JP2018107367A - Power semiconductor module - Google Patents

Power semiconductor module Download PDF

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JP2018107367A
JP2018107367A JP2016254758A JP2016254758A JP2018107367A JP 2018107367 A JP2018107367 A JP 2018107367A JP 2016254758 A JP2016254758 A JP 2016254758A JP 2016254758 A JP2016254758 A JP 2016254758A JP 2018107367 A JP2018107367 A JP 2018107367A
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cooler
semiconductor chip
substrate
bonding material
plate portion
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JP6710155B2 (en
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肇 津久井
Hajime Tsukui
肇 津久井
琢也 大内
Takuya Ouchi
琢也 大内
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Keihin Corp
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Abstract

PROBLEM TO BE SOLVED: To secure bondability of a semiconductor chip in a manufacturing process of a power semiconductor module.SOLUTION: A power semiconductor module includes: a cooler 2 having a first surface and a second surface which serve as heat transfer surfaces; a first substrate 3a to which a first semiconductor chip 3b is joined by a first joint material 3c which melts at a predetermined melting temperature, the first substrate 3a joined to the first surface of the cooler 2; a second substrate 4a to which a second semiconductor chip 4b is joined by a second joint material 4c having a melting temperature different from the first joint material 3c, the second substrate 4a joined to the second surface of the cooler 2.SELECTED DRAWING: Figure 1

Description

本発明は、パワー半導体モジュールに関するものである。   The present invention relates to a power semiconductor module.

例えば、特許文献1には、放熱機能を有する熱伝導器(冷却器)に絶縁層を形成し、絶縁層の上に電力半導体チップ(半導体チップ)を搭載した電力用半導体モジュール(パワー半導体モジュール)が開示されている。特許文献1の電力用半導体モジュールは、絶縁層と半導体チップとがハンダ(接合材)により接合され、絶縁層と熱伝導器とが銅材(接合材)により接合されている。また、特許文献1には、熱伝導器が複数の面において電力用半導体モジュールを搭載する構成が開示されている。   For example, Patent Document 1 discloses a power semiconductor module (power semiconductor module) in which an insulating layer is formed on a heat conductor (cooler) having a heat dissipation function, and a power semiconductor chip (semiconductor chip) is mounted on the insulating layer. Is disclosed. In the power semiconductor module of Patent Document 1, the insulating layer and the semiconductor chip are joined by solder (joining material), and the insulating layer and the heat conductor are joined by copper material (joining material). Patent Document 1 discloses a configuration in which a heat conductor is mounted with a power semiconductor module on a plurality of surfaces.

特開平10−284685号公報JP-A-10-284585

熱伝導器の複数の面に半導体チップを接合する場合において、先に第1面に半導体チップを接合した後に、第2面に半導体チップを接合する作業が必要となる。特許文献1では、熱伝導器の複数の面に半導体チップを搭載する場合でも、全ての面において同一の接合材を用いている。このため、冷却器の第2面に接合する際に、加熱炉の熱が第1面にも伝わり、先に第1面に接合された基板の接合材が再溶融し、第1面における半導体チップ及び基板が剥離する可能性がある。   When joining a semiconductor chip to a plurality of surfaces of a heat conductor, it is necessary to join the semiconductor chip to the second surface after first joining the semiconductor chip to the first surface. In patent document 1, even when a semiconductor chip is mounted on a plurality of surfaces of a heat conductor, the same bonding material is used on all surfaces. For this reason, when joining to the 2nd surface of a cooler, the heat of a heating furnace is transmitted also to the 1st surface, the joining material of the board | substrate previously joined to the 1st surface remelts, and the semiconductor in a 1st surface The chip and the substrate may be peeled off.

本発明は、上述する問題点に鑑みてなされたもので、パワー半導体モジュールの製造工程において、半導体チップの接合性を確保することを目的とする。   The present invention has been made in view of the above-described problems, and it is an object of the present invention to ensure the bondability of a semiconductor chip in a power semiconductor module manufacturing process.

上記目的を達成するために、本発明では、第1の手段として、伝熱面として第1面及び第2面を有する冷却器と、所定の溶融温度で溶融する第1接合材により第1半導体チップが接合されると共に、上記冷却器の第1面に接合される第1基板と、上記第1接合材と溶融温度が異なる第2接合材により第2半導体チップが接合されると共に上記冷却器の第2面に接合される第2基板とを備え、上記第1半導体チップは、上記第2半導体チップよりも発熱量が大きく、上記第1接合材は、上記第2接合材より熱伝導率が高く設定される、という構成を採用する。   In order to achieve the above object, according to the present invention, as a first means, a cooler having a first surface and a second surface as heat transfer surfaces, and a first bonding material that melts at a predetermined melting temperature, the first semiconductor While the chip is bonded, the second substrate is bonded by the first substrate bonded to the first surface of the cooler, and the second bonding material having a melting temperature different from that of the first bonding material, and the cooler. A second substrate bonded to the second surface, wherein the first semiconductor chip generates a larger amount of heat than the second semiconductor chip, and the first bonding material has a thermal conductivity higher than that of the second bonding material. A configuration is adopted in which is set high.

第2の手段として、上記第1の手段において、上記第1接合材は、銀焼結材であり、上記第2接合材は、ハンダである、という構成を採用する。   As the second means, in the first means, the first bonding material is a silver sintered material, and the second bonding material is a solder.

本発明によれば、第1接合材と、第2接合材とで溶融温度が異なっている。先に、一方の伝熱面において溶融温度が高い方の接合材を用いて基板を冷却器に接合し、次に、他方の伝熱面において溶融温度が低い方の接合材を用いて基板を冷却器に接合することにより、溶融温度が低い方の接合材による接合工程において、溶融温度が高い方の接合材が再溶融することがない。   According to the present invention, the melting temperature is different between the first bonding material and the second bonding material. First, the substrate is bonded to the cooler using a bonding material having a higher melting temperature on one heat transfer surface, and then the substrate is bonded using a bonding material having a lower melting temperature on the other heat transfer surface. By bonding to the cooler, the bonding material having the higher melting temperature is not re-melted in the bonding process using the bonding material having the lower melting temperature.

本発明の一実施形態に係るパワー半導体モジュールが備える電力変換装置の断面を示す模式図である。It is a mimetic diagram showing the section of the power converter with which the power semiconductor module concerning one embodiment of the present invention is provided.

以下、図面を参照して、本発明の一実施形態に係るパワー半導体モジュールの一実施形態について説明する。なお、以下の図面において、各部材を認識可能な大きさとするために、各部材の縮尺を適宜変更している。図1は、本実施形態に係るパワー半導体モジュールが備える電力変換装置1の断面を示す模式図である。   Hereinafter, an embodiment of a power semiconductor module according to an embodiment of the present invention will be described with reference to the drawings. In the following drawings, the scale of each member is appropriately changed in order to make each member a recognizable size. FIG. 1 is a schematic diagram illustrating a cross section of a power conversion device 1 included in the power semiconductor module according to the present embodiment.

本実施形態におけるパワー半導体モジュールは、電力変換装置1を備えている。電力変換装置1は、図1に示すように、冷却器2と、第1電子基板ユニット3と、第2電子基板ユニット4とを備えている。
冷却器2は、天板部2aと、天板部2aに対向する底板部2bと、天板部2aと底板部2bとの間に設けられる放熱部2cとを有している。放熱部2cは、天板部2a及び底板部2bに垂直となるように複数の放熱フィンが立設されており、放熱フィンの間を水が通過することにより、放熱フィンの表面から熱を逃がしている。冷却器2は、第1電子基板ユニット3及び第2電子基板ユニット4の熱を放熱フィンから放熱することにより、第1電子基板ユニット3及び第2電子基板ユニット4を冷却する水冷ジャケットである。
The power semiconductor module in the present embodiment includes a power conversion device 1. As shown in FIG. 1, the power conversion device 1 includes a cooler 2, a first electronic board unit 3, and a second electronic board unit 4.
The cooler 2 includes a top plate portion 2a, a bottom plate portion 2b facing the top plate portion 2a, and a heat radiating portion 2c provided between the top plate portion 2a and the bottom plate portion 2b. The heat radiating part 2c is provided with a plurality of heat radiating fins so as to be perpendicular to the top plate part 2a and the bottom plate part 2b. ing. The cooler 2 is a water cooling jacket that cools the first electronic board unit 3 and the second electronic board unit 4 by radiating the heat of the first electronic board unit 3 and the second electronic board unit 4 from the radiation fins.

第1電子基板ユニット3は、冷却器2の伝熱面である天板部2aの外面(第1面)に複数(本実施形態においては3つ)設けられ、第1基板3aと、第1半導体チップ3bと、銀焼結材接合層3c(第1接合材)とを備えている。第1基板3aは、第1半導体チップ3bが実装された絶縁基板であり、冷却器2の天板部2aの外面に銀焼結材接合層3cにより接合されている。また、第1基板3aには、銀焼結材接合層3cとの間に、両面において導電部材3dが設けられている。導電部材3dは、銀焼結材接合層3cを第1基板3aに定着させるために設けられる。   A plurality (three in this embodiment) of first electronic board units 3 are provided on the outer surface (first surface) of the top plate portion 2a, which is the heat transfer surface of the cooler 2, and the first board 3a, A semiconductor chip 3b and a silver sintered material bonding layer 3c (first bonding material) are provided. The first substrate 3a is an insulating substrate on which the first semiconductor chip 3b is mounted, and is bonded to the outer surface of the top plate portion 2a of the cooler 2 by a silver sintered material bonding layer 3c. The first substrate 3a is provided with conductive members 3d on both sides between the silver sintered material bonding layer 3c. The conductive member 3d is provided to fix the silver sintered material bonding layer 3c to the first substrate 3a.

第1半導体チップ3bは、銀焼結材接合層3cにより、第1基板3aにおける冷却器2と接合される面と対向する面に実装されており、通電時において最高約140℃程度で発熱する。銀焼結材接合層3cは、銀の微粒粉を約300℃で焼成することにより溶融させ、さらに溶融した銀の微粒粉を冷却して固化させたものである。なお、銀焼結材接合層3cは、再溶融する温度が約960℃とされ、熱伝導率が約420W/m・Kとされている。   The first semiconductor chip 3b is mounted on the surface of the first substrate 3a opposite to the surface to be bonded to the cooler 2 by the silver sintered material bonding layer 3c, and generates heat at a maximum of about 140 ° C. when energized. . The silver sintered material bonding layer 3c is obtained by melting silver fine powder by firing at about 300 ° C., and further cooling and solidifying the molten silver fine powder. The sintered silver bonding layer 3c has a remelting temperature of about 960 ° C. and a thermal conductivity of about 420 W / m · K.

第2電子基板ユニット4は、冷却器2の伝熱面である底板部2bの外面(第2面)に複数(本実施形態においては3つ)設けられ、第2基板4aと、第2半導体チップ4bと、ハンダ接合層4c(第2接合材)とを備えている。第2基板4aは、第2半導体チップ4bが実装された絶縁基板であり、冷却器2の底板部2bの外面にハンダ接合層4cにより接合されている。また、第2基板4aには、ハンダ接合層4cとの間に、両面において導電部材4dが設けられている。導電部材4dは、ハンダ接合層4cを第2基板4aに定着させるために設けられる。   A plurality (three in the present embodiment) of the second electronic substrate unit 4 are provided on the outer surface (second surface) of the bottom plate portion 2b that is the heat transfer surface of the cooler 2, and the second substrate 4a and the second semiconductor are provided. A chip 4b and a solder bonding layer 4c (second bonding material) are provided. The second substrate 4a is an insulating substrate on which the second semiconductor chip 4b is mounted, and is bonded to the outer surface of the bottom plate portion 2b of the cooler 2 by a solder bonding layer 4c. The second substrate 4a is provided with conductive members 4d on both sides between the solder bonding layer 4c. The conductive member 4d is provided to fix the solder bonding layer 4c to the second substrate 4a.

第2半導体チップ4bは、ハンダ接合層4cにより、第2基板4aにおける冷却器2と接合される面と対向する面に実装されており、通電時において最高約110℃程度で発熱する。ハンダ接合層4cは、溶融する温度及び再溶融温度が約270℃とされ、熱伝導率が約62W/m・Kとされている。   The second semiconductor chip 4b is mounted on the surface of the second substrate 4a opposite to the surface bonded to the cooler 2 by the solder bonding layer 4c, and generates heat at a maximum of about 110 ° C. when energized. The solder bonding layer 4c has a melting temperature and a remelting temperature of about 270 ° C., and a thermal conductivity of about 62 W / m · K.

すなわち、第1半導体チップ3bは、第2半導体チップ4bよりも発熱時の最高温度が高く、発熱量が大きい。また、銀焼結材接合層3cは、ハンダ接合層4cよりも熱伝導率が高く、さらに再溶融温度がハンダ接合層4cの溶融温度よりも高い。   That is, the first semiconductor chip 3b has a higher maximum temperature during heat generation and a larger amount of heat generation than the second semiconductor chip 4b. Further, the silver sintered material bonding layer 3c has a higher thermal conductivity than the solder bonding layer 4c, and the remelting temperature is higher than the melting temperature of the solder bonding layer 4c.

このような本実施形態における電力変換装置1における第1電子基板ユニット3及び第2電子基板ユニット4と冷却器2との組み付け方法を説明する。
まず、冷却器2の天板部2aにおいて、第1電子基板ユニット3の取り付け作業が行われる。具体的には、第1基板3aに設けられた導電部材3dと冷却器2の天板部2aとの間に、銀ナノ粒子が配置される。そして、銀ナノ粒子は、導電部材3d及び冷却器2の天板部2aを介して加熱及び加圧されることで、表面の皮膜が除去され、粒子同士が接触する。さらに、銀ナノ粒子は、約300℃程度で焼結されることで、粒子同士が溶融して結合し、導電部材3d及び天板部2aに溶着することで、導電部材3dと天板部2aとの間に銀焼結材接合層3cを形成する。
A method of assembling the first electronic board unit 3 and the second electronic board unit 4 and the cooler 2 in the power conversion device 1 in this embodiment will be described.
First, in the top plate portion 2a of the cooler 2, the first electronic board unit 3 is attached. Specifically, silver nanoparticles are disposed between the conductive member 3 d provided on the first substrate 3 a and the top plate portion 2 a of the cooler 2. The silver nanoparticles are heated and pressurized through the conductive member 3d and the top plate portion 2a of the cooler 2, whereby the surface film is removed and the particles come into contact with each other. Further, the silver nanoparticles are sintered at about 300 ° C., so that the particles are melted and bonded to each other and welded to the conductive member 3d and the top plate portion 2a, so that the conductive member 3d and the top plate portion 2a are bonded. The silver sintered material bonding layer 3c is formed between the two.

次に、冷却器2の底板部2bにおいて、第2電子基板ユニット4の取り付け作業が行われる。具体的には、第2基板4aに設けられた導電部材4dと冷却器2の底板部2bとの間にハンダが配置される。さらに、該ハンダは、不図示の加熱炉により約270℃程度で加熱されることで溶融し、導電部材4d及び冷却器2の底板部2bに密着した状態で固化することで、導電部材4dと冷却器2の底板部2bとの間にハンダ接合層4cを形成する。この際、加熱炉の熱と、加熱炉から冷却器2の底板部2bに加えられた熱とが天板部2a側へと伝わるものの、天板部2a側の銀焼結材接合層3cが、その再溶融温度である約960℃程度まで上昇することはなく、天板部2aの銀焼結材接合層3cが再溶融することはない。   Next, the mounting operation of the second electronic board unit 4 is performed on the bottom plate portion 2 b of the cooler 2. Specifically, solder is disposed between the conductive member 4 d provided on the second substrate 4 a and the bottom plate portion 2 b of the cooler 2. Further, the solder is melted by being heated at about 270 ° C. by a heating furnace (not shown), and solidified while being in close contact with the conductive member 4d and the bottom plate portion 2b of the cooler 2, so that the conductive member 4d A solder bonding layer 4 c is formed between the bottom plate portion 2 b of the cooler 2. At this time, although the heat of the heating furnace and the heat applied from the heating furnace to the bottom plate portion 2b of the cooler 2 are transmitted to the top plate portion 2a side, the silver sintered material bonding layer 3c on the top plate portion 2a side The remelting temperature does not increase to about 960 ° C., and the silver sintered material bonding layer 3c of the top plate portion 2a does not remelt.

本実施形態によれば、銀焼結材接合層3cは、ハンダ接合層4cよりも溶融温度及び再溶融温度が高く設定されている。これにより、第2電子基板ユニット4の冷却器2への接合作業によって、銀焼結材接合層3cが再溶融することがない。   According to the present embodiment, the silver sintered material bonding layer 3c is set to have a higher melting temperature and remelting temperature than the solder bonding layer 4c. Thereby, the silver sintered material joining layer 3c is not remelted by the joining operation of the second electronic substrate unit 4 to the cooler 2.

さらに、本実施形態によれば、銀焼結材接合層3cは、ハンダ接合層4cよりも熱伝導率が高い。また、第1半導体チップ3bは、第2半導体チップ4bよりも発熱温度が高い。したがって、第1半導体チップ3bの高い発熱量を銀焼結材接合層3cにより効率的に冷却器2へと伝えることができ、第1半導体チップ3bを効率よく冷却することができ、第1半導体チップ3bが過熱することを防止できる。   Furthermore, according to the present embodiment, the silver sintered material bonding layer 3c has a higher thermal conductivity than the solder bonding layer 4c. The first semiconductor chip 3b has a heat generation temperature higher than that of the second semiconductor chip 4b. Therefore, the high calorific value of the first semiconductor chip 3b can be efficiently transmitted to the cooler 2 by the silver sintered material bonding layer 3c, and the first semiconductor chip 3b can be efficiently cooled. The chip 3b can be prevented from overheating.

以上、図面を参照しながら本発明の好適な実施形態について説明したが、本発明は上記実施形態に限定されるものではない。上述した実施形態において示した各構成部材の諸形状や組み合わせ等は一例であって、本発明の趣旨から逸脱しない範囲において設計要求等に基づき種々変更可能である。   As mentioned above, although preferred embodiment of this invention was described referring drawings, this invention is not limited to the said embodiment. Various shapes, combinations, and the like of the constituent members shown in the above-described embodiments are examples, and various modifications can be made based on design requirements and the like without departing from the spirit of the present invention.

上記実施形態においては、第1電子基板ユニット3及び第2電子基板ユニット4は、それぞれ3個ずつ冷却器2に接合される構成としたが、本発明はこれに限定されない。第1電子基板ユニット3及び第2電子基板ユニット4は、4個以上または2個以下としてもよい。   In the above embodiment, the first electronic board unit 3 and the second electronic board unit 4 are each joined to the cooler 2 by three, but the present invention is not limited to this. The first electronic board unit 3 and the second electronic board unit 4 may be four or more or two or less.

1……電力変換装置、2……冷却器、3……第1電子基板ユニット、3a……第1基板、3b……第1半導体チップ、3c……銀焼結材接合層、4……第2電子基板ユニット、4a……第2基板、4b……第2半導体チップ、4c……ハンダ接合層 DESCRIPTION OF SYMBOLS 1 ... Power converter device, 2 ... Cooler, 3 ... 1st electronic board unit, 3a ... 1st board | substrate, 3b ... 1st semiconductor chip, 3c ... Silver sintered-material joining layer, 4 ... Second electronic substrate unit, 4a... Second substrate, 4b... Second semiconductor chip, 4c.

Claims (2)

伝熱面として第1面及び第2面を有する冷却器と、
所定の溶融温度で溶融する第1接合材により第1半導体チップが接合されると共に、前記冷却器の第1面に接合される第1基板と、
前記第1接合材と溶融温度が異なる第2接合材により第2半導体チップが接合されると共に前記冷却器の第2面に接合される第2基板と
を備え、
前記第1半導体チップは、前記第2半導体チップよりも発熱量が大きく、
前記第1接合材は、前記第2接合材より熱伝導率が高く設定される
ことを特徴とするパワー半導体モジュール。
A cooler having a first surface and a second surface as heat transfer surfaces;
A first substrate bonded to the first surface of the cooler and bonded to the first semiconductor chip by a first bonding material that melts at a predetermined melting temperature;
A second substrate bonded to the second surface of the cooler and a second semiconductor chip bonded by a second bonding material having a melting temperature different from that of the first bonding material;
The first semiconductor chip generates a larger amount of heat than the second semiconductor chip,
The power semiconductor module, wherein the first bonding material is set to have a higher thermal conductivity than the second bonding material.
前記第1接合材は、銀焼結材であり、
前記第2接合材は、ハンダである
ことを特徴とする請求項1記載のパワー半導体モジュール。
The first bonding material is a silver sintered material,
The power semiconductor module according to claim 1, wherein the second bonding material is solder.
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