JP2017092480A5 - - Google Patents

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Publication number
JP2017092480A5
JP2017092480A5 JP2016238670A JP2016238670A JP2017092480A5 JP 2017092480 A5 JP2017092480 A5 JP 2017092480A5 JP 2016238670 A JP2016238670 A JP 2016238670A JP 2016238670 A JP2016238670 A JP 2016238670A JP 2017092480 A5 JP2017092480 A5 JP 2017092480A5
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Japan
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light
light source
source device
optical
amplified
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JP2016238670A
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Japanese (ja)
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JP6714500B2 (ja
JP2017092480A (ja
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JP2016238670A 2015-05-29 2016-12-08 光源装置及び検査装置 Active JP6714500B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2015110187 2015-05-29
JP2015110187 2015-05-29

Related Parent Applications (1)

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JP2016556341A Division JP6059411B1 (ja) 2015-05-29 2016-05-10 光源装置及び検査装置

Publications (3)

Publication Number Publication Date
JP2017092480A JP2017092480A (ja) 2017-05-25
JP2017092480A5 true JP2017092480A5 (enExample) 2019-05-30
JP6714500B2 JP6714500B2 (ja) 2020-06-24

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JP2016556341A Active JP6059411B1 (ja) 2015-05-29 2016-05-10 光源装置及び検査装置
JP2016238670A Active JP6714500B2 (ja) 2015-05-29 2016-12-08 光源装置及び検査装置

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JP2016556341A Active JP6059411B1 (ja) 2015-05-29 2016-05-10 光源装置及び検査装置

Country Status (6)

Country Link
US (1) US10408874B2 (enExample)
EP (1) EP3306761B1 (enExample)
JP (2) JP6059411B1 (enExample)
KR (1) KR102403498B1 (enExample)
CN (1) CN107615603B (enExample)
WO (1) WO2016194556A1 (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6605651B2 (ja) 2018-03-27 2019-11-13 株式会社フジクラ レーザモジュール及びレーザ装置
JP7219096B2 (ja) * 2019-01-21 2023-02-07 浜松ホトニクス株式会社 分光測定装置および分光測定方法
CN111596158A (zh) * 2020-05-29 2020-08-28 苏州市运泰利自动化设备有限公司 基于产品老化测试状态的感光放大系统及方法
KR102286322B1 (ko) * 2020-05-29 2021-08-06 한국광기술원 마이크로 led 검사 시스템 및 방법
EP4213318A4 (en) * 2020-09-09 2025-01-29 Furukawa Electric Co., Ltd. Light source, light source device, method for driving light source, raman amplifier, and raman amplification system
KR102799599B1 (ko) * 2020-09-23 2025-04-23 하마마츠 포토닉스 가부시키가이샤 검사 장치
JP2023084807A (ja) * 2021-12-08 2023-06-20 古河電気工業株式会社 光源、光源装置、光源の駆動方法、ラマン増幅器、およびラマン増幅システム
US20240142512A1 (en) * 2022-10-31 2024-05-02 Texas Instruments Incorporated Semiconductor device testing

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3854673B2 (ja) * 1996-11-25 2006-12-06 株式会社日立コミュニケーションテクノロジー 光増幅媒体制御方法及び光増幅装置並びにそれを利用したシステム
JP3452768B2 (ja) * 1997-08-11 2003-09-29 富士通株式会社 光増幅のための方法及び装置並びに該装置を有するシステム
EP2315073B1 (en) * 1998-07-23 2014-12-31 The Furukawa Electric Co., Ltd. Raman amplifier and Raman amplification method
US7593647B2 (en) * 2002-09-19 2009-09-22 Novera Optics, Inc. Apparatuses and methods for automatic wavelength locking of an optical transmitter to the wavelength of an injected incoherent light signal
KR20050009584A (ko) * 2003-07-18 2005-01-25 삼성전자주식회사 반도체 광증폭기와 광증폭 모듈
KR100539928B1 (ko) * 2003-08-29 2005-12-28 삼성전자주식회사 다파장 광원 및 그를 이용한 파장 분할 다중 시스템
JP2009049123A (ja) * 2007-08-17 2009-03-05 Fujifilm Corp 光半導体素子、該光半導体素子を用いた波長可変光源および光断層画像取得装置
JP5894745B2 (ja) 2011-05-31 2016-03-30 浜松ホトニクス株式会社 集積回路検査装置
JP5398804B2 (ja) * 2011-09-16 2014-01-29 株式会社東芝 ファイバレーザ装置
WO2014028013A1 (en) * 2012-08-16 2014-02-20 Massachusetts Institute Of Technology Optical source for interferometric fiber optic gyroscopes
CN104300360B (zh) * 2014-10-16 2018-04-20 浙江大学 一种改善超辐射发光二极管光源波长稳定性的装置和方法

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