JP2017501034A5 - - Google Patents

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Publication number
JP2017501034A5
JP2017501034A5 JP2016552398A JP2016552398A JP2017501034A5 JP 2017501034 A5 JP2017501034 A5 JP 2017501034A5 JP 2016552398 A JP2016552398 A JP 2016552398A JP 2016552398 A JP2016552398 A JP 2016552398A JP 2017501034 A5 JP2017501034 A5 JP 2017501034A5
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JP
Japan
Prior art keywords
needle
needles
displaced
cleaning chamber
another embodiment
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JP2016552398A
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English (en)
Japanese (ja)
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JP2017501034A (ja
JP6505731B2 (ja
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Priority claimed from NL2011710A external-priority patent/NL2011710C2/en
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Publication of JP2017501034A publication Critical patent/JP2017501034A/ja
Publication of JP2017501034A5 publication Critical patent/JP2017501034A5/ja
Application granted granted Critical
Publication of JP6505731B2 publication Critical patent/JP6505731B2/ja
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JP2016552398A 2013-10-31 2014-10-29 測定プローブの針を洗浄するための装置 Active JP6505731B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
NL2011710 2013-10-31
NL2011710A NL2011710C2 (en) 2013-10-31 2013-10-31 Device for cleaning a stylus of a measuring probe.
PCT/NL2014/050749 WO2015065183A1 (en) 2013-10-31 2014-10-29 Device for cleaning a stylus of a measuring probe

Publications (3)

Publication Number Publication Date
JP2017501034A JP2017501034A (ja) 2017-01-12
JP2017501034A5 true JP2017501034A5 (enExample) 2017-09-28
JP6505731B2 JP6505731B2 (ja) 2019-04-24

Family

ID=50031466

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016552398A Active JP6505731B2 (ja) 2013-10-31 2014-10-29 測定プローブの針を洗浄するための装置

Country Status (10)

Country Link
US (1) US10232411B2 (enExample)
EP (1) EP3062938B1 (enExample)
JP (1) JP6505731B2 (enExample)
CN (2) CN105792950B (enExample)
BR (1) BR112016009520B1 (enExample)
ES (1) ES2935195T3 (enExample)
MX (1) MX2016005435A (enExample)
NL (1) NL2011710C2 (enExample)
PL (1) PL3062938T3 (enExample)
WO (1) WO2015065183A1 (enExample)

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CN108700610B (zh) * 2016-02-24 2022-09-27 株式会社日立高新技术 自动分析装置及清洗方法
GB2550549B (en) 2016-05-09 2019-05-08 Markes International Ltd A sampling apparatus
GB2550548A (en) * 2016-05-09 2017-11-29 Markes International Ltd A sampling apparatus
WO2017197025A1 (en) 2016-05-11 2017-11-16 Siemens Healthcare Diagnostics Inc. Probe wash station for analytical instrumentation
CN107030061B (zh) * 2017-04-06 2019-07-23 武汉华星光电技术有限公司 探针清洗装置及探针清洗方法
CN108931415B (zh) * 2017-05-23 2021-02-19 北京诚智光辉科技有限公司 带有清洗机构的细胞制片染色一体机
CN108508061A (zh) * 2018-03-09 2018-09-07 上海宝钢工业技术服务有限公司 钢板在线力学性能检测系统及方法
CN109622482B (zh) * 2018-11-13 2021-10-01 迪瑞医疗科技股份有限公司 生化分析仪的探针清洗槽、生化分析仪及探针清洗方法
DE102019212768B3 (de) * 2019-08-26 2020-11-05 Carl Zeiss Industrielle Messtechnik Gmbh Tasterreinigung bei Koordinatenmessgeräten
AU2021265270A1 (en) * 2020-05-01 2022-11-03 Agilent Technologies, Inc. Pipette tip washing devices and methods
CN114472252B (zh) * 2020-11-28 2023-03-24 法特迪精密科技(苏州)有限公司 测试探针清洁方法的探针固定方法
CN113061835A (zh) * 2021-03-24 2021-07-02 鑫光热处理工业(昆山)有限公司 一种热处理炉内氮势监控装置
CN112845230B (zh) * 2021-04-23 2022-02-08 南京摆渡人网络信息技术有限公司 一种农业大棚监控装置
CN113189165B (zh) * 2021-06-03 2024-03-01 南京普来森仪器有限公司 一种利用电化学原理测量铝酸钠成分的装置
CN118491916B (zh) * 2024-07-19 2024-09-17 泰州市成兴环境检测技术有限公司 一种土壤检测仪辅助清洁装置及其使用方法

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JPS55140155A (en) * 1979-04-19 1980-11-01 Olympus Optical Co Ltd Distribution device
JPS62242858A (ja) * 1986-04-15 1987-10-23 Nippon Tectron Co Ltd プロ−ブの洗浄装置
JP3225441B2 (ja) 1991-04-23 2001-11-05 東京エレクトロン株式会社 処理装置
JP3395381B2 (ja) 1994-07-27 2003-04-14 石川島播磨重工業株式会社 構造物の3次元計測装置
US5603342A (en) * 1995-06-29 1997-02-18 Coulter Corporation Apparatus for cleaning a fluid sample probe
DE19610607A1 (de) * 1996-03-18 1997-09-25 Boehringer Mannheim Gmbh Vorrichtung zur Reinigung von Pipettiernadeln oder Rührern
JP4197421B2 (ja) 2001-10-09 2008-12-17 株式会社Adeka 洗浄装置、該装置を使用した洗浄方法
KR20080095310A (ko) * 2001-11-02 2008-10-28 어플라이드 머티어리얼스, 인코포레이티드 미세 전자 소자의 세정 방법
DE10207499A1 (de) * 2002-02-22 2003-09-25 Evotec Ag Verfahren zum Reinigen von Fluidabgabeeinrichtungen und Reinigungsvorrichtung
JP2004325117A (ja) 2003-04-22 2004-11-18 Olympus Corp 液体分注装置および分注ヘッドの洗浄方法
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JP4557848B2 (ja) 2005-09-13 2010-10-06 キヤノン株式会社 形状測定方法および形状測定装置
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JP2009042067A (ja) 2007-08-09 2009-02-26 Hitachi High-Technologies Corp 自動分析装置
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JP2010133727A (ja) * 2008-12-02 2010-06-17 Beckman Coulter Inc 洗浄機構、洗浄方法及び分析装置
DE102008061444B4 (de) 2008-12-10 2014-07-03 Mag Ias Gmbh Drehmaschine mit einer Messvorrichtung und Verfahren zum Vermessen eines Werkstückes auf solch einer Drehmaschine
WO2011053756A1 (en) * 2009-10-30 2011-05-05 Douglas Machine Inc. Apparatus and methods for cleaning reagent dispensing tips of a screening unit
US9063107B2 (en) 2009-11-20 2015-06-23 Siemens Healthcare Diagnostics Inc. Apparatus, systems, and methods adapted to rinse and dry clinical analyzer sample probes
JP5686744B2 (ja) * 2010-01-13 2015-03-18 株式会社日立ハイテクノロジーズ 自動分析装置
WO2011093347A1 (ja) * 2010-01-29 2011-08-04 株式会社日立ハイテクノロジーズ 自動分析装置
CN202366900U (zh) * 2011-12-16 2012-08-08 长春迪瑞医疗科技股份有限公司 全自动尿液分析仪清洗池
JP2013134142A (ja) * 2011-12-26 2013-07-08 Hitachi High-Technologies Corp 自動分析装置
CN202527417U (zh) * 2012-03-22 2012-11-14 北京京东方光电科技有限公司 一种非接触式清洗装置
CN202700869U (zh) * 2012-06-30 2013-01-30 长春迪瑞医疗科技股份有限公司 探针清洗机构

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