JP2019191053A - プラズマ分光分析方法 - Google Patents
プラズマ分光分析方法 Download PDFInfo
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- 229910052770 Uranium Inorganic materials 0.000 description 1
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- BJEPYKJPYRNKOW-UHFFFAOYSA-N alpha-hydroxysuccinic acid Natural products OC(=O)C(O)CC(O)=O BJEPYKJPYRNKOW-UHFFFAOYSA-N 0.000 description 1
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- 239000004327 boric acid Substances 0.000 description 1
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- 239000010951 brass Substances 0.000 description 1
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- 229910052793 cadmium Inorganic materials 0.000 description 1
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- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910002804 graphite Inorganic materials 0.000 description 1
- 239000010439 graphite Substances 0.000 description 1
- 238000000673 graphite furnace atomic absorption spectrometry Methods 0.000 description 1
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- 229910052714 tellurium Inorganic materials 0.000 description 1
- PORWMNRCUJJQNO-UHFFFAOYSA-N tellurium atom Chemical compound [Te] PORWMNRCUJJQNO-UHFFFAOYSA-N 0.000 description 1
- 229910052716 thallium Inorganic materials 0.000 description 1
- BKVIYDNLLOSFOA-UHFFFAOYSA-N thallium Chemical compound [Tl] BKVIYDNLLOSFOA-UHFFFAOYSA-N 0.000 description 1
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- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
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- 239000010937 tungsten Substances 0.000 description 1
- JFALSRSLKYAFGM-UHFFFAOYSA-N uranium(0) Chemical compound [U] JFALSRSLKYAFGM-UHFFFAOYSA-N 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
- 239000011701 zinc Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
- G01N21/67—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/48—Biological material, e.g. blood, urine; Haemocytometers
- G01N33/483—Physical analysis of biological material
- G01N33/487—Physical analysis of biological material of liquid biological material
- G01N33/493—Physical analysis of biological material of liquid biological material urine
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
- G01N21/69—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence specially adapted for fluids, e.g. molten metal
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- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Biomedical Technology (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- General Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- Analytical Chemistry (AREA)
- Urology & Nephrology (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Medicinal Chemistry (AREA)
- Food Science & Technology (AREA)
- Biophysics (AREA)
- Hematology (AREA)
- Molecular Biology (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Investigating Or Analysing Biological Materials (AREA)
Abstract
Description
前記補助キレート剤が添加された検体が導入された測定容器中に設置される一対の電極への電圧印加により、一方の電極の近傍に前記検体中の分析対象重金属イオンを濃縮する濃縮工程と、
前記濃縮工程後、前記一対の電極への電圧印加によりプラズマを発生させ、該プラズマにより生じた前記分析対象重金属イオンの発光を検出する検出工程と、
を含んでなる。
前記実施形態に示した測定容器10を準備した。プラズマ発生電極20には直径0.1mmのニクロム線を使用し、露出部分21の長さは0.5mmとした。また、炭素電極30には、直径4.0mm及び長さ15mmの炭素棒を使用した。透光部11には石英ガラスを使用した。プラズマ発生電極20及び炭素電極30は電圧印加手段50としてのガルバノスタットに接続した。受光部40には、直径400μmの単芯光ファイバーを使用した。また、この光ファイバーは、凹面グレーティング方式の分光器(自家調製)に接続した。
7人の被験者それぞれに、100mgのDMSAを含むカプセル5個を単回、経口投与した。前記被験者それぞれの投与後6時間までの尿を採取して全て混合した蓄尿を検体とした。
前記各検体につき、黒鉛炉加熱原子吸光法(Graphite Furnace Atomic Absorption Spectrometry、GF/AAS)にて鉛イオン濃度(単位:ppb)を測定した。
前記各検体について、前記濃縮工程として、プラズマ発生電極20が陰極に、また、炭素電極30が陽極になるように下記の濃縮条件で通電し、プラズマ発生電極20の近傍に鉛イオンを濃縮させた。なお、下記の濃縮条件において、「印加時間」とは、濃縮工程において通電している時間と通電していない時間との合計の時間を表す。また、下記の濃縮条件では下記の電流値になるような電圧が両電極間に印加される。
電流:10〜40mA
印加時間:1,200sec
印加スイッチング周期:0.25μsec
印加スイッチングDuty:50〜80%
電圧:500V
印加時間:2.5ms
印加スイッチング周期:50μsec
印加スイッチングDuty:50%
各検体の上記GF/AAS及びプラズマ分光分析による鉛イオンの測定結果を下記表1及び図4に示す。なお、GF/AASの値は、各検体とも2回の測定の平均値である。また、プラズマ分光分析の値は、ピーク発光量をベース発光量で除した光量補正値で表している。
11 透光部
20 プラズマ発生電極
21 露出部分
22 絶縁体
30 炭素電極
40 受光部
50 電圧印加手段
60 検体
61 液面
Claims (4)
- キレート剤としてメソ−2,3−ジメルカプトコハク酸(DMSA)の投与後に採取された検体に、前記DMSA以外のキレート剤である補助キレート剤を添加する予備添加工程と、
前記補助キレート剤が添加された検体が導入された測定容器中に設置される一対の電極への電圧印加により、一方の電極の近傍に前記検体中の分析対象重金属イオンを濃縮する濃縮工程と、
前記濃縮工程後、前記一対の電極への電圧印加によりプラズマを発生させ、該プラズマにより生じた前記分析対象重金属イオンの発光を検出する検出工程と、
を含んでなることを特徴とするプラズマ分光分析方法。 - 前記補助キレート剤はエチレンジアミン四酢酸(EDTA)であることを特徴とする、請求項1記載のプラズマ分光分析方法。
- 前記検体は尿であることを特徴とする請求項1又は2記載のプラズマ分光分析方法。
- 前記分析対象重金属イオンは鉛イオンであることを特徴とする請求項1から3までのいずれかに記載のプラズマ分光分析方法。
Priority Applications (4)
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JP2018085538A JP7007986B2 (ja) | 2018-04-26 | 2018-04-26 | プラズマ分光分析方法 |
US16/390,513 US11143595B2 (en) | 2018-04-26 | 2019-04-22 | Plasma spectroscopy analysis method |
EP19170953.4A EP3561493B1 (en) | 2018-04-26 | 2019-04-24 | Plasma spectroscopy analysis method |
CN201910338218.0A CN110412016B (zh) | 2018-04-26 | 2019-04-25 | 等离子体光谱分析方法 |
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JP2018085538A JP7007986B2 (ja) | 2018-04-26 | 2018-04-26 | プラズマ分光分析方法 |
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CN (1) | CN110412016B (ja) |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2006023132A (ja) * | 2004-07-06 | 2006-01-26 | National Institute Of Advanced Industrial & Technology | ろ過膜及びそれを用いた鉛イオンの簡易定量方法 |
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