|
US3960449A
(en)
*
|
1975-06-05 |
1976-06-01 |
The Board Of Trustees Of Leland Stanford Junior University |
Measurement of angular dependence of scattered light in a flowing stream
|
|
JPH01201135A
(ja)
*
|
1988-02-04 |
1989-08-14 |
Shimadzu Corp |
赤外線散乱トモグラフィ装置
|
|
US5900949A
(en)
*
|
1996-05-23 |
1999-05-04 |
Hewlett-Packard Company |
CCD imager for confocal scanning microscopy
|
|
JPH1183431A
(ja)
*
|
1997-09-09 |
1999-03-26 |
Nikon Corp |
撮像光学系の座標中心位置決定装置
|
|
US6248988B1
(en)
*
|
1998-05-05 |
2001-06-19 |
Kla-Tencor Corporation |
Conventional and confocal multi-spot scanning optical microscope
|
|
US7147161B2
(en)
*
|
1998-06-12 |
2006-12-12 |
Symbol Technologies, Inc. |
Digitizing bar code symbol data
|
|
US6328213B1
(en)
*
|
1998-06-12 |
2001-12-11 |
Symbol Technologies, Inc. |
Method of processing an analog electrical signal containing information representative of reflected light from coded indicia, wherein the electrical signal contains edge transitions
|
|
DE29913707U1
(de)
*
|
1998-08-27 |
1999-11-25 |
Evotec Biosystems Ag |
Konfokale optische Vorrichtung zur optischen Erfassung eines Beobachtungsvolumens
|
|
US6307635B1
(en)
*
|
1998-10-21 |
2001-10-23 |
The Regents Of The University Of California |
Phase-shifting point diffraction interferometer mask designs
|
|
US7209287B2
(en)
*
|
2000-09-18 |
2007-04-24 |
Vincent Lauer |
Confocal optical scanning device
|
|
SG118191A1
(en)
*
|
2003-06-27 |
2006-01-27 |
St Microelectronics Asia |
Method and system for contrast enhancement of digital video
|
|
JP4756819B2
(ja)
*
|
2003-10-21 |
2011-08-24 |
オリンパス株式会社 |
走査型顕微鏡システム
|
|
DE10350918B3
(de)
*
|
2003-10-31 |
2005-04-14 |
Evotec Technologies Gmbh |
Vorrichtung und Verfahren zur Messung der Transmission eines Objekts
|
|
EP1610088B1
(de)
*
|
2004-06-22 |
2007-01-03 |
Polytec GmbH |
Vorrichtung zum optischen Vermessen eines Objektes
|
|
US7115848B1
(en)
*
|
2004-09-29 |
2006-10-03 |
Qioptiq Imaging Solutions, Inc. |
Methods, systems and computer program products for calibration of microscopy imaging devices
|
|
WO2006058187A2
(en)
*
|
2004-11-23 |
2006-06-01 |
Robert Eric Betzig |
Optical lattice microscopy
|
|
DE102005020542A1
(de)
*
|
2005-05-03 |
2006-11-09 |
Carl Zeiss Jena Gmbh |
Einrichtung und Verfahren zur reproduzierbaren Einstellung der Pinholeöffnung und Pinholelage in Laserscanmikroskopen
|
|
DE102006007170B4
(de)
|
2006-02-08 |
2009-06-10 |
Sirona Dental Systems Gmbh |
Verfahren und Anordnung zur schnellen und robusten chromatisch konfokalen 3D-Messtechnik
|
|
US7460248B2
(en)
*
|
2006-05-15 |
2008-12-02 |
Carestream Health, Inc. |
Tissue imaging system
|
|
JP4288519B2
(ja)
*
|
2006-09-13 |
2009-07-01 |
セイコーエプソン株式会社 |
アライメント装置及びアライメント方法
|
|
TWI422962B
(zh)
*
|
2006-12-05 |
2014-01-11 |
Hoya Corp |
灰階光罩之檢查方法、液晶裝置製造用灰階光罩之製造方法以及圖案轉印方法
|
|
CN101543054B
(zh)
*
|
2007-06-28 |
2011-12-07 |
松下电器产业株式会社 |
图像处理装置、图像处理方法
|
|
FI20085062A0
(fi)
*
|
2008-01-25 |
2008-01-25 |
Wallac Oy |
Parannettu mittausjärjestelmä ja -menetelmä
|
|
EP2211343A1
(en)
*
|
2009-01-27 |
2010-07-28 |
Thomson Licensing |
High data density optical recording medium
|
|
US8218869B2
(en)
*
|
2009-03-29 |
2012-07-10 |
Mitsubishi Electric Research Laboratories, Inc. |
Image segmentation using spatial random walks
|
|
JP5544764B2
(ja)
*
|
2009-06-09 |
2014-07-09 |
ソニー株式会社 |
画像処理装置および方法、並びにプログラム
|
|
CN101710131B
(zh)
*
|
2009-12-01 |
2011-06-01 |
西安交通大学 |
离焦数字三维微流场荧光测试仪
|
|
JP5914341B2
(ja)
*
|
2010-09-21 |
2016-05-11 |
オリンパス株式会社 |
単一発光粒子検出を用いた光分析方法
|
|
US8559008B2
(en)
*
|
2011-04-07 |
2013-10-15 |
Nanometrics Incorporated |
Ellipsometer focusing system
|
|
DE102011114500B4
(de)
*
|
2011-09-29 |
2022-05-05 |
Fei Company |
Mikroskopvorrichtung
|
|
US8908913B2
(en)
*
|
2011-12-19 |
2014-12-09 |
Mitsubishi Electric Research Laboratories, Inc. |
Voting-based pose estimation for 3D sensors
|
|
WO2013126762A1
(en)
*
|
2012-02-23 |
2013-08-29 |
The United States Of America, As Represented By The Secretary, Department Of Health And Human Services Office Of Technology Transfer, National Institutes Of Health |
Multi-focal structured illumination microscopy systems and methods
|
|
EP2966492B1
(en)
*
|
2012-05-02 |
2020-10-21 |
Centre National De La Recherche Scientifique |
Method and apparatus for single-particle localization using wavelet analysis
|
|
DE102012009836A1
(de)
|
2012-05-16 |
2013-11-21 |
Carl Zeiss Microscopy Gmbh |
Lichtmikroskop und Verfahren zur Bildaufnahme mit einem Lichtmikroskop
|
|
US9183631B2
(en)
*
|
2012-06-29 |
2015-11-10 |
Mitsubishi Electric Research Laboratories, Inc. |
Method for registering points and planes of 3D data in multiple coordinate systems
|
|
US10073045B2
(en)
*
|
2012-07-24 |
2018-09-11 |
Nova Measuring Instruments Ltd. |
Optical method and system for measuring isolated features of a structure
|
|
DE102012217967A1
(de)
*
|
2012-10-01 |
2014-04-03 |
Carl Zeiss Microscopy Gmbh |
Konfokales Mikroskop mit frei einstellbarer Probenabtastung
|
|
US9830865B2
(en)
*
|
2013-04-04 |
2017-11-28 |
Nvidia Corporation |
Regional histogramming for global approximation
|
|
KR101716928B1
(ko)
*
|
2013-08-22 |
2017-03-15 |
주식회사 만도 |
차량 카메라의 영상 처리 방법 및 이를 이용하는 영상 처리 장치
|
|
GB201318598D0
(en)
*
|
2013-10-21 |
2013-12-04 |
Univ Leicester |
Improvements in or relating to super-resolution microscopy
|
|
JP2015084062A
(ja)
*
|
2013-10-25 |
2015-04-30 |
株式会社キーエンス |
顕微鏡撮像装置、顕微鏡撮像方法および顕微鏡撮像プログラム
|
|
CN104597590B
(zh)
*
|
2014-12-30 |
2018-02-02 |
深圳先进技术研究院 |
一种超分辨荧光光谱成像显微镜
|