JP2018139210A5 - - Google Patents
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- Publication number
- JP2018139210A5 JP2018139210A5 JP2018032017A JP2018032017A JP2018139210A5 JP 2018139210 A5 JP2018139210 A5 JP 2018139210A5 JP 2018032017 A JP2018032017 A JP 2018032017A JP 2018032017 A JP2018032017 A JP 2018032017A JP 2018139210 A5 JP2018139210 A5 JP 2018139210A5
- Authority
- JP
- Japan
- Prior art keywords
- drive circuit
- analyzer
- accommodating
- control unit
- handheld housing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2015225201 | 2015-11-17 | ||
| JP2015225201 | 2015-11-17 |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2017551925A Division JP6386195B2 (ja) | 2015-11-17 | 2016-11-17 | 分析装置及びその制御方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2018139210A JP2018139210A (ja) | 2018-09-06 |
| JP2018139210A5 true JP2018139210A5 (enExample) | 2019-12-19 |
| JP6745536B2 JP6745536B2 (ja) | 2020-08-26 |
Family
ID=58717424
Family Applications (4)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2017551925A Active JP6386195B2 (ja) | 2015-11-17 | 2016-11-17 | 分析装置及びその制御方法 |
| JP2018032016A Active JP6420007B2 (ja) | 2015-11-17 | 2018-02-26 | 分析装置及びその制御方法 |
| JP2018032017A Active JP6745536B2 (ja) | 2015-11-17 | 2018-02-26 | 分析装置及びその制御方法 |
| JP2018149245A Active JP6745538B2 (ja) | 2015-11-17 | 2018-08-08 | 分析装置及びその制御方法 |
Family Applications Before (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2017551925A Active JP6386195B2 (ja) | 2015-11-17 | 2016-11-17 | 分析装置及びその制御方法 |
| JP2018032016A Active JP6420007B2 (ja) | 2015-11-17 | 2018-02-26 | 分析装置及びその制御方法 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2018149245A Active JP6745538B2 (ja) | 2015-11-17 | 2018-08-08 | 分析装置及びその制御方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (3) | US10847356B2 (enExample) |
| EP (3) | EP3686918B1 (enExample) |
| JP (4) | JP6386195B2 (enExample) |
| CN (4) | CN111383903A (enExample) |
| WO (1) | WO2017086393A1 (enExample) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP3686918B1 (en) | 2015-11-17 | 2024-03-20 | Atonarp Inc. | Analyzer apparatus and control method |
| WO2019224948A1 (ja) * | 2018-05-23 | 2019-11-28 | 株式会社島津製作所 | 飛行時間型質量分析装置 |
| US10985002B2 (en) * | 2019-06-11 | 2021-04-20 | Perkinelmer Health Sciences, Inc. | Ionization sources and methods and systems using them |
| JP7445507B2 (ja) * | 2020-04-22 | 2024-03-07 | シャープ株式会社 | 分析装置 |
| US20230243787A1 (en) * | 2020-07-14 | 2023-08-03 | Shimadzu Corporation | Gas chromatograph mass spectrometer |
| CA3206396A1 (en) | 2021-02-11 | 2022-08-18 | Adrian Delforge | Drift tube field driving system and method |
Family Cites Families (34)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3665185A (en) * | 1970-10-19 | 1972-05-23 | Minnesota Mining & Mfg | Ion scattering spectrometer with neutralization |
| JPS5831698B2 (ja) * | 1980-01-18 | 1983-07-07 | 工業技術院長 | 電界蒸発型イオンビ−ム発生装置 |
| JPS62223660A (ja) * | 1986-03-26 | 1987-10-01 | Toshiba Corp | イオン励起オ−ジエ電子分光装置 |
| US4808820A (en) * | 1987-09-23 | 1989-02-28 | Hewlett-Packard Company | Electron-emission filament cutoff for gas chromatography + mass spectrometry systems |
| JP2672950B2 (ja) * | 1987-10-20 | 1997-11-05 | 株式会社芝浦製作所 | エミッションコントロール装置 |
| JP2672949B2 (ja) * | 1987-10-20 | 1997-11-05 | 株式会社芝浦製作所 | エミッションコントロール装置 |
| US5164593A (en) * | 1991-02-28 | 1992-11-17 | Kratos Analytical Limited | Mass spectrometer system including an ion source operable under high pressure conditions, and a two-stage pumping arrangement |
| EP0730149A3 (en) * | 1995-03-02 | 1997-05-21 | Orion Research | Linearized potentiometric electrode |
| JP2000067808A (ja) * | 1998-08-25 | 2000-03-03 | Shimadzu Corp | イオン化装置 |
| JP3750386B2 (ja) * | 1998-12-09 | 2006-03-01 | 株式会社島津製作所 | 四重極質量分析装置 |
| CA2632251C (en) * | 2005-12-22 | 2011-06-21 | Thermo Finnigan Llc | Apparatus and method for pumping in an ion optical device |
| JP4720536B2 (ja) * | 2006-02-24 | 2011-07-13 | 株式会社島津製作所 | 電子線源装置 |
| JP4958258B2 (ja) * | 2006-03-17 | 2012-06-20 | 株式会社リガク | ガス分析装置 |
| US8426805B2 (en) * | 2008-02-05 | 2013-04-23 | Thermo Finnigan Llc | Method and apparatus for response and tune locking of a mass spectrometer |
| JP5055157B2 (ja) * | 2008-02-08 | 2012-10-24 | 株式会社日立ハイテクノロジーズ | 質量分析装置 |
| US8253098B2 (en) | 2008-06-27 | 2012-08-28 | University Of Yamanashi | Ionization analysis method and apparatus |
| JP5407616B2 (ja) | 2009-07-14 | 2014-02-05 | 株式会社島津製作所 | イオントラップ装置 |
| CN102280348A (zh) * | 2010-06-08 | 2011-12-14 | 江苏天瑞仪器股份有限公司 | 电子轰击离子源控制系统 |
| JP5454416B2 (ja) * | 2010-08-20 | 2014-03-26 | 株式会社島津製作所 | 質量分析装置 |
| EP2613142A4 (en) * | 2010-08-31 | 2016-12-21 | Atonarp Inc | ION TRANSFER DEVICE |
| JP5530531B2 (ja) * | 2010-11-19 | 2014-06-25 | 株式会社日立ハイテクノロジーズ | 質量分析装置および質量分析方法 |
| CN102636555B (zh) * | 2011-12-19 | 2014-04-02 | 中国科学院合肥物质科学研究院 | 一种适用于高场不对称波形离子迁移管的小型化测控系统 |
| JP6025406B2 (ja) * | 2012-06-04 | 2016-11-16 | 株式会社日立ハイテクノロジーズ | 質量分析装置 |
| JP5970274B2 (ja) * | 2012-07-18 | 2016-08-17 | 株式会社日立ハイテクノロジーズ | 質量分析装置 |
| JP5568117B2 (ja) * | 2012-09-21 | 2014-08-06 | ファナック株式会社 | 放電加工機の加工液供給装置 |
| US8704193B1 (en) * | 2012-11-16 | 2014-04-22 | Thermo Fisher Scientific (Bremen) Gmbh | RF transformer |
| DE102013201499A1 (de) | 2013-01-30 | 2014-07-31 | Carl Zeiss Microscopy Gmbh | Verfahren zur massenspektrometrischen Untersuchung von Gasgemischen sowie Massenspektrometer hierzu |
| US9666422B2 (en) | 2013-08-30 | 2017-05-30 | Atonarp Inc. | Analyzer |
| CN103702498B (zh) * | 2013-12-12 | 2015-07-15 | 兰州空间技术物理研究所 | 一种用于磁偏转质谱计的在线可调灯丝电压源电路 |
| JP5759036B2 (ja) | 2014-03-06 | 2015-08-05 | 株式会社日立ハイテクノロジーズ | 質量分析装置 |
| US8921774B1 (en) * | 2014-05-02 | 2014-12-30 | 908 Devices Inc. | High pressure mass spectrometry systems and methods |
| EP3686918B1 (en) | 2015-11-17 | 2024-03-20 | Atonarp Inc. | Analyzer apparatus and control method |
| US9991105B2 (en) * | 2015-12-23 | 2018-06-05 | University Of Maryland, College Park | Active stabilization of ion trap radiofrequency potentials |
| TWI721041B (zh) * | 2016-08-17 | 2021-03-11 | 日商半導體能源研究所股份有限公司 | 驅動電路、顯示裝置及電子裝置 |
-
2016
- 2016-11-17 EP EP20163789.9A patent/EP3686918B1/en active Active
- 2016-11-17 US US15/776,213 patent/US10847356B2/en active Active
- 2016-11-17 CN CN202010249945.2A patent/CN111383903A/zh active Pending
- 2016-11-17 CN CN202010249638.4A patent/CN111383904A/zh active Pending
- 2016-11-17 WO PCT/JP2016/084120 patent/WO2017086393A1/ja not_active Ceased
- 2016-11-17 JP JP2017551925A patent/JP6386195B2/ja active Active
- 2016-11-17 EP EP21168762.9A patent/EP3889996A1/en not_active Withdrawn
- 2016-11-17 CN CN202010249944.8A patent/CN111383902A/zh active Pending
- 2016-11-17 EP EP16866394.6A patent/EP3379562B1/en active Active
- 2016-11-17 CN CN201680067410.5A patent/CN108352290B/zh active Active
-
2018
- 2018-02-26 JP JP2018032016A patent/JP6420007B2/ja active Active
- 2018-02-26 JP JP2018032017A patent/JP6745536B2/ja active Active
- 2018-08-08 JP JP2018149245A patent/JP6745538B2/ja active Active
-
2020
- 2020-10-20 US US17/075,111 patent/US11011360B2/en active Active
-
2021
- 2021-04-20 US US17/235,023 patent/US11380533B2/en active Active
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