JP2017215456A - Substrate treatment apparatus, substrate treatment method, program and article production method - Google Patents

Substrate treatment apparatus, substrate treatment method, program and article production method Download PDF

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JP2017215456A
JP2017215456A JP2016109238A JP2016109238A JP2017215456A JP 2017215456 A JP2017215456 A JP 2017215456A JP 2016109238 A JP2016109238 A JP 2016109238A JP 2016109238 A JP2016109238 A JP 2016109238A JP 2017215456 A JP2017215456 A JP 2017215456A
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substrate
processing
unit
units
preprocessing
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JP6320457B2 (en
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洋佑 宝田
Hirosuke Takarada
洋佑 宝田
義人 多田
Yoshito Tada
義人 多田
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Canon Inc
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67242Apparatus for monitoring, sorting or marking
    • H01L21/67276Production flow monitoring, e.g. for increasing throughput
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20Exposure; Apparatus therefor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02107Forming insulating materials on a substrate
    • H01L21/02296Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer
    • H01L21/02299Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer pre-treatment
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/027Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67242Apparatus for monitoring, sorting or marking
    • H01L21/67259Position monitoring, e.g. misposition detection or presence detection
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/673Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
    • H01L21/67346Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders characterized by being specially adapted for supporting a single substrate or by comprising a stack of such individual supports
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67739Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
    • H01L21/67742Mechanical parts of transfer devices

Abstract

PROBLEM TO BE SOLVED: To provide a substrate treatment apparatus configured to conduct a transfer control of a substrate advantageous in productivity.SOLUTION: A substrate treatment apparatus includes: a first processing part configured to conduct first processing to a first substrate; a second processing part configured to conduct second processing to the first substrate having received the first processing; a determination part configured to determine a timing for putting a second substrate into the first processing part according to the time required for the second processing; and a change part configured to change an order of processing so that, when receiving a new processing request to process a third substrate while waiting for the putting of the second substrate until the determined timing, the third substrate is put into the first processing part ahead of the second substrate.SELECTED DRAWING: Figure 1

Description

本発明は、基板処理装置、基板処理方法、プログラム、及び物品製造方法に関する。   The present invention relates to a substrate processing apparatus, a substrate processing method, a program, and an article manufacturing method.

それぞれがパターン形成等の基板処理を行う複数の処理部を備える、いわゆるクラスタ型の基板処理装置がある。クラスタ型の基板処理装置では、一般に、フットプリントの縮小や装置コストの低減の観点から、基板の搬送部が複数の処理部の間で共用される一方、スループット向上の観点から、各処理部での基板処理が並列処理される。   There is a so-called cluster-type substrate processing apparatus that includes a plurality of processing units each performing substrate processing such as pattern formation. In a cluster type substrate processing apparatus, in general, a substrate transport unit is shared among a plurality of processing units from the viewpoint of reducing a footprint or reducing an apparatus cost. The substrate processing is performed in parallel.

クラスタ型の基板処理装置は、複数の処理部に加えて種々の前処理部等を含みうる。基板処理装置全体で高い生産性を達成するためには処理フローを最適化することが必要な場合がある(特許文献1)。   The cluster type substrate processing apparatus can include various preprocessing units in addition to a plurality of processing units. In order to achieve high productivity in the entire substrate processing apparatus, it may be necessary to optimize the processing flow (Patent Document 1).

近年、物品の回路パターンの微細化が進んでおり、処理部に対して高い精度が求められている。ところが複数の処理部の間には、取り付け誤差や処理部内の動作や状態に機差があるため、特定の基板は特定の処理部でしか実行されないよう並列処理に制約が設けられる(特許文献1)。複数の基板収納部からの基板を複数の処理部で並列処理する場合、処理対象の基板は当該複数の基板収納部から周期的に取り出されて、順次、前処理部に投入されていく。前処理部で前処理が済んだ基板は、その基板が収納されていた基板収納部に対応する処理部へと投入される。   In recent years, miniaturization of circuit patterns of articles has progressed, and high accuracy is required for the processing unit. However, there are differences in attachment errors and operations and states in the processing units among the plurality of processing units, and thus there is a restriction on parallel processing so that a specific board can be executed only by a specific processing unit (Patent Document 1). ). When parallel processing of substrates from a plurality of substrate storage units is performed by a plurality of processing units, substrates to be processed are periodically taken out from the plurality of substrate storage units and sequentially introduced into the preprocessing unit. The substrate that has been pre-processed by the pre-processing unit is put into a processing unit corresponding to the substrate storage unit in which the substrate is stored.

特許第4621698号公報Japanese Patent No. 4621698 特開2015−195355号公報JP-A-2015-195355

ここで、例えば他の基板収納部を用いた新たな基板処理のジョブが追加された場合を考える。この場合、基板処理装置全体で高い生産性を達成するためには、当該他の基板収納部からの基板をいち早く前処理部に割込みで搬送して、周期的な処理フローに入り込ませることが必要である。   Here, for example, consider a case where a new substrate processing job using another substrate storage unit is added. In this case, in order to achieve high productivity in the entire substrate processing apparatus, it is necessary to quickly transfer the substrate from the other substrate storage unit to the preprocessing unit by interruption and enter the periodic processing flow. It is.

しかし、従来の運用では、多くの場合、前処理部には基板が存在し、対応する処理部で先の基板が搬出されるのを待機している状態である。したがって、当該対応する処理部で先の基板が搬出され、それに応じて前処理部から基板が搬出されるのを待ってから、当該他の基板収納部からの基板を前処理部に搬送する必要があった。このため、早いタイミングで前処理部に割り込ませるのは困難であった。   However, in the conventional operation, in many cases, a substrate exists in the preprocessing unit, and the corresponding processing unit waits for the previous substrate to be carried out. Therefore, it is necessary to wait for the previous substrate to be unloaded from the corresponding processing unit and to unload the substrate from the preprocessing unit accordingly, and then to transfer the substrate from the other substrate storage unit to the preprocessing unit. was there. For this reason, it was difficult to interrupt the preprocessing unit at an early timing.

本発明は、例えば、生産性の点で有利な基板の搬送制御を行う基板処理装置を提供することを目的とする。   An object of the present invention is, for example, to provide a substrate processing apparatus that performs substrate transfer control which is advantageous in terms of productivity.

本発明の一側面によれば、第1基板に対して第1処理を行う第1処理部と、前記第1処理が行われた前記第1基板に対して第2処理を行う第2処理部と、前記第2処理に要する時間に基づいて、前記第1処理部へ第2基板を投入するタイミングを決定する決定部と、前記決定されたタイミングまで前記第2基板の投入を待機している間に第3基板を処理する新たな処理要求を受け付けた場合に、該第3基板を前記第2基板に優先して前記第1処理部に投入するよう処理順を変更する変更部とを有する基板処理装置が提供される。   According to an aspect of the present invention, a first processing unit that performs a first process on a first substrate and a second processing unit that performs a second process on the first substrate on which the first process has been performed. And a determination unit for determining a timing for loading the second substrate into the first processing unit based on a time required for the second processing, and waiting for the loading of the second substrate until the determined timing. And a change unit that changes the processing order so that the third substrate is put into the first processing unit in preference to the second substrate when a new processing request for processing the third substrate is received. A substrate processing apparatus is provided.

本発明によれば、例えば、生産性の点で有利な基板の搬送制御を行う基板処理装置を提供することができる。   According to the present invention, for example, it is possible to provide a substrate processing apparatus that performs substrate transfer control that is advantageous in terms of productivity.

実施形態における基板処理装置の構成を示す図。The figure which shows the structure of the substrate processing apparatus in embodiment. 実施形態における制御部の機能構成を示すブロック図。The block diagram which shows the function structure of the control part in embodiment. 実施形態における管理データの例を示す図。The figure which shows the example of the management data in embodiment. 実施形態における基板の処理フローの例を示す図。The figure which shows the example of the processing flow of the board | substrate in embodiment. 基板処理装置における各ユニットの基板1枚あたりの総処理時間の例を示す図。The figure which shows the example of the total processing time per board | substrate of each unit in a substrate processing apparatus. 次のユニットへの基板の最大搬送時間の例を示す図。The figure which shows the example of the maximum conveyance time of the board | substrate to the next unit. 2つの処理部が関与する場合の基板の処理フローの例を示す図。The figure which shows the example of the process flow of a board | substrate in case two process parts are concerned. 3つの処理部が慣用する場合の基板の処理フローの例を示す図。The figure which shows the example of the process flow of a board | substrate in case three process parts are used. 図7の処理フローにおいて、他の基板収納部を用いる新たなジョブが割り当てられた時の管理データの例を示す図。The figure which shows the example of the management data when the new job which uses another board | substrate storage part is allocated in the processing flow of FIG. 図9のJob1,Job2の基板の処理における一部区間のタイミングチャート。10 is a timing chart of a partial section in the processing of the substrates of Job1 and Job2 in FIG. 処理中である処理部の数が1〜4のそれぞれの場合における各前処理系における待機時間と総待機時間の例を示す図。The figure which shows the example of the waiting time in each pre-processing system in each case where the number of the process parts in process is 1-4, and total waiting time. 図9のJob1,Job2の基板を処理中に新たなJob3が割り当てられた時の管理データの例を示す図。FIG. 10 is a diagram illustrating an example of management data when a new job 3 is assigned during processing of the boards of Job 1 and Job 2 in FIG. 9. 他の基板収納部の基板を用いる新たなジョブが割り当てられた時の管理データの例を示す図。The figure which shows the example of management data when the new job which uses the board | substrate of another board | substrate storage part is allocated. 実施形態における基板の搬送制御処理を示すフローチャート。5 is a flowchart illustrating substrate transfer control processing according to the embodiment. 実施形態における基板の処理フローの例を示す図。The figure which shows the example of the processing flow of the board | substrate in embodiment. 基板処理装置における各ユニットの基板1枚あたりの総処理時間の例を示す図。The figure which shows the example of the total processing time per board | substrate of each unit in a substrate processing apparatus. 実施形態における基板の処理フローの例を示す図。The figure which shows the example of the processing flow of the board | substrate in embodiment. 実施形態における基板の搬送制御処理を示すフローチャート。5 is a flowchart illustrating substrate transfer control processing according to the embodiment.

以下、図面を参照して本発明の好適な実施形態について詳細に説明する。なお、本発明は以下の実施形態に限定されるものではなく、本発明の実施に有利な具体例を示すにすぎない。また、以下の実施形態の中で説明されている特徴の組み合わせの全てが本発明の課題解決のために必須のものであるとは限らない。   DESCRIPTION OF EMBODIMENTS Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the drawings. In addition, this invention is not limited to the following embodiment, It shows only the specific example advantageous for implementation of this invention. Moreover, not all combinations of features described in the following embodiments are indispensable for solving the problems of the present invention.

<第1実施形態>
図1は、実施形態における基板処理装置1の概略構成を示す平面図である。基板処理装置1は、それぞれが基板に対して処理を実施する複数の処理部ISTを有し、各処理部で並行して処理を実施する、いわゆるクラスタ型の基板処理装置である。図1の例において、複数の処理部ISTは、4つの処理部IST1,IST2,IST3,IST4を含む。ただし、本発明は特定の処理部の数に限定されるものではない。複数の処理部の各々は、基板に対してパターン形成を行うリソグラフィ装置(露光装置、荷電粒子線描画装置、インプリント装置等)、成膜装置(CVD装置等)、加工装置(レーザー加工装置等)でありうる。インプリント装置は、基板の上に供給された樹脂などのインプリント材に型(原版)を接触させた状態で該樹脂を硬化させることによって基板の上にパターンを形成する。露光装置は、基板の上に供給されたフォトレジストを原版を介して露光することによって該フォトレジストに原版のパターンに対応する潜像を形成する。荷電粒子線描画装置は、基板の上に供給されたフォトレジストに荷電粒子線によってパターンを描画することによって該フォトレジストに潜像を形成する。あるいは、複数の処理部の各々は、基板を洗浄する洗浄装置、基板に対してエッチングを行うエッチング装置、基板を検査する検査装置、基板に対してレジスト(薬液)を塗布する塗布装置のいずれかであってもよい。
<First Embodiment>
FIG. 1 is a plan view showing a schematic configuration of a substrate processing apparatus 1 in the embodiment. The substrate processing apparatus 1 is a so-called cluster type substrate processing apparatus that includes a plurality of processing units IST that each perform processing on a substrate, and performs processing in parallel in each processing unit. In the example of FIG. 1, the plurality of processing units IST include four processing units IST1, IST2, IST3, and IST4. However, the present invention is not limited to the number of specific processing units. Each of the plurality of processing units includes a lithography apparatus (exposure apparatus, charged particle beam drawing apparatus, imprint apparatus, etc.), a film forming apparatus (CVD apparatus, etc.), a processing apparatus (laser processing apparatus, etc.) that performs pattern formation on the substrate. ). The imprint apparatus forms a pattern on a substrate by curing the resin in a state where a mold (original) is in contact with an imprint material such as resin supplied on the substrate. The exposure apparatus exposes the photoresist supplied on the substrate through the original, thereby forming a latent image corresponding to the pattern of the original on the photoresist. The charged particle beam drawing apparatus forms a latent image on the photoresist by drawing a pattern with the charged particle beam on the photoresist supplied onto the substrate. Alternatively, each of the plurality of processing units is either a cleaning device that cleans the substrate, an etching device that etches the substrate, an inspection device that inspects the substrate, or a coating device that applies a resist (chemical solution) to the substrate It may be.

基板処理装置1は、複数の処理部IST1〜IST4に対して基板を搬送する搬送部3a,3bを有する。搬送部3a,3bはそれぞれ、不図示の搬送ハンドを有するロボットを含み、複数の基板を並行して搬送することができる。搬送部3a,3bは、後述する複数の基板収納部と、前処理部4a,4bと、複数の処理部ISTとの間で共用される搬送路に沿って基板を搬送するように構成されている。   The substrate processing apparatus 1 includes transport units 3a and 3b that transport substrates to a plurality of processing units IST1 to IST4. Each of the transfer units 3a and 3b includes a robot having a transfer hand (not shown) and can transfer a plurality of substrates in parallel. The transport units 3a and 3b are configured to transport substrates along a transport path that is shared among a plurality of substrate storage units to be described later, the preprocessing units 4a and 4b, and the plurality of processing units IST. Yes.

前処理部4a,4bは、順次実行される互いに異なる前処理を行う複数の前処理部を含む。具体的には、前処理部4a,4bは、基板が複数の処理部ISTで基板処理を行うのに適した状態となるように、当該基板に対して熱処理、温調処理、位置決め処理等の前処理を実施する。例えば、前処理部4aは、基板の加熱処理を行うベーカー(PBK)、及び、加熱処理された基板を一定温度に冷却するチラー(PCP)を含みうる。また格納部5aは、前処理部4aで処理済みの基板を受け取り次の前処理部4bに渡すためのインタフェースとして機能する。ここで、格納部5aが前処理部4aで処理済みの基板を受け取る動作を、リレーイン(FI)とよび、搬送部3bが格納部5aから基板を取り出して前処理部4bに渡す動作を、リレーアウト(FO)とよぶ。前処理部4bは、基板の温調処理(WTC)部、及び、プリアライメント(PA)部を含みうる。プリアライメントとは、例えば、受け取った基板を処理部ISTへ搬送する前に、基板を駆動しながら基板の外周及びノッチもしくはオリエンテーションフラットを検知することにより、基板の位置および回転角の少なくとも一方を調整することをいう。以降では、上記したような各種機能を含んだ前処理部4a,4b及び格納部5a,5bをまとめて、前処理系と呼ぶことがある。   The preprocessing units 4a and 4b include a plurality of preprocessing units that perform different preprocessing executed sequentially. Specifically, the pre-processing units 4a and 4b perform heat treatment, temperature adjustment processing, positioning processing, etc. on the substrate so that the substrate is in a state suitable for performing substrate processing by the plurality of processing units IST. Perform pre-processing. For example, the pretreatment unit 4a may include a baker (PBK) that performs heat treatment of the substrate, and a chiller (PCP) that cools the heat-treated substrate to a certain temperature. The storage unit 5a functions as an interface for receiving a substrate processed by the preprocessing unit 4a and passing it to the next preprocessing unit 4b. Here, the operation in which the storage unit 5a receives the substrate processed by the preprocessing unit 4a is called relay-in (FI), and the operation in which the transport unit 3b takes out the substrate from the storage unit 5a and passes it to the preprocessing unit 4b. This is called relay out (FO). The pre-processing unit 4b may include a substrate temperature adjustment processing (WTC) unit and a pre-alignment (PA) unit. Pre-alignment, for example, adjusts at least one of the position and rotation angle of the substrate by detecting the outer periphery and notch or orientation flat of the substrate while driving the substrate before transporting the received substrate to the processing unit IST. To do. Hereinafter, the preprocessing units 4a and 4b and the storage units 5a and 5b including various functions as described above may be collectively referred to as a preprocessing system.

基板処理装置1は、それぞれが複数の基板を収納可能な、複数の基板収納部FP(収納容器)を接続可能である。図1の例において、4つの基板収納部FP1,FP2,FP3,FP4のそれぞれと、4つの処理部IST1,IST2,IST3,IST4との対応関係が予め定められている。この対応関係は、後述する管理データにて特定される。そして、各基板は、基本的には、該基板を収納していた基板収納部に対応するパターン形成部で処理される。複数の基板収納部FP1,FP2,FP3,FP4はそれぞれ、基板処理装置1内外へ基板を搬入出するための容器であり、各容器は複数の基板を収納可能である。なお、基板処理装置1は、4つの基板収納部FP1,FP2,FP3,FP4に加えて更なる基板収納部を接続することも可能に構成されている。   The substrate processing apparatus 1 can connect a plurality of substrate storage units FP (storage containers), each of which can store a plurality of substrates. In the example of FIG. 1, the correspondence between each of the four substrate storage units FP1, FP2, FP3, and FP4 and the four processing units IST1, IST2, IST3, and IST4 is determined in advance. This correspondence is specified by management data described later. Each substrate is basically processed by a pattern forming unit corresponding to the substrate storage unit that has stored the substrate. Each of the plurality of substrate storage units FP1, FP2, FP3, and FP4 is a container for carrying a substrate in and out of the substrate processing apparatus 1, and each container can store a plurality of substrates. The substrate processing apparatus 1 is configured to be able to connect further substrate storage units in addition to the four substrate storage units FP1, FP2, FP3, and FP4.

制御部7は、基板処理装置1の動作を統括的に制御するものであり、処理部IST1〜IST4における基板処理、搬送部3a,3bによる基板搬送、前処理系による前処理等を制御する。制御部7はとりわけ、複数の基板収納部のうちの一部の基板収納部を用いた基板処理のジョブの実行時、そのジョブに関与する処理部において複数の基板処理が並列に行われるように、搬送部による複数の基板収納部から前処理部への基板の搬送を制御する。また、制御部7は、基板の処理量を最大化するために、複数の基板の処理順を決定し、基板の搬送、前処理、格納、処理が最適となるようスケジューリングする。制御部7は、不図示のCPUまたはDSPなどの計算部と、上記スケジューリングを行うための制御プログラムやレシピなどを記憶するメモリやハードディスクなどの記憶部とを含みうる。なお、レシピとは、基板を処理する際の一連の処理パラメータを含むデータをいう。   The control unit 7 comprehensively controls the operation of the substrate processing apparatus 1 and controls substrate processing in the processing units IST1 to IST4, substrate transfer by the transfer units 3a and 3b, preprocessing by the preprocessing system, and the like. In particular, when the control unit 7 executes a substrate processing job using a part of the plurality of substrate storage units, a plurality of substrate processes are performed in parallel in the processing units involved in the job. The transporting unit controls the transport of the substrate from the plurality of substrate storage units to the pretreatment unit. In addition, the control unit 7 determines the processing order of a plurality of substrates in order to maximize the processing amount of the substrates, and schedules the substrate transport, preprocessing, storage, and processing to be optimal. The control unit 7 may include a calculation unit such as a CPU or a DSP (not shown) and a storage unit such as a memory or a hard disk that stores a control program or a recipe for performing the scheduling. The recipe means data including a series of processing parameters when processing a substrate.

図2は、制御部7の機能構成を示すブロック図である。制御部7は、主制御部201と、処理系制御部202と、ジョブ実行部203と、搬送系制御部204と、レシピ管理部205と、処理順管理部206とを含む。なお、これらは、上記した制御プログラムにおけるモジュールとして実現されてもよい。処理系制御部202は、ジョブ実行部203で生成された基板処理装置1内部のジョブ(処理指令)を実行し、複数の処理部IST1〜IST4のそれぞれの状態を管理情報として管理する。レシピ管理部205は、記憶部207に記憶されているレシピ207aを管理する。ジョブ実行部203は、ホストコンピュータまたはユーザにより基板処理装置1に投入されたジョブを複数の処理部IST1〜IST4で実行可能な処理部レベルの内部ジョブに分解する。そしてジョブ実行部203は、該内部ジョブの進行状況に基づいて基板処理装置1全体のジョブの進捗を管理する。搬送系制御部204は、搬送部3a,3b、前処理部4a,4b、格納部5a,5bの駆動制御を含む、基板の受け渡し動作、前処理動作を制御する。処理順管理部206は、主制御部201により決定された基板の処理順を管理する。基板の処理順は、記憶部207に記憶される管理データ207bに記述される。   FIG. 2 is a block diagram illustrating a functional configuration of the control unit 7. The control unit 7 includes a main control unit 201, a processing system control unit 202, a job execution unit 203, a transport system control unit 204, a recipe management unit 205, and a processing order management unit 206. Note that these may be realized as modules in the control program described above. The processing system control unit 202 executes a job (processing instruction) inside the substrate processing apparatus 1 generated by the job execution unit 203, and manages each state of the plurality of processing units IST1 to IST4 as management information. The recipe management unit 205 manages the recipe 207 a stored in the storage unit 207. The job execution unit 203 decomposes a job input to the substrate processing apparatus 1 by a host computer or a user into processing unit level internal jobs that can be executed by the plurality of processing units IST1 to IST4. The job execution unit 203 manages the progress of the job of the entire substrate processing apparatus 1 based on the progress status of the internal job. The transport system control unit 204 controls the substrate transfer operation and the preprocessing operation including drive control of the transport units 3a and 3b, the preprocessing units 4a and 4b, and the storage units 5a and 5b. The processing order management unit 206 manages the processing order of the substrates determined by the main control unit 201. The processing order of the substrates is described in the management data 207b stored in the storage unit 207.

主制御部201は、基板処理装置レベルのジョブで指定された基板群における基板の処理順を決定し、処理順管理部206へ通知する。基板の処理順は、例えば、処理部IST1〜IST4の情報と、処理系制御部202の状態と、搬送系制御部204の状態とに基づいて決定される。また、主制御部201は、決定された処理順で基板が処理されるように、ジョブ実行部203及び搬送系制御部204を制御する。   The main control unit 201 determines the processing order of the substrates in the substrate group designated by the substrate processing apparatus level job, and notifies the processing order management unit 206 of the processing order. The processing order of the substrates is determined based on, for example, information on the processing units IST1 to IST4, the state of the processing system control unit 202, and the state of the transport system control unit 204. Further, the main control unit 201 controls the job execution unit 203 and the transport system control unit 204 so that the substrates are processed in the determined processing order.

図3に、管理データ207bの一例を示す。管理データ207bには、基板処理装置レベルのジョブ毎に、当該ジョブに関与する処理部、その処理部に対応する基板収納部(収納容器)、基板番号が記述される。実施形態において、基板IDは「PiWj」で表され、Piはジョブ番号を、Wjは基板の番号を表している。例えば、一番上の「P1W1」は、Job1における1番目の基板を示している。各基板収納部には、1ロット25枚(W1〜W25)の基板が収納されていることがわかる。そして、管理データ207bには更に、基板IDごとに、基板の状態、基板の位置、及び処理順が記述されている。「基板の状態」とは、前処理部あるいは処理部での処理の現況を表している。また、「基板の位置」とは、基板が現在基板処理装置あるいは基板収納部のうちのどこにあるかを表している。処理部IST1〜IST4において、取り付け誤差や処理部内の動作や状態に誤差があるため、特に微細な精度が要求されるプロセスでは、特定の基板は特定の処理部でしか実行できない。また、基板収納部FP1〜FP4内の基板それぞれに対して、異なる処理部を割り当てる場合は、基板単位でレシピや誤差(オフセット)の管理が必要となるため、外部システムにおける基板の管理が煩雑となる。よって、図3に示されるように、各ジョブにおいて、1ロット内の各基板は同じ処理部で処理される運用が一般的である。   FIG. 3 shows an example of the management data 207b. In the management data 207b, for each job at the substrate processing apparatus level, a processing unit involved in the job, a substrate storage unit (storage container) corresponding to the processing unit, and a substrate number are described. In the embodiment, the board ID is represented by “PiWj”, Pi represents the job number, and Wj represents the board number. For example, “P1W1” at the top indicates the first substrate in Job1. It can be seen that each substrate storage unit stores 25 substrates (W1 to W25) of one lot. The management data 207b further describes the state of the substrate, the position of the substrate, and the processing order for each substrate ID. The “substrate state” represents the current state of processing in the preprocessing unit or processing unit. The “substrate position” indicates where the substrate is currently located in the substrate processing apparatus or the substrate storage unit. In the processing units IST1 to IST4, there are errors in attachment errors and operations and states in the processing units. Therefore, in a process that requires particularly fine accuracy, a specific substrate can be executed only by a specific processing unit. In addition, when different processing units are assigned to the substrates in the substrate storage units FP1 to FP4, it is necessary to manage recipes and errors (offsets) in units of substrates, which makes it difficult to manage the substrates in the external system. Become. Therefore, as shown in FIG. 3, in each job, each substrate in one lot is generally processed by the same processing unit.

主制御部201は、各ジョブに対する基板収納部FPと処理部ISTの情報と、基板の状態及び位置から、基板の処理順を決定して処理順管理部206へ通知する。ここで、基板の処理順とは、特に処理部IST1〜IST4で処理中の基板も含めた、処理部IST1〜IST4で処理する予定の基板の順序のことである。処理部IST1〜IST4は、単位時間当たりの基板の処理量(スループット)が少ないため、主制御部201は処理部IST1〜IST4が待機状態とならずに、可能な限り並行して処理できるように、処理順を決定する。   The main control unit 201 determines the processing order of the substrates from the information of the substrate storage unit FP and the processing unit IST for each job, and the state and position of the substrates, and notifies the processing order management unit 206 of them. Here, the processing order of the substrates refers to the order of the substrates scheduled to be processed by the processing units IST1 to IST4, particularly including the substrates being processed by the processing units IST1 to IST4. Since the processing units IST1 to IST4 have a small substrate processing amount (throughput) per unit time, the main control unit 201 can perform processing in parallel as much as possible without the processing units IST1 to IST4 being in a standby state. Determine the processing order.

複数の基板収納部から同じ順序で周期的に基板を取り出してそれぞれ対応する処理部で基板処理が周期的に行われることを、「周期的にジョブが進行する」という。周期的にジョブが進行する場合は、サイクリックスケジューリングを当てはめて基板の処理順を決定すればよい。また、特許第4621698号公報のように基板の処理フローにおける対立を解消することで物品の生産量は最大化される。本実施形態においては、更にジョブの進行が周期的とはならない事象が発生した場合においても、制御部7がその事象に応じて搬送順を変更することで、物品の生産量を最適化することが可能となる。   When a substrate is periodically taken out from a plurality of substrate storage units in the same order and the substrate processing is periodically performed by the corresponding processing units, this is referred to as “periodically progressing job”. If the job progresses periodically, cyclic processing is applied to determine the substrate processing order. Further, the production volume of articles is maximized by eliminating the conflict in the substrate processing flow as in Japanese Patent No. 4621698. In the present embodiment, even when an event in which the progress of the job is not periodic occurs, the control unit 7 optimizes the production amount of the article by changing the conveyance order according to the event. Is possible.

図4は、基板の処理フローの例を示す図である。図4は、図3の管理データに対応して、Job1〜4の割り当てが同時になされた場合の処理フローを示している。図4において、グラフ41は、各種処理が実施されるときの基板の搬送経路の関係を示し、タイムチャート42は、グラフ41に従う各基板の単位時間毎の処理フローを示している。基板収納部FP1〜FP4、前処理系におけるPBK,PCP,FI,WTC,PA,FO、及び処理部IST1〜IST4の各部を、ユニットとよぶ。タイムチャート42において、各基板は、単位時間毎に各ユニットの処理が進行していくが、処理部IST1〜IST4の処理にはそれぞれ4単位時間を要することがわかる。   FIG. 4 is a diagram illustrating an example of a substrate processing flow. FIG. 4 shows a processing flow when Jobs 1 to 4 are assigned at the same time corresponding to the management data of FIG. In FIG. 4, a graph 41 shows the relationship of the substrate transport path when various types of processing are performed, and a time chart 42 shows a processing flow for each unit time of each substrate according to the graph 41. Each part of the substrate storage units FP1 to FP4, PBK, PCP, FI, WTC, PA, and FO in the preprocessing system and the processing units IST1 to IST4 is referred to as a unit. In the time chart 42, the processing of each unit progresses for each substrate every unit time, but it can be seen that the processing of the processing units IST1 to IST4 requires 4 unit times.

図5に、各ユニットの基板1枚あたりの総処理時間の例を示す。ここで、総処理時間とは、当該ユニットで実施される処理や前処理の他、例えば基板の吸着保持やリフトピンの昇降動作などの付随処理も含めた、当該ユニットで基板が最低限占有される時間の総和をいう。   FIG. 5 shows an example of the total processing time per substrate of each unit. Here, the total processing time means that the substrate is at least occupied by the unit including processing and pre-processing performed in the unit, as well as incidental processing such as suction holding of the substrate and lifting and lowering operation of the lift pins. Total time.

図6は、図4の処理フローにおける、次のユニットへの基板の最大搬送時間の例を示している。ここで、最大搬送時間とは、ユニットまたは不図示の搬送部の物理的な位置や姿勢が異なることによって発生するばらつきを考慮した基板の最大の搬送時間をいう。   FIG. 6 shows an example of the maximum transport time of the substrate to the next unit in the processing flow of FIG. Here, the maximum transport time refers to the maximum transport time of the substrate in consideration of variations caused by different physical positions and postures of units or transport units (not shown).

本実施形態において、基板処理は前処理よりも長時間を要する。図5に示される各ユニットの総処理時間及び図6に示される基板の最大搬送時間の例によれば、処理部IST(IST1〜IST4)が基板の処理フローにおける最大の遅延ユニットであることがわかる。また、図4の基板の処理フローのようなサイクリックスケジューリングによって基板収納部FP1〜FP4の基板を周期的に処理するよう処理順を決定することにより、物品の生産量が最大化される。   In this embodiment, the substrate processing takes a longer time than the pretreatment. According to the example of the total processing time of each unit shown in FIG. 5 and the maximum transport time of the substrate shown in FIG. 6, the processing unit IST (IST1 to IST4) is the maximum delay unit in the substrate processing flow. Recognize. Further, by determining the processing order so as to periodically process the substrates in the substrate storage units FP1 to FP4 by cyclic scheduling as in the substrate processing flow of FIG. 4, the production amount of articles is maximized.

次に、図7に、2つの処理部が関与する場合の基板の処理フローの例を示す。図7は、2つの処理部IST2,IST3に対してジョブが実行されている場合の処理フローを示している。また、図8に、3つの処理部が関与する場合の基板の処理フローの例を示す。図8は、3つ処理部IST1,IST2,IST3に対してジョブが実行されている場合の処理フローを示している。図7,8において、図4と同様に、グラフ71,81は、各種処理が実施されるときの基板の搬送経路の関係を示し、タイムチャート72,82は、グラフ71,81に従う各基板の単位時間毎の処理フローを示している。図7、図8において、基板番号中のN,M,Oは当該ジョブの基板の処理枚数を示した2以上の数である。   Next, FIG. 7 shows an example of a substrate processing flow when two processing units are involved. FIG. 7 shows a processing flow when a job is being executed for the two processing units IST2 and IST3. FIG. 8 shows an example of a substrate processing flow when three processing units are involved. FIG. 8 shows a processing flow when a job is being executed for the three processing units IST1, IST2, and IST3. 7 and 8, similarly to FIG. 4, graphs 71 and 81 show the relationship of the substrate transport path when various processes are performed, and time charts 72 and 82 show the relationship between the substrates according to the graphs 71 and 81. A processing flow for each unit time is shown. 7 and 8, N, M, and O in the board number are two or more numbers indicating the number of processed boards of the job.

図4では、全ての処理部にジョブが割り当てられたケースを示したが、図7、図8のように、一部の処理部のみにジョブが割り当てられるケースもある。これは、物品の製造工程において、基板処理装置1の前工程で正常な処理フローとなっていない場合や、物品の製造工程全体で物品の生産量を一時的に調整した場合に発生しうる。この場合、例えば、ジョブが割り当てられていない処理部IST4では、基板の処理は実施されない。また、図7、図8のいずれにおいても、投入されたジョブの範囲で、周期的に基板が処理されるように基板の処理順を決定して処理を実施することによって、ジョブが割り当てられた基板収納部の範囲で、物品の生産量が最大化される。   FIG. 4 shows a case in which jobs are assigned to all the processing units, but there are cases in which jobs are assigned to only some of the processing units as shown in FIGS. This may occur in the article manufacturing process when the process flow is not normal in the previous process of the substrate processing apparatus 1 or when the production amount of the article is temporarily adjusted throughout the article manufacturing process. In this case, for example, the substrate processing is not performed in the processing unit IST4 to which no job is assigned. Also, in both FIG. 7 and FIG. 8, the job is assigned by determining the processing order of the substrates so that the substrates are periodically processed within the range of the submitted jobs, and executing the processing. The production amount of articles is maximized in the range of the substrate storage unit.

次に、ジョブの進行が周期的とはならない事象として、図7及び図8の基板の処理フローにおいて、新たな基板収納部に対する新たなジョブが割り当てられた場合の基板を処理する方法について説明する。   Next, a method for processing a substrate when a new job is assigned to a new substrate storage unit in the substrate processing flow of FIGS. 7 and 8 will be described as an event where the progress of the job is not periodic. .

図9は、図7の処理フローにおいて、P1W(N)及びP2W(M)の基板をそれぞれIST2及びIST3で処理中のタイミングで、他の基板収納部FP4を用いる新たなジョブJob3を割り当てた時の管理データ207bの例を示す。図9において、Job3が割り当てられた基板P3W1〜P3W25はそれぞれ、基板の状態は「未処理」で、基板の位置は現在、基板収納部FP4にあることが示されている。このとき、基板処理装置1全体で高い生産性を達成するためには、当該他の基板収納部FP4からの基板をいち早く前処理部に割込みで搬送して、周期的な処理フローに入り込ませることが必要である。   FIG. 9 shows a case where a new job Job3 using another substrate storage unit FP4 is allocated at the timing when the substrates of P1W (N) and P2W (M) are being processed by IST2 and IST3, respectively, in the processing flow of FIG. An example of management data 207b is shown. In FIG. 9, it is shown that the substrates P3W1 to P3W25 to which Job3 is assigned are in the “unprocessed” state, and the substrate position is currently in the substrate storage unit FP4. At this time, in order to achieve high productivity in the entire substrate processing apparatus 1, the substrate from the other substrate storage unit FP 4 is promptly transferred to the preprocessing unit by interruption and entered into the periodic processing flow. is necessary.

しかし、基板収納部FP4の基板P3W1〜P3W25の処理を優先したために、Job1,Job2の処理部IST2,IST3での処理量が低下する場合には、基板処理装置1全体での処理量は最大化されず、かえって処理効率を落とす場合がある。例えば、基板収納部FP4の基板P3W1〜P3W25の処理を優先するために、前処理中である基板P1W(N+1),P1W(N+2),P2W(M+1),P2W(M+2)を一時的に搬送経路から外れた格納部5bへ格納する方法が考えられる。この場合、優先的に投入された基板P3W1〜P3W25のいずれかの基板が処理部IST4で処理されている間に、基板P1W(N+1),P1W(N+2),P2W(M+1),P2W(M+2)を再度、前処理部へ投入することになる。しかしこのような場合には、処理部IST2,IST3へ遅延なく基板を搬送することはできない。   However, if the processing amount of the processing units IST2 and IST3 of Job1 and Job2 decreases because the processing of the substrates P3W1 to P3W25 of the substrate storage unit FP4 is prioritized, the processing amount of the entire substrate processing apparatus 1 is maximized. Otherwise, the processing efficiency may be lowered. For example, in order to prioritize the processing of the substrates P3W1 to P3W25 of the substrate storage unit FP4, the substrates P1W (N + 1), P1W (N + 2), P2W (M + 1), and P2W (M + 2) being preprocessed are temporarily transported. A method of storing in the storage unit 5b that is out of the range is conceivable. In this case, the substrate P1W (N + 1), P1W (N + 2), P2W (M + 1), P2W (M + 2) while any of the substrates P3W1 to P3W25 that have been preferentially processed is processed by the processing unit IST4. Is again input to the preprocessing unit. However, in such a case, the substrate cannot be transferred to the processing units IST2 and IST3 without delay.

そこで本実施形態では、基板収納部FPからの搬送が実施され前処理がいったん開始された基板に対しては、基板の処理順を変更せず、次に前処理を開始する予定である基板収納部FP内の基板から処理順を変更する。さらに、本実施形態では、他の基板収納部へジョブが割りつけられた場合には、当該ジョブの基板の処理を優先しながら、既に割り付け済み状態であるジョブの基板の処理量は低下させない。また、新たなジョブの割り付けが発生しない状態でも、既に割り付け済み状態であるジョブの基板の処理量を最大化する。このような最適化された基板処理方法を以下に詳しく説明する。   Therefore, in the present embodiment, for a substrate that has been transported from the substrate storage unit FP and has been preprocessed, the substrate storage is scheduled to start next without changing the processing order of the substrates. The processing order is changed from the substrate in the part FP. Furthermore, in this embodiment, when a job is assigned to another substrate storage unit, the processing amount of the substrate of the job that has already been assigned is not reduced while giving priority to the processing of the substrate of the job. Further, even when no new job allocation occurs, the processing amount of the substrate of the job already allocated is maximized. Such an optimized substrate processing method will be described in detail below.

本実施形態では、基板の搬送経路上にある前処理系における待機時間に着目する。図10は、図7の処理フローに従う図9のジョブJob1,Job2の基板の処理における一部区間のタイミングチャートである。図10における記号は以下のとおりである。
IST:処理部IST2又はIST3における処理時間、
PA:プリアライメントPAの処理時間、
WPA:プリアライメント後の待機時間
WTC:基板温調WTCの処理時間、
WWTC:基板温調後の待機時間、
TIST:PAからIST2またはIST3への搬送時間、
TPA:WTCからPAへの搬送時間、
TWTC:FIからWTCへの搬送時間
WFI:WTCへの搬送前のFIにおける待機時間
In the present embodiment, attention is paid to the standby time in the pretreatment system on the substrate transport path. FIG. 10 is a timing chart of a partial section in the substrate processing of jobs Job1 and Job2 of FIG. 9 according to the processing flow of FIG. The symbols in FIG. 10 are as follows.
T IST : processing time in the processing unit IST2 or IST3,
T PA : Pre-alignment PA processing time,
T WPA : Standby time after pre-alignment T WTC : Substrate temperature control WTC processing time
T WWTC : Standby time after substrate temperature adjustment,
T TIST : transport time from PA to IST2 or IST3,
T TPA : transport time from WTC to PA,
T TWTC : Transport time from FI to WTC T WFI : Standby time in FI before transport to WTC

前処理系に基板が存在していない状態時、直ちに、基板格納容器FPから当該前処理系へ、スケジューリングされた次の基板が搬送され当該前処理部での基板の前処理が実施される場合を考える。この場合、処理部IST2,IST3における処理時間が十分に長いため、当該前処理系において待機時間が発生する。TWPA,TWWTC,TWFIが、そのような待機時間を示している。 When no substrate is present in the pretreatment system, the next scheduled substrate is immediately transferred from the substrate storage container FP to the pretreatment system, and the pretreatment of the substrate in the pretreatment unit is performed. think of. In this case, since the processing time in the processing units IST2 and IST3 is sufficiently long, a standby time occurs in the preprocessing system. T WPA , T WWTC , and T WFI indicate such a waiting time.

基板収納部FPから処理部IST1〜IST4への基板の搬送経路上に存在する前処理系をU(i)(i=1,2,…,M)とする。また、前処理系のユニットU(i)における前処理時間をT(i)、前処理系のユニットU(i)からU(i+1)への搬送時間をTT(i)とする。基板は周期的に等間隔で前処理系、及び処理部IST1〜IST4で処理されるため、前処理系のユニットU(i)における待機時間Tw(i)は、次式により算出される。 Let U (i) (i = 1, 2,..., M) be a pretreatment system existing on the substrate transport path from the substrate storage unit FP to the processing units IST1 to IST4. Further, the preprocessing time in the preprocessing unit U (i) is T (i) , and the transport time from the preprocessing system unit U (i) to U (i + 1) is T T (i) . Since the substrate is periodically processed at equal intervals by the preprocessing system and the processing units IST1 to IST4, the waiting time T w (i) in the unit U (i) of the preprocessing system is calculated by the following equation.

Figure 2017215456
Figure 2017215456

更に、搬送時間TT(i)の差異はほぼゼロであるすると、処理部IST1〜IST4において待機時間が発生すると処理量の低下を招くため、待機時間をゼロにする必要がある。したがって、処理部IST1〜IST4における基板1枚あたり処理時間をTISTとすると、式(1)は次式とみなすことにする。 Furthermore, if the difference in the transport time T T (i) is almost zero, if the standby time occurs in the processing units IST1 to IST4, the processing amount is reduced, so the standby time needs to be zero. Therefore, when the processing time per substrate in the processing units IST1 to IST4 is T IST , the expression (1) is regarded as the following expression.

Figure 2017215456
Figure 2017215456

式(2)は、処理部IST1〜IST4うちの1つが処理中である場合に当てはまる。処理部IST1〜IST4のうち複数が処理中であった場合は、見掛け上、処理部の数で割った時間を基板1つあたりの処理部IST1〜IST4での処理時間とみなすことができる。したがって、処理中である処理部の数をnとすると、前処理系のユニットU(i)における待機時間Tw(i)は、次式により表される。 Expression (2) applies when one of the processing units IST1 to IST4 is processing. When a plurality of the processing units IST1 to IST4 are being processed, apparently the time divided by the number of processing units can be regarded as the processing time in the processing units IST1 to IST4 per substrate. Accordingly, when the number of processing units being processed is n, the standby time T w (i) in the unit U (i) of the preprocessing system is expressed by the following equation.

Figure 2017215456
Figure 2017215456

図11は、処理中である処理部IST1〜IST4の数が1〜4のそれぞれに対して、式(3)により算出した前処理系の各部における待機時間と総待機時間の例を示している。ジョブが割り当てられた基板収納部FPから基板を搬送して前処理を開始する。その後、次に予定されている基板の前処理を開始するまでに、総待機時間だけ待機する。図11は、その後に、基板収納部FPから基板を搬送して前処理を開始しても、処理部での基板の処理量を低下させずに、割り当て済みのジョブに対する基板の搬送部3a,3bでの搬送及び前処理系における前処理が実施されうることを示している。   FIG. 11 shows an example of the waiting time and the total waiting time in each part of the preprocessing system calculated by Expression (3) for each of the processing units IST1 to IST4 being processed being 1 to 4. . The substrate is transferred from the substrate storage unit FP to which the job is assigned, and pre-processing is started. After that, it waits for the total waiting time until the next scheduled substrate pre-processing starts. FIG. 11 shows that even if the substrate is transferred from the substrate storage unit FP and the preprocessing is started, the substrate transfer unit 3a for the assigned job is reduced without reducing the processing amount of the substrate in the processing unit. It shows that pre-processing in the transport and pre-processing system in 3b can be performed.

基板収納部FPから処理部IST1〜IST4への基板の搬送経路上に存在する前処理系をU(i)(i=1,2,…,M)とする。前処理系のユニットU(i)における前処理時間をT(i)、前処理系のユニットU(i)からU(i+1)への搬送時間をTT(i)とする。また、複数の処理部IST1〜IST4における基板1枚あたりの処理時間をTIST、基板処理を実行中(処理中)である処理部の数をnとする。ここで、ジョブが割り当てられた基板収納部FPから基板を搬送して前処理が行われて基板が搬出され、当該前処理部が基板の待ち受け状態となった後、当該前処理部で次に予定されている基板の前処理を開始するまでに待機する待機時間を考える。この待機を実施しても、割り当て済みのジョブに対する基板を、処理部での基板の処理量を低下させずに搬送部3a,3bでの搬送及び前処理系における前処理が実施できる待機時間の最大値は、次式によって算出される。 Let U (i) (i = 1, 2,..., M) be a pretreatment system existing on the substrate transport path from the substrate storage unit FP to the processing units IST1 to IST4. The preprocessing time in the preprocessing unit U (i) is T (i) , and the transfer time from the preprocessing system unit U (i) to U (i + 1) is T T (i) . Also, T IST is the processing time per substrate in the plurality of processing units IST1 to IST4, and n is the number of processing units that are executing (processing) the substrate processing. Here, after the substrate is transferred from the substrate storage unit FP to which the job is assigned, the preprocessing is performed, the substrate is unloaded, and the preprocessing unit enters the standby state of the substrate. Consider the waiting time to wait before starting the pre-treatment of the scheduled substrate. Even when this standby is executed, the waiting time of the substrate for the assigned job can be carried out by the transfer units 3a and 3b and the preprocessing in the preprocessing system can be performed without reducing the processing amount of the substrate in the processing unit. The maximum value is calculated by the following formula.

Figure 2017215456
Figure 2017215456

式(4)で算出された待機時間を、割り当て済みのジョブに対する基板収納部FPの基板に対する前処理の開始の待機時間として設ける。そして待機中に新たな基板収納部を用いる新たなジョブが割り当てられた場合に、該新たな基板収納部の基板を優先して前処理を開始するように基板の処理順を変更する。この結果、新たなジョブに係る処理部における基板処理が最短時間で開始されるため、並行化して処理される処理部の数が最速で増加し、基板処理装置1全体の基板の処理量が向上される。   The standby time calculated by Expression (4) is provided as the standby time for starting the preprocessing for the substrate of the substrate storage unit FP for the assigned job. Then, when a new job using a new substrate storage unit is assigned during standby, the processing order of the substrates is changed so that preprocessing is started with priority given to the substrate of the new substrate storage unit. As a result, since the substrate processing in the processing unit related to the new job is started in the shortest time, the number of processing units processed in parallel increases at the fastest, and the substrate processing amount of the entire substrate processing apparatus 1 is improved. Is done.

ただし、次のような経過を辿った場合には、基板処理装置1全体の処理量が下がる可能性がある。
式(4)の最大待機時間だけ、割り当て済みのジョブに対する基板収納部FPの基板に対する前処理の開始を待機。
⇒ 最大待機時間の直前まで待機中に新たな基板収納部を用いる新たなジョブが、処理中ではない処理部へ割り当てられる。
⇒ 該新たな基板収納部の基板を優先して前処理を開始するように基板の処理順を変更。
⇒ 該基板の前処理を開始した場合、割り当て済みのジョブに対する基板収納部FPの基板の前処理の開始が遅延。
⇒ 当該割り当て済みのジョブを処理する処理部の処理開始に遅延が発生。
However, when the following process is followed, the processing amount of the entire substrate processing apparatus 1 may be reduced.
Waiting for the start of pre-processing for the substrate of the substrate storage unit FP for the assigned job for the maximum waiting time of Expression (4).
⇒ A new job that uses a new substrate storage unit is assigned to a processing unit that is not in process during standby until just before the maximum standby time.
⇒ Changed the processing order of the substrates so that pre-processing is started with priority given to the substrates in the new substrate storage unit.
⇒ When the preprocessing of the substrate is started, the start of the preprocessing of the substrate in the substrate storage unit FP for the assigned job is delayed.
⇒ There is a delay in starting the processing of the processing unit that processes the assigned job.

このような場合、基板処理装置1全体の処理量が下がる。本実施形態において、式(4)ではなく式(5)を最大の待機時間とする。   In such a case, the processing amount of the entire substrate processing apparatus 1 is reduced. In this embodiment, not the equation (4) but the equation (5) is set as the maximum waiting time.

Figure 2017215456
Figure 2017215456

式(5)で算出した待機時間を、割り当て済みのジョブに対する基板収納部FPの基板に対する前処理の開始の最大待機時間として設ける。これに伴い、待機中に新たな基板収納部を用いる新たなジョブが割り当てられた場合に、該新たな基板収納部の基板を優先して前処理を開始するように基板の処理順を変更する。これにより、新たな基板収納部からの基板の基板処理が最短時間で開始されるとともに、割り当て済みのジョブに対する基板収納部FPの基板に対する処理部の処理も遅延しない。この結果、基板処理装置1全体の基板の処理量が最大化される。   The standby time calculated by Expression (5) is provided as the maximum standby time for starting the preprocessing for the substrate of the substrate storage unit FP for the assigned job. Accordingly, when a new job using a new substrate storage unit is assigned during standby, the processing order of the substrates is changed so that the preprocessing is started with priority on the substrate of the new substrate storage unit. . Thereby, the substrate processing of the substrate from the new substrate storage unit is started in the shortest time, and the processing of the processing unit for the substrate of the substrate storage unit FP for the assigned job is not delayed. As a result, the substrate processing amount of the entire substrate processing apparatus 1 is maximized.

図12は、図9のJob1,Job2の基板を処理中に、新たなJob3が割り当てられた時の管理データ207bの例を示す。処理順は、処理部IST2,IST3で処理中の基板を起点として示している。図12によれば、Job3の割り当て後、新たな基板収納部FP4の基板P3W1,P3W2は、Job1,Job2における「未処理」の基板P1W(N+3),P2W(M+2),P2W(M+3)よりも優先されるように基板の処理順が変更される。   FIG. 12 shows an example of management data 207b when a new job 3 is assigned during processing of the boards of Job 1 and Job 2 in FIG. The processing order indicates the substrate being processed by the processing units IST2 and IST3 as a starting point. According to FIG. 12, after the assignment of Job3, the substrates P3W1 and P3W2 of the new substrate storage unit FP4 are more than the “unprocessed” substrates P1W (N + 3), P2W (M + 2), and P2W (M + 3) in Job1 and Job2. The processing order of the substrates is changed so that priority is given.

次に、処理部IST1〜IST4全てに対してそれぞれ基板収納部FP1〜FP4の基板を処理するJob1〜Job4が割り当てられており、ここに他の基板収納部FP5の基板を処理部IST4で処理するジョブが新たに割り当てられた場合を考える。図13に、この時の管理データ207bの例を示す。図13によれば、Job5の割り当て後に、他の基板収納部FP5の基板P5W1,P5W2を、Job1,Job2,Job3の基板収納部FP1,FP2,FP3に存在する「未処理」の基板よりも優先されるように基板の処理順が変更される。これにより、基板処理装置1全体の基板の処理量は向上される。   Next, Job1 to Job4 for processing the substrates of the substrate storage units FP1 to FP4 are assigned to all the processing units IST1 to IST4, respectively, and the substrates of the other substrate storage units FP5 are processed by the processing unit IST4. Consider a case where a job is newly assigned. FIG. 13 shows an example of the management data 207b at this time. According to FIG. 13, after Job5 is assigned, the boards P5W1 and P5W2 of the other board storage part FP5 are prioritized over the “unprocessed” boards existing in the board storage parts FP1, FP2 and FP3 of Job1, Job2 and Job3. As described above, the processing order of the substrates is changed. Thereby, the processing amount of the substrate of the whole substrate processing apparatus 1 is improved.

図14は、本実施形態における基板の搬送制御処理を示すフローチャートである。制御部7は、割り当て済みのジョブに対して基板の処理順を決定し、図7のような処理フローに従い、基板収納部から基板を最初のユニットに搬送し、前処理を開始するよう、搬送部及び前処理部を制御する(S2)。最初のユニットでの前処理が完了すると、当該基板は次のユニットへと搬送され、最初のユニットは次の基板の待ち受け状態となる。その後、最初のユニットには、スケジュールされた次の基板が搬送されることになる。ただし本実施形態では、制御部7は、最初のユニットに空きができ次第ただちに次の基板を搬送することはしない。本実施形態では、処理部で処理待ちが生じないように定められる待機時間(例えば処理部で処理待ちが生じない範囲で最大の待機時間)、当該最初のユニットへ次の基板を搬送するのを待機させる(S4)。この最大の待機時間は、処理部での基板処理に要する時間と前処理のユニットのそれぞれに要する時間とに基づいて定められる。例えば、この最大の待機時間は、式(5)により算出される。   FIG. 14 is a flowchart showing a substrate transfer control process according to this embodiment. The control unit 7 determines the processing order of the substrates for the assigned jobs, and transports the substrates from the substrate storage unit to the first unit and starts preprocessing according to the processing flow as shown in FIG. And the preprocessing unit are controlled (S2). When the pretreatment in the first unit is completed, the substrate is transferred to the next unit, and the first unit is in a standby state for the next substrate. Thereafter, the first substrate is transported to the first unit. However, in the present embodiment, the control unit 7 does not transport the next substrate as soon as the first unit is empty. In the present embodiment, the waiting time determined so that the processing unit does not wait for processing (for example, the maximum waiting time within a range where processing waiting does not occur in the processing unit), the next substrate is transferred to the first unit. Wait (S4). This maximum waiting time is determined based on the time required for substrate processing in the processing unit and the time required for each of the preprocessing units. For example, this maximum waiting time is calculated by equation (5).

待機中、制御部7は、新たな基板収納部に対して新たなジョブが割り当てられたか否かを判断する(S6)。待機中に新たな基板収納部に対して新たなジョブが割り当てられた場合、制御部7は、当該新たな基板収納部における基板の処理を優先するように、基板の処理順を決定する(S8)。待機中に新たな基板収納部に対して新たなジョブが割り当てられなかった場合は、直前の基板の処理順を引き継ぐ。   During standby, the control unit 7 determines whether a new job has been assigned to the new substrate storage unit (S6). When a new job is assigned to a new substrate storage unit during standby, the control unit 7 determines the processing order of the substrates so as to give priority to the processing of the substrate in the new substrate storage unit (S8). ). If a new job is not assigned to a new substrate storage unit during standby, the processing order of the immediately preceding substrate is taken over.

次に、制御部7は、決定された処理順に基づいて、次の基板に対する基板収納部からの前処理を開始する(S10)。その後、制御部7は、前処理を開始していない基板(「未処理」の基板)が基板収納部に存在するかを判断する(S12)。「未処理」の基板)が基板収納部に存在する場合、S4に戻り、その基板に対して処理を繰り返す。   Next, the control unit 7 starts preprocessing from the substrate storage unit for the next substrate based on the determined processing order (S10). Thereafter, the control unit 7 determines whether there is a substrate that has not started preprocessing (a “non-processed” substrate) in the substrate storage unit (S12). If an “unprocessed substrate” exists in the substrate storage unit, the process returns to S4 and the process is repeated for the substrate.

このように、図14のフローチャートに従って、ジョブを割り当てられた基板収納部FPにおける基板の処理順が決定され、基板に対して搬送、前処理、及び処理が実施される。待機中に新たな基板収納部に対して新たなジョブが処理中ではない処理部へ割り当てられた場合、該新たな基板収納部における基板の前処理が優先されるように基板の処理順が変更される。これにより、処理中ではない処理部における基板の処理が最短時間で開始されるとともに、割り当て済みのジョブに対する基板収納部における基板に対する処理部の処理も遅延しない。この結果、基板処理装置1全体の基板の処理量が最大化される。   As described above, according to the flowchart of FIG. 14, the processing order of the substrates in the substrate storage unit FP to which the job is assigned is determined, and the substrate is transferred, preprocessed, and processed. If a new job is assigned to a new processing unit that is not being processed for a new substrate storage unit during standby, the substrate processing order is changed so that the pre-processing of the substrate in the new substrate storage unit is given priority. Is done. As a result, the processing of the substrate in the processing unit that is not processing is started in the shortest time, and the processing of the processing unit for the substrate in the substrate storage unit for the assigned job is not delayed. As a result, the substrate processing amount of the entire substrate processing apparatus 1 is maximized.

以上の実施形態をまとめる。上述の実施形態において、前処理系は、第1基板に対して第1処理(前処理)を行う第1処理部として機能する。4つの処理部IST1,IST2,IST3,IST4は、第1処理が行われた第1基板に対して第2処理(パターン形成)を行う第2処理部として機能する。制御部7は、第2処理に要する時間に基づいて、第1処理部へ第2基板を投入するタイミングを決定する決定部として機能する。制御部7はまた、決定されたタイミングまで第2基板の投入を待機している間に第3基板(新たな基板収納部における基板)を処理する新たな処理要求(新たなジョブ)を受け付ける。制御部7は、この新たな処理要求を受け付けた場合に、該第3基板を第2基板に優先して第1処理部に投入するよう処理順を変更する変更部としても機能する。   The above embodiment is summarized. In the above-described embodiment, the pretreatment system functions as a first processing unit that performs a first treatment (pretreatment) on the first substrate. The four processing units IST1, IST2, IST3, and IST4 function as second processing units that perform second processing (pattern formation) on the first substrate on which the first processing has been performed. The control unit 7 functions as a determination unit that determines the timing of loading the second substrate into the first processing unit based on the time required for the second processing. The control unit 7 also accepts a new processing request (new job) for processing the third substrate (the substrate in the new substrate storage unit) while waiting for the insertion of the second substrate until the determined timing. The control unit 7 also functions as a changing unit that changes the processing order so that when the new processing request is received, the third substrate is put into the first processing unit with priority over the second substrate.

<第2実施形態>
図15は、基板収納部FP1〜FP8、前処理系としてPBK1〜PBK4,PCP1〜PCP2,FI,WTC,PA,FO、及び処理部IST1〜IST4における基板の搬送経路の関係をグラフ化したものである。処理部IST1〜IST4のスループットが第1実施形態のものよりも高い場合、前処理部PBK1〜PBK4,PCP1〜PCP2のように前処理部はそれぞれ複数の基板を並行化して前処理を実行できるように基板処理装置1に構成される。
Second Embodiment
FIG. 15 is a graph showing the relationship between the substrate storage units FP1 to FP8, PBK1 to PBK4, PCP1 to PCP2, FI, WTC, PA, and FO as preprocessing systems, and the substrate transport paths in the processing units IST1 to IST4. is there. When the throughput of the processing units IST1 to IST4 is higher than that of the first embodiment, the preprocessing units can execute preprocessing by parallelizing a plurality of substrates, respectively, like the preprocessing units PBK1 to PBK4 and PCP1 to PCP2. The substrate processing apparatus 1 is configured.

図16は、各ユニットの基板1枚あたりの総処理時間の例を示す図である。処理部ISTにおける総処理時間が第1実施形態(図5)に比べて短い。そのため、前処理部PBKにおいて複数の基板を並行化できる構成ではない場合、前処理部PBKによる前処理によって、処理部ISTの処理に遅延が発生して、基板処理装置1全体の処理量が向上しない。   FIG. 16 is a diagram illustrating an example of the total processing time per substrate of each unit. The total processing time in the processing unit IST is shorter than that in the first embodiment (FIG. 5). Therefore, when the preprocessing unit PBK is not configured to be able to parallelize a plurality of substrates, the preprocessing by the preprocessing unit PBK causes a delay in the processing of the processing unit IST, and the processing amount of the entire substrate processing apparatus 1 is improved. do not do.

本実施形態においても、図14のフローチャートに従ってジョブを割り当てられた基板収納部における基板の処理順を決定し、基板に対して搬送、前処理、及び処理を実施する。待機中に他の基板収納部を用いる新たなジョブが現在未使用の処理部に割り当てられた場合、該他の基板収納部における基板の前処理が優先して開始されるように基板の処理順を変更する。これにより、処理中ではない処理部における基板の処理が最短時間で開始されるとともに、割り当て済みのジョブに対する基板収納部における基板に対する処理部の処理も遅延しない。この結果、基板処理装置1全体の基板の処理量が最大化される。   Also in the present embodiment, the processing order of the substrates in the substrate storage unit to which the job is assigned is determined according to the flowchart of FIG. When a new job using another substrate storage unit is assigned to a currently unused processing unit during standby, the substrate processing order is preferentially started so that the pre-processing of the substrate in the other substrate storage unit is started. To change. As a result, the processing of the substrate in the processing unit that is not processing is started in the shortest time, and the processing of the processing unit for the substrate in the substrate storage unit for the assigned job is not delayed. As a result, the substrate processing amount of the entire substrate processing apparatus 1 is maximized.

ただし、並行化して複数の基板を前処理できる前処理系を基板処理装置1が構成する場合、前処理部における基板の前処理時間は見掛け上、並行化可能な基板の数で割った時間を基板1つあたりの該前処理部での前処理時間とみなすことができる。基板収納部から処理部への基板の搬送経路上に存在する前処理系をU(i)(i=1,2,…,m)とする。また、前処理系のユニットU(i)における前処理時間をT(i)、前処理系のユニットU(i)からU(i+1)への搬送時間をTT(i)、処理部IST1〜IST4における基板1枚あたりの処理時間をTISTとする。また、処理中である処理部の数をn、前処理系のユニットU(i)における並行化して前処理可能な基板の数をP(i)とする。ジョブが割り当てられた基板収納部から基板を搬送して前処理を開始する。その後、次に予定されている基板の前処理を開始するまでに、待機時間だけ待機する。この待機を実施しても、処理部での基板の処理量を低下させずに、割り当て済みのジョブに対する基板の搬送部での搬送及び前処理系における前処理を実施できる待機時間の最大値は、次式によって算出される。 However, when the substrate processing apparatus 1 configures a preprocessing system that can preprocess a plurality of substrates in parallel, the preprocessing time of the substrate in the preprocessing unit is apparently divided by the number of substrates that can be parallelized. It can be regarded as a pretreatment time in the pretreatment unit per substrate. Let U (i) (i = 1, 2,..., M) be a pretreatment system existing on the substrate transport path from the substrate storage unit to the processing unit. Further, the preprocessing time in the preprocessing unit U (i) is T (i) , the transport time from the preprocessing system unit U (i) to U (i + 1) is T T (i) , and the processing unit the processing time per one substrate in IST1~IST4 and T IST. Further, n is the number of processing units being processed, and P (i) is the number of substrates that can be preprocessed in parallel in the unit U (i) of the preprocessing system. The substrate is transferred from the substrate storage unit to which the job is assigned and pre-processing is started. After that, the process waits for a waiting time until the next scheduled substrate pretreatment is started. Even if this standby is performed, the maximum value of the standby time during which the substrate transfer unit for the assigned job and the preprocessing in the preprocessing system can be performed without reducing the processing amount of the substrate in the processing unit is Is calculated by the following equation.

Figure 2017215456
Figure 2017215456

<第3実施形態>
新たにジョブが割り当てられた基板収納部の基板の処理を、ジョブが割り当てられていた基板収納部に存在する「未処理」の基板よりも優先するように基板の処理順を変更する基板処理方法を説明した。上述の第1及び第2実施形態では、前処理を開始している基板に対しては基板の処理順を変更しない基板処理方法であった。本実施形態では、図15のように、複数の基板を並行化して前処理できる前処理系が基板処理装置1に構成されている場合は、次のユニットへ搬送する基板に対して基板の処理順を変更する基板の制御処理について説明する。
<Third Embodiment>
Substrate processing method for changing the processing order of substrates so that processing of a substrate in a substrate storage unit to which a job has been newly assigned has priority over “unprocessed” substrates existing in the substrate storage unit to which a job has been allocated Explained. In the first and second embodiments described above, the substrate processing method does not change the processing order of the substrates with respect to the substrate on which the preprocessing is started. In this embodiment, as shown in FIG. 15, when the substrate processing apparatus 1 is configured with a preprocessing system that can perform preprocessing by parallelizing a plurality of substrates, the substrate processing is performed on the substrate transported to the next unit. A substrate control process for changing the order will be described.

図17は、前処理部PBK1〜PBK4を起点とした基板の搬送経路の関係をグラフ化したものである。本実施形態では、前処理部PBK1〜PBK4から前処理部PCP1,PCP2へ基板を搬送して前処理部PCP1,PCP2で基板に対して前処理を開始する。その後、待機時間だけ待機した後に、前処理部PBK1〜PBK4における基板の処理順を変更して、その処理順に基づいて次の基板を前処理部PBK1〜PBK4から前処理部PCP1,PCP2へ搬送する。待機時間の最大値は、上述の第1及び第2実施形態と同様の方法により算出できる。   FIG. 17 is a graph showing the relationship of the substrate transport paths starting from the preprocessing units PBK1 to PBK4. In the present embodiment, the substrate is transferred from the pretreatment units PBK1 to PBK4 to the pretreatment units PCP1 and PCP2, and the pretreatment units PCP1 and PCP2 start pretreatment of the substrate. Thereafter, after waiting for the waiting time, the processing order of the substrates in the preprocessing units PBK1 to PBK4 is changed, and the next substrate is transferred from the preprocessing units PBK1 to PBK4 to the preprocessing units PCP1 and PCP2 based on the processing order. . The maximum value of the waiting time can be calculated by the same method as in the first and second embodiments described above.

例えば、基板収納部FPから処理部IST1〜IST4への基板の搬送経路上に存在する前処理系のユニットをU(i)(i=1,2,…,M)とする。また、前処理系のユニットU(i)における前処理時間をT(i)、前処理系のユニットU(i)からU(i+1)への搬送時間をTT(i)とする。また、処理部IST1〜IST4における基板1枚あたりの処理時間をTIST、処理中である処理部の数をn、前処理系のユニットU(i)における並行化可能な基板の数をP(i)とする。複数の基板を並行化して前処理/格納が可能な前処理系のユニットU(a)(a=1,2,…,M-1)から基板を搬送した後、次に前処理系のユニットU(a)から基板の搬送を開始するまでに待機する待機時間を考える。この待機を実施しても、割り当て済みのジョブに対する基板を、処理部での基板の処理量を低下させずに搬送部での搬送及び前処理系における前処理が実施できる待機時間の最大値は、次式によって算出される。 For example, U (i) (i = 1, 2,..., M) is a pre-processing unit existing on the substrate transport path from the substrate storage unit FP to the processing units IST1 to IST4. Further, the preprocessing time in the preprocessing unit U (i) is T (i) , and the transport time from the preprocessing system unit U (i) to U (i + 1) is T T (i) . In addition, the processing time per substrate in the processing units IST1 to IST4 is T IST , the number of processing units being processed is n, and the number of parallelizable substrates in the preprocessing unit U (i) is P ( i) . Pre-processing unit U (a) (a = 1,2, ..., M-1) that can pre-process / store a plurality of substrates in parallel, and then the pre-processing unit Consider a waiting time to wait from U (a) to the start of substrate transfer. Even if this standby is performed, the maximum value of the standby time during which the substrate for the assigned job can be transferred in the transfer unit and pre-processing in the preprocessing system without reducing the processing amount of the substrate in the processing unit is Is calculated by the following equation.

Figure 2017215456
Figure 2017215456

図18は、本実施形態における基板処理方法を示すフローチャートである。制御部7は、前処理系のユニットU(a)から前処理系のユニットU(a+1)へ基板を搬送する(S22)。その後、制御部7は、式(7)により算出した最大の待機時間、スケジュールされた次の基板の、基板収納部から前処理系のユニットU(a)への搬送を待機させる(S24)。 FIG. 18 is a flowchart showing the substrate processing method in the present embodiment. The controller 7 transports the substrate from the preprocessing unit U (a) to the preprocessing unit U (a + 1) (S22). After that, the control unit 7 waits for the maximum waiting time calculated by the equation (7) and the next scheduled substrate to be transferred from the substrate storage unit to the unit U (a) of the pretreatment system (S24).

待機中に新たな基板が前処理系のユニットU(a)(図17の例ではPBK1〜4のいずれか)へ搬送された場合(S26でYES)、制御部7は、前処理系のユニットU(a)から搬送する基板の処理順を変更する(S28)。待機中に新たな基板が前処理系のユニットU(a)へ搬送されなかった場合(S26でNO)は、直前の基板の処理順を引き継ぐ。 When a new substrate is transferred to the pre-processing unit U (a) (any of PBK1 to PBK4 in the example of FIG. 17 ) during standby (YES in S26), the control unit 7 The processing order of the substrates transported from U (a) is changed (S28). If a new substrate is not transferred to the preprocessing unit U (a) during standby (NO in S26), the processing order of the immediately preceding substrate is taken over.

次に、制御部7は、処理順(S28で変更された場合は変更後の処理順)に基づいて、次の基板を前処理系のユニットU(a)から前処理系のユニットU(a+1)へ搬送する(S30)。その後、制御部7は、前処理系のユニットU(a)から搬送する基板が他に存在するかを判断する(S32)。前処理系のユニットU(a)から搬送する基板が他に存在する場合、S24に戻り、その基板に対して処理を繰り返す。 Next, the control unit 7, (if it is changed in S28 processing order after the change) processing order based on the unit U (a pre-processing system for the next substrate from the pre-processing system of the unit U (a) +1) (S30). Thereafter, the control unit 7 determines whether there is another substrate to be transported from the pre-processing unit U (a) (S32). If there is another substrate to be transferred from the pre-processing unit U (a) , the process returns to S24 and the processing is repeated for the substrate.

本実施形態において、前処理系のユニットU(a)から前処理系のユニットU(a+1)へ搬送する基板の処理順を変更する際、次に搬送する基板が前処理系のユニットU(a)において前処理中である場合が発生し得る。この場合は、当該基板の搬送は実施せず、さらに次の処理順である基板を搬送する。 In this embodiment, when changing the processing order of the substrate transported from the preprocessing unit U (a) to the preprocessing system unit U (a + 1) , the next transported substrate is the preprocessing system unit U. In (a) , a case of pre-processing may occur. In this case, the substrate is not transported, and the substrate in the next processing order is transported.

このように、図18のフローチャートに従って、前処理系に存在する基板の処理順が決定され、基板に対して搬送、前処理、及び処理が実施される。待機中に新たな基板収納部に対して新たなジョブが処理中ではない処理部へ割り当てられた場合、該新たな基板収納部における基板の前処理が優先されるように基板の処理順が変更される。これにより、処理中ではない処理部における基板の処理が最短時間で開始されるとともに、割り当て済みのジョブに対する基板収納部における基板に対する処理部の処理も遅延しない。この結果、基板処理装置1全体の基板の処理量が最大化される。   As described above, the processing order of the substrates existing in the preprocessing system is determined according to the flowchart of FIG. If a new job is assigned to a new processing unit that is not being processed for a new substrate storage unit during standby, the substrate processing order is changed so that the pre-processing of the substrate in the new substrate storage unit is given priority. Is done. As a result, the processing of the substrate in the processing unit that is not processing is started in the shortest time, and the processing of the processing unit for the substrate in the substrate storage unit for the assigned job is not delayed. As a result, the substrate processing amount of the entire substrate processing apparatus 1 is maximized.

<第4実施形態>
第2実施形態と第3実施形態とを併用する場合、あるいは、第3実施形態で前処理系の複数のユニットに対して基板の処理順を変更する場合を考える。これらの場合、式(6)及び式(7)で算出した最大待機時間だけ待機すると、処理部IST1〜IST4における基板の処理に遅延が発生して基板処理装置1の基板の処理量が低下する。このため、制御部7は、それぞれの待機時間の合計が式(6)及び式(7)を超えないように配分する。
<Fourth embodiment>
Consider the case where the second embodiment and the third embodiment are used together, or the case where the substrate processing order is changed for a plurality of units in the pretreatment system in the third embodiment. In these cases, when waiting for the maximum waiting time calculated by the equations (6) and (7), a delay occurs in the substrate processing in the processing units IST1 to IST4, and the substrate processing amount of the substrate processing apparatus 1 decreases. . For this reason, the control part 7 distributes so that the sum total of each waiting time may not exceed Formula (6) and Formula (7).

<物品製造方法の実施形態>
本発明の実施形態における物品の製造方法は、例えば、半導体デバイス等のマイクロデバイスや微細構造を有する素子等の物品を製造するのに好適である。本実施形態の物品の製造方法は、上記のリソグラフィ装置(露光装置やインプリント装置、描画装置など)を用いて基板に原版のパターンを転写する工程と、かかる工程でパターンが転写された基板を加工する工程とを含む。更に、かかる製造方法は、他の周知の工程(酸化、成膜、蒸着、ドーピング、平坦化、エッチング、レジスト剥離、ダイシング、ボンディング、パッケージング等)を含む。本実施形態の物品の製造方法は、従来の方法に比べて、物品の性能・品質・生産性・生産コストの少なくとも1つにおいて有利である。
<Embodiment of article manufacturing method>
The method for manufacturing an article according to an embodiment of the present invention is suitable for manufacturing an article such as a microdevice such as a semiconductor device or an element having a fine structure. The article manufacturing method of the present embodiment includes a step of transferring an original pattern onto a substrate using the above-described lithography apparatus (exposure apparatus, imprint apparatus, drawing apparatus, etc.), and a substrate on which the pattern is transferred in such a process. Process. Further, the manufacturing method includes other well-known steps (oxidation, film formation, vapor deposition, doping, planarization, etching, resist stripping, dicing, bonding, packaging, and the like). The method for manufacturing an article according to the present embodiment is advantageous in at least one of the performance, quality, productivity, and production cost of the article as compared with the conventional method.

<他の実施形態>
本発明は、上述の実施形態の1以上の機能を実現するプログラムを、ネットワーク又は記憶媒体を介してシステム又は装置に供給し、そのシステム又は装置のコンピュータにおける1つ以上のプロセッサーがプログラムを読出し実行する処理でも実現可能である。また、1以上の機能を実現する回路(例えば、ASIC)によっても実現可能である。
<Other embodiments>
The present invention supplies a program that realizes one or more functions of the above-described embodiments to a system or apparatus via a network or a storage medium, and one or more processors in a computer of the system or apparatus read and execute the program This process can be realized. It can also be realized by a circuit (for example, ASIC) that realizes one or more functions.

1:基板処理装置、IST:処理部、3a,3b:搬送部、4a,4b:前処理部、5a,5b:格納部、FP:基板収納部、7:制御部 1: substrate processing apparatus, IST: processing unit, 3a, 3b: transfer unit, 4a, 4b: preprocessing unit, 5a, 5b: storage unit, FP: substrate storage unit, 7: control unit

本発明の一側面によれば、基板に対して第1処理を行う第1処理部と、前記第1処理が行われた基板に対して第2処理を行う第2処理部と、前記第2処理に要する時間に基づいて、前記第1処理部へ基板を投入するタイミングを決定する決定部と、前記決定されたタイミングまで基板の投入を待機している間に投入を待機している基板とは異なる他の基板を処理する新たな処理要求を受け付けた場合に、該投入を待機している基板より前記他の基板優先して前記第1処理部に投入するよう処理順を変更する変更部とを有することを特徴とする基板処理装置が提供される。 According to one aspect of the present invention, a second processing unit that performs a first processing unit that performs first processing on board, the second processing for the board of the first processing has been performed, the based on the time required for the second processing standby, a determining section for determining a timing to inject board to the first processing unit, it poured while waiting the insertion of board at the determined Taiminguma processed when receiving a new process request for processing the different other substrates and in which a substrate, such that in favor of the other substrate than the substrate waiting the charged charged into the first processing unit There is provided a substrate processing apparatus including a changing unit that changes the order.

Claims (9)

第1基板に対して第1処理を行う第1処理部と、
前記第1処理が行われた前記第1基板に対して第2処理を行う第2処理部と、
前記第2処理に要する時間に基づいて、前記第1処理部へ第2基板を投入するタイミングを決定する決定部と、
前記決定されたタイミングまで前記第2基板の投入を待機している間に第3基板を処理する新たな処理要求を受け付けた場合に、該第3基板を前記第2基板に優先して前記第1処理部に投入するよう処理順を変更する変更部と、
を有することを特徴とする基板処理装置。
A first processing unit for performing a first process on a first substrate;
A second processing unit that performs a second process on the first substrate on which the first process has been performed;
A determination unit that determines the timing of loading the second substrate into the first processing unit based on the time required for the second processing;
When a new processing request for processing the third substrate is received while waiting for the loading of the second substrate until the determined timing, the third substrate is given priority over the second substrate. A change unit for changing the processing order to be input to one processing unit;
A substrate processing apparatus comprising:
前記第1処理部と前記第2処理部との間で共用される搬送路に沿って基板を搬送する搬送部を更に有することを特徴とする請求項1に記載の基板処理装置。   The substrate processing apparatus according to claim 1, further comprising a transfer unit that transfers the substrate along a transfer path shared between the first processing unit and the second processing unit. 前記第2処理は、パターン形成を基板に行う処理であり、
前記第1処理は、該基板に対する前記パターン形成のための前処理である
ことを特徴とする請求項1又は2に記載の基板処理装置。
The second process is a process of performing pattern formation on the substrate,
The substrate processing apparatus according to claim 1, wherein the first process is a preprocess for forming the pattern on the substrate.
前記第1処理部は、順次実行される互いに異なる前処理を行う複数の前処理部を含み、
前記決定部は、前記第2処理に要する時間に基づいて、前記複数の前処理部のうちの最初の前処理部へ前記第2基板を投入するタイミングを決定し、
前記変更部は、前記決定されたタイミングまで前記第2基板の投入を待機している間に前記新たな処理要求を受け付けた場合に、前記第3基板を前記第2基板に優先して前記最初の前処理部に投入するように処理順を変更する
ことを特徴とする請求項3に記載の基板処理装置。
The first processing unit includes a plurality of preprocessing units that perform different preprocessing executed sequentially,
The determining unit determines a timing of loading the second substrate into a first preprocessing unit of the plurality of preprocessing units based on a time required for the second processing;
When the change unit receives the new processing request while waiting for the second substrate to be inserted until the determined timing, the changing unit gives priority to the third substrate over the second substrate. The substrate processing apparatus according to claim 3, wherein the processing order is changed so as to be put into the preprocessing unit.
前記第1処理部は、順次実行される互いに異なる前処理を行う複数の前処理部を含み、
前記第2処理部は、それぞれ前記パターン形成を行う複数のパターン形成部を含み、
それぞれが複数の基板を収納可能な複数の基板収納部が前記基板処理装置に接続され、
前記複数の基板収納部と、前記複数のパターン形成部との対応関係が予め定められており、
各基板は、該基板を収納していた基板収納部に対応するパターン形成部で処理される
ことを特徴とする請求項3に記載の基板処理装置。
The first processing unit includes a plurality of preprocessing units that perform different preprocessing executed sequentially,
Each of the second processing units includes a plurality of pattern forming units that perform the pattern formation,
A plurality of substrate storage portions each capable of storing a plurality of substrates are connected to the substrate processing apparatus,
The correspondence relationship between the plurality of substrate storage units and the plurality of pattern forming units is predetermined,
The substrate processing apparatus according to claim 3, wherein each substrate is processed by a pattern forming unit corresponding to a substrate storage unit that stores the substrate.
前記決定部は、前記複数の前処理部のそれぞれで実行される前記前処理に要する時間、前記複数の前処理部における前処理部の数、前記複数のパターン形成部のそれぞれで実行される前記パターン形成に要する時間、及び、前記複数のパターン形成部におけるパターン形成部の数、に基づいて前記タイミングを決定することを特徴とする請求項5に記載の基板処理装置。   The determination unit is executed in each of the plurality of pre-processing units, the time required for the pre-processing executed in each of the plurality of pre-processing units, the number of pre-processing units in the plurality of pre-processing units, and each of the plurality of pattern forming units. The substrate processing apparatus according to claim 5, wherein the timing is determined based on a time required for pattern formation and the number of pattern formation portions in the plurality of pattern formation portions. 第1処理部で、第1基板に対して第1処理を行う工程と、
第2処理部で、前記第1処理が行われた前記第1基板に対して第2処理を行う工程と、
前記第2処理に要する時間に基づいて、前記第1処理部へ第2基板を投入するタイミングを決定する工程と、
前記決定されたタイミングまで前記第2基板の投入を待機している間に第3基板を処理する新たな処理要求を受け付けた場合に、該第3基板を前記第2基板に優先して前記第1処理部に投入するよう処理順を変更する工程と、
を有することを特徴とする基板処理方法。
Performing a first process on the first substrate in the first processing unit;
Performing a second process on the first substrate on which the first process has been performed in a second processing unit;
Determining the timing of loading the second substrate into the first processing unit based on the time required for the second processing;
When a new processing request for processing the third substrate is received while waiting for the loading of the second substrate until the determined timing, the third substrate is given priority over the second substrate. A step of changing the processing order to be put into one processing unit;
A substrate processing method comprising:
コンピュータに、
第1処理部で、第1基板に対して第1処理を行う工程と、
第2処理部で、前記第1処理が行われた前記第1基板に対して第2処理を行う工程と、
前記第2処理に要する時間に基づいて、前記第1処理部へ第2基板を投入するタイミングを決定する工程と、
前記決定されたタイミングまで前記第2基板の投入を待機している間に第3基板を処理する新たな処理要求を受け付けた場合に、該第3基板を前記第2基板に優先して前記第1処理部に投入するよう処理順を変更する工程と、
を実行させるためのプログラム。
On the computer,
Performing a first process on the first substrate in the first processing unit;
Performing a second process on the first substrate on which the first process has been performed in a second processing unit;
Determining the timing of loading the second substrate into the first processing unit based on the time required for the second processing;
When a new processing request for processing the third substrate is received while waiting for the loading of the second substrate until the determined timing, the third substrate is given priority over the second substrate. A step of changing the processing order to be put into one processing unit;
A program for running
請求項3乃至6のいずれか1項に記載の基板処理装置を用いてパターン形成を基板に行う工程と、
前記工程で前記パターン形成を行われた前記基板を処理する工程と、
を含むことを特徴とする物品製造方法。
A step of performing pattern formation on the substrate using the substrate processing apparatus according to claim 3;
Processing the substrate on which the pattern has been formed in the step;
An article manufacturing method comprising:
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