JP2019075557A - 光源一体型光センシングシステム、及びそれを含む電子機器 - Google Patents
光源一体型光センシングシステム、及びそれを含む電子機器 Download PDFInfo
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- 230000003287 optical effect Effects 0.000 claims abstract description 75
- 239000000463 material Substances 0.000 claims description 74
- 239000000758 substrate Substances 0.000 claims description 43
- 239000004065 semiconductor Substances 0.000 description 31
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 14
- 238000000034 method Methods 0.000 description 11
- 238000004458 analytical method Methods 0.000 description 9
- 150000001875 compounds Chemical class 0.000 description 8
- 238000012986 modification Methods 0.000 description 7
- 230000004048 modification Effects 0.000 description 7
- 238000004364 calculation method Methods 0.000 description 5
- 238000002347 injection Methods 0.000 description 5
- 239000007924 injection Substances 0.000 description 5
- 239000000203 mixture Substances 0.000 description 4
- 238000000926 separation method Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000000206 photolithography Methods 0.000 description 3
- 230000000704 physical effect Effects 0.000 description 3
- 229910002704 AlGaN Inorganic materials 0.000 description 2
- 229910000530 Gallium indium arsenide Inorganic materials 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 239000002019 doping agent Substances 0.000 description 2
- 239000012212 insulator Substances 0.000 description 2
- 238000000691 measurement method Methods 0.000 description 2
- 229910052594 sapphire Inorganic materials 0.000 description 2
- 239000010980 sapphire Substances 0.000 description 2
- 241001465754 Metazoa Species 0.000 description 1
- 238000001069 Raman spectroscopy Methods 0.000 description 1
- 238000005253 cladding Methods 0.000 description 1
- 230000002708 enhancing effect Effects 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 230000003252 repetitive effect Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000012780 transparent material Substances 0.000 description 1
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- G—PHYSICS
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- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
- G01S7/481—Constructional features, e.g. arrangements of optical elements
- G01S7/4811—Constructional features, e.g. arrangements of optical elements common to transmitter and receiver
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- G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
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- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
- G01S7/481—Constructional features, e.g. arrangements of optical elements
- G01S7/4811—Constructional features, e.g. arrangements of optical elements common to transmitter and receiver
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
- G01S7/481—Constructional features, e.g. arrangements of optical elements
- G01S7/4814—Constructional features, e.g. arrangements of optical elements of transmitters alone
- G01S7/4815—Constructional features, e.g. arrangements of optical elements of transmitters alone using multiple transmitters
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- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/075—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L33/00
- H01L25/0753—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L33/00 the devices being arranged next to each other
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- H01L31/02—Details
- H01L31/0232—Optical elements or arrangements associated with the device
- H01L31/02327—Optical elements or arrangements associated with the device the optical elements being integrated or being directly associated to the device, e.g. back reflectors
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- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
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- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
- H01L31/101—Devices sensitive to infrared, visible or ultraviolet radiation
- H01L31/102—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier
- H01L31/105—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier the potential barrier being of the PIN type
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- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/18—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities
- H01S5/183—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL]
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- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/18—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities
- H01S5/185—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only horizontal cavities, e.g. horizontal cavity surface-emitting lasers [HCSEL]
- H01S5/187—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only horizontal cavities, e.g. horizontal cavity surface-emitting lasers [HCSEL] using Bragg reflection
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- H01S5/00—Semiconductor lasers
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- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/3401—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers having no PN junction, e.g. unipolar lasers, intersubband lasers, quantum cascade lasers
- H01S5/3402—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers having no PN junction, e.g. unipolar lasers, intersubband lasers, quantum cascade lasers intersubband lasers, e.g. transitions within the conduction or valence bands
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Abstract
Description
100 基板
200 発光物質層
220,221,222,223,224,225,226 発光素子
300 受光物質層
320,321,322,323,324,324,326 受光素子
500,501,502,503,504,505 受発光単位素子
600,610 支持構造物
700,710,720,731,732,733,740 レンズ構造物
5000 ライダー装置
Claims (18)
- 基板と、
前記基板上に位置し、第1光軸を有するように配列された複数の発光素子と、
前記基板上に位置し、前記第1光軸と平行な第2光軸を有するように配列された複数の受光素子と、を含む光センシングシステム。 - 前記第1光軸と前記第2光軸は、実質的に同軸であることを特徴とする請求項1に記載の光センシングシステム。
- 前記複数の発光素子と前記複数の受光素子は、一体型に集積された構造に形成されていることを特徴とする請求項1または2に記載の光センシングシステム。
- 前記複数の発光素子と、前記複数の受光素子との配列は、
前記複数の発光素子のうち1以上の発光素子と、前記複数の受光素子のうち1以上の受光素子とからなる複数の受発光単位素子が反復的に配列された形態であることを特徴とする請求項1〜3のいずれか1つに記載の光センシングシステム。 - 前記受発光単位素子は、
前記1以上の発光素子を、前記1以上の受光素子が取り囲む形態を有することを特徴とする請求項4に記載の光センシングシステム。 - 前記受発光単位素子は、
前記基板上に形成され、前記1以上の発光素子を含む発光領域と、前記1以上の発光素子の材質と同一材質を含む非発光領域と、を具備する発光物質層と、
前記非発光領域上に形成された前記1以上の受光素子と、を含むことを特徴とする請求項4に記載の光センシングシステム。 - 前記受発光単位素子は、
前記基板上に形成され、前記1以上の受光素子を含む受光領域と、前記1以上の受光素子の材質と同一材質を含む非受光領域と、を具備する受光物質層と、
前記非受光領域上に形成された前記1以上の発光素子と、を含むことを特徴とする請求項4に記載の光センシングシステム。 - 前記受発光単位素子上に位置し、
前記1以上の発光素子から出射される光の出射角を調節するレンズ構造物をさらに含むことを特徴とする請求項4に記載の光センシングシステム。 - 前記レンズ構造物は、
前記1以上の受光素子に向かう光の入射角を調節するように形成されていることを特徴とする請求項8に記載の光センシングシステム。 - 前記レンズ構造物は、
前記複数の受発光単位素子それぞれの相対的位置によって異なる出射角を有する形状に形成されたことを特徴とする請求項8に記載の光センシングシステム。 - 前記複数の受発光単位素子が配列される一面を具備し、前記一面上の位置により、前記複数の受発光単位素子それぞれの光軸方向が異なるように、前記一面形状が設定された支持構造物をさらに含むことを特徴とする請求項4に記載の光センシングシステム。
- 前記一面は、曲面、または角度が異なる複数の傾斜面を含む形状であることを特徴とする請求項11に記載の光センシングシステム。
- 前記複数の発光素子は、
第1波長帯域の光を発光する第1発光素子と、
前記第1波長帯域と異なる第2波長帯域の光を発光する第2発光素子と、を含むことを特徴とする請求項1〜12のいずれか1つに記載の光センシングシステム。 - 請求項1〜12のいずれか1つに記載の光センシングシステムと、
プロセッサと、を含み、
前記光センシングシステムの複数の発光素子は対象体に向けて光を照射し、前記光センシングシステムの複数の受光素子は前記対象体に向けて照射された光の反射光を受光し、
前記プロセッサは前記光センシングシステムを制御し、前記光センシングシステムから受信された光を分析する、ライダー装置。 - 前記プロセッサは、
前記複数の発光素子が時間差を置いて発光されるように、前記光センシングシステムを制御することを特徴とする請求項14に記載のライダー装置。 - 前記プロセッサは、
前記複数の発光素子が同時に発光されるように、前記光センシングシステムを制御することを特徴とする請求項14に記載のライダー装置。 - 前記複数の発光素子は、
第1波長帯域の光を発光する第1発光素子と、
前記第1波長帯域と異なる第2波長帯域の光を発光する第2発光素子と、を含むことを特徴とする請求項14に記載のライダー装置。 - 前記プロセッサは、
前記第1発光素子と前記第2発光素子とが時間差を置いて発光するように、前記光センシングシステムを制御することを特徴とする請求項17に記載のライダー装置。
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KR1020170131654A KR102523975B1 (ko) | 2017-10-11 | 2017-10-11 | 광원 일체형 광 센싱 시스템 및 이를 포함하는 전자 기기 |
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KR102523975B1 (ko) * | 2017-10-11 | 2023-04-20 | 삼성전자주식회사 | 광원 일체형 광 센싱 시스템 및 이를 포함하는 전자 기기 |
US11047959B2 (en) * | 2018-02-15 | 2021-06-29 | Optilab, Llc | Apparatus and method for generating multiple-wavelength distributed continuous wave and pulse optical transmission signal |
CN117814752A (zh) * | 2018-11-27 | 2024-04-05 | 晶元光电股份有限公司 | 光学感测模块 |
KR102393225B1 (ko) * | 2020-11-16 | 2022-05-02 | 성균관대학교산학협력단 | 제어 회로 웨이퍼와 결합된 일체형 수발광 소자 및 제조 방법 |
CN114596790A (zh) * | 2020-12-02 | 2022-06-07 | 台湾爱司帝科技股份有限公司 | 用以制造显示模块的方法以及相关的全荧幕影像显示器 |
DE102021127038A1 (de) | 2021-10-19 | 2023-04-20 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | Detektorelement, lidar modul und verfahren zum betrieb eines lidar moduls |
KR102701389B1 (ko) * | 2022-05-30 | 2024-09-02 | 성균관대학교산학협력단 | 3차원 이미징용 수광 발광 소자 배치 |
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US10923615B2 (en) | 2021-02-16 |
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EP3470873A1 (en) | 2019-04-17 |
EP3470873B1 (en) | 2023-11-29 |
KR20190040832A (ko) | 2019-04-19 |
US20210167241A1 (en) | 2021-06-03 |
CN109659388B (zh) | 2023-09-12 |
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