CN107667310B - 荧光成像系统 - Google Patents

荧光成像系统 Download PDF

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Publication number
CN107667310B
CN107667310B CN201680032373.4A CN201680032373A CN107667310B CN 107667310 B CN107667310 B CN 107667310B CN 201680032373 A CN201680032373 A CN 201680032373A CN 107667310 B CN107667310 B CN 107667310B
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data
image
sample
pinhole
processing module
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Chinese (zh)
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CN107667310A (zh
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S·莱特勒
P·博伊斯克腾
A·甘德森
L·莱斯特姆
C·格内穆
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Life Technologies Corp
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Life Technologies Corp
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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458—Fluorescence microscopy
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0036—Scanning details, e.g. scanning stages
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0036—Scanning details, e.g. scanning stages
    • G02B21/0044—Scanning details, e.g. scanning stages moving apertures, e.g. Nipkow disks, rotating lens arrays

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
CN201680032373.4A 2015-06-02 2016-05-10 荧光成像系统 Active CN107667310B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201562169675P 2015-06-02 2015-06-02
US62/169,675 2015-06-02
PCT/US2016/031570 WO2016195927A1 (en) 2015-06-02 2016-05-10 Systems and methods for calibrating a structured illumination imaging system and for capturing a structured illumination image

Publications (2)

Publication Number Publication Date
CN107667310A CN107667310A (zh) 2018-02-06
CN107667310B true CN107667310B (zh) 2021-01-01

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US (1) US10782514B2 (enExample)
EP (2) EP3304166B1 (enExample)
JP (1) JP7195738B2 (enExample)
CN (1) CN107667310B (enExample)
WO (1) WO2016195927A1 (enExample)

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CN108827920B (zh) * 2018-03-21 2022-05-27 苏州国科医工科技发展(集团)有限公司 一种低荧光漂白共聚焦成像方法及系统
EP3644044B1 (en) * 2018-10-24 2020-12-23 Leica Biosystems Imaging, Inc. Camera exposure control when acquiring fluorescence in situ hybridization images
US11492140B2 (en) * 2021-03-25 2022-11-08 Rockwell Collins, Inc. Camera monitor using close proximity precision injection of light

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CN104285175A (zh) * 2012-05-02 2015-01-14 法国国家科学研究中心 使用小波分析进行单颗粒定位的方法和装置
JP2015084062A (ja) * 2013-10-25 2015-04-30 株式会社キーエンス 顕微鏡撮像装置、顕微鏡撮像方法および顕微鏡撮像プログラム
CN104597590A (zh) * 2014-12-30 2015-05-06 深圳先进技术研究院 一种超分辨荧光光谱成像显微镜

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CN101201537A (zh) * 2006-12-05 2008-06-18 Hoya株式会社 灰色调掩模的检查装置及制造方法、图案转印方法
CN101543054A (zh) * 2007-06-28 2009-09-23 松下电器产业株式会社 图像处理装置、图像处理方法及程序
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Also Published As

Publication number Publication date
US20180157022A1 (en) 2018-06-07
EP3304166B1 (en) 2019-06-26
WO2016195927A1 (en) 2016-12-08
EP3620838A1 (en) 2020-03-11
JP7195738B2 (ja) 2022-12-26
CN107667310A (zh) 2018-02-06
EP3304166A1 (en) 2018-04-11
JP2018523154A (ja) 2018-08-16
US10782514B2 (en) 2020-09-22

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