JP2017504784A5 - - Google Patents

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JP2017504784A5
JP2017504784A5 JP2016524589A JP2016524589A JP2017504784A5 JP 2017504784 A5 JP2017504784 A5 JP 2017504784A5 JP 2016524589 A JP2016524589 A JP 2016524589A JP 2016524589 A JP2016524589 A JP 2016524589A JP 2017504784 A5 JP2017504784 A5 JP 2017504784A5
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loop
electrical characteristic
determining
conductive loops
deviation
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JP2016524589A
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Japanese (ja)
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JP2017504784A (ja
JP6514195B2 (ja
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Priority claimed from US14/218,516 external-priority patent/US9921045B2/en
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JP2016524589A 2013-10-22 2014-10-17 外来オブジェクト検出ループアレイ感度の向上のためのシステム、方法、および装置 Active JP6514195B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201361894313P 2013-10-22 2013-10-22
US61/894,313 2013-10-22
US14/218,516 2014-03-18
US14/218,516 US9921045B2 (en) 2013-10-22 2014-03-18 Systems, methods, and apparatus for increased foreign object detection loop array sensitivity
PCT/US2014/061190 WO2015061178A1 (en) 2013-10-22 2014-10-17 Systems, methods, and apparatus for increased foreign object detection loop array sensitivity

Publications (3)

Publication Number Publication Date
JP2017504784A JP2017504784A (ja) 2017-02-09
JP2017504784A5 true JP2017504784A5 (enExample) 2017-11-16
JP6514195B2 JP6514195B2 (ja) 2019-05-15

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JP2016524589A Active JP6514195B2 (ja) 2013-10-22 2014-10-17 外来オブジェクト検出ループアレイ感度の向上のためのシステム、方法、および装置

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US (1) US9921045B2 (enExample)
EP (1) EP3044845B1 (enExample)
JP (1) JP6514195B2 (enExample)
CN (1) CN105637729B (enExample)
WO (1) WO2015061178A1 (enExample)

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