JP2018136239A5 - - Google Patents

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Publication number
JP2018136239A5
JP2018136239A5 JP2017031827A JP2017031827A JP2018136239A5 JP 2018136239 A5 JP2018136239 A5 JP 2018136239A5 JP 2017031827 A JP2017031827 A JP 2017031827A JP 2017031827 A JP2017031827 A JP 2017031827A JP 2018136239 A5 JP2018136239 A5 JP 2018136239A5
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JP
Japan
Prior art keywords
inspection
electronic component
unit
holding
subjected
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Pending
Application number
JP2017031827A
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English (en)
Japanese (ja)
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JP2018136239A (ja
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Publication date
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Priority to JP2017031827A priority Critical patent/JP2018136239A/ja
Priority claimed from JP2017031827A external-priority patent/JP2018136239A/ja
Priority to CN201810144864.9A priority patent/CN108499906A/zh
Priority to TW107105615A priority patent/TWI668455B/zh
Publication of JP2018136239A publication Critical patent/JP2018136239A/ja
Publication of JP2018136239A5 publication Critical patent/JP2018136239A5/ja
Pending legal-status Critical Current

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JP2017031827A 2017-02-23 2017-02-23 電子部品搬送装置及び電子部品検査装置 Pending JP2018136239A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2017031827A JP2018136239A (ja) 2017-02-23 2017-02-23 電子部品搬送装置及び電子部品検査装置
CN201810144864.9A CN108499906A (zh) 2017-02-23 2018-02-12 电子部件输送装置及电子部件检查装置
TW107105615A TWI668455B (zh) 2017-02-23 2018-02-14 電子零件搬送裝置及電子零件檢查裝置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2017031827A JP2018136239A (ja) 2017-02-23 2017-02-23 電子部品搬送装置及び電子部品検査装置

Publications (2)

Publication Number Publication Date
JP2018136239A JP2018136239A (ja) 2018-08-30
JP2018136239A5 true JP2018136239A5 (enrdf_load_stackoverflow) 2020-02-27

Family

ID=63365484

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2017031827A Pending JP2018136239A (ja) 2017-02-23 2017-02-23 電子部品搬送装置及び電子部品検査装置

Country Status (3)

Country Link
JP (1) JP2018136239A (enrdf_load_stackoverflow)
CN (1) CN108499906A (enrdf_load_stackoverflow)
TW (1) TWI668455B (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2020051944A (ja) * 2018-09-27 2020-04-02 セイコーエプソン株式会社 電子部品搬送装置および電子部品検査装置

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0514951U (ja) * 1991-08-14 1993-02-26 横河電機株式会社 半導体テスト装置
TW369692B (en) * 1997-12-26 1999-09-11 Samsung Electronics Co Ltd Test and burn-in apparatus, in-line system using the apparatus, and test method using the system
KR100898821B1 (ko) * 2007-11-29 2009-05-22 주식회사 실트론 웨이퍼 캐리어의 제조방법
KR101304275B1 (ko) * 2008-09-30 2013-09-11 (주)테크윙 전자부품 테스트 시스템
EP2241520A3 (en) * 2009-04-13 2013-05-29 Ackley Machine Corp. Ejection System
JP5621313B2 (ja) * 2010-05-14 2014-11-12 セイコーエプソン株式会社 電子部品検査装置及び電子部品搬送方法
TWI425230B (zh) * 2011-10-25 2014-02-01 Chroma Ate Inc Touchpad detection machine
JP6083140B2 (ja) * 2012-07-20 2017-02-22 セイコーエプソン株式会社 電子部品搬送装置および電子部品検査装置
JP5996983B2 (ja) * 2012-09-19 2016-09-21 ヤマハ発動機株式会社 電子部品装着装置
CN106269581B (zh) * 2015-06-10 2019-10-18 鸿劲科技股份有限公司 指纹辨识电子元件作业装置及其应用的测试分类设备
CN105938169A (zh) * 2016-03-25 2016-09-14 江苏凯尔生物识别科技有限公司 指纹模组金属环组装吸附冶具
CN106180004B (zh) * 2016-08-08 2022-10-28 深圳市华力宇电子科技有限公司 指纹分选机的控制系统及控制方法

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