JP2017228730A - Wiring board, electronic apparatus, and electronic module - Google Patents

Wiring board, electronic apparatus, and electronic module Download PDF

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JP2017228730A
JP2017228730A JP2016125650A JP2016125650A JP2017228730A JP 2017228730 A JP2017228730 A JP 2017228730A JP 2016125650 A JP2016125650 A JP 2016125650A JP 2016125650 A JP2016125650 A JP 2016125650A JP 2017228730 A JP2017228730 A JP 2017228730A
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conductor
recess
metal layer
wiring board
view
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JP6737646B2 (en
Inventor
和人 村田
Kazuto Murata
和人 村田
道生 篠▲崎▼
Michio Shinozaki
道生 篠▲崎▼
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Kyocera Corp
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Kyocera Corp
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161Disposition
    • H01L2224/16151Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/491Disposition
    • H01L2224/4912Layout
    • H01L2224/49171Fan-out arrangements

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  • Structure Of Printed Boards (AREA)
  • Production Of Multi-Layered Print Wiring Board (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a wiring board, an electronic apparatus, and an electronic module excellent in long-term reliability.SOLUTION: A wiring board 1 comprises: an insulating substrate 11 rectangular in a plan view that has, on a principal surface, a concave part 12 in which an electronic component 2 is mounted; a frame-like metal layer 13 that is provided on a lateral wall of the concave part 12; and a through conductor group 14G that includes a plurality of through conductors 14 arranged to be covered by the metal layer 13 in a plan perspective view. The metal layer 13 and the through conductor group 14G are separated; the metal layer 13 and the through conductor group 14G do not have another through conductor therebetween in a thickness direction of the insulating substrate 11; the through conductor group 14G is provided along the lateral wall of the concave part 12 in a plan perspective view.SELECTED DRAWING: Figure 3

Description

本発明は、配線基板、電子装置および電子モジュールに関するものである。   The present invention relates to a wiring board, an electronic device, and an electronic module.

従来、セラミックスからなる絶縁基板の主面に電子部品を搭載する配線基板および電子装置が知られている(例えば、特許文献1参照。)。   Conventionally, a wiring board and an electronic device in which an electronic component is mounted on a main surface of an insulating substrate made of ceramics are known (for example, see Patent Document 1).

このような配線基板において、絶縁基板は、上面に電子部品をそれぞれ収納して搭載する凹部を有しており、凹部の周囲に枠状の金属層を有している。   In such a wiring substrate, the insulating substrate has a recess for storing and mounting electronic components on the upper surface, and has a frame-shaped metal layer around the recess.

特開2015-039133号公報JP 2015-039133

しかしながら、近年は、電子装置の高機能化および小型化が進んでいる。これにより、凹部周囲の側壁の幅が小さく、凹部の側壁の角部に挟まれた凹部の側壁が変形しやすいものとなっており、例えば製作工程における積層時または切断時等の応力によって、凹部の側壁における上面が、絶縁基板の外縁に沿って厚み方向で凹形状に反ってしまい、枠状の金属層に蓋体や枠体を接合する際に、凹部内の気密性が低下することが懸念される。   However, in recent years, electronic devices have been improved in function and size. As a result, the width of the sidewalls around the recesses is small, and the sidewalls of the recesses sandwiched between the corners of the sidewalls of the recesses are likely to be deformed. The upper surface of the side wall of the substrate warps in a concave shape in the thickness direction along the outer edge of the insulating substrate, and when the lid or frame is joined to the frame-shaped metal layer, the airtightness in the recess may be reduced. Concerned.

本発明の一つの態様によれば、配線基板は、主面に電子部品を搭載する凹部を有する、平面視で矩形状の絶縁基板と、前記凹部の側壁上に設けられた枠状の金属層と、平面透視で前記金属層に覆われるように配置された複数の貫通導体を含む貫通導体群とを有しており、前記金属層と前記貫通導体群とが離れており、前記絶縁基板の厚み方向において前記金属層と前記貫通導体群との間に他の貫通導体を有しておらず、平面透視で前記貫通導体群が前記凹部の側壁に沿って設けられている。   According to one aspect of the present invention, a wiring board has a concave portion for mounting an electronic component on a main surface, a rectangular insulating substrate in a plan view, and a frame-shaped metal layer provided on a side wall of the concave portion. And a through conductor group including a plurality of through conductors arranged so as to be covered with the metal layer in a plan view, the metal layer and the through conductor group are separated from each other, and the insulating substrate There is no other through conductor between the metal layer and the through conductor group in the thickness direction, and the through conductor group is provided along the side wall of the recess in a plan view.

本発明の一つの態様によれば、電子装置は、上記構成の配線基板と、前記凹部に搭載された電子部品とを有する。   According to one aspect of the present invention, an electronic device includes the wiring board configured as described above and an electronic component mounted in the recess.

本発明の一つの態様によれば、電子モジュールは、接続パッドを有するモジュール用基板と、接続パッドにはんだを介して前記外部電極に接続された上記構成の電子装置とを有する。   According to one aspect of the present invention, an electronic module includes a module substrate having a connection pad, and the electronic device configured as described above connected to the external electrode via solder on the connection pad.

本発明の一つの態様による配線基板において、主面に電子部品を搭載する凹部を有する、平面視で矩形状の絶縁基板と、凹部の側壁上に設けられた枠状の金属層と、平面透視で金属層に覆われるように配置された複数の貫通導体を含む貫通導体群とを有しており、金属層と貫通導体群とが離れており、絶縁基板の厚み方向において金属層と貫通導体群との間に他の貫通導体を有しておらず、平面透視で貫通導体群が凹部の側壁に沿って設けられている。上記構成により、絶縁基板の内部に配置された貫通導体が凹部の側壁を保持することにより、例えば製作工程における積層時または切断時等の応力により、凹部の側壁における上面が、絶縁基板の外縁に沿って厚み方向で凹形状となるのを抑制することができ、枠状の金属層と蓋体または枠体との接合を良好なものとし、凹部内の気密性を良好なも
のとすることができる。
In a wiring board according to one aspect of the present invention, a rectangular insulating substrate having a recess for mounting an electronic component on a main surface thereof, a frame-shaped metal layer provided on a side wall of the recess, and a plane see-through A through conductor group including a plurality of through conductors arranged so as to be covered with the metal layer, the metal layer and the through conductor group are separated from each other, and the metal layer and the through conductor in the thickness direction of the insulating substrate There are no other through conductors between the groups, and the through conductor groups are provided along the side walls of the recesses in a plan view. With the above configuration, the through conductor disposed inside the insulating substrate holds the side wall of the recess, so that the upper surface of the side wall of the recess becomes the outer edge of the insulating substrate, for example, due to stress during lamination or cutting in the manufacturing process. It is possible to suppress the concave shape in the thickness direction along the frame, to improve the bonding between the frame-shaped metal layer and the lid or the frame, and to improve the airtightness in the recess. it can.

本発明の一つの態様による電子装置において、上記構成の配線基板と、凹部に搭載された電子部品とを有することによって、気密性に優れた長期信頼性に優れた電子装置とすることができる。   In the electronic device according to one aspect of the present invention, by including the wiring board having the above-described configuration and the electronic component mounted in the recess, an electronic device having excellent airtightness and excellent long-term reliability can be obtained.

本発明の一つの態様による電子モジュールにおいて、接続パッドを有するモジュール用基板と、接続パッドにはんだを介して外部電極に接続された上記構成の電子装置とを有することによって、長期信頼性に優れたものとすることができる。   The electronic module according to one aspect of the present invention has excellent long-term reliability by including a module substrate having a connection pad and the electronic device having the above-described configuration connected to the external electrode via solder on the connection pad. Can be.

(a)は本発明の第1の実施形態における電子装置を示す上面図であり、(b)は(a)の下面図である。(A) is a top view which shows the electronic device in the 1st Embodiment of this invention, (b) is a bottom view of (a). 図1における配線基板の貫通導体を示す内部上面図である。It is an internal top view which shows the through conductor of the wiring board in FIG. (a)は、図1(a)に示した電子装置のA−A線における縦断面図であり、(b)は、B−B線における縦断面図である。(A) is a longitudinal cross-sectional view in the AA line of the electronic device shown to Fig.1 (a), (b) is a longitudinal cross-sectional view in the BB line. 図3に示した電子装置のC部における要部拡大断面図である。FIG. 4 is an enlarged cross-sectional view of a main part in part C of the electronic device shown in FIG. 3. (a)は本発明の第2の実施形態における電子装置を示す上面図であり、(b)は(a)の下面図である。(A) is a top view which shows the electronic device in the 2nd Embodiment of this invention, (b) is a bottom view of (a). (a)は、図5における配線基板の貫通導体を示す内部上面図であり、(b)は、(a)のD部における要部拡大断面図である。(A) is an internal top view which shows the penetration conductor of the wiring board in FIG. 5, (b) is a principal part expanded sectional view in the D section of (a). 図5(a)に示した電子装置のA−A線における縦断面図である。It is a longitudinal cross-sectional view in the AA line of the electronic device shown to Fig.5 (a). (a)は本発明の第3の実施形態における電子装置を示す上面図であり、(b)は(a)の下面図である。(A) is a top view which shows the electronic device in the 3rd Embodiment of this invention, (b) is a bottom view of (a). 図8における配線基板の貫通導体を示す内部上面図である。It is an internal top view which shows the through conductor of the wiring board in FIG. (a)は、図8(a)に示した電子装置のA−A線における縦断面図であり、(b)は、B−B線における縦断面図である。(A) is a longitudinal cross-sectional view in the AA line of the electronic device shown to Fig.8 (a), (b) is a longitudinal cross-sectional view in the BB line.

本発明のいくつかの例示的な実施形態について、添付の図面を参照しつつ説明する。   Several exemplary embodiments of the present invention will be described with reference to the accompanying drawings.

(第1の実施形態)
本発明の第1の実施形態における電子装置は、図1〜図4に示すように、配線基板1と、配線基板1の凹部12に搭載された電子部品2とを含んでいる。電子装置は、図4に示すように、例えば電子モジュールを構成するモジュール用基板5上にはんだ6を用いて接続される。
(First embodiment)
As shown in FIGS. 1 to 4, the electronic device according to the first embodiment of the present invention includes a wiring board 1 and an electronic component 2 mounted in a recess 12 of the wiring board 1. As shown in FIG. 4, the electronic device is connected to the module substrate 5 constituting the electronic module using solder 6, for example.

本実施形態における配線基板1は、主面に電子部品2を搭載する凹部12を有する、平面視で矩形状の絶縁基板11と、凹部12の側壁上に設けられた枠状の金属層13と、平面透視で金属層13に覆われるように配置された複数の貫通導体14を含む貫通導体群14Gとを有している。金属層13と貫通導体群14Gとが離れており、絶縁基板11の厚み方向において金属層13と貫通導体群14Gとの間に他の貫通導体を有しておらず、平面透視で貫通導体群14Gが凹部12の側壁に沿って設けられている。絶縁基板11は、表面および内部に配線導体15を有している。図1〜図4において、上方向とは、仮想のz軸の正方向のことをいう。なお、以下の説明における上下の区別は便宜的なものであり、実際に配線基板1等が使用される際の上下を限定するものではない。   The wiring substrate 1 in the present embodiment has a concave insulating portion 12 for mounting the electronic component 2 on the main surface, a rectangular insulating substrate 11 in plan view, and a frame-shaped metal layer 13 provided on the side wall of the concave portion 12. And a through conductor group 14G including a plurality of through conductors 14 arranged so as to be covered with the metal layer 13 in a plan view. The metal layer 13 and the through conductor group 14G are separated from each other, and there is no other through conductor between the metal layer 13 and the through conductor group 14G in the thickness direction of the insulating substrate 11. 14G is provided along the side wall of the recess 12. The insulating substrate 11 has a wiring conductor 15 on the surface and inside. 1-4, the upward direction means the positive direction of the virtual z-axis. In addition, the upper and lower distinction in the following description is for convenience, and does not limit the upper and lower when the wiring board 1 or the like is actually used.

また、図1および図2に示す例において、平面透視において、金属層13または貫通導体14が重なる領域を点線にて示している。図1においては、平面透視において、貫通導体14が重なる領域を点線にて示し、図2においては、平面透視において、金属層13が重なる領
域を点線にて示している。
Further, in the example shown in FIGS. 1 and 2, a region where the metal layer 13 or the through conductor 14 overlap is shown by a dotted line in a plan view. In FIG. 1, a region where the through conductors 14 overlap with each other in a plan view is indicated by a dotted line, and in FIG. 2, a region where the metal layer 13 overlaps in a plan view is indicated by a dotted line.

絶縁基板11は、一方主面(図1〜図4では上面)および他方主面(図1〜図4では下面)と、側面とを有している。絶縁基板11は、複数の絶縁層11aからなり、主面に開口し、電子部品2を搭載する凹部12を有している。絶縁基板11は、平面視すなわち主面に垂直な方向から見ると矩形の板状の形状を有している。絶縁基板11は電子部品2を支持するための支持体として機能し、凹部12の底面の搭載部上に、電子部品2がはんだバンプ、金バンプまたは導電性樹脂(異方性導電樹脂等)、樹脂等の接続部材3を介して接着されて固定される。   The insulating substrate 11 has one main surface (upper surface in FIGS. 1 to 4), the other main surface (lower surface in FIGS. 1 to 4), and a side surface. The insulating substrate 11 is composed of a plurality of insulating layers 11a, and has an opening in the main surface and a recess 12 for mounting the electronic component 2. The insulating substrate 11 has a rectangular plate shape when seen from a plan view, that is, from a direction perpendicular to the main surface. The insulating substrate 11 functions as a support for supporting the electronic component 2. On the mounting portion on the bottom surface of the recess 12, the electronic component 2 is solder bump, gold bump or conductive resin (anisotropic conductive resin, etc.) It is bonded and fixed via a connecting member 3 such as resin.

絶縁基板11は、例えば、酸化アルミニウム質焼結体(アルミナセラミックス),窒化アルミニウム質焼結体,窒化珪素質焼結体、ムライト質焼結体またはガラスセラミックス焼結体等のセラミックスを用いることができる。絶縁基板11は、例えば酸化アルミニウム質焼結体である場合であれば、酸化アルミニウム(Al),酸化珪素(SiO),酸化マグネシウム(MgO),酸化カルシウム(CaO)等の原料粉末に適当な有機バインダーおよび溶剤等を添加混合して泥漿物を作製する。この泥漿物を、従来周知のドクターブレード法またはカレンダーロール法等を採用してシート状に成形することによってセラミックグリーンシートを作製する。次に、このセラミックグリーンシートに適当な打ち抜き加工を施すとともに、セラミックグリーンシートを複数枚積層して生成形体を形成し、この生成形体を高温(約1600℃)で焼成することによって絶縁基板11が製作される。 For the insulating substrate 11, for example, a ceramic such as an aluminum oxide sintered body (alumina ceramic), an aluminum nitride sintered body, a silicon nitride sintered body, a mullite sintered body, or a glass ceramic sintered body is used. it can. If the insulating substrate 11 is an aluminum oxide sintered body, for example, a raw material powder such as aluminum oxide (Al 2 O 3 ), silicon oxide (SiO 2 ), magnesium oxide (MgO), calcium oxide (CaO), etc. A suitable organic binder, a solvent, etc. are added and mixed to prepare a slurry. A ceramic green sheet is produced by forming this mud into a sheet using a conventionally known doctor blade method or calendar roll method. Next, an appropriate punching process is performed on the ceramic green sheet, and a plurality of ceramic green sheets are laminated to form a generated shape, and the generated shape is fired at a high temperature (about 1600 ° C.), whereby the insulating substrate 11 is formed. Produced.

凹部12は、図1および図2に示す例において、絶縁基板11の一方主面に設けられている。凹部12は、底面に電子部品2を搭載するためのものである。凹部12の底面には、電子部品2と電気的に接続するための金属層14が導出している。凹部12は、平面視において、角部が円弧状の矩形状であり、絶縁基板11の中央部に設けられている。図1〜図3に示す例
において、絶縁基板11は、4層の絶縁層11aから形成されており、凹部12は、一方主面側の1番目〜3番目の絶縁層11aに設けられている。
The recess 12 is provided on one main surface of the insulating substrate 11 in the example shown in FIGS. The recess 12 is for mounting the electronic component 2 on the bottom surface. A metal layer 14 for electrical connection with the electronic component 2 is led out from the bottom surface of the recess 12. The concave portion 12 has a rectangular shape with a circular arc shape in a plan view, and is provided in the central portion of the insulating substrate 11. In the example shown in FIGS. 1 to 3, the insulating substrate 11 is formed of four insulating layers 11a, and the recess 12 is provided in the first to third insulating layers 11a on the one main surface side. .

凹部12は、例えば、絶縁基板11用のセラミックグリーンシートのいくつかにレーザー加工や金型による打ち抜き加工等によって、凹部12となる貫通孔をそれぞれのセラミックグリーンシートに形成し、このセラミックグリーンシートを、貫通孔を形成していない他のセラミックグリーンシートに積層することで形成できる。   The recesses 12 are formed by forming through holes to be the recesses 12 in the respective ceramic green sheets by laser processing or punching with a mold in some of the ceramic green sheets for the insulating substrate 11, for example. It can be formed by laminating on another ceramic green sheet in which no through hole is formed.

絶縁基板11の表面および内部には、金属層13と、貫通導体14と、配線導体15とが設けられている。金属層13は、絶縁基板11の凹部12の側壁上に枠状に設けられている。枠状の金属層13は、配線基板1の上面に例えば金属製の蓋体または金属製の枠体等を接合するためのものである。配線導体15は、絶縁基板11の表面および内部に設けられている。配線導体15は、電子部品2とモジュール用基板5とを電気的に接続するためのものである。貫通導体14は、絶縁基板11の内部に設けられており、平面透視において金属層13に覆われるように配置されている。   On the surface and inside of the insulating substrate 11, a metal layer 13, a through conductor 14, and a wiring conductor 15 are provided. The metal layer 13 is provided in a frame shape on the side wall of the recess 12 of the insulating substrate 11. The frame-shaped metal layer 13 is for bonding, for example, a metal lid or a metal frame to the upper surface of the wiring board 1. The wiring conductor 15 is provided on the surface and inside of the insulating substrate 11. The wiring conductor 15 is for electrically connecting the electronic component 2 and the module substrate 5. The through conductors 14 are provided inside the insulating substrate 11 and are disposed so as to be covered with the metal layer 13 in a plan view.

貫通導体14は、図3に示す例において、縦断面視において、凹部12の底面と凹部12の側壁の上面との間、すなわち凹部12の側壁内に設けられており、凹部12の側壁における上面側から2番目の絶縁層11aに設けられている。金属層13と貫通導体14との間には、絶縁層11aが設けられており、金属層13と貫通導体14とは離れており、金属層13と貫通導体14との間には、他の貫通導体が設けられていない。金属層13と貫通導体14との間の絶縁層11aの厚みは、貫通導体14が設けられる絶縁層11aの厚みよりも小さく、0.5mm以下である
ことが好ましい。
In the example shown in FIG. 3, the through conductor 14 is provided between the bottom surface of the recess 12 and the upper surface of the side wall of the recess 12 in the longitudinal sectional view, that is, in the side wall of the recess 12. It is provided in the second insulating layer 11a from the side. An insulating layer 11a is provided between the metal layer 13 and the through conductor 14, the metal layer 13 and the through conductor 14 are separated from each other, and other metal No through conductor is provided. The thickness of the insulating layer 11a between the metal layer 13 and the through conductor 14 is preferably smaller than the thickness of the insulating layer 11a on which the through conductor 14 is provided, and is 0.5 mm or less.

貫通導体14の上端部は、図3に示す例のように、縦断面視において、金属層13と貫通導
体14との間の絶縁層11aに埋設している。金属層13と貫通導体14との間の絶縁層11aの厚みの10%以下であることが好ましい。10%以上の厚みに埋設していると、凹部12の側壁または金属層13の表面に歪み等が生じやすくなる。
The upper end portion of the through conductor 14 is embedded in the insulating layer 11a between the metal layer 13 and the through conductor 14 in the longitudinal sectional view as in the example shown in FIG. The thickness is preferably 10% or less of the thickness of the insulating layer 11a between the metal layer 13 and the through conductor 14. If it is embedded in a thickness of 10% or more, distortion or the like is likely to occur on the side wall of the recess 12 or the surface of the metal layer 13.

複数の貫通導体14は、凹部12の側壁に沿って複数の貫通導体14を設けることにより、貫通導体群14Gを構成している。金属層13と貫通導体群14Gを構成する複数の貫通導体14の間には絶縁層11aが設けられることで、金属層13と貫通導体群14Gとが離れている。   The plurality of through conductors 14 constitute a through conductor group 14G by providing the plurality of through conductors 14 along the side wall of the recess 12. An insulating layer 11a is provided between the metal layer 13 and the plurality of through conductors 14 constituting the through conductor group 14G, thereby separating the metal layer 13 and the through conductor group 14G.

このような貫通導体14は、セラミックグリーンシートの厚み以上、すなわちセラミックグリーンシートの表面から端部が突出するようにして、貫通導体14用の貫通孔にメタライズペーストを充填しておき、このセラミックグリーンシートを他のセラミックグリーンシートと積層した際に、メタライズペーストの端部が他のセラミックグリーンシート側に埋設されるようにしておけばよい。また、厚み方向において、焼成時にセラミックグリーンシートよりも収縮しにくいメタライズペーストを貫通導体14用の貫通孔にメ充填しておけばよい。   Such a through conductor 14 has a thickness equal to or greater than the thickness of the ceramic green sheet, that is, the end protrudes from the surface of the ceramic green sheet, and the through hole for the through conductor 14 is filled with metallized paste. When the sheet is laminated with another ceramic green sheet, the end portion of the metallized paste may be embedded in the other ceramic green sheet side. Further, in the thickness direction, a metallized paste that is less likely to shrink than the ceramic green sheet during firing may be filled in the through hole for the through conductor 14.

これらの貫通導体14と凹部12の内壁との間隔、あるいは貫通導体14と凹部12の外壁との間隔は、貫通導体14の径よりも大きいことが好ましい。   The distance between the through conductor 14 and the inner wall of the recess 12 or the distance between the through conductor 14 and the outer wall of the recess 12 is preferably larger than the diameter of the through conductor 14.

金属層13、貫通導体14、配線導体15は、例えばタングステン(W),モリブデン(Mo),マンガン(Mn),銀(Ag)または銅(Cu)等を主成分とする金属粉末メタライズである。例えば、絶縁基板11が酸化アルミニウム質焼結体から成る場合であれば、W,MoまたはMn等の高融点金属粉末に適当な有機バインダーおよび溶媒等を添加混合して得たメタライズペーストを、絶縁基板11用のセラミックグリーンシートに予めスクリーン印刷法によって所定のパターンに印刷塗布して、絶縁基板11用のセラミックグリーンシートと同時に焼成することによって、絶縁基板11の所定位置に被着形成される。金属層13および配線導体15は、例えば、絶縁基板11用のセラミックグリーンシートに金属層13または配線導体15用のメタライズペーストをスクリーン印刷法等の印刷手段によって印刷塗布し、絶縁基板11用のセラミックグリーンシートとともに焼成することによって形成される。また、貫通導体14は、例えば、絶縁基板11用のセラミックグリーンシートに金型またはパンチングによる打ち抜き加工またはレーザー加工等の加工方法によって貫通導体14用の貫通孔を形成し、この貫通孔に貫通導体14用のメタライズペーストを上記印刷手段によって充填しておき、絶縁基板11用のセラミックグリーンシートとともに焼成することによって形成される。メタライズペーストは、上述の金属粉末に適当な溶剤およびバインダーを加えて混練することによって、適度な粘度に調整して作製される。なお、絶縁基板11との接合強度を高めるために、ガラス粉末、セラミック粉末を含んでいても構わない。   The metal layer 13, the through conductor 14, and the wiring conductor 15 are metal powder metallization mainly composed of tungsten (W), molybdenum (Mo), manganese (Mn), silver (Ag), copper (Cu), or the like. For example, when the insulating substrate 11 is made of an aluminum oxide sintered body, a metallized paste obtained by adding and mixing an appropriate organic binder and solvent to a refractory metal powder such as W, Mo or Mn is insulated. The ceramic green sheet for the substrate 11 is preliminarily printed and applied in a predetermined pattern by a screen printing method, and is fired at the same time as the ceramic green sheet for the insulating substrate 11 to be deposited on a predetermined position of the insulating substrate 11. The metal layer 13 and the wiring conductor 15 are formed by, for example, printing and applying a metallized paste for the metal layer 13 or the wiring conductor 15 on a ceramic green sheet for the insulating substrate 11 by a printing means such as a screen printing method. It is formed by firing together with a green sheet. The through conductor 14 is formed, for example, by forming a through hole for the through conductor 14 in a ceramic green sheet for the insulating substrate 11 by a die or punching process by punching or laser processing, and the through conductor is formed in the through hole. It is formed by filling the metallized paste for 14 with the above printing means and firing together with the ceramic green sheet for the insulating substrate 11. The metallized paste is prepared by adjusting an appropriate viscosity by adding an appropriate solvent and binder to the above metal powder and kneading. In order to increase the bonding strength with the insulating substrate 11, glass powder or ceramic powder may be included.

金属層13および配線導体15の絶縁基板11から露出する表面には、電気めっき法または無電解めっき法によって金属めっき層が被着される。金属めっき層は、ニッケル,銅,金または銀等の耐食性および接続部材3との接続性に優れる金属から成るものであり、例えば厚さ0.5〜5μm程度のニッケルめっき層と0.1〜3μm程度の金めっき層とが順次被着される。これによって、金属層13および配線導体15が腐食することを効果的に抑制できるとともに、金属層13と蓋体、または金属製の蓋体または金属製の枠体との接合、配線導体15とボンディングワイヤ等の接続部材3との接合、ならびに配線導体15とモジュール用基板5に形成された接続用の接続パッド51との接合を強固にできる。   A metal plating layer is applied to the surfaces of the metal layer 13 and the wiring conductor 15 exposed from the insulating substrate 11 by electroplating or electroless plating. The metal plating layer is made of a metal having excellent corrosion resistance such as nickel, copper, gold, or silver and connectivity with the connection member 3, for example, a nickel plating layer having a thickness of about 0.5 to 5 μm and a gold having a thickness of about 0.1 to 3 μm. A plating layer is sequentially deposited. As a result, the metal layer 13 and the wiring conductor 15 can be effectively prevented from corroding, and the metal layer 13 and the lid, or the metal lid or metal frame, and the wiring conductor 15 and the bonding are bonded. The bonding between the connection member 3 such as a wire and the bonding between the wiring conductor 15 and the connection pad 51 for connection formed on the module substrate 5 can be strengthened.

また、金属めっき層は、ニッケルめっき層/金めっき層に限られるものではなく、ニッケルめっき層/パラジウムめっき層/金めっき層等を含むその他の金属めっき層であっても構わない。   The metal plating layer is not limited to nickel plating layer / gold plating layer, and may be other metal plating layers including nickel plating layer / palladium plating layer / gold plating layer.

配線基板1の凹部12の底面の搭載部に電子部品2を搭載し、電子装置を作製できる。配線基板1に搭載される電子部品2は、ICチップまたはLSIチップ等の半導体素子,発光素子,水晶振動子または圧電振動子等の圧電素子および各種センサ等である。例えば、電子部品2がワイヤボンディング型の半導体素子である場合には、半導体素子は、低融点ろう材または導電性樹脂等の接合部材によって、搭載部上に固定された後、ボンディングワイヤ等の接続部材3を介して半導体素子の電極と配線導体15とが電気的に接続されることによって配線基板配線基板1に搭載される。これにより、電子部品2は配線導体15に電気的に接続される。また、例えば電子部品2がフリップチップ型の半導体素子である場合には、半導体素子は、はんだバンプ、金バンプまたは導電性樹脂(異方性導電樹脂等)等の接続部材3を介して、半導体素子の電極と配線導体15とが電気的および機械的に接続されることによって配線基板1に搭載される。また、配線基板1には、複数の電子部品2を搭載してもよいし、必要に応じて、抵抗素子または容量素子等の小型の電子部品を搭載してもよい。また、電子部品2は必要に応じて、樹脂またはガラス等からなる封止材4を用いて、樹脂、ガラス、セラミックスまたは金属等からなる蓋体等により封止される。   An electronic device can be manufactured by mounting the electronic component 2 on the mounting portion on the bottom surface of the recess 12 of the wiring board 1. The electronic component 2 mounted on the wiring board 1 is a semiconductor element such as an IC chip or an LSI chip, a light emitting element, a piezoelectric element such as a crystal vibrator or a piezoelectric vibrator, and various sensors. For example, when the electronic component 2 is a wire bonding type semiconductor element, the semiconductor element is fixed on the mounting portion by a bonding member such as a low melting point brazing material or a conductive resin, and then connected to a bonding wire or the like. The electrode of the semiconductor element and the wiring conductor 15 are electrically connected via the member 3 to be mounted on the wiring board wiring board 1. As a result, the electronic component 2 is electrically connected to the wiring conductor 15. For example, when the electronic component 2 is a flip chip type semiconductor element, the semiconductor element is a semiconductor via a connection member 3 such as a solder bump, a gold bump, or a conductive resin (anisotropic conductive resin, etc.). The electrode of the element and the wiring conductor 15 are mounted on the wiring board 1 by being electrically and mechanically connected. In addition, a plurality of electronic components 2 may be mounted on the wiring board 1, or small electronic components such as a resistance element or a capacitor element may be mounted as necessary. Moreover, the electronic component 2 is sealed with a lid made of resin, glass, ceramics, metal, or the like, using a sealing material 4 made of resin, glass, or the like, as necessary.

本実施形態の電子装置の外部電極13が、例えば、図4に示すように、モジュール用基板5の接続パッド51にはんだ6を介して接続されて、電子モジュールとなる。電子装置は、例えば、図4に示すように、配線基板1の上面側に配置された外部電極13が、モジュール用基板5の接続パッド51に接続されている。電子部品2として発光素子等の光学素子が用いられる場合、図4に示すように、モジュール用基板5には、光を透過するための開口部52が設けられる。このような開口部52は、平面視において、電子部品2よりも大きく形成される。   For example, as shown in FIG. 4, the external electrode 13 of the electronic device of the present embodiment is connected to the connection pad 51 of the module substrate 5 via the solder 6 to form an electronic module. In the electronic device, for example, as shown in FIG. 4, the external electrode 13 disposed on the upper surface side of the wiring substrate 1 is connected to the connection pad 51 of the module substrate 5. When an optical element such as a light emitting element is used as the electronic component 2, the module substrate 5 is provided with an opening 52 for transmitting light, as shown in FIG. Such an opening 52 is formed larger than the electronic component 2 in plan view.

本実施形態の配線基板1は、主面に電子部品2を搭載する凹部12を有する、平面視で矩形状の絶縁基板11と、凹部12の側壁上に設けられた枠状の金属層13と、平面透視で金属層13に覆われるように配置された複数の貫通導体14を含む貫通導体群14Gとを有しており、金属層13と貫通導体群14Gとが離れており、絶縁基板11の厚み方向において金属層13と貫通導体群14Gとの間に他の貫通導体を有しておらず、平面透視で貫通導体群14Gが凹部12の側壁に沿って設けられている。上記構成により、絶縁基板11の内部に配置された貫通導体14が凹部12の側壁を保持することにより、例えば製作工程における積層時または切断時等の応力により、凹部12の側壁における上面が、絶縁基板11の外縁に沿って厚み方向で凹形状となるのを抑制することができ、枠状の金属層13と蓋体または枠体との接合を良好なものとし、凹部12内の気密性を良好なものとすることができる。   The wiring board 1 of the present embodiment has a recess 12 for mounting the electronic component 2 on the main surface, a rectangular insulating substrate 11 in plan view, and a frame-shaped metal layer 13 provided on the side wall of the recess 12. A through conductor group 14G including a plurality of through conductors 14 disposed so as to be covered with the metal layer 13 in a plan view, the metal layer 13 and the through conductor group 14G are separated from each other, and the insulating substrate 11 In the thickness direction, there is no other through conductor between the metal layer 13 and the through conductor group 14G, and the through conductor group 14G is provided along the side wall of the recess 12 in a plan view. With the above configuration, the through conductor 14 disposed inside the insulating substrate 11 holds the side wall of the recess 12 so that the upper surface of the side wall of the recess 12 is insulated due to, for example, stress during lamination or cutting in the manufacturing process. It is possible to suppress a concave shape in the thickness direction along the outer edge of the substrate 11, improve the bonding between the frame-shaped metal layer 13 and the lid or frame, and improve the airtightness in the concave portion 12. It can be good.

また、平面透視において、貫通導体群14Gは、複数の貫通導体14が帯状に配置されている。このように配置していると、凹部12の側壁に沿って絶縁基板11の内部に配置された貫通導体14がより良好に保持することにより、凹部12の側壁における上面が、絶縁基板11の外縁に沿って厚み方向で凹形状となることを抑制することができる。   Further, in the planar perspective view, the through conductor group 14G has a plurality of through conductors 14 arranged in a band shape. With this arrangement, the through conductors 14 disposed inside the insulating substrate 11 along the side walls of the recesses 12 are better held, so that the upper surface of the side walls of the recesses 12 is the outer edge of the insulating substrate 11. It can suppress that it becomes concave shape in the thickness direction along.

なお、複数の貫通導体14が帯状に配置されているとは、平面透視において、複数の貫通導体14が凹部12の側壁に沿って5個以上配置されていることを示している。図1および図2に示す例において、1つの貫通導体群14Gは、11個の貫通導体14を備えており、配線基板1は、凹部12の4つの側壁に沿ってそれぞれ貫通導体群14Gが設けられており、4つの貫通導体群14Gが形成されている。   Note that the phrase “the plurality of through conductors 14 are arranged in a strip shape” indicates that five or more through conductors 14 are arranged along the side wall of the recess 12 in a plan view. In the example shown in FIGS. 1 and 2, one through conductor group 14 </ b> G includes 11 through conductors 14, and the wiring board 1 is provided with through conductor groups 14 </ b> G along the four side walls of the recess 12. The four through conductor groups 14G are formed.

また、複数の貫通導体14が、1つの貫通導体群14G内において、同じ大きさの貫通導体14が等間隔に配置されていると、例えば製作工程における積層時または切断時等の応力が、等間隔に配置された貫通導体群14Gによって均等に分散されやすいものとなり、凹部12の側壁に沿って絶縁基板11の内部に配置された貫通導体14が凹部12の側壁をより良好に保持することができ、好ましい。   Further, when the plurality of through conductors 14 are arranged at equal intervals in one through conductor group 14G, for example, stress at the time of stacking or cutting in the manufacturing process, etc. The through conductor groups 14G arranged at intervals are easily dispersed evenly, and the through conductors 14 arranged inside the insulating substrate 11 along the side walls of the recesses 12 can better hold the side walls of the recesses 12. It is possible and preferable.

なお、配線基板1において、4つの側壁のそれぞれにおいて、複数の貫通導体14が側壁に沿って等間隔に連続して配置されている、すなわち4つの側壁のそれぞれに貫通導体群14Gが設けられていることが好ましい。   In the wiring board 1, a plurality of through conductors 14 are continuously arranged along the side wall at equal intervals on each of the four side walls, that is, a through conductor group 14G is provided on each of the four side walls. Preferably it is.

また、平面透視において、貫通導体群14Gは、凹部12の側壁の角部から離れて設けられている。このように配置していると、例えば製作工程における積層時または切断時等の応力により、凹部の側壁の角部に挟まれた、厚み方向で凹形状となりやすい凹部12の側壁に沿って絶縁基板11の内部に配置された貫通導体14が保持することにより、凹部12の側壁上面が、絶縁基板11の外縁に沿って厚み方向で凹形状となることを効果的に抑制することができる。   Further, the through conductor group 14 </ b> G is provided away from the corner of the side wall of the recess 12 in a plan view. With this arrangement, the insulating substrate is formed along the side wall of the recess 12 that tends to be concave in the thickness direction, which is sandwiched between corners of the side wall of the recess due to stress during lamination or cutting in the manufacturing process, for example. By holding the through conductors 14 arranged inside 11, it is possible to effectively suppress the upper surface of the side wall of the recess 12 from being recessed in the thickness direction along the outer edge of the insulating substrate 11.

なお、貫通導体群14Gが、凹部12の側壁の角部から離れて設けられているとは、凹部12の相対する角部同士を通過する、絶縁基板11の仮想延長対角線上あるいは仮想延長対角線を越えて、貫通導体14が設けられていないことである。また、図2に示す例のように、仮想延長対角線を挟んで隣接する貫通導体群14G同士の最短距離が、1つの貫通導体群14G内の貫通導体14同士の間隔よりも大きいと、例えば電子装置の作動時に電子部品2の熱が配線基板1に伝わったとしても、取り扱い時等の応力が加わりやすい凹部12の側壁の角部に、絶縁基板11と貫通導体14との熱膨張差による応力が発生し難いものとなり、凹部12の側壁の角部に割れ等が発生するのを抑制することができ、好ましい。なお、貫通導体群14Gの端部に配置された貫通導体14は、貫通導体14の直径2つ分以上貫通導体群14Gの並びに直交する外壁の外縁から離間していることが好ましい。   Note that the penetrating conductor group 14G is provided apart from the corners of the side walls of the recess 12 means that the through-extension diagonal line of the insulating substrate 11 that passes through the opposite corners of the recess 12 or the virtual extension diagonal line. Beyond that, the through conductor 14 is not provided. Further, as in the example shown in FIG. 2, if the shortest distance between adjacent through conductor groups 14G across the virtual extension diagonal line is larger than the interval between the through conductors 14 in one through conductor group 14G, for example, electrons Even if the heat of the electronic component 2 is transmitted to the wiring board 1 during operation of the apparatus, stress due to the difference in thermal expansion between the insulating substrate 11 and the through conductor 14 is formed at the corner of the side wall of the recess 12 where stress is easily applied during handling. Is less likely to occur, and it is possible to suppress the occurrence of cracks and the like at the corners of the side walls of the recesses 12, which is preferable. The through conductors 14 disposed at the end of the through conductor group 14G are preferably separated from the outer edges of the orthogonal outer walls of the through conductor group 14G by two or more diameters of the through conductor 14.

本実施形態の電子装置は、上記構成の配線基板1と、凹部12に搭載された電子部品2を有していることによって、気密性に優れた長期信頼性に優れた電子装置とすることができる。   The electronic device according to the present embodiment includes the wiring substrate 1 having the above-described configuration and the electronic component 2 mounted in the recess 12 so that the electronic device has excellent airtightness and excellent long-term reliability. it can.

本実施形態の電子モジュールは、接続パッド51を有するモジュール用基板5と、接続パッド51にはんだ6を介して外部電極13に接続された上記構成の電子装置とを有していることによって、長期信頼性に優れたものとすることができる。   The electronic module according to the present embodiment includes the module substrate 5 having the connection pads 51, and the electronic device having the above-described configuration connected to the external electrodes 13 via the solder 6 on the connection pads 51. The reliability can be improved.

本実施形態における配線基板1は、小型の電子装置において好適に使用することができ、配線基板1における凹部12内の気密性を高めることができる。   The wiring board 1 in this embodiment can be used suitably in a small electronic device, and the airtightness in the recessed part 12 in the wiring board 1 can be improved.

(第2の実施形態)
次に、本発明の第2の実施形態による電子装置について、図5〜図7を参照しつつ説明する。
(Second Embodiment)
Next, an electronic device according to a second embodiment of the present invention will be described with reference to FIGS.

本発明の第2の実施形態における電子装置において、上記した第1の実施形態の電子装置と異なる点は、貫通導体群14Gは、凹部12の側壁における外縁側に設けられている点である。なお、第2の実施形態における電子装置において、第1の実施形態の電子装置と同様に、図5に示す例において、平面透視において、金属層13が重なる領域が重なる領域を点線にて示している。また、図6に示す例において、平面透視において、貫通導体14が重なる領域を点線にて示している。   The electronic device according to the second embodiment of the present invention is different from the electronic device according to the first embodiment described above in that the through conductor group 14G is provided on the outer edge side of the side wall of the recess 12. Note that, in the electronic device according to the second embodiment, similarly to the electronic device according to the first embodiment, in the example illustrated in FIG. 5, the region where the metal layer 13 overlaps is indicated by a dotted line in a plan view. Yes. Further, in the example shown in FIG. 6, a region where the through conductors 14 overlap is indicated by a dotted line in a plan view.

第2の実施形態における配線基板1は、第1の実施形態の配線基板1と同様に、絶縁基板11の内部に配置された貫通導体14が凹部12の側壁を保持することにより、例えば製作工程における積層時または切断時等の応力により、凹部12の側壁における上面が、絶縁基板11の外縁に沿って厚み方向で凹形状となるのを抑制することができ、枠状の金属層13と蓋体または枠体との接合を良好なものとし、凹部12内の気密性を良好なものとすることがで
きる。
Similar to the wiring substrate 1 of the first embodiment, the wiring substrate 1 in the second embodiment has a through conductor 14 disposed inside the insulating substrate 11 holding the side wall of the recess 12, for example, a manufacturing process. It is possible to suppress the upper surface of the side wall of the concave portion 12 from being concave in the thickness direction along the outer edge of the insulating substrate 11 due to stress at the time of lamination or cutting in the frame, and the frame-shaped metal layer 13 and the lid The bonding with the body or the frame can be made good, and the airtightness in the recess 12 can be made good.

貫通導体群14Gが凹部12の側壁における外縁側に設けられているとは、貫通導体14が凹部12の外壁側、すなわち貫通導体群14Gを構成するそれぞれの貫通導体14の中心が、凹部12の側壁の幅W1の中心線Nよりも凹部12の外壁側に位置していることである。   The through conductor group 14G is provided on the outer edge side of the side wall of the concave portion 12 that the through conductor 14 is on the outer wall side of the concave portion 12, that is, the center of each through conductor 14 constituting the through conductor group 14G is That is, it is located on the outer wall side of the recess 12 with respect to the center line N of the width W1 of the side wall.

なお、貫通導体群14Gを凹部12の側壁における外縁側に設ける場合、貫通導体14と凹部12の外壁との間隔W3は、貫通導体14と凹部12の外壁との間における歪みを抑制するために、貫通導体14の直径以上(W3≧φ1)としておくことが好ましい。   When the through conductor group 14G is provided on the outer edge side of the side wall of the recess 12, the interval W3 between the through conductor 14 and the outer wall of the recess 12 is set to suppress distortion between the through conductor 14 and the outer wall of the recess 12. The diameter of the through conductor 14 is preferably equal to or greater than (W3 ≧ φ1).

第2の実施形態における配線基板1の貫通導体14は、絶縁基板11用のセラミックグリーンシートに設けられる貫通導体14用の貫通孔を、凹部12の側壁における外縁側に形成しておくことにより形成することができる。   The through conductor 14 of the wiring board 1 in the second embodiment is formed by forming a through hole for the through conductor 14 provided in the ceramic green sheet for the insulating substrate 11 on the outer edge side of the side wall of the recess 12. can do.

また、図5(a)および図7に示す例のように、金属層13の表面の外縁端部を被覆するように絶縁膜16を形成しておいても構わない。絶縁膜16は、例えば、金属層13に、金属製の蓋体または金属製の枠体を接合する際に、金属層13表面におけるろう材等の流れをコントロールし、金属層13と金属製の蓋体または金属製の枠体とを良好に接合し、凹部12内の気密性を良好なものとすることができる。金属導体14は、平面透視において、絶縁膜16と重なるように設けていても構わない。   Further, as in the example shown in FIGS. 5A and 7, the insulating film 16 may be formed so as to cover the outer edge of the surface of the metal layer 13. The insulating film 16, for example, controls the flow of the brazing material or the like on the surface of the metal layer 13 when joining the metal lid body or the metal frame body to the metal layer 13, and the metal layer 13 and the metal layer It is possible to satisfactorily join the lid or the metal frame and to improve the airtightness in the recess 12. The metal conductor 14 may be provided so as to overlap the insulating film 16 in a plan view.

絶縁膜16は、絶縁基板11と実質的に同等のセラミック層である。例えば、絶縁基板11が酸化アルミニウム質焼結体から成る場合であれば、絶縁膜16は酸化アルミニウム質焼結体から成る。このような絶縁膜16は、絶縁膜16が、酸化アルミニウム質焼結体から成る場合であれば、酸化アルミニウム粉末に適当な有機バインダーおよび溶媒等を添加混合して得たセラミックペーストを、絶縁基板11用のセラミックグリーンシートに、金属層13用のメタライズペーストと部分的に重なるようにスクリーン印刷法によって所定のパターンに印刷塗布して、絶縁基板11用のセラミックグリーンシートと同時に焼成することによって、絶縁基板11の所定位置に被着形成される。   The insulating film 16 is a ceramic layer substantially equivalent to the insulating substrate 11. For example, if the insulating substrate 11 is made of an aluminum oxide sintered body, the insulating film 16 is made of an aluminum oxide sintered body. When the insulating film 16 is made of an aluminum oxide sintered body, such an insulating film 16 is obtained by adding a ceramic paste obtained by adding and mixing an appropriate organic binder and a solvent to the aluminum oxide powder. The ceramic green sheet for 11 is printed and applied in a predetermined pattern by a screen printing method so as to partially overlap with the metallized paste for the metal layer 13, and fired simultaneously with the ceramic green sheet for the insulating substrate 11, The insulating substrate 11 is deposited on a predetermined position.

第2の実施形態の配線基板1は、上述の第1の実施形態の配線基板1と同様の製造方法を用いて製作することができる。   The wiring board 1 of the second embodiment can be manufactured using the same manufacturing method as the wiring board 1 of the first embodiment described above.

(第3の実施形態)
次に、本発明の第3の実施形態による電子装置について、図8〜図10を参照しつつ説明する。本発明の第3の実施形態における電子装置において、上記した実施形態の電子装置と異なる点は、貫通導体群14Gの長さL1が凹部12の長さL2より大きい点である。また、第3の実施形態における電子装置において、第1の実施形態の電子装置と同様に、図8に示す例において、平面透視において、金属層13が重なる領域が重なる領域を点線にて示している。また、図9に示す例において、平面透視において、貫通導体14が重なる領域を点線にて示している。また、図9および図10に示す例において、凹部12が重なる領域を点線にて示している。
(Third embodiment)
Next, an electronic device according to a third embodiment of the present invention will be described with reference to FIGS. The electronic device according to the third embodiment of the present invention differs from the electronic device according to the above-described embodiment in that the length L1 of the through conductor group 14G is larger than the length L2 of the recess 12. Further, in the electronic device according to the third embodiment, similarly to the electronic device according to the first embodiment, in the example illustrated in FIG. 8, the region where the metal layer 13 overlaps is indicated by a dotted line in a plan view. Yes. Further, in the example shown in FIG. 9, a region where the through conductors 14 overlap is shown by a dotted line in plan perspective. Further, in the example shown in FIGS. 9 and 10, the region where the concave portion 12 overlaps is indicated by a dotted line.

第3の実施形態における配線基板1は、第1の実施形態の配線基板1と同様に、絶縁基板11の内部に配置された貫通導体14が凹部12の側壁を保持することにより、例えば製作工程における積層時または切断時等の応力により、凹部12の側壁における上面が、絶縁基板11の外縁に沿って厚み方向で凹形状となるのを抑制することができ、枠状の金属層13と蓋体または枠体との接合を良好なものとし、凹部12内の気密性を良好なものとすることができる。   Similar to the wiring substrate 1 of the first embodiment, the wiring substrate 1 in the third embodiment has a through conductor 14 disposed inside the insulating substrate 11 holding the side wall of the recess 12, for example, in a manufacturing process. It is possible to suppress the upper surface of the side wall of the concave portion 12 from being concave in the thickness direction along the outer edge of the insulating substrate 11 due to stress at the time of lamination or cutting in the frame, and the frame-shaped metal layer 13 and the lid The bonding with the body or the frame can be made good, and the airtightness in the recess 12 can be made good.

また、貫通導体群14Gの長さL1が凹部12の長さL2より大きいことにより、貫通導体14が凹部12の側壁の全体にわたって保持することにより、凹部12の側壁における上面が、絶縁基板11の外縁に沿って厚み方向で凹形状となるのをより良好に抑制することができる。   Further, since the length L1 of the through conductor group 14G is larger than the length L2 of the recess 12, the through conductor 14 holds the entire side wall of the recess 12, so that the upper surface of the side wall of the recess 12 is It can suppress more favorably that it becomes concave shape in the thickness direction along an outer edge.

なお、第3の実施形態の配線基板1において、平面透視において、貫通導体群14の長さL1が凹部12の長さL2より大きいとは、図10に示す例のように、複数の貫通導体14からなる貫通導体群14Gの長さL1が、最も開口の大きな凹部12の内壁の長さL2よりも大きいことを示している(L1>L2)。なお、第3の実施形態の配線基板1においても、第1の実施形態の配線基板1と同様に、貫通導体群14Gは凹部12の側壁の角部から離れて設けられている。第3の実施形態の配線基板1は、上述の第1の実施形態の配線基板1と同様の製造方法を用いて製作することができる。   In the wiring substrate 1 of the third embodiment, the length L1 of the through conductor group 14 is larger than the length L2 of the concave portion 12 in a plan view, as in the example shown in FIG. This indicates that the length L1 of the through conductor group 14G consisting of 14 is larger than the length L2 of the inner wall of the recess 12 having the largest opening (L1> L2). In the wiring board 1 of the third embodiment, the through conductor group 14G is provided away from the corner of the side wall of the recess 12 as in the wiring board 1 of the first embodiment. The wiring board 1 of the third embodiment can be manufactured using the same manufacturing method as the wiring board 1 of the first embodiment described above.

本発明は、上述の実施の形態の例に限定されるものではなく、種々の変更は可能である。例えば、絶縁基板11は、平面視において、側面または角部に切欠き部や面取り部を有している矩形状であっても構わない。また、絶縁基板11の側面と一方主面との間に切欠きが設けられており、切欠きの内面に配線導体15が延出された、いわゆるキャスタレーション導体を有していてもよい。   The present invention is not limited to the above-described embodiments, and various modifications can be made. For example, the insulating substrate 11 may have a rectangular shape having a notch or a chamfered portion on a side surface or a corner when viewed in a plan view. Further, a notch may be provided between the side surface of the insulating substrate 11 and the one main surface, and a so-called castellation conductor in which the wiring conductor 15 is extended to the inner surface of the notch may be provided.

また、第1〜第3の実施形態の配線基板1を組み合わせても構わない。例えば、第1または第3の実施形態の配線基板1において、絶縁膜16を設けても良い。   Moreover, you may combine the wiring board 1 of 1st-3rd embodiment. For example, the insulating film 16 may be provided in the wiring substrate 1 of the first or third embodiment.

上述の実施形態において、絶縁基板11は、4層の絶縁層11aにより構成している例を示しているが、絶縁基板11は、3層、もしくは5層以上の絶縁層11aにより構成していても構わない。   In the above-described embodiment, the example in which the insulating substrate 11 is configured by the four insulating layers 11a is shown. However, the insulating substrate 11 is configured by three or five or more insulating layers 11a. It doesn't matter.

また、配線基板1は、多数個取り配線基板の形態で製作されていてもよい。   Further, the wiring board 1 may be manufactured in the form of a multi-piece wiring board.

1・・・・配線基板
11・・・・絶縁基板
12・・・・凹部
13・・・・金属層
14・・・・貫通導体
14G・・・貫通導体群
15・・・・配線導体
16・・・・絶縁膜
2・・・・電子部品
3・・・・接続部材
L1・・・貫通導体群の長さ
L2・・・凹部の長さ
1 ... Wiring board
11 ... Insulating substrate
12 ... Recess
13 ... Metal layer
14 ... Penetration conductor
14G ... Penetration conductor group
15 ... Wiring conductor
16 ··· Insulating film 2 ··· Electronic component 3 ··· Connection member L1 · Length L2 of through conductor group · Length of recess

Claims (7)

主面に電子部品を搭載する凹部を有する、平面視で矩形状の絶縁基板と、
前記凹部の側壁上に設けられた枠状の金属層と、
平面透視で前記金属層に覆われるように配置された複数の貫通導体を含む貫通導体群とを有しており、
前記金属層と前記貫通導体群とが離れており、前記絶縁基板の厚み方向において前記金属層と前記貫通導体群との間に他の貫通導体を有しておらず、平面透視で前記貫通導体群が前記凹部の側壁に沿って設けられていることを特徴とする配線基板。
A rectangular insulating substrate in plan view having a recess for mounting electronic components on the main surface;
A frame-shaped metal layer provided on the side wall of the recess;
A through conductor group including a plurality of through conductors arranged so as to be covered with the metal layer in a plan view,
The metal layer and the through conductor group are separated from each other, and there is no other through conductor between the metal layer and the through conductor group in the thickness direction of the insulating substrate. A wiring board characterized in that a group is provided along the side wall of the recess.
平面透視において、前記貫通導体群は前記複数の貫通導体が帯状に配置されていることを特徴とする請求項1に記載の配線基板。   2. The wiring board according to claim 1, wherein the plurality of through conductors are arranged in a band shape in the through conductor group in a plan view. 平面透視において、前記貫通導体群は前記凹部の側壁の角部から離れて設けられていることを特徴とする請求項1または請求項2に記載の配線基板。   3. The wiring board according to claim 1, wherein the through conductor group is provided apart from a corner portion of the side wall of the concave portion in a plan view. 平面透視において、前記貫通導体群は前記凹部の側壁における外縁側に設けられていることを特徴とする請求項1乃至請求項3のいずれかに記載の配線基板。   4. The wiring board according to claim 1, wherein the through conductor group is provided on an outer edge side of a side wall of the recess in a plan view. 平面透視において、前記貫通導体群の長さは前記凹部の長さより大きいことを特徴とする請求項1乃至請求項4のいずれかに配線基板。   5. The wiring board according to claim 1, wherein the length of the through conductor group is larger than the length of the concave portion in a plan view. 請求項1乃至請求項5のいずれかに記載の配線基板と、
前記凹部に搭載された電子部品とを有することを特徴とする電子装置。
The wiring board according to any one of claims 1 to 5,
And an electronic component mounted in the recess.
接続パッドを有するモジュール用基板と、
前記接続パッドにはんだを介して接続された請求項6に記載の電子装置とを有することを特徴とする電子モジュール。
A module substrate having connection pads;
An electronic module comprising: the electronic device according to claim 6 connected to the connection pad via solder.
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111566806A (en) * 2018-01-24 2020-08-21 京瓷株式会社 Wiring substrate, electronic device, and electronic module

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10189810A (en) * 1996-12-25 1998-07-21 Ngk Spark Plug Co Ltd Wiring board and its manufacturing method
JP2001144572A (en) * 1999-11-16 2001-05-25 Nippon Dempa Kogyo Co Ltd Ceramic container and crystal vibrator using the same
WO2006120826A1 (en) * 2005-05-12 2006-11-16 Murata Manufacturing Co., Ltd. Ceramic multilayer board
JP2010153796A (en) * 2008-11-26 2010-07-08 Kyocera Corp Method of manufacturing substrate for electronic component mounting
WO2014115766A1 (en) * 2013-01-22 2014-07-31 京セラ株式会社 Package for electronic element mounting, electronic device, and imaging module
JP2016051709A (en) * 2014-08-28 2016-04-11 京セラ株式会社 Wiring board, electronic device, and electronic module

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10189810A (en) * 1996-12-25 1998-07-21 Ngk Spark Plug Co Ltd Wiring board and its manufacturing method
JP2001144572A (en) * 1999-11-16 2001-05-25 Nippon Dempa Kogyo Co Ltd Ceramic container and crystal vibrator using the same
WO2006120826A1 (en) * 2005-05-12 2006-11-16 Murata Manufacturing Co., Ltd. Ceramic multilayer board
CN101010996A (en) * 2005-05-12 2007-08-01 株式会社村田制作所 Ceramic multilayer substrate
US20070187137A1 (en) * 2005-05-12 2007-08-16 Murata Manufacturing Co., Ltd. Ceramic multilayer substrate
JP2010153796A (en) * 2008-11-26 2010-07-08 Kyocera Corp Method of manufacturing substrate for electronic component mounting
WO2014115766A1 (en) * 2013-01-22 2014-07-31 京セラ株式会社 Package for electronic element mounting, electronic device, and imaging module
JP2016051709A (en) * 2014-08-28 2016-04-11 京セラ株式会社 Wiring board, electronic device, and electronic module

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111566806A (en) * 2018-01-24 2020-08-21 京瓷株式会社 Wiring substrate, electronic device, and electronic module
CN111566806B (en) * 2018-01-24 2024-04-30 京瓷株式会社 Wiring substrate, electronic device, and electronic module

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