition Methods 0.000 description 3
- 238000001900 extreme ultraviolet lithography Methods 0.000 description 3
- 150000002500 ions Chemical class 0.000 description 3
- 150000004767 nitrides Chemical class 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 239000010409 thin film Substances 0.000 description 3
- 229910052776 Thorium Inorganic materials 0.000 description 2
- 239000002800 charge carrier Substances 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 150000001247 metal acetylides Chemical class 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- ZSLUVFAKFWKJRC-IGMARMGPSA-N 232Th Chemical compound [232Th] ZSLUVFAKFWKJRC-IGMARMGPSA-N 0.000 description 1
- 229910052580 B4C Inorganic materials 0.000 description 1
- 229910052684 Cerium Inorganic materials 0.000 description 1
- 229910052770 Uranium Inorganic materials 0.000 description 1
- 150000001768 cations Chemical class 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 239000012777 electrically insulating material Substances 0.000 description 1
- 239000002241 glass-ceramic Substances 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 238000010849 ion bombardment Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 229910052756 noble gas Inorganic materials 0.000 description 1
- 239000012811 non-conductive material Substances 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 230000003746 surface roughness Effects 0.000 description 1
- 239000013077 target material Substances 0.000 description 1
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- C—CHEMISTRY; METALLURGY
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/0605—Carbon
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/067—Borides
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/14—Metallic material, boron or silicon
- C23C14/18—Metallic material, boron or silicon on other inorganic substrates
- C23C14/185—Metallic material, boron or silicon on other inorganic substrates by cathodic sputtering
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- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
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- C23C28/00—Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D
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- C23C28/00—Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D
- C23C28/40—Coatings including alternating layers following a pattern, a periodic or defined repetition
- C23C28/44—Coatings including alternating layers following a pattern, a periodic or defined repetition characterized by a measurable physical property of the alternating layer or system, e.g. thickness, density, hardness
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- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/7095—Materials, e.g. materials for housing, stage or other support having particular properties, e.g. weight, strength, conductivity, thermal expansion coefficient
- G03F7/70958—Optical materials or coatings, e.g. with particular transmittance, reflectance or anti-reflection properties
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- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
- G21K1/062—Devices having a multilayer structure
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- B82Y30/00—Nanotechnology for materials or surface science, e.g. nanocomposites
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
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Abstract
Description
2 第2の膜
3 バリア膜
4 膜対
5 積層体
6 基板
10 多層膜ミラー
11 反射率曲線
12 反射率曲線
13 反射率曲線
14 反射率曲線
20 DCマグネトロンスパッタリング装置
21 第1のスパッタリングターゲット
22 第2のスパッタリングターゲット
23 基板ホルダ
24 マグネトロン
25 直流電圧
Claims (13)
- EUV放射用の多層膜ミラー(10)であって、
前記多層膜ミラー(10)は、交互に第1の膜(1)と第2の膜(2)とを複数有する積層体(5)を備え、前記第1の膜(1)は、ランタンまたはランタン化合物を有し、前記第2の膜(2)は、ホウ素を有する、多層膜ミラーにおいて、
前記第2の膜(2)に炭素がドープされており、前記第2の膜(2)中の炭素の物質量の割合は、10%以下であることを特徴とする、多層膜ミラー。 - 前記第2の膜(2)中の炭素の物質量の割合は、5%以下である、請求項1記載の多層膜ミラー。
- 前記第2の膜(2)中の炭素の物質量の割合は、3%以下である、請求項1または2記載の多層膜ミラー。
- 前記ランタン化合物は、ランタン窒化物、ランタン酸化物またはランタン炭化物である、請求項1から3までのいずれか1項記載の多層膜ミラー。
- 前記第1の膜(1)および前記第2の膜(2)は、それぞれ1nm〜3nmの厚さを有している、請求項1から4までのいずれか1項記載の多層膜ミラー。
- 前記第1の膜(1)と前記第2の膜(2)との間の境界面に、B4CまたはCを有するとともに1.0nm以下の厚さを有する薄いバリア膜(3)が配置されている、請求項1から5までのいずれか1項記載の多層膜ミラー。
- 前記積層体(5)は、周期的な膜列であり、1つの周期の厚さは、3nm〜4nmである、請求項1から6までのいずれか1項記載の多層膜ミラー。
- 前記膜列(5)は、それぞれ前記第1の膜(1)の1つと前記第2の膜(2)の1つとを有する100〜400の膜対(4)を有している、請求項1から7までのいずれか1項記載の多層膜ミラー。
- EUVスペクトル領域用の多層膜ミラー(10)を製造する方法であって、
ランタンまたはランタン化合物を有する第1の膜(1)とホウ素を有する第2の膜(2)とを交互に堆積させ、その際、前記第2の膜(2)には炭素がドープされており、前記第2の膜(2)中の炭素の物質量の割合は、10%以下である、多層膜ミラーを製造する方法。 - 前記第1の膜(1)および前記第2の膜(2)を、DCマグネトロンスパッタリングにより堆積させる、請求項9記載の方法。
- 前記第2の膜(2)のDCマグネトロンスパッタリング時、炭素がドープされたホウ素を有するスパッタリングターゲット(22)を使用する、請求項10記載の方法。
- 前記スパッタリングターゲット(22)中の炭素が10%以下の物質量の割合を有する、請求項11記載の方法。
- DCマグネトロンスパッタリングを室温で行う、請求項10から12までのいずれか1項記載の方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102016118940.5A DE102016118940B3 (de) | 2016-10-06 | 2016-10-06 | Multilayer-Spiegel zur Reflexion von EUV-Strahlung und Verfahren zu dessen Herstellung |
DE102016118940.5 | 2016-10-06 | ||
PCT/EP2017/074231 WO2018065251A1 (de) | 2016-10-06 | 2017-09-25 | Multilayer-spiegel zur reflexion von euv-strahlung und verfahren zu dessen herstellung |
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JP2019533197A true JP2019533197A (ja) | 2019-11-14 |
JP6938626B2 JP6938626B2 (ja) | 2021-09-22 |
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US (1) | US11500137B2 (ja) |
EP (1) | EP3523684B1 (ja) |
JP (1) | JP6938626B2 (ja) |
DE (1) | DE102016118940B3 (ja) |
WO (1) | WO2018065251A1 (ja) |
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DE102018211980A1 (de) * | 2018-07-18 | 2019-09-05 | Carl Zeiss Smt Gmbh | Reflektives optisches Element |
DE102019103188A1 (de) * | 2019-02-08 | 2020-08-13 | VON ARDENNE Asset GmbH & Co. KG | Verfahren, Sputtertarget und Prozessieranordnung |
US11520235B2 (en) * | 2019-10-07 | 2022-12-06 | Kenneth Carlisle Johnson | EUV lithography system with diffraction optics |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2011527416A (ja) * | 2008-07-09 | 2011-10-27 | カール・ツァイス・エスエムティー・ゲーエムベーハー | 反射性光学素子およびその製造方法 |
JP2014523641A (ja) * | 2011-06-15 | 2014-09-11 | エーエスエムエル ネザーランズ ビー.ブイ. | 多層ミラー、多層ミラーを生成する方法およびリソグラフィ装置 |
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DE102006046000A1 (de) | 2006-09-27 | 2007-08-30 | Schott Ag | EUV Maskenblank und Verfahren zu dessen Herstellung |
KR101694283B1 (ko) * | 2009-02-13 | 2017-01-09 | 에이에스엠엘 네델란즈 비.브이. | 다층 거울 및 리소그래피 장치 |
US8109691B2 (en) | 2010-02-09 | 2012-02-07 | Clark Pacific Technology, Inc. | Apparatus and method for on site pouring of pre-stressed concrete structures |
TWI526559B (zh) * | 2012-04-06 | 2016-03-21 | 中央研究院 | 藉由物理氣相沉積法在基板上成長碳薄膜或無機材料薄膜的方法 |
EP2998980A4 (en) * | 2013-05-09 | 2016-11-16 | Nikon Corp | OPTICAL ELEMENT, OPTICAL PROJECTION SYSTEM, EXPOSURE DEVICE AND METHOD FOR PRODUCING THE DEVICE |
DE102013210533A1 (de) * | 2013-06-06 | 2014-12-11 | Carl Zeiss Smt Gmbh | Spiegel für beuv-licht |
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EP3523684A1 (de) | 2019-08-14 |
US11500137B2 (en) | 2022-11-15 |
WO2018065251A1 (de) | 2018-04-12 |
DE102016118940B3 (de) | 2018-01-25 |
US20190235141A1 (en) | 2019-08-01 |
EP3523684B1 (de) | 2021-10-27 |
JP6938626B2 (ja) | 2021-09-22 |
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