JP2018514909A5 - - Google Patents

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Publication number
JP2018514909A5
JP2018514909A5 JP2017552078A JP2017552078A JP2018514909A5 JP 2018514909 A5 JP2018514909 A5 JP 2018514909A5 JP 2017552078 A JP2017552078 A JP 2017552078A JP 2017552078 A JP2017552078 A JP 2017552078A JP 2018514909 A5 JP2018514909 A5 JP 2018514909A5
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JP
Japan
Prior art keywords
electron
ion source
ions
ion
monochromator
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JP2017552078A
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English (en)
Japanese (ja)
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JP6550468B2 (ja
JP2018514909A (ja
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Priority claimed from PCT/US2016/024757 external-priority patent/WO2016160835A1/en
Publication of JP2018514909A publication Critical patent/JP2018514909A/ja
Publication of JP2018514909A5 publication Critical patent/JP2018514909A5/ja
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JP2017552078A 2015-03-29 2016-03-29 正及び負の同時イオン化による分析物の質量分析のための装置 Active JP6550468B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201562139758P 2015-03-29 2015-03-29
US62/139,758 2015-03-29
PCT/US2016/024757 WO2016160835A1 (en) 2015-03-29 2016-03-29 Apparatus for mass analysis of analytes by simultaneous positive and negative ionization

Publications (3)

Publication Number Publication Date
JP2018514909A JP2018514909A (ja) 2018-06-07
JP2018514909A5 true JP2018514909A5 (cg-RX-API-DMAC7.html) 2019-05-09
JP6550468B2 JP6550468B2 (ja) 2019-07-24

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JP2017552078A Active JP6550468B2 (ja) 2015-03-29 2016-03-29 正及び負の同時イオン化による分析物の質量分析のための装置

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US (2) US10153150B2 (cg-RX-API-DMAC7.html)
JP (1) JP6550468B2 (cg-RX-API-DMAC7.html)
DE (1) DE112016001458T5 (cg-RX-API-DMAC7.html)
GB (1) GB2552615B (cg-RX-API-DMAC7.html)
WO (1) WO2016160835A1 (cg-RX-API-DMAC7.html)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6550468B2 (ja) * 2015-03-29 2019-07-24 メリディオン エルエルシーＭｅｒｉｄｉｏｎ， Ｌｌｃ 正及び負の同時イオン化による分析物の質量分析のための装置
US10670561B2 (en) * 2018-07-20 2020-06-02 Battelle Memorial Institute Device and system for selective ionization and analyte detection and method of using the same
US11043370B2 (en) 2018-07-20 2021-06-22 Battelle Memorial Institute Device and system for selective ionization and analyte detection and method of using the same
JP6943897B2 (ja) * 2019-01-18 2021-10-06 日本電子株式会社 マススペクトル処理装置及び方法
US20210175063A1 (en) 2019-12-10 2021-06-10 Thermo Finnigan Llc Axial ci source - off-axis electron beam
CN117147673B (zh) * 2023-10-24 2024-01-26 广州源古纪科技有限公司 一种呼气质谱检测方法、系统及设备

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4933551A (en) * 1989-06-05 1990-06-12 The United State Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Reversal electron attachment ionizer for detection of trace species
US5340983A (en) * 1992-05-18 1994-08-23 The State Of Oregon Acting By And Through The State Board Of Higher Education On Behalf Of Oregon State University Method and apparatus for mass analysis using slow monochromatic electrons
JP4186889B2 (ja) * 1999-04-15 2008-11-26 株式会社日立製作所 質量分析装置
US6919562B1 (en) * 2002-05-31 2005-07-19 Analytica Of Branford, Inc. Fragmentation methods for mass spectrometry
AU2003237345A1 (en) * 2002-06-03 2003-12-19 The State Of Oregon Acting By And Through The State Board Of Higher Education Onbehalf Of Oregonof Mass spectrometer
CA2525978C (en) * 2003-05-30 2011-07-19 Purdue Research Foundation Process for increasing ionic charge in mass spectrometry
US7576324B2 (en) * 2003-09-05 2009-08-18 Griffin Analytical Technologies, L.L.C. Ion detection methods, mass spectrometry analysis methods, and mass spectrometry instrument circuitry
GB201104225D0 (en) 2011-03-14 2011-04-27 Micromass Ltd Pre scan for mass to charge ratio range
JP6550468B2 (ja) * 2015-03-29 2019-07-24 メリディオン エルエルシーＭｅｒｉｄｉｏｎ， Ｌｌｃ 正及び負の同時イオン化による分析物の質量分析のための装置

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