JP2017215535A - Exposure device - Google Patents

Exposure device Download PDF

Info

Publication number
JP2017215535A
JP2017215535A JP2016110392A JP2016110392A JP2017215535A JP 2017215535 A JP2017215535 A JP 2017215535A JP 2016110392 A JP2016110392 A JP 2016110392A JP 2016110392 A JP2016110392 A JP 2016110392A JP 2017215535 A JP2017215535 A JP 2017215535A
Authority
JP
Japan
Prior art keywords
exposure
substrate
long substrate
unit
stage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2016110392A
Other languages
Japanese (ja)
Other versions
JP6723831B2 (en
Inventor
典夫 橋本
Norio Hashimoto
典夫 橋本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Orc Manufacturing Co Ltd
Original Assignee
Orc Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Orc Manufacturing Co Ltd filed Critical Orc Manufacturing Co Ltd
Priority to JP2016110392A priority Critical patent/JP6723831B2/en
Priority to CN201710395242.9A priority patent/CN107450276B/en
Publication of JP2017215535A publication Critical patent/JP2017215535A/en
Application granted granted Critical
Publication of JP6723831B2 publication Critical patent/JP6723831B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20Exposure; Apparatus therefor
    • G03F7/2051Exposure without an original mask, e.g. using a programmed deflection of a point source, by scanning, by drawing with a light beam, using an addressed light or corpuscular source
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F9/00Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/0008Apparatus or processes for manufacturing printed circuits for aligning or positioning of tools relative to the circuit board

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide an exposure device that measures a feed amount of a substrate at a high accuracy to a long substrate and draws a pattern on both sides of the substrate in a state where flatness of the substrate is maintained.SOLUTION: An exposure device includes: first exposure means 23 including a light modulation element array; first substrate holding means 24 for holding a part of a longitudinal direction of a long substrate in a flat state; first relative movement means 25 for relatively moving the first exposure means 23 and the first substrate holding means 24 in the longitudinal direction of the long substrate; folding means 30 for folding a transportation path of the long substrate; second exposure means 43 including a light modulation element array; second substrate holding means 44 for holding a part in the longitudinal direction of the long substrate in a flat state; and second relatively moving means 45 for relatively moving the second exposure means 43 and the second substrate holding means 44 in the longitudinal direction of the long substrate.SELECTED DRAWING: Figure 1

Description

本発明は、供給リールから繰り出されて巻取リールに巻き取られる長尺基板の搬送中に、その長尺基板の両面にパターンを描画する露光装置に関する。   The present invention relates to an exposure apparatus that draws a pattern on both sides of a long substrate while the long substrate is being fed from a supply reel and wound on a take-up reel.

一般的に、携帯電話やモバイル機器等に用いられる電子回路基板(プリント回路基板)のベース素材として、例えば、厚みが0.1mm以下で長さが500mm以上(例えば100m)の長尺基板(感光性長尺フィルム)をロール状にしたものが使用される。近年、このような長尺基板に対して、転写マスクを使わず描画光を直接基板に照射してパターンを描画するダイレクト露光装置(マスクレス露光装置)が求められている。   In general, as a base material of an electronic circuit board (printed circuit board) used for a mobile phone, a mobile device, etc., for example, a long board (photosensitive) having a thickness of 0.1 mm or less and a length of 500 mm or more (for example, 100 m). Long film) is used. In recent years, a direct exposure apparatus (maskless exposure apparatus) that draws a pattern by directly irradiating the substrate with drawing light without using a transfer mask is required for such a long substrate.

長尺基板にパターンを描画するダイレクト露光装置としては、例えば特許文献1のような露光装置が知られているが、このような露光装置では、長尺基板の片面にしかパターンを露光できず、露光が終わった基板のロールを取り外し、投入側に再設置して露光工程をもう1度行う必要があり、生産性が低い。一方で、ダイレクト露光装置を用いて長尺基板の両面に電子回路を形成するために、特許文献2にあるように基板の両面に対して描画光を照射してパターンを形成する露光装置が検討されている。   As a direct exposure apparatus for drawing a pattern on a long substrate, for example, an exposure apparatus such as Patent Document 1 is known, but with such an exposure apparatus, a pattern can be exposed only on one side of a long substrate, It is necessary to remove the roll of the substrate after the exposure and re-install it on the input side to perform the exposure process once again, resulting in low productivity. On the other hand, in order to form an electronic circuit on both sides of a long substrate using a direct exposure apparatus, an exposure apparatus that forms a pattern by irradiating drawing light on both sides of the substrate as in Patent Document 2 is examined. Has been.

特開2006−102991号公報JP 2006-102991 A 特開2005−121959号公報JP 2005-121959 A

特許文献2の露光装置は、基板の両面に描画光を照射するという構造上、露光範囲をカバーするサイズの露光ステージを設けることができないという問題がある。露光ステージは基板の送り量を高精度に測定する、また、基板の平面性を高める、という役割を持ち、露光ステージなしでは基板に高精度なパターンを描画することは困難である。   The exposure apparatus of Patent Document 2 has a problem in that an exposure stage having a size that covers the exposure range cannot be provided due to the structure in which drawing light is irradiated on both surfaces of the substrate. The exposure stage has a role of measuring the feed amount of the substrate with high accuracy and improving the flatness of the substrate, and it is difficult to draw a highly accurate pattern on the substrate without the exposure stage.

本発明は、以上の課題に基づき、長尺基板に対し、基板の送り量を高精度に測定し、更に、基板の平面性を確保した状態で基板の両面にパターンを描画するダイレクト露光装置を得ることを目的とする。   Based on the above problems, the present invention provides a direct exposure apparatus that measures a substrate feed amount with respect to a long substrate with high accuracy, and further draws a pattern on both sides of the substrate while ensuring the flatness of the substrate. The purpose is to obtain.

露光装置が、光変調素子アレイを備え、長尺基板の第1面に光変調素子アレイにより変調したパターン光を照射する第1露光部と、長尺基板の長さ方向の一部を平面状に保持する第1露光ステージと、長尺基板の長さ方向に、第1露光部と第1露光ステージとを相対移動させる第1相対移動手段と、長尺基板の搬送経路を折返す折返し手段と、光変調素子アレイを備え、長尺基板の第2面に光変調素子アレイにより変調したパターン光を照射する第2露光部と、長尺基板の長さ方向の一部を平面状に保持する第2露光ステージと、長尺基板の長さ方向に、第2露光部と第2露光ステージとを相対移動させる第2相対移動手段と、を備える。このような露光装置とすることで、露光ステージを用いて長尺基板の両面を露光することができる。また、第1露光部と第2露光部とが、それぞれ下方向にパターン光を照射するので、長尺基板の両面に同じ条件でパターンを露光することができる。   An exposure apparatus includes a light modulation element array, a first exposure unit that irradiates a first surface of a long substrate with pattern light modulated by the light modulation element array, and a part of the length of the long substrate in a planar shape. A first exposure stage held by the first exposure stage, a first relative movement means for moving the first exposure section and the first exposure stage relative to each other in the length direction of the long substrate, and a folding means for turning back the conveyance path of the long substrate. And a second exposure unit that irradiates the second surface of the long substrate with pattern light modulated by the light modulation element array, and a portion of the long substrate in the length direction is held in a flat shape. And a second relative movement means for relatively moving the second exposure unit and the second exposure stage in the length direction of the long substrate. By setting it as such an exposure apparatus, both surfaces of a elongate board | substrate can be exposed using an exposure stage. In addition, since the first exposure unit and the second exposure unit respectively irradiate pattern light downward, the pattern can be exposed on both surfaces of the long substrate under the same conditions.

また、第1相対移動手段と第2相対移動手段とが、第1露光ステージと第2露光ステージとを、同期して長尺基板の長さ方向に沿った相反する方向にそれぞれ移動させるとともに、第1露光部と第2露光部とが、第1露光ステージと第2露光ステージの移動に応じて、長尺基板に照射するパターン光をそれぞれ変調する。更に、長尺基板を送り出す基板供給手段を備え、基板供給手段が、第1露光ステージの移動に同期して長尺基板を送り出す速度を調整し、同様に、長尺基板を巻取る基板巻取り手段を備え、基板巻取り手段が、第2露光ステージの移動に同期して長尺基板を巻取る速度を調整する。これによって、基板のバッファ部を設けなくとも長尺基板を搬送できるので、ロールエンド付近等の長尺基板の両面にパターンを露光できない無駄な領域を少なくすることができる。   In addition, the first relative movement means and the second relative movement means move the first exposure stage and the second exposure stage synchronously in opposite directions along the length direction of the long substrate, respectively. The first exposure unit and the second exposure unit respectively modulate the pattern light applied to the long substrate according to the movement of the first exposure stage and the second exposure stage. Furthermore, a substrate supply means for feeding out a long substrate is provided, and the substrate supply means adjusts the speed at which the long substrate is fed in synchronization with the movement of the first exposure stage, and similarly takes up the substrate. Means for adjusting the speed at which the long substrate is taken up in synchronization with the movement of the second exposure stage. Accordingly, since the long substrate can be transported without providing the buffer portion of the substrate, it is possible to reduce a useless area where the pattern cannot be exposed on both surfaces of the long substrate such as near the roll end.

また、基板供給手段と基板巻取り手段とが露光装置の同一サイドに設けられているので、ロールチェンジ等の段取り作業の効率が向上する。   Further, since the substrate supply means and the substrate winding means are provided on the same side of the exposure apparatus, the efficiency of the setup work such as roll change is improved.

また、第1相対移動手段と第2相対移動手段とが同じ高さに設けられているいるので、装置の高さを抑えることができ、コンパクトな露光装置を実現できる。   In addition, since the first relative moving means and the second relative moving means are provided at the same height, the height of the apparatus can be suppressed, and a compact exposure apparatus can be realized.

本発明の露光装置によれば、長尺基板に対し、基板の送り量を高精度に測定するとともに、基板の平面性を確保した状態で基板の両面にパターンを描画することができる。   According to the exposure apparatus of the present invention, it is possible to measure a substrate feed amount with respect to a long substrate with high accuracy and to draw a pattern on both surfaces of the substrate while ensuring the flatness of the substrate.

本発明による露光装置の全体構成を示す正面図である。It is a front view which shows the whole structure of the exposure apparatus by this invention. 本発明による露光装置の全体構成を示す平面図である。It is a top view which shows the whole structure of the exposure apparatus by this invention. 本発明によるダイレクト露光装置の露光ヘッドの構成を示す正面図である。It is a front view which shows the structure of the exposure head of the direct exposure apparatus by this invention.

図1は、本発明によるロールトゥロール方式のダイレクト露光装置である露光装置1の全体構成を示す正面図である。また、図2は露光装置1の全体構成を示す平面図である。なお、図2では長尺基板(ワーク)Wの一部を透視し(波線部)、本来は長尺基板Wに隠れる部分が見えるように描かれている。   FIG. 1 is a front view showing an overall configuration of an exposure apparatus 1 which is a roll-to-roll direct exposure apparatus according to the present invention. FIG. 2 is a plan view showing the overall configuration of the exposure apparatus 1. In FIG. 2, a part of the long substrate (work) W is seen through (broken line portion), and the portion hidden by the long substrate W is drawn.

露光装置1は、長尺基板Wの搬送経路に沿って順に、長尺基板Wの供給と巻取りをするリール駆動部10と、長尺基板Wの第1面にパターンを露光して電子回路を形成する第1露光処理部20と、搬送経路を折返す折返し部30と、長尺基板Wの第2面にパターンを露光して電子回路を形成する第2露光処理部40とを備えている。ここで長尺基板Wの第1面とはリール駆動部10の供給リール11から巻き出された基板の上面側を意味し、第2面とは供給リール11から巻き出された基板の下面側を意味する。   The exposure apparatus 1 exposes a pattern on the first surface of the long substrate W by exposing the pattern to the reel driving unit 10 that supplies and winds the long substrate W in order along the conveyance path of the long substrate W, and an electronic circuit. The first exposure processing unit 20 for forming the substrate, the folding unit 30 for folding the conveyance path, and the second exposure processing unit 40 for exposing the pattern to the second surface of the long substrate W to form an electronic circuit. Yes. Here, the first surface of the long substrate W means the upper surface side of the substrate unwound from the supply reel 11 of the reel driving unit 10, and the second surface means the lower surface side of the substrate unwound from the supply reel 11. Means.

長尺基板Wはフォトレジストなどの感光材料が塗布された銅張積層板などによるシート状の基板であり、数十〜数百メートルの長さを有する。露光後に現像やエッチング、裁断等の工程を経ることで、FPC基板の基材となる。   The long substrate W is a sheet-like substrate made of a copper-clad laminate coated with a photosensitive material such as a photoresist, and has a length of several tens to several hundreds of meters. The substrate of the FPC board is obtained by performing processes such as development, etching, and cutting after the exposure.

リール駆動部10は、供給リール(基板供給部)11、巻取りリール(基板巻取り手段)12、ガイドローラ13を備え、不図示の駆動系を用いて供給リール11および巻き取りリール12を回転駆動させる。それ以外にも、長尺基板Wの端面位置を検知するセンサや、長尺基板Wに掛かるテンションを調整する機構等を備えてもよい。   The reel drive unit 10 includes a supply reel (substrate supply unit) 11, a take-up reel (substrate take-up unit) 12, and a guide roller 13, and rotates the supply reel 11 and the take-up reel 12 using a drive system (not shown). Drive. In addition, a sensor that detects the position of the end surface of the long substrate W, a mechanism that adjusts the tension applied to the long substrate W, and the like may be provided.

リール駆動部10と第1露光処理部20の間には、長尺基板Wの搬送方向を90°変更するガイドローラ14、基板を制動(保持)する基板制動ローラ16、基板端面を検知するエッジセンサ21、長尺基板Wの搬送方向を90°変更するとともにエッジセンサ21の出力に従って基板端面位置を調整する補正ローラ15、が設けられている。   Between the reel driving unit 10 and the first exposure processing unit 20, a guide roller 14 that changes the transport direction of the long substrate W by 90 °, a substrate braking roller 16 that brakes (holds) the substrate, and an edge that detects the substrate end surface A sensor 21 and a correction roller 15 that changes the conveyance direction of the long substrate W by 90 ° and adjusts the position of the substrate end surface according to the output of the edge sensor 21 are provided.

第1露光処理部20は、露光ステージ24(第1露光ステージ)、一対のアライメントカメラ22(図2参照)及び第1露光ユニット(露光部)23を備え、長尺基板の第1面にパターンを露光する。ここで、露光処理部20における長尺基板Wの移動方向(搬送方向)をX方向、長尺基板Wと直交する方向(厚さ方向)をZ方向、X方向及びZ方向に直交する方向をY方向と定義する。   The first exposure processing unit 20 includes an exposure stage 24 (first exposure stage), a pair of alignment cameras 22 (see FIG. 2), and a first exposure unit (exposure unit) 23. A pattern is formed on the first surface of the long substrate. To expose. Here, the moving direction (transport direction) of the long substrate W in the exposure processing unit 20 is the X direction, the direction orthogonal to the long substrate W (thickness direction) is the Z direction, and the direction orthogonal to the X direction and the Z direction is. It is defined as the Y direction.

第1露光ユニット23は、複数の露光ヘッド(図示せず)を備え、長尺基板Wから所定距離だけ鉛直上方に離れた場所に規則的に配置されている。   The first exposure unit 23 includes a plurality of exposure heads (not shown), and is regularly arranged at a position vertically away from the long substrate W by a predetermined distance.

図3は1つの露光ヘッドの構成を示す概略図である。光源(水銀ランプ等)OP1から出た光は、照明光学系OP2及び折り返しミラーOP3を介して平行光となって光変調素子アレイOP4に入射する。光変調素子アレイOP4は、例えば複数のマイクロミラーを2次元配列させたDMD(Digital Micro-mirror Device)である。光変調素子アレイOP4で変調された光(UV)は、結像光学系OP5によって長尺基板上に結像する。また、露光ヘッドは光軸方向に沿って結像位置を調整する合焦光学系OP6を備えている。   FIG. 3 is a schematic diagram showing the configuration of one exposure head. The light emitted from the light source (such as a mercury lamp) OP1 becomes parallel light via the illumination optical system OP2 and the folding mirror OP3 and enters the light modulation element array OP4. The light modulation element array OP4 is, for example, a DMD (Digital Micro-mirror Device) in which a plurality of micromirrors are two-dimensionally arranged. The light (UV) modulated by the light modulation element array OP4 is imaged on the long substrate by the imaging optical system OP5. In addition, the exposure head includes a focusing optical system OP6 that adjusts the imaging position along the optical axis direction.

DMDを用いてパターンを多重露光する技術は、例えば特開2003−084444号公報に開示され、広汎に実用化されている周知技術である。また、複数ヘッドを用いて1つのパターンを描画する技術は、例えば特開2003−195512号公報に開示され、広汎に実用化されている周知技術である。   A technique of performing multiple exposure of a pattern using DMD is a well-known technique disclosed in, for example, Japanese Patent Application Laid-Open No. 2003-084444 and widely used. Further, a technique for drawing one pattern using a plurality of heads is a well-known technique disclosed in, for example, Japanese Patent Application Laid-Open No. 2003-195512 and widely used.

露光ステージ24は、長尺基板Wの裏面を吸着(例えば真空吸着)して平面状に保持するもので、X方向及びZ方向に自在に移動可能である。すなわち、架台BF上に、X方向に延びるガイドレールに移動自在に支持されたステージ移動部(第1相対移動手段)25が設けられ、露光ステージ24を昇降させる昇降部26が支持されている。ステージ移動部25にはリニアスケールやレーザ変位計等のステージ移動部25の位置を測定する手段(図示せず)が設けられており、露光ステージ24の移動量(すなわち長尺基板Wの送り量)を正確に測定することができる。   The exposure stage 24 sucks (for example, vacuum sucks) the back surface of the long substrate W and holds it in a flat shape, and is freely movable in the X direction and the Z direction. That is, a stage moving unit (first relative moving unit) 25 that is movably supported by a guide rail extending in the X direction is provided on the gantry BF, and an elevating unit 26 that moves the exposure stage 24 up and down is supported. The stage moving unit 25 is provided with means (not shown) for measuring the position of the stage moving unit 25 such as a linear scale or a laser displacement meter. The moving amount of the exposure stage 24 (that is, the feed amount of the long substrate W). ) Can be measured accurately.

露光ステージ24は、昇降部26によって、長尺基板Wの裏面に接触する上端位置と、長尺基板Wの裏面と離間する下端位置との間を昇降する。ステージ移動部25は、X方向に正逆(下流方向と上流方向)に移動可能である。ステージ移動部25は、長尺基板Wの長さ方向に露光ステージ24と露光ユニット23を相対移動させる相対移動手段を構成している。露光ステージ24が一度に長尺基板Wを吸着保持可能な範囲(面積)は、例えば620(X)×520(Y)mmである。   The exposure stage 24 moves up and down between the upper end position contacting the back surface of the long substrate W and the lower end position spaced apart from the back surface of the long substrate W by the lifting unit 26. The stage moving unit 25 can move forward and backward (downstream and upstream) in the X direction. The stage moving unit 25 constitutes a relative moving unit that relatively moves the exposure stage 24 and the exposure unit 23 in the length direction of the long substrate W. The range (area) in which the exposure stage 24 can hold the long substrate W at a time is, for example, 620 (X) × 520 (Y) mm.

一対のアライメントカメラ22は、露光ユニット23より上流側に設置され、長尺基板Wに設けられたアライメントマーク(図示せず)を撮像する。各アライメントカメラ22が撮像した画像は、画像処理部(図示せず)によって画像処理され、長尺基板Wと露光ユニット23との位置合わせ時の補正量算出に用いられる。   The pair of alignment cameras 22 is installed on the upstream side of the exposure unit 23 and images an alignment mark (not shown) provided on the long substrate W. An image captured by each alignment camera 22 is subjected to image processing by an image processing unit (not shown) and used for calculating a correction amount when aligning the long substrate W and the exposure unit 23.

折返し部(折返し手段)30には、ガイドローラ31および33と、基板を制動する基板制動ローラ32とが設けられる。ガイドローラ31および33が長尺基板Wを90°ずつ折り曲げるので、折返し部30の前後では長尺基板Wの搬送方向が180°反転する。それに伴い、折返し部30以降は長尺基板Wの第1面が下面側となり、第2面が上面側となる。   The folding portion (folding means) 30 is provided with guide rollers 31 and 33 and a substrate braking roller 32 for braking the substrate. Since the guide rollers 31 and 33 bend the long substrate W by 90 °, the conveyance direction of the long substrate W is reversed by 180 ° before and after the folded portion 30. Accordingly, the first surface of the long substrate W is on the lower surface side and the second surface is on the upper surface side after the folded portion 30.

折返し部30と露光処理部40の間では、長尺基板Wは架台(ベース部)BFの内部に設けられた通路を通って搬送される。また、折返し部30と露光処理部40との間には、ガイドローラ16と、長尺基板Wの搬送方向を90°変更し基板を制動するガイドローラ17と、基板端面を検知するエッジセンサ41と、長尺基板Wの搬送方向を90°変更するとともにエッジセンサ21の出力に従って基板端面位置を調整する補正ローラ15、が設けられる。   Between the turn-back unit 30 and the exposure processing unit 40, the long substrate W is conveyed through a passage provided in the gantry (base unit) BF. Further, between the folding unit 30 and the exposure processing unit 40, a guide roller 16, a guide roller 17 that changes the conveyance direction of the long substrate W by 90 ° and brakes the substrate, and an edge sensor 41 that detects the substrate end surface. And a correction roller 15 that changes the conveyance direction of the long substrate W by 90 ° and adjusts the position of the substrate end face according to the output of the edge sensor 21.

第2露光処理部40は、露光ステージ44(第2露光ステージ)、一対のアライメントカメラ42(図2参照)及び第2露光ユニット(露光部)43を備え、長尺基板の第2面にパターンを露光する。   The second exposure processing unit 40 includes an exposure stage 44 (second exposure stage), a pair of alignment cameras 42 (see FIG. 2), and a second exposure unit (exposure unit) 43, and a pattern is formed on the second surface of the long substrate. To expose.

アライメントカメラ42、第2露光ユニット43、露光ステージ44、ステージ移動部45、昇降部46は、それぞれ第1露光処理部20のアライメントカメラ22、第1露光ユニット23、露光ステージ24、ステージ移動部25、昇降部26と同様の機能を持っている。一方で、第1露光処理部20と第2露光処理部40とは、長尺基板の搬送方向が相違している。   The alignment camera 42, the second exposure unit 43, the exposure stage 44, the stage moving unit 45, and the elevating unit 46 are respectively the alignment camera 22, the first exposure unit 23, the exposure stage 24, and the stage moving unit 25 of the first exposure processing unit 20. It has the same function as the elevating unit 26. On the other hand, the first exposure processing unit 20 and the second exposure processing unit 40 are different in the transport direction of the long substrate.

すなわち、第1露光処理部20と第2露光処理部40は、X方向に相反するように対称な配置であり、X方向に相反するように動作する。例えば図1を用いて説明すると、第1露光処理部20の露光ステージ24が左方向に移動しながら長尺基板Wの第1面に走査露光を行う際に、第2露光処理部40の露光ステージ44は右方向に移動しながら長尺基板Wの第2面に走査露光を行う。   That is, the 1st exposure process part 20 and the 2nd exposure process part 40 are symmetrical arrangement | positioning so that it may oppose in the X direction, and operate | move so that it may conflict in the X direction. For example, referring to FIG. 1, when the exposure stage 24 of the first exposure processing unit 20 performs scanning exposure on the first surface of the long substrate W while moving in the left direction, the exposure of the second exposure processing unit 40 is performed. The stage 44 performs scanning exposure on the second surface of the long substrate W while moving in the right direction.

また、本発明の露光装置では、各部の長尺基板Wの搬送速度を合わせて露光動作を行なう。例えば、供給リール11は露光ステージ24の移動と同期して基板の巻出しを行う。これは供給リール11の長尺基板Wの残量に応じて、リール回転速度を常時調整することで実現する。露光ステージ44の移動と巻取りリール12の巻出しとの関係も同様である。更に、露光ステージ24と露光ステージ44も同様に同期して動作する。   In the exposure apparatus of the present invention, the exposure operation is performed in accordance with the transport speed of the long substrate W in each part. For example, the supply reel 11 unwinds the substrate in synchronization with the movement of the exposure stage 24. This is realized by constantly adjusting the reel rotation speed in accordance with the remaining amount of the long substrate W on the supply reel 11. The relationship between the movement of the exposure stage 44 and the unwinding of the take-up reel 12 is the same. Further, the exposure stage 24 and the exposure stage 44 operate similarly in synchronization.

このように搬送速度を合わせ、各部が同期して長尺基板Wを搬送することにより、長尺基板Wのロールエンド付近に発生する、基板両面にパターン露光をすることができない領域(段取りのための捨て領域)を短くすることができる。   In this way, by adjusting the transport speed and each part transporting the long substrate W in synchronism, an area that occurs near the roll end of the long substrate W and cannot be subjected to pattern exposure on both sides of the substrate (for setup purposes) Can be shortened.

また、本発明の露光装置では同一の架台BFに設けられた同じ高さのベース上にステージ移動部25とステージ移動部45を設置している。このような構成にしたことにより、露光装置の構成がシンプルとなり、露光装置がコンパクトになる。   In the exposure apparatus of the present invention, the stage moving unit 25 and the stage moving unit 45 are installed on the same height base provided on the same frame BF. By adopting such a configuration, the configuration of the exposure apparatus becomes simple and the exposure apparatus becomes compact.

また、本発明の露光装置では折返し部30を設ける構造上、供給リール11と巻取りリール12とが露光装置の同じサイド(図1では露光装置の右端部)に配置される。このような配置により、リールの交換が容易になり、生産性が向上する。   Further, in the exposure apparatus of the present invention, the supply reel 11 and the take-up reel 12 are arranged on the same side of the exposure apparatus (the right end part of the exposure apparatus in FIG. 1) due to the structure in which the turn-back portion 30 is provided. Such an arrangement facilitates reel replacement and improves productivity.

次に、本発明の露光装置の動作について説明する。露光装置1の動作は、長尺基板Wを搬送する搬送ステップと、長尺基板Wの搬送を停止し次の搬送ステップの準備を行う準備ステップとを交互に実施する。   Next, the operation of the exposure apparatus of the present invention will be described. The operation of the exposure apparatus 1 alternately performs a transport step for transporting the long substrate W and a preparation step for stopping transport of the long substrate W and preparing for the next transport step.

搬送ステップでは、リール駆動部が供給リール11と巻取りリール12の回転速度を制御し、所定の速度で長尺基板Wの送り出しと巻取りを行う。また、露光ステージ24と44が長尺基板Wを吸着した状態でX方向に移動しながら、準備ステップでのアライメント結果に従って補正した描画データを用いて、第1露光ユニット23と第2露光ユニット43が長尺基板の第1面と第2面にパターンを露光する。なお、搬送ステップ中は基板制動ローラ16と32は制動を解除する。   In the transport step, the reel driving unit controls the rotation speeds of the supply reel 11 and the take-up reel 12, and feeds and winds the long substrate W at a predetermined speed. Further, the first exposure unit 23 and the second exposure unit 43 are used by using the drawing data corrected in accordance with the alignment result in the preparation step while the exposure stages 24 and 44 move in the X direction while adsorbing the long substrate W. Exposes the pattern on the first and second surfaces of the long substrate. Note that the substrate braking rollers 16 and 32 release the braking during the transport step.

準備ステップでは、リール駆動部が供給リール11と巻取りリール12を停止し、基板制動ローラ16と32とを制動状態にする。露光ステージ24と44の基板吸着を解除し、昇降部を下降、させて露光ステージと長尺基板Wとを離間させる。次に、露光ステージ24、44を走査開始位置まで戻し、昇降部を上昇させる。基板制動ローラ16と32が制動を解除するとともに、露光ステージ24、44が長尺基板Wの吸着を行う。露光ステージとリール駆動部を駆動させながらアライメントカメラ22と42がアライメントマークの撮像し、描画データの位置補正処理を行う。その後、長尺基板Wがパターン露光開始位置に来るように露光ステージ24、44の位置を調整する。   In the preparation step, the reel driving unit stops the supply reel 11 and the take-up reel 12 and puts the substrate braking rollers 16 and 32 into a braking state. The substrate suction of the exposure stages 24 and 44 is released, and the elevating part is lowered to separate the exposure stage and the long substrate W from each other. Next, the exposure stages 24 and 44 are returned to the scanning start position, and the elevating unit is raised. The substrate braking rollers 16 and 32 release the braking, and the exposure stages 24 and 44 suck the long substrate W. The alignment cameras 22 and 42 image the alignment mark while driving the exposure stage and the reel driving unit, and perform a drawing data position correction process. Thereafter, the positions of the exposure stages 24 and 44 are adjusted so that the long substrate W comes to the pattern exposure start position.

以上の2つのステップを繰り返すことで、長尺基板Wの両面にパターンを形成することができる。   By repeating the above two steps, a pattern can be formed on both sides of the long substrate W.

以上の実施形態では図1を用いて説明したが、図1と基板の搬送方向が異なる場合でも本発明を適用する事ができる。例えば、第1露光処理部20と第2露光処理部40とを入れ替え、長尺基板Wの搬送方向を反転させてもよい。その場合、供給リール11と巻取りリール12の役割も入れ替えればよい。あるいは、リール駆動部10が露光装置の左端部に来るように、図1の鏡像関係となる構成としてもよい。   Although the above embodiment has been described with reference to FIG. 1, the present invention can be applied even when the substrate transport direction is different from FIG. For example, the first exposure processing unit 20 and the second exposure processing unit 40 may be interchanged to reverse the transport direction of the long substrate W. In that case, the roles of the supply reel 11 and the take-up reel 12 may be switched. Alternatively, the mirror image relationship of FIG. 1 may be adopted so that the reel driving unit 10 comes to the left end of the exposure apparatus.

また、以上の実施形態では、第1露光処理部と第2露光処理部を同一高さとして説明したが、露光装置のX方向長さを短縮するために露光処理部がZ方向に一部重なるように配置してもよい。   In the above embodiment, the first exposure processing unit and the second exposure processing unit are described as having the same height. However, in order to reduce the length of the exposure apparatus in the X direction, the exposure processing units partially overlap in the Z direction. You may arrange as follows.

また、長尺基板の搬送経路の各部に、必要に応じてダンサーローラ等の基板バッファを設けてもよい。この場合、長尺基板のロールエンド付近の両面露光できない領域が大きくなるが、各部の同期に関して条件を緩和する事ができ、搬送エラー要因を減らすことができる。   Moreover, you may provide board | substrate buffers, such as a dancer roller, in each part of the conveyance path | route of a long board | substrate as needed. In this case, the area where the double-sided exposure cannot be performed near the roll end of the long substrate becomes large, but the conditions regarding the synchronization of each part can be relaxed, and the cause of the transport error can be reduced.

以上に説明したように、本発明に係る露光装置によれば、長尺基板に対し、露光ステージを用いることで、基板の送り量を高精度に測定し、また、基板の平面性を確保した状態で基板の両面にパターンを描画する露光装置を得ることができる。   As described above, according to the exposure apparatus of the present invention, by using an exposure stage for a long substrate, the substrate feed amount is measured with high accuracy and the flatness of the substrate is ensured. An exposure apparatus that draws a pattern on both surfaces of the substrate in a state can be obtained.

1 露光装置
10 リール駆動部
11 供給リール
12 巻取りリール
20 第1露光処理部
22 アライメントカメラ
23 第1露光ユニット
24 露光ステージ
30 折返し部
40 第2露光処理部
42 アライメントカメラ
43 第2露光ユニット
44 露光ステージ
BF 架台
W 長尺基板
DESCRIPTION OF SYMBOLS 1 Exposure apparatus 10 Reel drive part 11 Supply reel 12 Take-up reel 20 1st exposure process part 22 Alignment camera 23 1st exposure unit 24 Exposure stage 30 Folding part 40 2nd exposure process part 42 Alignment camera 43 2nd exposure unit 44 Exposure Stage BF Base W Long substrate

Claims (7)

光変調素子アレイを備え、長尺基板の第1面に前記光変調素子アレイにより変調したパターン光を照射する第1露光部と、
前記長尺基板の長さ方向の一部を平面状に保持する第1露光ステージと、
前記長尺基板の長さ方向に、前記第1露光部と前記第1露光ステージとを相対移動させる第1相対移動手段と、
前記長尺基板の搬送経路を折返す折返し手段と、
光変調素子アレイを備え、前記長尺基板の第2面に前記光変調素子アレイにより変調したパターン光を照射する第2露光部と、
前記長尺基板の長さ方向の一部を平面状に保持する第2露光ステージと、
前記長尺基板の長さ方向に、前記第2露光部と第2露光ステージとを相対移動させる第2相対移動手段と、
を備えたことを特徴とする露光装置。
A first exposure unit including a light modulation element array, and irradiating a first surface of a long substrate with pattern light modulated by the light modulation element array;
A first exposure stage for holding a part of the length of the long substrate in a planar shape;
First relative movement means for relatively moving the first exposure unit and the first exposure stage in the length direction of the long substrate;
A folding means for folding the transport path of the long substrate;
A second exposure unit that includes a light modulation element array, and irradiates the second surface of the long substrate with pattern light modulated by the light modulation element array;
A second exposure stage for holding a part of the long substrate in the length direction in a planar shape;
Second relative movement means for relatively moving the second exposure unit and the second exposure stage in the length direction of the long substrate;
An exposure apparatus comprising:
前記第1露光部と前記第2露光部とが、それぞれ下方向に前記パターン光を照射することを特徴とする請求項1に記載の露光装置。   The exposure apparatus according to claim 1, wherein the first exposure unit and the second exposure unit irradiate the pattern light downward. 前記第1相対移動手段と前記第2相対移動手段とが、前記第1露光ステージと前記第2露光ステージとを、同期して前記長尺基板の長さ方向に沿った相反する方向にそれぞれ移動させるとともに、
前記第1露光部と前記第2露光部とが、前記第1露光ステージと前記第2露光ステージの移動に応じて、前記長尺基板に照射するパターン光をそれぞれ変調することを特徴とする請求項1または請求項2に記載の露光装置。
The first relative movement unit and the second relative movement unit move the first exposure stage and the second exposure stage in synchronization with each other in opposite directions along the length direction of the long substrate. As well as
The said 1st exposure part and the said 2nd exposure part respectively modulate the pattern light irradiated to the said elongate board | substrate according to the movement of a said 1st exposure stage and a said 2nd exposure stage. The exposure apparatus according to claim 1 or 2.
前記長尺基板を送り出す基板供給手段を備え、
前記基板供給手段が、前記第1露光ステージの移動に同期して前記長尺基板を送り出す速度を調整することを特徴とする請求項1乃至3のいずれかに記載の露光装置。
Comprising substrate supply means for feeding out the long substrate;
4. The exposure apparatus according to claim 1, wherein the substrate supply unit adjusts a speed at which the long substrate is sent out in synchronization with the movement of the first exposure stage.
前記長尺基板を巻取る基板巻取り手段を備え、
前記基板巻取り手段が、前記第2露光ステージの移動に同期して前記長尺基板を巻取る速度を調整することを特徴とする請求項4に記載の露光装置。
A substrate winding means for winding the long substrate;
The exposure apparatus according to claim 4, wherein the substrate winding unit adjusts a speed of winding the long substrate in synchronization with the movement of the second exposure stage.
前記基板供給手段と前記基板巻取り手段とが露光装置の同一サイドに設けられていることを特徴とする請求項5に記載の露光装置。   6. The exposure apparatus according to claim 5, wherein the substrate supply unit and the substrate winding unit are provided on the same side of the exposure apparatus. 前記第1相対移動手段と前記第2相対移動手段とが同じ高さのベース部に設けられていることを特徴とする請求項1乃至6のいずれかに記載の露光装置。   The exposure apparatus according to claim 1, wherein the first relative movement unit and the second relative movement unit are provided on a base portion having the same height.
JP2016110392A 2016-06-01 2016-06-01 Exposure equipment Active JP6723831B2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2016110392A JP6723831B2 (en) 2016-06-01 2016-06-01 Exposure equipment
CN201710395242.9A CN107450276B (en) 2016-06-01 2017-05-27 Exposure device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2016110392A JP6723831B2 (en) 2016-06-01 2016-06-01 Exposure equipment

Publications (2)

Publication Number Publication Date
JP2017215535A true JP2017215535A (en) 2017-12-07
JP6723831B2 JP6723831B2 (en) 2020-07-15

Family

ID=60486954

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016110392A Active JP6723831B2 (en) 2016-06-01 2016-06-01 Exposure equipment

Country Status (2)

Country Link
JP (1) JP6723831B2 (en)
CN (1) CN107450276B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2020052284A (en) * 2018-09-27 2020-04-02 株式会社オーク製作所 Exposure apparatus
CN113341657A (en) * 2020-03-03 2021-09-03 株式会社斯库林集团 Drawing device

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109733051A (en) * 2019-02-20 2019-05-10 安徽地势坤光电科技有限公司 Plate making method and plate making system of screen printing plate without net knots
US11551970B2 (en) * 2020-10-22 2023-01-10 Innolux Corporation Method for manufacturing an electronic device

Citations (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11204582A (en) * 1998-01-20 1999-07-30 Hitachi Ltd Manufacture of tape with bump, manufacture of semiconductor chip, and bump forming apparatus
JP2000056481A (en) * 1998-08-11 2000-02-25 Nippon Seiko Kk Aligning method for exposing device
JP2003045918A (en) * 2001-07-31 2003-02-14 Toppan Printing Co Ltd Aligner for tape carrier
JP2004347964A (en) * 2003-05-23 2004-12-09 Ushio Inc Double-sided projection exposure apparatus for belt-like work
JP2006098718A (en) * 2004-09-29 2006-04-13 Fuji Photo Film Co Ltd Drawing apparatus
JP2006106505A (en) * 2004-10-07 2006-04-20 Fuji Photo Film Co Ltd Device and method for image recording
JP2007102116A (en) * 2005-10-07 2007-04-19 Fujifilm Corp Digital exposure device
JP2007316589A (en) * 2006-04-26 2007-12-06 Orc Mfg Co Ltd Projection exposure device
JP2010217877A (en) * 2009-03-13 2010-09-30 Nikon Corp Exposure apparatus, exposure method, and method of manufacturing device
JP2011084402A (en) * 2009-09-25 2011-04-28 Nikon Corp Substrate cartridge, substrate treatment apparatus, substrate treatment system, control apparatus and method of manufacturing display element
WO2011099563A1 (en) * 2010-02-12 2011-08-18 株式会社ニコン Substrate processing device
US20110199414A1 (en) * 2010-02-12 2011-08-18 Xerox Corporation Continuous Feed Duplex Printer
JP2012203265A (en) * 2011-03-25 2012-10-22 Hitachi Via Mechanics Ltd Inverting device, exposure apparatus using the same, and exposure method
WO2015044437A1 (en) * 2013-09-30 2015-04-02 Flint Group Germany Gmbh Device and method for the in-line production of flexographic printing plates
CN206400258U (en) * 2016-11-07 2017-08-11 俞庆平 A kind of double-side exposure device of flexible material

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62293248A (en) * 1986-06-13 1987-12-19 Mamiya Koki Kk Method for exposing both-face of flexible substrate
JP6510768B2 (en) * 2014-05-23 2019-05-08 株式会社オーク製作所 Exposure device

Patent Citations (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11204582A (en) * 1998-01-20 1999-07-30 Hitachi Ltd Manufacture of tape with bump, manufacture of semiconductor chip, and bump forming apparatus
JP2000056481A (en) * 1998-08-11 2000-02-25 Nippon Seiko Kk Aligning method for exposing device
JP2003045918A (en) * 2001-07-31 2003-02-14 Toppan Printing Co Ltd Aligner for tape carrier
JP2004347964A (en) * 2003-05-23 2004-12-09 Ushio Inc Double-sided projection exposure apparatus for belt-like work
JP2006098718A (en) * 2004-09-29 2006-04-13 Fuji Photo Film Co Ltd Drawing apparatus
JP2006106505A (en) * 2004-10-07 2006-04-20 Fuji Photo Film Co Ltd Device and method for image recording
JP2007102116A (en) * 2005-10-07 2007-04-19 Fujifilm Corp Digital exposure device
JP2007316589A (en) * 2006-04-26 2007-12-06 Orc Mfg Co Ltd Projection exposure device
JP2010217877A (en) * 2009-03-13 2010-09-30 Nikon Corp Exposure apparatus, exposure method, and method of manufacturing device
JP2011084402A (en) * 2009-09-25 2011-04-28 Nikon Corp Substrate cartridge, substrate treatment apparatus, substrate treatment system, control apparatus and method of manufacturing display element
WO2011099563A1 (en) * 2010-02-12 2011-08-18 株式会社ニコン Substrate processing device
US20110199414A1 (en) * 2010-02-12 2011-08-18 Xerox Corporation Continuous Feed Duplex Printer
JP2012203265A (en) * 2011-03-25 2012-10-22 Hitachi Via Mechanics Ltd Inverting device, exposure apparatus using the same, and exposure method
WO2015044437A1 (en) * 2013-09-30 2015-04-02 Flint Group Germany Gmbh Device and method for the in-line production of flexographic printing plates
CN206400258U (en) * 2016-11-07 2017-08-11 俞庆平 A kind of double-side exposure device of flexible material

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2020052284A (en) * 2018-09-27 2020-04-02 株式会社オーク製作所 Exposure apparatus
JP7175150B2 (en) 2018-09-27 2022-11-18 株式会社オーク製作所 Exposure device
CN113341657A (en) * 2020-03-03 2021-09-03 株式会社斯库林集团 Drawing device
KR20210111680A (en) * 2020-03-03 2021-09-13 가부시키가이샤 스크린 홀딩스 Drawing apparatus
JP2021139978A (en) * 2020-03-03 2021-09-16 株式会社Screenホールディングス Drawing apparatus
KR102578965B1 (en) * 2020-03-03 2023-09-14 가부시키가이샤 스크린 홀딩스 Drawing apparatus
JP7441076B2 (en) 2020-03-03 2024-02-29 株式会社Screenホールディングス drawing device
CN113341657B (en) * 2020-03-03 2024-09-27 株式会社斯库林集团 Drawing device

Also Published As

Publication number Publication date
CN107450276B (en) 2021-06-11
JP6723831B2 (en) 2020-07-15
CN107450276A (en) 2017-12-08

Similar Documents

Publication Publication Date Title
JP6510768B2 (en) Exposure device
JP5144992B2 (en) Exposure equipment
US20080031640A1 (en) Method Of Calibrating Alignment Section, Image-Drawing Device With Calibrated Alignment Section, And Conveying Device
CN107450276B (en) Exposure device
JP5117243B2 (en) Exposure equipment
JP2006098718A (en) Drawing apparatus
JP5114061B2 (en) Projection exposure equipment
JP2006098725A (en) Correction method of drawing position, and drawing apparatus capable of correcting drawing position
KR102439362B1 (en) Maskless exposure device and exposure method
JPWO2013065451A1 (en) Substrate processing apparatus and substrate processing method
JP2019053140A (en) Exposure device
JP7175150B2 (en) Exposure device
KR102578965B1 (en) Drawing apparatus
JP7446687B2 (en) direct exposure equipment
JP7175149B2 (en) Exposure device and exposure method
TW202321825A (en) Exposure apparatus capable of performing a heat treatment immediately after a long substrate is exposed
JP2016070953A (en) Direct exposure device
JP6460699B2 (en) Direct exposure system
TW201942684A (en) Exposure device with a substrate conveying system capable of suppressing the meandering of a long substrate
JP2018205330A (en) Light exposure device and substrate mounting method

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20190513

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20200219

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20200317

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20200507

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20200623

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20200624

R150 Certificate of patent or registration of utility model

Ref document number: 6723831

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250