JP2019528435A5 - - Google Patents

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Publication number
JP2019528435A5
JP2019528435A5 JP2019503570A JP2019503570A JP2019528435A5 JP 2019528435 A5 JP2019528435 A5 JP 2019528435A5 JP 2019503570 A JP2019503570 A JP 2019503570A JP 2019503570 A JP2019503570 A JP 2019503570A JP 2019528435 A5 JP2019528435 A5 JP 2019528435A5
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JP
Japan
Prior art keywords
sample
fluid sample
support
sample support
gas
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JP2019503570A
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English (en)
Japanese (ja)
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JP6997757B2 (ja
JP2019528435A (ja
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Priority claimed from GBGB1613173.2A external-priority patent/GB201613173D0/en
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Publication of JP2019528435A5 publication Critical patent/JP2019528435A5/ja
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Publication of JP6997757B2 publication Critical patent/JP6997757B2/ja
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JP2019503570A 2016-07-29 2017-07-28 電子顕微鏡法 Active JP6997757B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GBGB1613173.2A GB201613173D0 (en) 2016-07-29 2016-07-29 Electron microscopy
GB1613173.2 2016-07-29
PCT/EP2017/069240 WO2018020036A1 (en) 2016-07-29 2017-07-28 Electron microscopy

Publications (3)

Publication Number Publication Date
JP2019528435A JP2019528435A (ja) 2019-10-10
JP2019528435A5 true JP2019528435A5 (https=) 2020-09-03
JP6997757B2 JP6997757B2 (ja) 2022-02-04

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ID=56936668

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2019503570A Active JP6997757B2 (ja) 2016-07-29 2017-07-28 電子顕微鏡法

Country Status (10)

Country Link
US (1) US11067486B2 (https=)
EP (1) EP3491360B1 (https=)
JP (1) JP6997757B2 (https=)
CN (1) CN109891208A (https=)
AU (1) AU2017302126B2 (https=)
CA (1) CA3032234C (https=)
DK (1) DK3491360T3 (https=)
ES (1) ES3026360T3 (https=)
GB (1) GB201613173D0 (https=)
WO (1) WO2018020036A1 (https=)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3647763B1 (en) * 2018-10-29 2021-07-14 FEI Company A method of preparing a biological sample for study in an analysis device
CN111389478B (zh) * 2020-03-23 2023-07-25 西安医学院 一种组织切片的实验处理装置及其使用方法
GB2593491A (en) * 2020-03-24 2021-09-29 Res & Innovation Uk Electron microscopy support
EP4109069A1 (en) 2021-06-25 2022-12-28 FEI Company Blotting material with profiled region, method of manufacturing same, and uses thereof
US20250341450A1 (en) * 2022-05-13 2025-11-06 The Board Of Trustees Of The Leland Stanford Junior University Cold Gas Stream Method for CryoEM Sample Grid Vitrification
NL2033291B1 (en) 2022-10-12 2024-04-26 Academisch Ziekenhuis Leiden Device and Method for Cryogenic Electron Microscopy Sample Preparation
EP4711738A1 (en) * 2024-09-17 2026-03-18 European Molecular Biology Laboratory Sample preparation method and device for preparing a vitrified sample layer on a sample holder grid for subsequent cryo electron microscopy

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59109840A (ja) 1982-12-16 1984-06-25 Hitachi Koki Co Ltd 走査形電子顕微鏡用生物試料の前処理方法
US7112790B1 (en) * 2003-08-13 2006-09-26 Cypress Semiconductor Corp. Method to prepare TEM samples
JP2007163447A (ja) 2005-12-09 2007-06-28 Lee Bing Huan 電子顕微鏡用の超薄液体制御板
JP4891830B2 (ja) 2007-04-18 2012-03-07 日本電子株式会社 電子顕微鏡用試料ホルダおよび観察方法
JP5261496B2 (ja) * 2007-11-20 2013-08-14 マックス プランク ゲゼルシャフト ツゥアー フェデルゥン デル ヴィッセンシャフテン エー フォー 超急速冷凍装置及び超急速冷凍方法
GB0724736D0 (en) * 2007-12-19 2008-01-30 Oxford Nanolabs Ltd Formation of layers of amphiphilic molecules
GB2461708A (en) 2008-07-08 2010-01-13 Silson Ltd Sample holder
JP2010054272A (ja) 2008-08-27 2010-03-11 National Institute Of Advanced Industrial Science & Technology スピン偏極走査電子顕微鏡
AT507079B1 (de) * 2009-01-22 2010-02-15 Leica Mikrosysteme Gmbh Vorrichtung und verfahren zum präparieren von proben
JP5550262B2 (ja) * 2009-05-29 2014-07-16 キヤノン株式会社 試料観察システム及び試料観察方法
US9312095B2 (en) * 2010-03-24 2016-04-12 Brown University Method and system for automating sample preparation for microfluidic cryo TEM
GB201118282D0 (en) 2011-10-21 2011-12-07 Cancer Rec Tech Ltd Sample slide preparation method and device
JP5930922B2 (ja) * 2012-09-14 2016-06-08 株式会社日立ハイテクノロジーズ 荷電粒子線装置及び試料観察方法
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EP2853847B1 (en) * 2013-09-30 2016-02-03 Fei Company Preparation of cryogenic sample for charged-particle microscopy
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WO2016170008A1 (en) * 2015-04-20 2016-10-27 Ventana Medical Systems, Inc. Inkjet deposition of reagents for histological samples
EP3260839B1 (en) * 2016-06-22 2021-01-27 Universiteit Maastricht Method for preparing samples for imaging or diffraction experiments under cryogenic conditions
EP3647763B1 (en) * 2018-10-29 2021-07-14 FEI Company A method of preparing a biological sample for study in an analysis device

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