JP2019191119A5 - - Google Patents

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Publication number
JP2019191119A5
JP2019191119A5 JP2018087513A JP2018087513A JP2019191119A5 JP 2019191119 A5 JP2019191119 A5 JP 2019191119A5 JP 2018087513 A JP2018087513 A JP 2018087513A JP 2018087513 A JP2018087513 A JP 2018087513A JP 2019191119 A5 JP2019191119 A5 JP 2019191119A5
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JP
Japan
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predetermined number
distance measurement
distance
detection signals
detection signal
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JP2018087513A
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English (en)
Japanese (ja)
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JP7030607B2 (ja
JP2019191119A (ja
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Priority claimed from JP2018087513A external-priority patent/JP7030607B2/ja
Priority to JP2018087513A priority Critical patent/JP7030607B2/ja
Priority to CN201910248398.3A priority patent/CN110412598B/zh
Priority to TW108111643A priority patent/TWI798408B/zh
Priority to US16/375,896 priority patent/US11561303B2/en
Priority to KR1020190040503A priority patent/KR20190125171A/ko
Priority to EP19170343.8A priority patent/EP3561544A1/en
Publication of JP2019191119A publication Critical patent/JP2019191119A/ja
Publication of JP2019191119A5 publication Critical patent/JP2019191119A5/ja
Publication of JP7030607B2 publication Critical patent/JP7030607B2/ja
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JP2018087513A 2018-04-27 2018-04-27 測距処理装置、測距モジュール、測距処理方法、およびプログラム Active JP7030607B2 (ja)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP2018087513A JP7030607B2 (ja) 2018-04-27 2018-04-27 測距処理装置、測距モジュール、測距処理方法、およびプログラム
CN201910248398.3A CN110412598B (zh) 2018-04-27 2019-03-29 测距处理装置、测距模块、测距处理方法和程序
TW108111643A TWI798408B (zh) 2018-04-27 2019-04-02 測距處理裝置，測距模組，測距處理方法及程式
US16/375,896 US11561303B2 (en) 2018-04-27 2019-04-05 Ranging processing device, ranging module, ranging processing method, and program
KR1020190040503A KR20190125171A (ko) 2018-04-27 2019-04-07 측거 처리 장치, 측거 모듈, 측거 처리 방법 및 프로그램
EP19170343.8A EP3561544A1 (en) 2018-04-27 2019-04-18 Ranging processing device, ranging module, ranging processing method, and program

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2018087513A JP7030607B2 (ja) 2018-04-27 2018-04-27 測距処理装置、測距モジュール、測距処理方法、およびプログラム

Publications (3)

Publication Number Publication Date
JP2019191119A JP2019191119A (ja) 2019-10-31
JP2019191119A5 true JP2019191119A5 (enExample) 2021-04-30
JP7030607B2 JP7030607B2 (ja) 2022-03-07

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JP2018087513A Active JP7030607B2 (ja) 2018-04-27 2018-04-27 測距処理装置、測距モジュール、測距処理方法、およびプログラム

Country Status (6)

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US (1) US11561303B2 (enExample)
EP (1) EP3561544A1 (enExample)
JP (1) JP7030607B2 (enExample)
KR (1) KR20190125171A (enExample)
CN (1) CN110412598B (enExample)
TW (1) TWI798408B (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11561085B2 (en) 2019-06-05 2023-01-24 Qualcomm Incorporated Resolving multipath interference using a mixed active depth system
WO2021177045A1 (ja) * 2020-03-04 2021-09-10 ソニーグループ株式会社 信号処理装置、信号処理方法、および、測距モジュール
US11563873B2 (en) * 2020-04-14 2023-01-24 Qualcomm Incorporated Wide-angle 3D sensing
CN114879167A (zh) * 2022-05-07 2022-08-09 四川创安微电子有限公司 一种像素电路、光电信号采集方法及系统和测距传感器
CN116299363A (zh) * 2023-03-20 2023-06-23 福建杰木科技有限公司 一种iToF模组的两相位采样标定与校正方法及装置

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100778904B1 (ko) * 2004-09-17 2007-11-22 마츠시다 덴코 가부시키가이샤 레인지 이미지 센서
JP2008209298A (ja) * 2007-02-27 2008-09-11 Fujifilm Corp 測距装置及び測距方法
JP5295511B2 (ja) * 2007-03-23 2013-09-18 富士フイルム株式会社 測距装置及び測距方法
KR101710514B1 (ko) 2010-09-03 2017-02-27 삼성전자주식회사 깊이 센서 및 이를 이용한 거리 추정 방법
EP2477043A1 (en) * 2011-01-12 2012-07-18 Sony Corporation 3D time-of-flight camera and method
DE102011081567B4 (de) * 2011-08-25 2023-08-31 pmdtechnologies ag Empfänger für einen optischen Entfernungsmesser
DE102013207652B4 (de) * 2012-05-21 2018-05-30 pmdtechnologies ag Lichtlaufzeitkamerasystem
JP6520913B2 (ja) * 2014-02-24 2019-05-29 日本電気株式会社 物体検出装置、ｐｏｓ端末装置、物体検出方法及びコンピュータプログラム
KR102194233B1 (ko) 2014-05-19 2020-12-22 삼성전자주식회사 깊이 영상 생성 장치 및 방법
JP6507529B2 (ja) 2014-08-29 2019-05-08 株式会社デンソー 光飛行型測距装置
US9823352B2 (en) * 2014-10-31 2017-11-21 Rockwell Automation Safety Ag Absolute distance measurement for time-of-flight sensors
US10061029B2 (en) * 2015-01-06 2018-08-28 Samsung Electronics Co., Ltd. Correction of depth images from T-O-F 3D camera with electronic-rolling-shutter for light modulation changes taking place during light integration
JP6764863B2 (ja) * 2015-07-03 2020-10-07 パナソニックセミコンダクターソリューションズ株式会社 距離測定装置
JP6558122B2 (ja) 2015-07-30 2019-08-14 株式会社デンソー 光飛行型測距装置
CN106527761A (zh) * 2015-09-10 2017-03-22 义明科技股份有限公司 非接触式光学感测装置及三维空间物件深度位置感测方法
EP3185037B1 (en) * 2015-12-23 2020-07-08 STMicroelectronics (Research & Development) Limited Depth imaging system
JP2017150893A (ja) * 2016-02-23 2017-08-31 ソニー株式会社 測距モジュール、測距システム、および、測距モジュールの制御方法
JP6862751B2 (ja) * 2016-10-14 2021-04-21 富士通株式会社 距離測定装置、距離測定方法及びプログラム
JP7214363B2 (ja) 2018-04-27 2023-01-30 ソニーセミコンダクタソリューションズ株式会社 測距処理装置、測距モジュール、測距処理方法、およびプログラム

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