JP2019011960A5 - - Google Patents

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Publication number
JP2019011960A5
JP2019011960A5 JP2017127044A JP2017127044A JP2019011960A5 JP 2019011960 A5 JP2019011960 A5 JP 2019011960A5 JP 2017127044 A JP2017127044 A JP 2017127044A JP 2017127044 A JP2017127044 A JP 2017127044A JP 2019011960 A5 JP2019011960 A5 JP 2019011960A5
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JP
Japan
Prior art keywords
image
electronic component
unit
hand
light
Prior art date
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Application number
JP2017127044A
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English (en)
Japanese (ja)
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JP6903270B2 (ja
JP2019011960A (ja
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Priority to JP2017127044A priority Critical patent/JP6903270B2/ja
Priority claimed from JP2017127044A external-priority patent/JP6903270B2/ja
Priority to TW107121832A priority patent/TWI673502B/zh
Priority to CN201810674961.9A priority patent/CN109212621A/zh
Priority to US16/021,545 priority patent/US10679334B2/en
Publication of JP2019011960A publication Critical patent/JP2019011960A/ja
Publication of JP2019011960A5 publication Critical patent/JP2019011960A5/ja
Application granted granted Critical
Publication of JP6903270B2 publication Critical patent/JP6903270B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2017127044A 2017-06-29 2017-06-29 電子部品搬送装置および電子部品検査装置 Expired - Fee Related JP6903270B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2017127044A JP6903270B2 (ja) 2017-06-29 2017-06-29 電子部品搬送装置および電子部品検査装置
TW107121832A TWI673502B (zh) 2017-06-29 2018-06-26 電子零件搬送裝置及電子零件檢查裝置
CN201810674961.9A CN109212621A (zh) 2017-06-29 2018-06-27 电子部件输送装置以及电子部件检查装置
US16/021,545 US10679334B2 (en) 2017-06-29 2018-06-28 Electronic component handler and electronic component tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2017127044A JP6903270B2 (ja) 2017-06-29 2017-06-29 電子部品搬送装置および電子部品検査装置

Publications (3)

Publication Number Publication Date
JP2019011960A JP2019011960A (ja) 2019-01-24
JP2019011960A5 true JP2019011960A5 (enExample) 2020-07-16
JP6903270B2 JP6903270B2 (ja) 2021-07-14

Family

ID=64734417

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2017127044A Expired - Fee Related JP6903270B2 (ja) 2017-06-29 2017-06-29 電子部品搬送装置および電子部品検査装置

Country Status (4)

Country Link
US (1) US10679334B2 (enExample)
JP (1) JP6903270B2 (enExample)
CN (1) CN109212621A (enExample)
TW (1) TWI673502B (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2019128289A (ja) * 2018-01-25 2019-08-01 セイコーエプソン株式会社 電子部品搬送装置および電子部品検査装置
JP7281981B2 (ja) * 2019-06-27 2023-05-26 東京エレクトロン株式会社 プローバおよびプローブカードのプリヒート方法
TWI808357B (zh) * 2020-11-19 2023-07-11 鏵友益科技股份有限公司 半導體元件的檢測方法
CN112786509B (zh) * 2021-01-26 2024-02-23 江苏优普纳科技有限公司 一种定位系统、定位方法及计算设备
CN114821526B (zh) * 2022-04-14 2024-11-15 重庆长安汽车股份有限公司 基于4d毫米波雷达点云的障碍物三维边框检测方法

Family Cites Families (20)

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US5394100A (en) * 1993-05-06 1995-02-28 Karl Suss America, Incorporated Probe system with automatic control of contact pressure and probe alignment
JP4399040B2 (ja) * 1998-06-17 2010-01-13 カシオ計算機株式会社 移動体像オフセット方法および撮像装置
JP3206658B2 (ja) 1999-02-23 2001-09-10 日本電気株式会社 半導体装置の製造方法
CA2451789C (en) 2001-06-29 2012-03-27 Meso Scale Technologies, Llc. Assay plates, reader systems and methods for luminescence test measurements
DE102004003615B4 (de) * 2004-01-25 2005-12-15 Man Roland Druckmaschinen Ag Vorrichtung und Verfahren zur Erfassung und Auswertung eines Bildes von einem vorbestimmten Ausschnitt eines Druckerzeugnisses
US20090136118A1 (en) 2005-04-11 2009-05-28 Advantest Corporation Electronic Device Handling Apparatus
US7921997B2 (en) 2007-03-19 2011-04-12 Burns James A Attachable device accessory case cover with interchangeable components
US8331726B2 (en) 2009-06-29 2012-12-11 International Business Machines Corporation Creating emission images of integrated circuits
CN102263926A (zh) 2010-05-31 2011-11-30 鸿富锦精密工业（深圳）有限公司 电子设备及其图像处理方法
TWM414656U (en) * 2011-05-20 2011-10-21 Hon Tech Inc Electronic component tester with image-taking device
JP5261540B2 (ja) * 2011-06-24 2013-08-14 シャープ株式会社 欠陥検査装置及び欠陥検査方法
JP2014196908A (ja) * 2013-03-29 2014-10-16 セイコーエプソン株式会社 ハンドラーおよび検査装置
KR101563165B1 (ko) * 2014-06-26 2015-10-26 주식회사 이오테크닉스 웨이퍼 다이들의 마킹방법
US9958383B2 (en) 2014-12-18 2018-05-01 Microsoft Technology Licensing, Llc. Range camera
EP3075702B1 (en) * 2015-03-31 2021-02-17 OSAI A.S. S.p.A. Testing method and unit for micro electromechanical systems
JP2017015482A (ja) * 2015-06-30 2017-01-19 セイコーエプソン株式会社 電子部品搬送装置および電子部品検査装置
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TWI669517B (zh) 2015-08-31 2019-08-21 日商幸福日本股份有限公司 IC test system
CN106829359A (zh) 2015-09-30 2017-06-13 精工爱普生株式会社 电子部件输送装置以及电子部件检查装置
CN109997049A (zh) * 2016-11-29 2019-07-09 精工爱普生株式会社 电子元件输送装置以及电子元件检查装置

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