JP2018204283A - Demolition method of pcb treatment facilities - Google Patents

Demolition method of pcb treatment facilities Download PDF

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JP2018204283A
JP2018204283A JP2017110026A JP2017110026A JP2018204283A JP 2018204283 A JP2018204283 A JP 2018204283A JP 2017110026 A JP2017110026 A JP 2017110026A JP 2017110026 A JP2017110026 A JP 2017110026A JP 2018204283 A JP2018204283 A JP 2018204283A
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area
pcb
pressure
opening
management area
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JP6993110B2 (en
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加藤 治
Osamu Kato
治 加藤
清水 由章
Yoshiaki Shimizu
由章 清水
英明 浮氣
Hideaki Uwaki
英明 浮氣
西村 裕太
Hirota Nishimura
裕太 西村
松本 忠雄
Tadao Matsumoto
忠雄 松本
晃仁 ▲高▼橋
晃仁 ▲高▼橋
Akihito Takahashi
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Shinko Pantec Co Ltd
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Kobelco Eco Solutions Co Ltd
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Abstract

To provide a demolition method of PCB treatment facilities capable of securely performing demolition in a controlled area without causing PCB to flow out.SOLUTION: The present invention relates to a demolition method for PCB treatment facilities X having a first area L3 contaminated with PCB, and a second area L2 partitioned off with walls or a ceiling WL from the first area L3 and having higher PCB concentration than the first area L3. The demolition method comprises: a first pressure adjusting step of adjusting pressure to first pressure while supplying and discharging air to and from the first area L3; a second pressure adjusting step of adjusting pressure to second pressure higher than the first pressure while supplying and discharging air to and from the second area L2; and a boring step of boring the walls or the ceiling WL so as to form opening parts 20 equal to or smaller than a predetermined area one after another.SELECTED DRAWING: Figure 2

Description

本発明は、PCB処理施設を解体する方法に関する。   The present invention relates to a method for dismantling a PCB processing facility.

不燃性の絶縁体であるPCB(ポリ塩化ビフェニル)は人体に有害であることから、「ポリ塩化ビフェニル廃棄物の適正な処理の推進に関する特別措置法」第6条に基づく「ポリ塩化ビフェニル廃棄物処理基本計画」に定められた法定期間内に無害化処理することが規定されている。このPCBで汚染されたPCB汚染物は、PCB処理施設の汚染レベル3に位置付けられた管理区域(グローブボックス)にて分別,解体されて所定の容器に詰替えられた後、該容器をプラズマ溶融炉に投入したり、洗浄処理によりPCB濃度を低下させたりして無害化処理が実行される。日本に存在するPCB汚染物全ての無害化処理を終えた後はPCB処理施設を解体することとなるが、PCB処理施設の管理区域等はPCBで汚染されているため、PCB処理施設の解体には慎重を期す必要がある。   PCB (polychlorinated biphenyl), which is a non-flammable insulator, is harmful to the human body. Therefore, “Polychlorinated biphenyl waste” based on Article 6 of the “Special Measures Law for Promotion of Proper Treatment of Polychlorinated Biphenyl Waste” It is stipulated that the detoxification process be performed within the legal period defined in the “Processing Basic Plan”. The PCB contaminated with this PCB is separated and dismantled in a control area (glove box) located at the contamination level 3 of the PCB processing facility and is refilled into a predetermined container, and then the container is plasma-melted. The detoxification process is performed by putting it into a furnace or reducing the PCB concentration by a cleaning process. After detoxification of all PCB contaminants present in Japan, the PCB processing facility will be dismantled. However, because the PCB processing facility management area is contaminated with PCB, the PCB processing facility will be dismantled. Need to be careful.

特許文献1には、PCBを外部に流出させないためのPCB処理施設の解体方法が開示されている。この特許文献1の発明は、PCB処理施設をグリーンハウスで覆い、グリーンハウスとPCB処理施設との間の空間を負圧に維持した状態で、PCB処理施設の外壁の内面(発泡コンクリート)に付着したPCB汚染層を平ノミ状のカッターで剥ぎ取るものである。これによって、PCB処理施設の解体に伴うPCB汚染物の減容化を図ると記載されている。   Patent Document 1 discloses a method for disassembling a PCB processing facility for preventing PCBs from flowing out. The invention of Patent Document 1 covers the PCB processing facility with a green house, and adheres to the inner surface (foamed concrete) of the outer wall of the PCB processing facility in a state where the space between the green house and the PCB processing facility is maintained at a negative pressure. The PCB contamination layer is peeled off with a flat chisel cutter. According to this, it is described that the volume of PCB contaminants accompanying the dismantling of the PCB processing facility will be reduced.

特開2011−021406号公報JP 2011-021406 A

ところで、PCB処理施設は、PCB汚染物を分別,解体するための汚染レベル3の管理区域、汚染レベル3よりもPCB濃度の低い汚染レベル1〜2の管理区域、および非管理区域等で構成されている。特許文献1のPCB処理施設の解体方法は、汚染レベル1〜2の管理区域又は非管理区域に隣接する外壁に付着したPCBを除去する技術であり、各管理区域の間を隔てる内壁や外壁自体の解体については考慮されていない。   By the way, the PCB processing facility is composed of a pollution level 3 management area for separating and disassembling PCB contaminants, a pollution level 1-2 management area having a PCB concentration lower than the pollution level 3, and a non-management area. ing. The method for dismantling a PCB processing facility in Patent Document 1 is a technique for removing PCBs attached to an outer wall adjacent to a management area or a non-management area having a contamination level of 1 to 2, and the inner wall or the outer wall itself separating each management area. The dismantling of is not considered.

また、管理区域の内壁は外壁と異なり金属パネルを組み合わせて構成されている場合もあり、PCB汚染物を平ノミ状のカッターで剥ぎ取ることが困難である。一方、金属パネル表面を洗浄液で洗浄すればPCB濃度をある程度低下させることができるが、金属パネル間の目地やビス部に高濃度のPCBが付着しているため、解体対象のPCB処理施設から搬出して、外部のPCB処理施設で無害化処理が可能なレベルまでPCB濃度を低下させることが極めて難しい。   In addition, the inner wall of the management area may be configured by combining metal panels, unlike the outer wall, and it is difficult to remove PCB contaminants with a flat chiseled cutter. On the other hand, the PCB concentration can be reduced to some extent by cleaning the surface of the metal panel with a cleaning solution. However, since high-concentration PCB adheres to the joints and screw parts between the metal panels, the PCB is removed from the PCB processing facility to be dismantled. Thus, it is extremely difficult to reduce the PCB concentration to a level that allows detoxification processing at an external PCB processing facility.

そこで、PCBを外部に流出させること無く管理区域を確実に解体できるPCB処理施設の解体方法が望まれている。   Therefore, there is a demand for a method for dismantling a PCB processing facility that can surely dismantle a management area without causing PCBs to flow out.

PCB処理施設の解体方法は、PCBで汚染された第一区域と、当該第一区域と壁又は天井で隔てられており、前記第一区域よりもPCB濃度の低い第二区域とを有するPCB処理施設を解体する方法であって、前記第一区域の空気を給排気しながら第一圧力に調節する第一圧力調節工程と、前記第二区域の空気を給排気しながら前記第一圧力よりも高い第二圧力に調節する第二圧力調節工程と、前記壁又は天井を穿孔することにより所定面積以下の開口部を順次形成する穿孔工程と、を備えた点にある。   A method for disassembling a PCB processing facility includes: a PCB process having a first area contaminated with PCB; and a second area separated from the first area by a wall or ceiling and having a lower PCB concentration than the first area. A method of dismantling a facility, wherein a first pressure adjusting step of adjusting air to supply a first pressure while supplying and exhausting air in the first area; A second pressure adjusting step for adjusting to a high second pressure and a perforating step for sequentially forming openings having a predetermined area or less by perforating the wall or ceiling.

上述したように、第一区域と第二区域とを区画する壁又は天井には、洗浄処理でPCBを除去することが困難な目地やビス部等のPCB濃度の高い部位が存在している。そこで、本方法では、穿孔工程により壁又は天井に開口部を形成しているので、PCB濃度の高い部位を除去して第一区域のPCB濃度を低下させることができる。   As described above, on the wall or ceiling that divides the first area and the second area, there are parts having a high PCB concentration such as joints and screw parts where it is difficult to remove the PCB by the cleaning process. Therefore, in this method, since the opening is formed in the wall or ceiling by the perforation process, the PCB concentration in the first area can be lowered by removing a portion having a high PCB concentration.

また、本方法では、第一区域の第一圧力を第二区域の第二圧力よりも低く設定した状態で、両区域を区画する壁又は天井に開口部を形成することとしている。その結果、第二区域から第一区域への空気の流れが発生するので、開口部を形成する際に第一区域の高濃度PCBが第二区域に流出するといった不都合を防止することができる。その後、開口部を閉塞していたPCB濃度の高い部位を順次除去すれば、第一区域全体のPCB濃度が低下し、第一区域を安全に解体することができる。   Moreover, in this method, it is supposed that an opening part is formed in the wall or ceiling which divides both areas in the state which set the 1st pressure of the 1st area lower than the 2nd pressure of the 2nd area. As a result, an air flow from the second area to the first area is generated, so that inconveniences such as high concentration PCB in the first area flowing out to the second area when the opening is formed can be prevented. Then, if the part with high PCB density | concentration which obstruct | occluded the opening part is removed sequentially, the PCB density | concentration of the whole 1st area will fall, and a 1st area can be disassembled safely.

一方、開口部を形成することによって第一区域と第二区域とが同圧になり、第一区域の高濃度PCBが第二区域に流出するおそれがある。しかしながら、本方法の開口部は所定面積以下で構成されているので、第一区域の圧力上昇が抑制されて第一区域と第二区域とが同圧になり難く、高濃度PCBを第一区域内に確実に閉じ込めることができる。   On the other hand, by forming the opening, the first area and the second area have the same pressure, and the high-concentration PCB in the first area may flow out to the second area. However, since the opening of the present method is configured to have a predetermined area or less, the pressure increase in the first area is suppressed, and the first area and the second area are unlikely to have the same pressure. It can be surely confined inside.

このように、PCBを外部に流出させること無く管理区域を確実に解体できるPCB処理施設の解体方法を提供できた。   In this way, a method for dismantling a PCB processing facility that can surely dismantle a management area without causing PCBs to flow out can be provided.

他の方法として、前記穿孔工程は、前記開口部をPCBで汚染されていない塞ぎ部材で閉塞した後に、新たな前記開口部を形成する点にある。   As another method, the perforating step is to form a new opening after closing the opening with a blocking member not contaminated with PCB.

本方法のように、PCB濃度の高い部位を除去して形成された開口部を、PCBで汚染されていない塞ぎ部材で閉塞すれば、第一区域のPCB濃度を低下させることができる。これを繰り返すことで、第一区域全体のPCB濃度が低下するので、第一区域の壁又は天井を解体対象のPCB処理施設から搬出した後に外部のPCB処理施設で無害化処理することができる。   If the opening formed by removing a portion having a high PCB concentration is closed with a blocking member that is not contaminated with PCB as in this method, the PCB concentration in the first area can be reduced. By repeating this, the PCB concentration in the entire first area decreases, so that the wall or ceiling of the first area can be detoxified in the external PCB processing facility after being removed from the PCB processing facility to be dismantled.

他の方法として、前記穿孔工程は、前記第二区域の側から前記開口部を穿孔する点にある。   As another method, the perforating step is to perforate the opening from the second area side.

本方法のように、相対的に圧力の高い第二区域側から開口部を穿孔すれば、開口部を閉塞していたPCB濃度の高い部位が第一区域に落下することとなる。その結果、第一区域の高濃度PCBが第二区域に流出することを防止することができる。   If the opening is perforated from the second area side where the pressure is relatively high as in the present method, the portion having a high PCB concentration that has blocked the opening falls to the first area. As a result, it is possible to prevent the high concentration PCB in the first area from flowing into the second area.

他の方法として、前記穿孔工程は、前記第一区域のPCB濃度に基づいて前記開口部の開口面積を設定する点にある。   As another method, the drilling step is to set an opening area of the opening based on a PCB concentration in the first area.

本方法のように、第一区域のPCB濃度に基づいて開口部の開口面積を設定すれば、例えば第一区域のPCB濃度が高い場合に開口面積を小さくすることが可能となる。その結果、第二区域から第一区域に向かう空気の流速を高めて、第一区域の高濃度PCBの流出を確実に防止することができる。   If the opening area of the opening is set based on the PCB concentration in the first area as in the present method, for example, when the PCB concentration in the first area is high, the opening area can be reduced. As a result, the flow rate of air from the second area toward the first area can be increased, and the outflow of the high-concentration PCB in the first area can be reliably prevented.

他の方法は、前記穿孔工程は、前記第一区域からの空気の排気量に基づいて前記開口部の開口面積を設定する点にある。   Another method is that the perforating step sets an opening area of the opening based on an exhaust amount of air from the first area.

本方法のように、第一区域からの空気の排気量に基づいて開口部の開口面積を設定すれば、例えば第一区域からの空気の排気量が小さい場合に開口面積を小さくすることが可能となる。その結果、第一区域と第二区域との差圧が小さい場合でも、第二区域から第一区域に向かう空気の流速を確保して、第一区域に存在する高濃度PCBの第二区域への流出を確実に防止することができる。   If the opening area of the opening is set based on the amount of air exhausted from the first area as in this method, the opening area can be reduced when the amount of air exhausted from the first area is small, for example. It becomes. As a result, even when the differential pressure between the first zone and the second zone is small, the flow rate of air from the second zone to the first zone is secured, and the high concentration PCB existing in the first zone is moved to the second zone. Can be reliably prevented.

他の方法は、前記第一圧力調節工程は、排気量を所定値に維持した状態で給気量を変更して前記第一圧力に維持する点にある。   Another method is that the first pressure adjusting step changes the air supply amount while maintaining the exhaust amount at a predetermined value to maintain the first pressure.

第一区域からの排気にはPCBが含まれており、例えば活性炭槽などで無害化処理する必要がある。このため、第一区域の負圧を作り出すために排気量を増大させると、活性炭槽の処理能力を超過してしまうおそれがある。しかしながら、本方法であれば、排気量を変更せずに給気量を小さくすることで第一区域の負圧を作り出すことが可能となる。その結果、第一区域の負圧を維持しながら、PCBを含む排気を確実に無害化処理することができる。   The exhaust gas from the first zone contains PCB and needs to be detoxified in an activated carbon tank, for example. For this reason, if the displacement is increased in order to create the negative pressure in the first zone, the processing capacity of the activated carbon tank may be exceeded. However, with this method, it is possible to create a negative pressure in the first zone by reducing the air supply amount without changing the exhaust amount. As a result, the exhaust gas containing PCB can be reliably detoxified while maintaining the negative pressure in the first zone.

PCB処理施設の管理区域を示す概略側面図である。It is a schematic side view which shows the management area of a PCB processing facility. 第一実施形態に係る管理区域の内壁を穿孔する説明図である。It is explanatory drawing which pierces the inner wall of the management area which concerns on 1st embodiment. 第二実施形態に係る外壁を穿孔する説明図である。It is explanatory drawing which pierces the outer wall which concerns on 2nd embodiment. PCB処理施設を解体するフロー図である。It is a flowchart which disassembles a PCB processing facility. 穿孔作業の説明図である。It is explanatory drawing of a drilling operation | work.

以下に、本発明に係るPCB処理施設の解体方法の実施形態について、図面に基づいて説明する。本実施形態では、PCB処理施設Xの解体方法の一例として、PCBで汚染された管理区域Lの内壁WL(壁や天井の一例)又は外壁WO(壁の一例)を解体する場合として説明する。ただし、以下の実施形態に限定されることなく、その要旨を逸脱しない範囲内で種々の変形が可能である。   Hereinafter, an embodiment of a PCB processing facility dismantling method according to the present invention will be described with reference to the drawings. In the present embodiment, as an example of a method of dismantling the PCB processing facility X, a case will be described in which an inner wall WL (an example of a wall or a ceiling) or an outer wall WO (an example of a wall) of a management area L contaminated with PCB is disassembled. However, the present invention is not limited to the following embodiments, and various modifications can be made without departing from the scope of the invention.

図1に示すように、PCB処理施設Xは、PCBの汚染レベルが定められた管理区域LおよびPCBを取り扱わない非管理区域L0と、を備えている。また、PCB処理施設Xは、不図示の洗浄設備、プラズマ溶融炉や活性炭槽等を備えている。   As shown in FIG. 1, the PCB processing facility X includes a management area L in which a PCB contamination level is set and a non-management area L0 in which no PCB is handled. Further, the PCB processing facility X includes a cleaning facility (not shown), a plasma melting furnace, an activated carbon tank, and the like.

管理区域Lは、PCB汚染レベル3である高濃度管理区域L3と、PCB汚染レベル2の中濃度管理区域L2と、PCB汚染レベル1の低濃度管理区域L1とで構成されている。PCB汚染レベル3の高濃度管理区域L3とは、通常操業下でPCBによる作業環境の汚染の可能性があるため、レベルの高い管理が必要な区域である。PCB汚染レベル2の中濃度管理区域L2とは、通常操業下ではPCBによる作業環境の汚染は無いが、工程内の作業で間接的に高濃度のPCBを取扱う(又はPCBがほとんど除去された対象物を作業環境中で取扱う)ため、相応の管理が必要な区域である。PCB汚染レベル1の低濃度管理区域L1とは、工程内のPCBは設備内に密閉されているため、通常操業下ではPCBによる作業環境の汚染は無く、最小限の管理で対応できる区域である。   The management area L includes a high concentration management area L3 having a PCB contamination level 3, a medium concentration management area L2 having a PCB contamination level 2, and a low concentration management area L1 having a PCB contamination level 1. The high concentration management area L3 of PCB contamination level 3 is an area that requires high level management because there is a possibility of contamination of the work environment by PCB under normal operation. The medium concentration control area L2 of the PCB contamination level 2 is a target in which the PCB is not contaminated by the work environment under normal operation, but the PCB in the process is indirectly handled (or the PCB is almost removed). This is an area that requires appropriate management in order to handle items in the work environment. The PCB contamination level 1 low concentration control area L1 is an area where PCB in the process is sealed in the equipment, so that there is no contamination of the work environment by PCB under normal operation, and can be handled with minimum management. .

高濃度管理区域L3では、PCB汚染物を種類ごとに分別した上で、グローブボックス内で電気機器等を解体して、例えば洗浄かご、ドラム缶やぺール缶で構成される容器(不図示)に詰替える。そして、この容器を洗浄設備やプラズマ溶融炉に投入して、PCB汚染物を無害化する。なお、PCB汚染物は、電気機器(安定器、トランス、コンデンサ等)、運転廃棄物(作業服、ゴム手袋、ウエス等)、感圧複写紙、汚泥、絶縁油などで構成されている。   In the high-concentration management area L3, after separating the PCB contaminants by type, the electrical equipment is disassembled in the glove box, for example, into a container (not shown) composed of a washing basket, a drum can or a pail can. Refill. Then, this container is put into a cleaning facility or a plasma melting furnace to make PCB contaminants harmless. PCB contaminants are composed of electrical equipment (stabilizers, transformers, capacitors, etc.), operating waste (work clothes, rubber gloves, wastes, etc.), pressure-sensitive copying paper, sludge, insulating oil, and the like.

中濃度管理区域L2は、グローブボックス(内側は高濃度管理区域L3)の外側や、PCBを含んだ空気や液体が流通する配管やPCB濃度の低い機器等が配置されている。低濃度管理区域L1では、PCBを含む液体を内封する密閉機器や配管等が配置されている。非管理区域L0は、屋根裏や管理区域Lと外壁WOとの間の空間などで構成されている。   In the middle concentration management area L2, the outside of the glove box (inside, the high concentration management area L3), piping through which air and liquid containing PCB circulate, equipment with low PCB concentration, and the like are arranged. In the low concentration management area L1, a sealing device, piping, or the like that encloses a liquid containing PCB is disposed. The non-management area L0 includes an attic or a space between the management area L and the outer wall WO.

非管理区域L0と低濃度管理区域L1と中濃度管理区域L2と高濃度管理区域L3とは、夫々内壁WLで区画されており、非管理区域L0と外部とは外壁WOで区画されている。なお、低濃度管理区域L1や中濃度管理区域L2と外部とが外壁WOで区画されていることもあるが、本実施形態では非管理区域L0と外部とが外壁WOで区画されて場合について説明する。   The non-management area L0, the low concentration management area L1, the medium concentration management area L2, and the high concentration management area L3 are each partitioned by the inner wall WL, and the non-management area L0 and the outside are partitioned by the outer wall WO. In addition, although the low concentration management area L1 and the medium concentration management area L2 and the outside may be partitioned by the outer wall WO, in this embodiment, the case where the non-management area L0 and the outside are partitioned by the outer wall WO will be described. To do.

夫々の非管理区域L0や管理区域L1,L2,L3を区画する壁や天井といった内壁WLは、建材ボード、軽量発泡コンクリート(ALC)、ウレタン層を一対の鉄板で挟み込んだ状態で角部がビス止めされた複数のサンドイッチパネル等の壁材や天井材で構成されている。夫々の壁材や天井材の接合部にはパッキンやシール材などの目地材が充填されており、複数の壁材および天井材が一体化されて内壁WLが形成されている。壁材や天井材の表面は、洗浄することによってPCB処理施設Xから搬出して外部のPCB処理施設で無害化処理可能なレベルまでPCB濃度を低下させることが可能な部分もあるが、接合部の目地やビス部等は、洗浄によってPCB濃度を低下させることが困難である。このため、詳細は後述するが、本実施形態では内壁WLのうちビス部や目地の存在する部位を穿孔して開口部20を形成することとしている。   The inner walls WL, such as the walls and ceilings that define each non-management area L0 and the management areas L1, L2, and L3, have corners that are screwed with a building material board, lightweight foam concrete (ALC), and a urethane layer sandwiched between a pair of iron plates. It consists of wall materials and ceiling materials such as a plurality of sandwich panels that are stopped. Joint portions of the respective wall materials and ceiling materials are filled with joint materials such as packing and sealing materials, and the plurality of wall materials and ceiling materials are integrated to form an inner wall WL. The surface of the wall material and ceiling material can be removed from the PCB processing facility X by washing and the PCB concentration can be lowered to a level at which it can be rendered harmless at the external PCB processing facility. It is difficult to reduce the PCB concentration of the joints, screw parts, and the like by washing. For this reason, although details will be described later, in the present embodiment, the opening 20 is formed by drilling a part where a screw part or joint exists in the inner wall WL.

外壁WOは、特開2011−021406号公報に開示されているように、鉄筋が埋設された複数の軽量発泡コンクリート(ALC)パネルを組付けて構成されている。この軽量発泡コンクリートにはPCBが浸み込んでいるおそれがあり、切削工具で剥ぎ取るだけでは完全に除去できない。このため、詳細は後述するが、本実施形態では外壁WOを穿孔して開口部20を形成することとしている。   As disclosed in JP 2011-021406 A, the outer wall WO is configured by assembling a plurality of lightweight foamed concrete (ALC) panels in which reinforcing bars are embedded. There is a possibility that PCB is infiltrated into this lightweight foamed concrete, and it cannot be completely removed only by peeling off with a cutting tool. For this reason, although details will be described later, in this embodiment, the opening 20 is formed by perforating the outer wall WO.

非管理区域L0は、ダンパ等で構成されるバルブV0を有する換気口10によって外部と連通している。夫々の管理区域L1,L2,L3には、不図示の給気ファンによって空気が供給される給気路11a,12a,13aが接続されており、不図示の排気ファンによって空気が排出される排気路11b,12b,13bが接続されている。給気路11a,12a,13aは外部と連通しており、給気ファンによって外気を管理区域L1,L2,L3に取り込むように構成されている。排気路11b,12b,13bは、活性炭槽等の排気処理設備と連通しており、排気ファンによってPCBを含む空気が排気処理設備に送られて浄化されるように構成されている。なお、給気ファンは、夫々の給気路11a,12a,13aごとに個別のポンプとしても良いし、PCB汚染レベルの等しい複数の管理区域L1,L2,L3に連通する給気路11a,12a,13aに共通のポンプとしても良い。同様に、排気ファンは、夫々の排気路11b,12b,13bごとに個別のポンプとしても良いし、PCB汚染レベルの等しい複数の管理区域L1,L2,L3に連通する排気路11b,12b,13bに共通のポンプとしても良い。   The non-management area L0 communicates with the outside through a ventilation port 10 having a valve V0 composed of a damper or the like. Air supply passages 11a, 12a, and 13a to which air is supplied by an air supply fan (not shown) are connected to the respective management areas L1, L2, and L3, and exhaust air from which air is discharged by an exhaust fan (not shown). The paths 11b, 12b, and 13b are connected. The air supply passages 11a, 12a, and 13a communicate with the outside, and are configured to take outside air into the management areas L1, L2, and L3 by an air supply fan. The exhaust passages 11b, 12b, and 13b communicate with an exhaust treatment facility such as an activated carbon tank, and are configured such that air containing PCB is sent to the exhaust treatment facility and purified by an exhaust fan. The air supply fan may be an individual pump for each of the air supply paths 11a, 12a, 13a, or the air supply paths 11a, 12a communicating with the plurality of management areas L1, L2, L3 having the same PCB contamination level. , 13a may be a common pump. Similarly, the exhaust fan may be an individual pump for each of the exhaust passages 11b, 12b, and 13b, or the exhaust passages 11b, 12b, and 13b communicating with the plurality of management areas L1, L2, and L3 having the same PCB contamination level. It may be a common pump.

低濃度管理区域L1の給気路11aには、ダンパ等で構成される第一給気バルブV1aが設けられており、低濃度管理区域L1の排気路11bには、ダンパ等で構成される第一排気バルブV1bが設けられている。中濃度管理区域L2の給気路12aには、ダンパ等で構成される第二給気バルブV2aが設けられており、中濃度管理区域L2の排気路12bには、ダンパ等で構成される第二排気バルブV2bが設けられている。高濃度管理区域L3の給気路13aには、ダンパ等で構成される第三給気バルブV3aが設けられており、高濃度管理区域L3の排気路13bには、ダンパ等で構成される第三排気バルブV3bが設けられている。なお、給気バルブV1a,V2a,V3aの夫々は、管理区域L1,L2,L3ごとに設けても良いし、PCB汚染レベルの等しい複数の管理区域L1,L2,L3の給気路11a,12a,13aの合流部に設けても良い。同様に、排気バルブV1b,V2b,V3bの夫々は、管理区域L1,L2,L3ごとに設けても良いし、PCB汚染レベルの等しい複数の管理区域L1,L2,L3の排気路11b,12b,13bの合流部に設けても良い。   A first air supply valve V1a composed of a damper or the like is provided in the air supply path 11a of the low concentration management area L1, and a first air valve composed of a damper or the like is provided in the exhaust path 11b of the low concentration management area L1. One exhaust valve V1b is provided. The air supply passage 12a in the medium concentration management area L2 is provided with a second air supply valve V2a configured by a damper or the like, and the exhaust passage 12b in the medium concentration management area L2 is provided with a first damper configured by a damper or the like. Two exhaust valves V2b are provided. The air supply passage 13a in the high concentration management area L3 is provided with a third air supply valve V3a constituted by a damper or the like, and the exhaust passage 13b in the high concentration management area L3 is provided by a damper or the like. Three exhaust valves V3b are provided. The supply valves V1a, V2a, and V3a may be provided for each of the management areas L1, L2, and L3, or the supply paths 11a and 12a of the plurality of management areas L1, L2, and L3 having the same PCB contamination level. , 13a may be provided at the junction. Similarly, each of the exhaust valves V1b, V2b, V3b may be provided for each of the management areas L1, L2, L3, or the exhaust passages 11b, 12b of the plurality of management areas L1, L2, L3 having the same PCB contamination level. You may provide in the junction part of 13b.

夫々の管理区域L1,L2,L3は、給気バルブV1a,V2a,V3aおよび排気バルブV1b,V2b,V3bの開度を調節することで、大気圧よりも低い圧力に調節されている。また、低濃度管理区域L1,中濃度管理区域L2および高濃度管理区域L3は、この順で圧力が低くなるように調節されている。また、夫々の非管理区域L0や管理区域L1,L2,L3には、圧力を測定する圧力センサSが設けられている。なお、圧力センサSを省略しても良い。また、夫々の管理区域L1,L2,L3の圧力調整を、給気ファン又は排気ファンの出力で調節しても良い。   Each management area L1, L2, L3 is adjusted to a pressure lower than the atmospheric pressure by adjusting the opening degree of the supply valves V1a, V2a, V3a and the exhaust valves V1b, V2b, V3b. The low concentration management area L1, the medium concentration management area L2, and the high concentration management area L3 are adjusted so that the pressure decreases in this order. Each non-management area L0 and management areas L1, L2, and L3 are provided with pressure sensors S that measure pressure. Note that the pressure sensor S may be omitted. Moreover, you may adjust the pressure adjustment of each management area L1, L2, L3 with the output of an air supply fan or an exhaust fan.

図2〜図4を用いて、本実施形態にかかるPCB処理施設Xの解体方法の一例として、PCBで汚染された管理区域Lの内壁WL又は外壁WOを解体する方法について説明する。以下では、隣り合う何れか2つの管理区域L1,L2,L3のうち、相対的にPCB濃度が高い管理区域を第一区域とし、相対的にPCB濃度が低い管理区域を第二区域と定義している。つまり、図2の例では、高濃度管理区域L3が第一区域となり、中濃度管理区域L2が第二区域となる。また、図3の例では、低濃度管理区域L1又は非管理区域L0が第一区域となり、非管理区域L0又は外部が第二区域となる。   As an example of a method for dismantling the PCB processing facility X according to the present embodiment, a method for dismantling the inner wall WL or the outer wall WO of the management area L contaminated with PCB will be described with reference to FIGS. Hereinafter, of any two adjacent management areas L1, L2, and L3, a management area having a relatively high PCB concentration is defined as a first area, and a management area having a relatively low PCB concentration is defined as a second area. ing. That is, in the example of FIG. 2, the high concentration management area L3 is the first area, and the medium concentration management area L2 is the second area. In the example of FIG. 3, the low concentration management area L1 or the non-management area L0 is the first area, and the non-management area L0 or the outside is the second area.

図2および図4に示すように、本実施形態にかかるPCB処理施設Xの解体方法は、PCBで汚染された高濃度管理区域L3(第一区域の一例)と、高濃度管理区域L3と内壁WLで隔てられており、高濃度管理区域L3よりもPCB濃度の低い中濃度管理区域L2(第二区域の一例)とを有するPCB処理施設Xを解体する方法であって、高濃度管理区域L3の空気を給排気しながら大気圧よりも低い第一圧力に調節する第一圧力調節工程と、中濃度管理区域L2の空気を給排気しながら大気圧よりも低く第一圧力よりも高い第二圧力に調節する第二圧力調節工程と、内壁WLを穿孔することにより所定面積以下の開口部20を順次形成する穿孔工程と、開口部20を閉塞していた部位を低濃度化処理する低濃度化処理工程と、を備えている。また、穿孔工程では、開口部20をPCBで汚染されていない鉄板等の塞ぎ部材30で閉塞した後に、新たな開口部20を形成するように構成されている。   As shown in FIGS. 2 and 4, the method for dismantling the PCB processing facility X according to this embodiment includes a high concentration management area L3 (an example of a first area) contaminated with PCB, a high concentration management area L3, and an inner wall. A method of dismantling a PCB processing facility X having a medium concentration management area L2 (an example of a second area) separated by WL and having a PCB concentration lower than that of the high concentration management area L3, the high concentration management area L3 A first pressure adjusting step for adjusting the first pressure lower than the atmospheric pressure while supplying / exhausting the air, and a second lower than the atmospheric pressure and higher than the first pressure while supplying / exhausting the air in the medium concentration management zone L2 A second pressure adjusting step for adjusting the pressure, a perforating step for sequentially forming the opening 20 having a predetermined area or less by perforating the inner wall WL, and a low concentration for reducing the concentration of the portion that has blocked the opening 20 And processing step . In the perforating process, the opening 20 is closed with a closing member 30 such as an iron plate not contaminated with PCB, and then a new opening 20 is formed.

第一圧力調節工程では、開口部20が形成されたことによる高濃度管理区域L3の圧力上昇を抑制するために、第三排気バルブV3bの開度を一定に維持した状態で、第三給気バルブV3aの開度が小さくなるように制御する。つまり、高濃度管理区域L3からの空気の排気量が活性炭槽等の処理能力の範囲内に維持されるので、屋外に排出される排気のPCB濃度を確実に基準値以内とすることができる。   In the first pressure adjusting step, the third air supply is performed in a state in which the opening of the third exhaust valve V3b is kept constant in order to suppress the pressure increase in the high concentration management area L3 due to the opening 20 being formed. Control is performed so that the opening degree of the valve V3a is reduced. That is, since the exhaust amount of air from the high concentration management area L3 is maintained within the range of the processing capacity of the activated carbon tank or the like, the PCB concentration of the exhaust discharged to the outdoors can be surely within the reference value.

第二圧力調節工程では、開口部20が形成されたことによる中濃度管理区域L2の圧力低下を抑制するために、第二給気バルブV2aの開度が大きくなるように、又は第二排気バルブV2bの開度が小さくなるように制御する。これによって、開口部20が形成されている際に、中濃度管理区域L2から高濃度管理区域L3への空気の流れが形成されるので、高濃度管理区域L3の高濃度PCBが、中濃度管理区域L2に流出することが防止される。   In the second pressure adjusting step, in order to suppress the pressure drop in the medium concentration management zone L2 due to the formation of the opening 20, the opening of the second air supply valve V2a is increased, or the second exhaust valve Control is performed so that the opening degree of V2b is reduced. As a result, when the opening 20 is formed, an air flow from the medium concentration management area L2 to the high concentration management area L3 is formed, so that the high concentration PCB in the high concentration management area L3 is controlled by the medium concentration management area L3. Outflow to the area L2 is prevented.

穿孔工程では、上述したように、内壁WLのうちPCB濃度の高いビス部や目地の存在する部位に開口部20を形成する。具体的には、ホールソーなどで開口部20を形成する予定箇所の角部を穿孔した後、切断装置で角部の間を切断して矩形状又は円形状の開口部20を形成する。このとき、本実施形態では、相対的に圧力の高い中濃度管理区域L2の側から高濃度管理区域L3の側に向かって開口部20を穿孔することとしている。これによって、開口部20を閉塞していたPCB濃度の高い部位が高濃度管理区域L3に落下することとなる。その結果、高濃度管理区域L3の高濃度PCBが、中濃度管理区域L2に流出することを防止することができる。   In the drilling step, as described above, the opening 20 is formed in a portion of the inner wall WL where a screw portion or joint having a high PCB concentration exists. Specifically, after a corner portion where the opening 20 is to be formed is drilled with a hole saw or the like, the corner 20 is cut with a cutting device to form a rectangular or circular opening 20. At this time, in the present embodiment, the opening 20 is perforated from the medium concentration management area L2 side having a relatively high pressure toward the high concentration management area L3 side. As a result, the portion with a high PCB concentration that has blocked the opening 20 falls into the high concentration management area L3. As a result, it is possible to prevent the high concentration PCB in the high concentration management area L3 from flowing out to the medium concentration management area L2.

穿孔工程で形成された開口部20は、高濃度管理区域L3の第一圧力が中濃度管理区域L2の第二圧力よりも低く状態を継続できるように、開口面積が所定面積以下に設定されている。この所定面積(m)は、高濃度管理区域L3の空気中のPCB濃度(μg/m)、又は、壁面に付着しているPCB濃度(μg/100cm)に基づいて設定されても良いし、高濃度管理区域L3からの空気の排気量(m/h)に基づいて設定されても良い。 The opening 20 formed in the drilling process has an opening area set to a predetermined area or less so that the first pressure in the high concentration management area L3 can be kept lower than the second pressure in the medium concentration management area L2. Yes. This predetermined area (m 2 ) may be set based on the PCB concentration (μg / m 3 ) in the air in the high concentration management area L3 or the PCB concentration (μg / 100 cm 2 ) adhering to the wall surface. Alternatively, it may be set based on the exhaust amount (m 3 / h) of air from the high concentration management area L3.

開口部20の開口面積を高濃度管理区域L3のPCB濃度に基づいて設定する場合、開口面積×PCB濃度≦所定値A(μg/m)となるように設定される。つまり、高濃度管理区域L3のPCB濃度が高いほど、開口部20の開口面積を小さく設定することとしている。これにより、高濃度管理区域L3のPCB濃度が高いほど、中濃度管理区域L2から高濃度管理区域L3に向かう空気の流速が高まるので、高濃度管理区域L3の高濃度PCBの流出を確実に防止することができる。   When the opening area of the opening 20 is set based on the PCB concentration of the high concentration management area L3, the opening area × PCB concentration ≦ predetermined value A (μg / m) is set. That is, the higher the PCB concentration in the high concentration management area L3, the smaller the opening area of the opening 20 is set. As a result, the higher the PCB concentration in the high concentration management area L3, the higher the flow rate of air from the medium concentration management area L2 to the high concentration management area L3, thus reliably preventing the high concentration PCB from flowing out of the high concentration management area L3. can do.

開口部20の開口面積を高濃度管理区域L3からの空気の排気量に基づいて設定する場合、高濃度管理区域L3からの空気の排気量/開口面積≧所定値B(m/h)となるように設定される。つまり、高濃度管理区域L3からの空気の排気量が小さいほど、開口部20の開口面積を小さく設定することとしている。これにより、高濃度管理区域L3と中濃度管理区域L2との差圧が小さい場合でも、中濃度管理区域L2から高濃度管理区域L3に向かう空気の流速を確保して、高濃度管理区域L3の高濃度PCBの流出を確実に防止することができる。   When the opening area of the opening 20 is set based on the exhaust amount of air from the high concentration management area L3, the exhaust amount of air from the high concentration management area L3 / opening area ≧ predetermined value B (m / h). Is set as follows. That is, the smaller the amount of air exhausted from the high concentration management area L3, the smaller the opening area of the opening 20 is set. Thereby, even when the differential pressure between the high concentration management area L3 and the medium concentration management area L2 is small, the flow rate of air from the medium concentration management area L2 to the high concentration management area L3 is secured, and the high concentration management area L3 Outflow of high concentration PCB can be reliably prevented.

低濃度化処理工程では、開口部20を閉塞していた部位を洗浄等の除染作業を行い、PCB処理施設Xから搬出して外部のPCB処理施設で無害化できるPCB濃度まで低下させる。なお、開口部20を閉塞していた部位をPCB処理施設Xにある洗浄設備等で卒業判定基準値以下まで処理しても良い。   In the concentration reduction processing step, the site where the opening 20 is blocked is subjected to decontamination work such as cleaning, and the PCB concentration is lowered from the PCB processing facility X to a PCB concentration that can be rendered harmless at the external PCB processing facility. In addition, you may process the site | part which obstruct | occluded the opening part 20 to below graduation judgment reference value with the washing | cleaning equipment etc. in the PCB processing facility X.

図4には、これらの一連の工程を説明するフロー図が示されている。管理区域Lの内壁WLを解体するにあたり、中濃度管理区域L2の第二圧力が高濃度管理区域L3の第一圧力よりも高くなるように中濃度管理区域L2および高濃度管理区域L3における空気の給排気量を調節する。そして、内壁WLに形成予定の開口部20の開口面積を設定する。この開口面積は、上述したように高濃度管理区域L3のPCB濃度や高濃度管理区域L3からの空気の排気量に基づいて設定される。   FIG. 4 is a flow diagram for explaining a series of these steps. In dismantling the inner wall WL of the management area L, air in the medium concentration management area L2 and the high concentration management area L3 is set so that the second pressure in the medium concentration management area L2 is higher than the first pressure in the high concentration management area L3. Adjust the air supply / exhaust amount. Then, the opening area of the opening 20 to be formed on the inner wall WL is set. As described above, the opening area is set based on the PCB concentration in the high concentration management area L3 and the exhaust amount of air from the high concentration management area L3.

次いで、穿孔工程によって、第一圧力と第二圧力との差圧を監視しながら、設定された開口面積の数分の1の面積(例えば、横1m×縦0.5m)で数度に分けて内壁WLを穿孔する。具体的には、図5に示すように、設定された開口部20の開口面積を長手方向に複数分割(図5では3分割)して、分割部A1〜A3を設定する。そして、ホールソーなどを用いて、分割部A1〜A3の角部に複数の孔部を形成する。次いで、第一の分割部A1の複数の孔部(角部)の間を切断装置で切断して、第一の穿孔口20aを形成する。内壁WLに第一の穿孔口20aが形成されることで、中濃度管理区域L2から高濃度管理区域L3への空気の流れが形成される。このとき、本実施形態では設定された開口面積の数分の1の面積で徐々に穿孔するので、高濃度管理区域L3の第一圧力と中濃度管理区域L2の第二圧力との差圧(第二圧力から第一圧力を減算した値)は基準値(例えば、5mmAq)以上で維持されている。なお、圧力センサSによって計測された高濃度管理区域L3の第一圧力と中濃度管理区域L2の第二圧力との差圧の絶対値が、基準値を下回った場合、中濃度管理区域L2や高濃度管理区域L3における空気の吸排気量を調節しても良い。具体的には、高濃度管理区域L3の第三給気バルブV3aの開度を小さくして第一圧力を低下させる。また、中濃度管理区域L2の第二給気バルブV2aの開度を大きくしたり、第二排気バルブV2bの開度を小さくしたりして中濃度管理区域L2の第二圧力を上昇させる。この圧力調節は、何れか1つのバルブ開度を変更することで実行されても良いし、何れか2つ以上のバルブ開度を変更することで実行されても良い。   Next, while the differential pressure between the first pressure and the second pressure is monitored by the perforation process, it is divided into several degrees with an area that is a fraction of the set opening area (for example, 1 m wide × 0.5 m long). To perforate the inner wall WL. Specifically, as shown in FIG. 5, the set opening area of the opening 20 is divided into a plurality of parts in the longitudinal direction (three divisions in FIG. 5), and divided parts A1 to A3 are set. And a some hole is formed in the corner | angular part of division | segmentation part A1-A3 using a hole saw. Next, a plurality of hole portions (corner portions) of the first divided portion A1 are cut with a cutting device to form the first perforated port 20a. By forming the first perforation port 20a in the inner wall WL, an air flow from the medium concentration management area L2 to the high concentration management area L3 is formed. At this time, in this embodiment, since the holes are gradually perforated in a fraction of the set opening area, the differential pressure between the first pressure in the high concentration management area L3 and the second pressure in the medium concentration management area L2 ( The value obtained by subtracting the first pressure from the second pressure is maintained at a reference value (for example, 5 mmAq) or more. When the absolute value of the differential pressure between the first pressure in the high concentration management area L3 and the second pressure in the medium concentration management area L2 measured by the pressure sensor S is lower than the reference value, the medium concentration management area L2 or The intake / exhaust amount of air in the high concentration management area L3 may be adjusted. Specifically, the first pressure is lowered by reducing the opening of the third air supply valve V3a in the high concentration management area L3. Further, the second pressure in the intermediate concentration management area L2 is increased by increasing the opening of the second supply valve V2a in the intermediate concentration management area L2 or decreasing the opening of the second exhaust valve V2b. This pressure adjustment may be executed by changing any one of the valve openings, or may be executed by changing any two or more valve openings.

次いで、圧力センサSによって計測された第一圧力と第二圧力の差圧(第二圧力から第一圧力を減算した値)が基準値以上であれば、第二の分割部A2の複数の孔部(角部)の間を切断装置で切断して、第二の穿孔口20bを形成する。一方、圧力センサSによって計測された第一圧力と第二圧力の差圧が基準値を下回れば、第一の穿孔口20aを塞ぎ部材30で閉塞した後、第二の穿孔口20bを形成する。同様に、第三の分割部A3に第三の穿孔口20cを形成し、これら一連の穿孔作業を繰り返す。図4に戻って、複数の穿孔口20a〜20cの合計である開口部20の面積が概ね設定された開口面積となった場合、穿孔作業を停止して、PCBで汚染されていない塞ぎ部材30で開口部20を閉塞する(図2参照)。そして、開口部20を閉塞していた部位は、洗浄等の除染作業が実行される。このように、PCB濃度の高い部位を除去して形成された開口部20を、PCBで汚染されていない塞ぎ部材30で閉塞すれば、高濃度管理区域L3のPCB濃度を低下させることができる。そして、内壁WLのうちPCB濃度の高い部位を全て撤去し終えるまで、上述した作業を繰り返す。最終的に、高濃度管理区域L3の空気中のPCB濃度が所定値(例えば、低濃度管理区域L1と同程度のPCB濃度)を下回ったとき、高濃度管理区域L3の全ての内壁WLを解体し、中濃度管理区域L2と一体化された区域とする。同様の方法で、夫々の管理区域L1,L2,L3を区画する全ての内壁WLを撤去すれば、PCB処理施設Xの管理区域L1,L2,L3は、外壁WOに隣接する内壁WLのみに囲まれた極めてPCB濃度の低い一つの区域(低濃度管理区域L1)となる。   Next, if the differential pressure between the first pressure and the second pressure measured by the pressure sensor S (a value obtained by subtracting the first pressure from the second pressure) is equal to or greater than a reference value, a plurality of holes in the second divided portion A2 The portion (corner portion) is cut with a cutting device to form the second perforation port 20b. On the other hand, if the differential pressure between the first pressure and the second pressure measured by the pressure sensor S is lower than the reference value, the first perforation port 20a is closed with the member 30 and then the second perforation port 20b is formed. . Similarly, the third perforation port 20c is formed in the third divided portion A3, and these series of perforation operations are repeated. Returning to FIG. 4, when the area of the opening 20 that is the sum of the plurality of punching holes 20 a to 20 c becomes the set opening area, the punching operation is stopped, and the blocking member 30 that is not contaminated with PCB. Then, the opening 20 is closed (see FIG. 2). And the decontamination work, such as washing | cleaning, is performed about the site | part which obstruct | occluded the opening part 20. FIG. In this way, if the opening 20 formed by removing a portion having a high PCB concentration is closed with the blocking member 30 that is not contaminated with PCB, the PCB concentration in the high concentration management area L3 can be lowered. And the operation | work mentioned above is repeated until it finishes removing all the parts with high PCB density | concentration among the inner walls WL. Eventually, when the PCB concentration in the air of the high concentration management area L3 falls below a predetermined value (for example, the same PCB concentration as the low concentration management area L1), all the inner walls WL of the high concentration management area L3 are dismantled And an area integrated with the medium concentration management area L2. If all the inner walls WL that divide the respective management areas L1, L2, and L3 are removed in the same manner, the management areas L1, L2, and L3 of the PCB processing facility X are surrounded only by the inner wall WL adjacent to the outer wall WO. This is one area with a very low PCB concentration (low concentration management area L1).

図3には、PCB処理施設Xの外壁WOを解体する方法が示されている。上述したように、外壁WOに隣接する内壁WL(管理区域Lの最外壁)と外壁WOとの間の空間は非管理区域L0に指定されている。図2の解体方法により、管理区域Lは極めてPCB濃度が低い状態となっているが、外部に少量のPCBでも流出させることは好ましくない。そこで、本実施形態では、外壁WOに隣接する内壁WLや外壁WOを解体する際に、上述した解体方法と同様の方法を用いることとしている。   FIG. 3 shows a method of dismantling the outer wall WO of the PCB processing facility X. As described above, the space between the inner wall WL (outermost wall of the management area L) adjacent to the outer wall WO and the outer wall WO is designated as the non-management area L0. Although the PCB concentration in the management area L is extremely low by the disassembling method of FIG. 2, it is not preferable to discharge a small amount of PCB to the outside. Therefore, in the present embodiment, when disassembling the inner wall WL or the outer wall WO adjacent to the outer wall WO, a method similar to the dismantling method described above is used.

具体的には、外壁WOに隣接する内壁WLを解体する際は、第一区域を低濃度管理区域L1とし、第二区域を非管理区域L0としている。また、外壁WOを解体する際は、非管理区域L0を第一区域とし、外部を第二区域としている。   Specifically, when disassembling the inner wall WL adjacent to the outer wall WO, the first area is the low concentration management area L1, and the second area is the non-management area L0. Further, when dismantling the outer wall WO, the non-management area L0 is set as the first area and the outside is set as the second area.

外壁WOに隣接する内壁WLを解体する際は、外部に連通した非管理区域L0を大気圧に維持した状態で、低濃度管理区域L1を負圧に設定する。そして、上述した解体方法で開口部20を形成すると共にPCBで汚染されていない塞ぎ部材30で開口部20を閉塞して、外壁WOに隣接する内壁WLのビス部や目地の存在する部位を撤去する。これによって、低濃度管理区域L1のPCB濃度を非管理区域L0のPCB濃度を同程度になるまで低減することができる。   When disassembling the inner wall WL adjacent to the outer wall WO, the low concentration management area L1 is set to a negative pressure while the non-management area L0 communicating with the outside is maintained at atmospheric pressure. Then, the opening 20 is formed by the disassembling method described above, and the opening 20 is closed by the blocking member 30 that is not contaminated with PCB, and the screw portion and joints of the inner wall WL adjacent to the outer wall WO are removed. To do. As a result, the PCB concentration in the low concentration management area L1 can be reduced to the same level as the PCB concentration in the non-management area L0.

そして、内壁WLを全て解体して外壁WOのみとした状態で、外壁WOに沿って足場40を形成して、外側から外壁WOに開口部20を形成する。この開口部20は、外壁WOの軽量発泡コンクリートパネルの間の目地や軽量発泡コンクリートの内部に埋設された鉄筋の間に形成する。次いで、外壁WOの外側からPCBで汚染されていない塞ぎ部材30で開口部20を閉塞し、同様の作業を繰り返す。このとき、外壁WOの内部を負圧に設定し、外部から非管理区域L0に向かう空気の流れを形成する。これによって、極めて濃度の低いPCBを外部に流出させることを防止することができる。   Then, in a state where all the inner walls WL are disassembled to form only the outer wall WO, the scaffold 40 is formed along the outer wall WO, and the opening 20 is formed in the outer wall WO from the outside. The opening 20 is formed between the joint between the lightweight foamed concrete panels of the outer wall WO and between the reinforcing bars embedded in the lightweight foamed concrete. Next, the opening 20 is closed with a closing member 30 that is not contaminated with PCB from the outside of the outer wall WO, and the same operation is repeated. At this time, the inside of the outer wall WO is set to a negative pressure, and an air flow from the outside toward the non-management area L0 is formed. As a result, it is possible to prevent the PCB having a very low concentration from flowing out.

[その他の実施形態]
(1)塞ぎ部材30は鉄板に限定されず、樹脂パネルやガラス板で構成しても良い。また、塞ぎ部材30と開口部20との接触部位にシール部材を設けても良い。塞ぎ部材30を省略して、差圧を順次拡大しながら開口部20を形成しても良い。
(2)開口部20の穿孔方法は、上述したホールソーや切断装置を用いる方法に限定されず、例えばドリルで穿孔しても良く、特に限定されない。
[Other Embodiments]
(1) The closing member 30 is not limited to an iron plate, and may be formed of a resin panel or a glass plate. Further, a sealing member may be provided at a contact portion between the closing member 30 and the opening 20. The closing member 30 may be omitted, and the opening 20 may be formed while sequentially increasing the differential pressure.
(2) The method of drilling the opening 20 is not limited to the above-described method using the hole saw or the cutting device, and may be drilled with a drill, for example, and is not particularly limited.

本発明は、PCB処理施設の壁や天井を解体する方法に利用可能である。   The present invention can be used in a method for dismantling a wall or ceiling of a PCB processing facility.

20 開口部
30 塞ぎ部材
L3 高濃度管理区域(第一区域)
L2 中濃度管理区域(第二区域)
WL 内壁(壁、天井)
X PCB処理施設
20 opening 30 closing member L3 high concentration management area (first area)
L2 medium concentration management area (second area)
WL inner wall (wall, ceiling)
X PCB processing facility

Claims (6)

PCBで汚染された第一区域と、当該第一区域と壁又は天井で隔てられており、前記第一区域よりもPCB濃度の低い第二区域とを有するPCB処理施設を解体する方法であって、
前記第一区域の空気を給排気しながら第一圧力に調節する第一圧力調節工程と、
前記第二区域の空気を給排気しながら前記第一圧力よりも高い第二圧力に調節する第二圧力調節工程と、
前記壁又は天井を穿孔することにより所定面積以下の開口部を順次形成する穿孔工程と、を備えたPCB処理施設の解体方法。
A method of dismantling a PCB processing facility having a first area contaminated with PCB and a second area separated from the first area by a wall or ceiling and having a lower PCB concentration than the first area. ,
A first pressure adjusting step of adjusting the first pressure while supplying and exhausting air in the first zone;
A second pressure adjusting step of adjusting the second pressure higher than the first pressure while supplying and exhausting air in the second area;
A method of disassembling a PCB processing facility, comprising: a perforating step that sequentially forms openings having a predetermined area or less by perforating the wall or ceiling.
前記穿孔工程は、前記開口部をPCBで汚染されていない塞ぎ部材で閉塞した後に、新たな前記開口部を形成する請求項1に記載のPCB処理施設の解体方法。   2. The method for disassembling a PCB processing facility according to claim 1, wherein, in the punching step, the opening is newly formed after the opening is closed with a closing member not contaminated with PCB. 前記穿孔工程は、前記第二区域の側から前記開口部を穿孔する請求項1又は2に記載のPCB処理施設の解体方法。   The method for disassembling a PCB processing facility according to claim 1 or 2, wherein the perforating step perforates the opening from the second area side. 前記穿孔工程は、前記第一区域のPCB濃度に基づいて前記開口部の開口面積を設定する請求項1から3のいずれか一項に記載のPCB処理施設の解体方法。   The method for disassembling a PCB processing facility according to any one of claims 1 to 3, wherein the perforating step sets an opening area of the opening based on a PCB concentration in the first area. 前記穿孔工程は、前記第一区域からの空気の排気量に基づいて前記開口部の開口面積を設定する請求項1から3のいずれか一項に記載のPCB処理施設の解体方法。   4. The method for disassembling a PCB processing facility according to claim 1, wherein in the drilling step, an opening area of the opening is set based on an exhaust amount of air from the first area. 前記第一圧力調節工程は、排気量を所定値に維持した状態で給気量を変更して前記第一圧力に維持する請求項1から5のいずれか一項に記載のPCB処理施設の解体方法。   The dismantling of the PCB processing facility according to any one of claims 1 to 5, wherein the first pressure adjusting step changes the air supply amount while maintaining the exhaust amount at a predetermined value to maintain the first pressure. Method.
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