JP2017083269A - Automatic analysis device - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide an automatic analysis device with which it is possible to effectively prevent the deterioration of analysis data due to some components included in a sample.SOLUTION: The automatic analysis device comprises: a first placement part on which placed is a holding jig that holds a container in which a sample is stored; a sample probe for drawing in a prescribed amount of sample from the container; a second placement part, provided at a position where the sample probe draws in a sample, on which a plurality of holding jigs holding the container of a sample drawn in by the sample probe are placed in any order; a conveyance part for holding the holding jigs placed on the first and second placement parts, moving in the horizontal together with the holding jigs that are held, and conveying the holding jigs from at least the first placement part to one of free spaces in the second placement part; and a control circuit for making at least a portion of the conveyance part holding the holding jig move in a different manner from conveyance-related movement.SELECTED DRAWING: Figure 4

Description

  Embodiments described herein relate generally to an automatic analyzer.

The automatic analyzer is intended for testing biochemical test items and immunological test items, and changes in color tone and turbidity caused by the reaction of the sample and the reagent mixture used in the analysis of each test item. Measure optically with the photometer. By this measurement, analytical data indicated by the concentration of various test item components in the sample, the activity of the enzyme, and the like are generated.

In the automatic analyzer, an inspection target item selected from a plurality of inspection items is analyzed for each sample. The analysis procedure is as follows. First, the sample in the sample container in which the sample dispensing probe is arranged at the dispensing position is sucked and discharged to the reaction container. Next, the reagent dispensing probe sucks the reagent in the reagent container and discharges it to the reaction container, and the photometric circuit measures the sample and reagent mixture discharged into the reaction container.

By the way, before performing the inspection by the automatic analyzer, the sample is centrifuged using a centrifuge that is separate from the automatic analyzer. For example, when the sample is whole blood, it is separated into an upper layer sample containing serum and a lower layer sample containing blood cells and platelets. Thereafter, the transport device in the automatic analyzer transports the centrifuged sample to the dispensing position.

However, when a certain period of time elapses after centrifugation, the lower layer sample floats on the liquid surface of the upper layer sample in the sample container. As a result, a part of the floating lower layer sample is mixed into the upper layer sample sucked by the sample dispensing probe, and a measurement error occurs in an inspection item for analysis using only the upper layer sample. For example, when the sample is whole blood, the blood cell component may be destroyed by centrifugation, and the remnant of the blood cell component may float on the surface of the serum component. The debris of the blood cell component is sucked by the sample dispensing probe and mixed into the reaction container, thereby causing a measurement error.

JP2013-205405A

An object of the embodiment is to provide an automatic analyzer that can efficiently prevent generation of a measurement error.

An automatic analyzer according to an embodiment includes a first placement unit on which a holder that holds a container containing a sample to be inspected is placed, a sample probe that sucks a predetermined amount of sample from the container, and a sample A second placement section provided with a probe at a position for sucking the sample, and a plurality of holders for holding a container of the sample to be sucked by the sample probe; and a first placement and a second placement. The holding tool placed on the placement unit is held, moved together with the held holding tool in the horizontal direction, and the holding tool is transported from at least the first placement unit to one of the empty areas of the second placement unit. And a control circuit that causes at least a portion of the transport unit that holds the holding tool to perform a motion different from the motion due to the transport.

The perspective view which shows the structure of the analyzer which concerns on embodiment. FIG. 4 is a top view illustrating an example of a configuration of a transfer device according to the embodiment. FIG. 3 is a three-side view of a sample rack according to the embodiment. The figure which shows an example of a structure of the moving mechanism which concerns on embodiment. The figure which shows an example of a structure of the up-and-down moving mechanism which concerns on embodiment. The block diagram which shows the structure of the automatic analyzer which concerns on embodiment. Sectional drawing which shows the positional relationship of the sample in a sample container and the sample dispensing probe which attracts | sucks a sample in the dispensing position which concerns on embodiment. The flowchart which shows an example of the operation | movement process of the moving mechanism which concerns on embodiment. The figure which shows an example of a structure of the inclination operation | movement mechanism which concerns on embodiment. The figure which shows an example of a structure of the rotation mechanism based on embodiment.

(Example)
Hereinafter, embodiments will be described with reference to the drawings.

FIG. 1 is a perspective view showing the configuration of the measuring apparatus 10 of the automatic analyzer 100. The measuring apparatus 10 includes a first reagent container 15, a second reagent container 16, and a reaction table 18.

The sample container 11 is a container for storing a sample. An example of the sample container 11 is a blood collection tube that accommodates the centrifuged blood. The centrifuged blood is separated into an upper layer sample containing, for example, serum separated into an upper layer, and a lower layer sample containing red blood cells, white blood cells, and platelets separated into a lower layer. Another example of the sample container 11 is a sample cup or test tube of a predetermined size that accommodates each sample such as serum or plasma dispensed from a centrifuged blood collection tube and urine.

A reagent container 13 is accommodated in each of the first reagent container 15 and the second reagent container 16. The reagent container 13 contains a reagent to be used for each inspection. A reagent rack 14 is arranged in the first reagent container 15 and the second reagent container 16 and holds the reagent container 13. The reaction table 18 is arranged so as to surround the first reagent storage 15 and holds a plurality of reaction containers 17 arranged on the circumference.

The measuring device 10 also includes a sample dispensing probe 19, a sample dispensing arm 20, a first reagent dispensing probe 21, a first reagent dispensing arm 22, and a stirring device 23.

The sample dispensing probe 19 is connected to the sample container 1 held in the sample rack 31 on the dispensing lane 42.
The sample in 1 is aspirated and dispensed into the reaction vessel 17. The sample dispensing probe 19 is an example of a sample probe that sucks a predetermined amount of a sample from the sample container 11. The sample rack 31 is an example of a holder that can hold a plurality of sample containers 11 that contain samples to be inspected.

The sample dispensing arm 20 holds the sample dispensing probe 19 and moves the sample dispensing probe 19 as the sample dispensing arm 20 rotates. Further, the sample dispensing probe 19 is moved up and down by moving the sample dispensing arm 20 up and down.

The first reagent dispensing probe 21 dispenses the reagent into the reaction container 17. A sample is dispensed in the reaction container 17, and the reagent is mixed with the sample in the reaction container 17.

The first reagent dispensing arm 22 holds the first reagent dispensing probe 21 and moves the first reagent dispensing probe 21 by rotating the first reagent dispensing arm 22. Further, the first reagent dispensing arm 22 moves up and down by moving the first reagent dispensing arm 22 up and down.

The first reagent dispensing arm 22 holds the first reagent dispensing probe 21 so as to be rotatable and vertically movable. The stirring device 23 stirs the mixed solution of the sample and the reagent dispensed into the reaction vessel 17.

Furthermore, the measuring apparatus 10 includes a second reagent dispensing probe 25, a second reagent dispensing arm 26, a photometric device 29, and a cleaning nozzle 30.

The second reagent dispensing probe 25 performs dispensing in which the reagent in the reagent container 13 held in the reagent rack 14 is sucked and discharged into the reaction container 17. The second reagent dispensing arm 26 holds the second reagent dispensing probe 25 so as to be rotatable and vertically movable. The photometric device 29 detects the light transmitted through the standard sample in the reaction vessel 17 and the mixed solution containing the sample and the reagent, analyzes the obtained detection signal, and generates, for example, standard data and test data. Standard data is the absorbance of a standard sample of known concentration. The test data is the absorbance of the test sample measured by the photometry circuit. Further, the photometric device 29 outputs the generated standard data and test data to the processing circuit 90. The cleaning nozzle 30 cleans the inside of the reaction vessel 17 for which the measurement by the photometric device 29 has been completed.

FIG. 2 is a top view showing the configuration of the transfer device 40 of the automatic analyzer 100. The transport device 40 includes a loading lane 41, a moving mechanism 51, a dispensing lane 42, a standby lane 43, and a collection lane 44. The lanes of the transfer device 40 are provided at spatially separated positions, and the sample rack 31 is transferred from each lane to another lane via the moving mechanism 51.

The input lane 41 is disposed close to the right side of the measuring device 10 so that the longitudinal direction of the input lane 41 is parallel to the front-rear direction of the measuring device 10. Here, the sample rack 31 placed on the input lane 41 is sequentially pushed out in the direction of the arrow L1 by a drive mechanism disposed below the input lane 41 that is driven to move in the longitudinal direction of the input lane 41. It stops at the input position Ta on the input lane 41. The input lane 41 is an example of a first placement unit on which the sample container 11 containing a sample to be inspected is placed.

The moving mechanism 51 holds the sample rack 31 placed at the loading position Ta and moves it from the loading position Ta in the direction of the arrow L2 which is the left direction via the front of the reader 45 to dispense with the sample rack 31. The sample rack 31 is placed on the dispensing lane 42 so that the longitudinal directions of the lanes 42 are parallel to each other. At this time, the moving mechanism 51 moves along the longitudinal direction of the sample rack 31 placed on the placement section of the dispensing lane 42 or the standby lane 43. The position where the sample rack 31 that has been transported by the moving mechanism 51 is usually placed at the loading position Tb closest to the loading lane 41. However,
The position where the moving mechanism 51 holds the sample rack 31 is not limited to the above, and the sample rack 31 arranged on the dispensing lane 42 and the standby lane 43 may be held and moved. The moving mechanism 51 is an example of a transport unit that transports the sample rack 31 between the lanes of the sample rack 31 so as to transport the sample rack 31 from the input lane 41 to the dispensing lane 42, for example.

In the dispensing lane 42, the sample rack 3 is moved to the dispensing position Tc where the sample dispensing probe 19 dispenses the sample.
1 is arranged so as to be movable, and is disposed close to the left of the input lane 41 in front of the measuring device 10 so that the longitudinal direction of the dispensing lane 42 is parallel to the left-right direction of the measuring device 10. Here, the sample rack 31 is placed at a plurality of arbitrary positions on the dispensing lane 42. Further, the dispensing lane 42 is provided with a belt that is rotationally driven in the longitudinal direction of the lane, and the plurality of sample racks 31 placed on the dispensing lane 42 are in units of sample containers 11 by the rotational driving of the belt. Slide to the dispensing position Tc. The sample rack 31 in which the sample is sucked by the sample dispensing probe 19 of each sample container 11 to be held stops at the carry-out position Td. A plurality of sample racks 31 are placed on the dispensing lane 42 in a single line with respect to the longitudinal direction, and the moving mechanism 51 is placed in the longitudinal direction of the sample rack 31 placed on the placement portion of the dispensing lane 42. Move along. Dispensing lane 4
The belt No. 2 slides the sample rack 31 holding the sample container 11 toward the unloading position Td every time the sample suction from the sample container 11 at the dispensing position Tc is completed. The belt of the dispensing lane 42 is also moved out of the other sample racks 31 placed on the dispensing lane 42.
Slide it toward Td. The sample rack 31 moved to the carry-out position Td by the belt driving of the dispensing lane 42 is transported to and placed on either the standby lane 43 or the collection lane 44 by the moving mechanism 51.

Note that no structure is provided between the dispensing lane 42 and the moving mechanism 51 to prevent the sample rack 31 from being loaded and unloaded, and the moving mechanism 51 dispenses the conveyed sample rack 31. It can be placed at any position in the empty area on the lane 42, and any sample rack 31 placed on the dispensing lane 42 can be carried out. The position on the dispensing lane 42 where the sample rack 31 conveyed by the moving mechanism 51 is loaded and placed is not limited to the loading position Tb. The sample rack 31 that has been transported without the sample rack 31 being placed on the dispensing lane 42
Any one of the positions where 1 can be placed may be used. Further, the sample rack 31 that the moving mechanism 51 carries out from the dispensing lane 42 is not limited to the one positioned at the loading position Td, and the sample rack 31 is not located on the dispensing position Tc and is dispensed. Any other position may be used as long as it is placed at any position on the lane 42. A plurality of sample racks 31 are placed at arbitrary positions in the dispensing lane 42, and a second placement unit that sends the sample racks 31 to the position where the sample dispensing probe 19 sucks the sample in units of sample containers 11 is provided. It is an example.

The waiting lane 43 is arranged in the vicinity of the dispensing lane 42 so that the longitudinal direction of the waiting lane 43 is parallel to the dispensing lane 42, and a part of the sample rack 31 on which the sample is dispensed by the measuring apparatus 10. Is temporarily placed. The standby lane 43 includes an input lane 41 and a recovery lane 4.
4 is arranged. The standby lane 43 is an example of a third placement unit that temporarily places the sample rack 31 after the inspection.

The collection lane 44 is disposed close to the opposite side of the input lane 41 with the measuring device 10 sandwiched so that the longitudinal direction of the collection lane 44 is parallel to the front-rear direction of the measuring device 10, and after the sample dispensing is completed. A sample rack 31 is placed. Here, the sample rack 31 at the collection position Te is moved in the direction of the arrow L4 by the drive mechanism arranged below the collection lane 44.

Further, the transport apparatus 40 includes a reader 45 and a plurality of detectors 46. The reader 45 is arranged between the loading lane 41 and the dispensing lane 42, reads the rack ID written on the sample rack 31 and the sample ID written on the sample container 11 held in the sample rack 31, and performs processing. An optical sensor that outputs to the circuit 90. For example, the rack ID and the sample ID are bar code symbolized and printed on the sample rack 31 and the sample container 11. The reader 45 can read the ID by applying light to the barcode symbol and analyzing the reflected light. The detector 46 is
The sample ID of the sample container 11 placed on the standby lane 43 and placed on the standby lane 43 by the same operation as the reader 45 is read, and position information indicating the position of the sample container 11 on the standby lane 43 is detected. It is an optical sensor that outputs to the processing circuit 90.

  Next, the configuration of the sample rack 31 will be described with reference to FIG.

FIG. 3 is a three-view diagram illustrating an example of the configuration of the sample rack 31. FIG. 3A shows a top view of the sample rack 31. FIG. 3B shows a side view of the sample rack 31 from the short side direction. FIG. 3C shows a side view of the sample rack 31 from the longitudinal direction.

As shown in FIG. 3A, the sample rack 31 has an opening 311 that can hold a plurality of sample containers 11 in a line in the longitudinal direction. In addition, as shown in FIG.
The sample rack 31 has through holes 312 elongated in the vertical direction in the vicinity of both ends in the longitudinal direction of the side surface. The moving mechanism 51 holds the sample rack 31 through the through hole 312. Also,
Although not shown, a rack ID is written on the surface of the sample rack 31 so that it can be read by the reader 45 and the detector 46 of the transport device 40.

FIG. 4 shows a configuration diagram of the moving mechanism 51. FIG. 4 is a perspective view showing a state in which the moving mechanism 51 does not hold the sample rack 31. The movement mechanism 51 includes a vertical movement mechanism 57 and a tilting operation mechanism 57b.
And a rotational movement mechanism 58 and a linear movement mechanism 59. The vertical movement mechanism 57 moves the sample rack 31 held by the support arm 571 up and down by moving the support arm 571 up and down between the solid line display position and the dotted line display position in the drawing. The tilting operation mechanism 57 b tilts the support arm 571 around a support arm tilting shaft 590 provided on the support arm 571. The rotary moving mechanism 58 can rotate the moving mechanism 51 by 180 ° in the R2 direction opposite to R1 and R1 in the figure, with the rotary shaft 581 on the frame 587 as the center. The linear movement mechanism 59 slides the movement mechanism 51 in the L2 direction and the L3 direction in the drawing.

FIG. 5 is a side view showing an example of the configuration of the vertical movement mechanism 57. The vertical movement mechanism 57 includes a support arm 571, a first holder 572, a second holder 573, and a rail 574. The support arm 571 supports the sample rack 31 while being inserted into the through hole 312 of the sample rack 31. The first holder 572 holds the support arm 571 so as to be slidable in the directions of the arrows L5 and L6, which are the longitudinal directions. The second holder 573 is the first holder 572.
Is slidably supported in the directions of the arrows L7 and L8, which are the vertical directions. Rail 574
The second holder 573 is guided in the L7 direction and the L8 direction.

The vertical movement mechanism 57 includes a shaft 575, a roller 576, a plate 577, and the drive arm 5.
78. The shaft 575 is fixed to the support arm 571. The roller 576 is rotatably disposed on the shaft 575. A plate 577 indicated by a broken line in the drawing is provided with an opening for guiding a roller 576 positioned at the center in the vertical direction downward and upward along a curved path. The drive arm 578 is formed with a hole through which the shaft 575 passes freely at one end.

Further, the vertical movement mechanism 57 is supported on a frame 580 fixed to the rotation shaft 581. The vertical movement mechanism 57 has a motor 579. Frame 580 is rail 57
4. The plate 577 and the motor 579 are held. The motor 579 has a central position at which the other end of the drive arm 578 is tilted in the directions indicated by the arrows R3 and R4 to be positioned at the center in the vertical direction.
The HP support arm 571 is driven downward and upward along the same curved path as the roller 576.

As shown in FIG. 5, the motor 579 tilts and drives the drive arm 578 in the R4 direction, whereby the support arm 571 at the center position HP is driven in the L6 direction and the L8 direction and stops at the lower stop position BP. Further, the motor 579 tilts and drives the drive arm 578 in the R3 direction until it becomes horizontal, whereby the support arm 571 is driven in the L5 direction and the L7 direction and reaches the center position HP. By this drive, the support arm 571 enters the through hole 312 of the sample rack 31 placed at any position on the input lane 41, the dispensing lane 42, or the standby lane 43, and Touch the top. Further, the motor 579 tilts and drives the drive arm 578 in the R3 direction, so that the support arm 571 is driven in the L6 direction and the L7 direction and stops at the upper stop position UP. By this driving, the support arm 571 moves the sample rack 31 to the upper stop position UP, which is a height at which the sample rack 31 can be rotated by the rotational movement mechanism 58 and can be linearly moved by the linear movement mechanism 59.

The sample rack 31 is held by the support arm 571 by the support arm 571 coming into contact with the upper end portion of the through hole 312. Here, the sample container 11 placed on the sample rack 31
In the case where the whole blood that has been centrifuged is retained for a certain time or longer, the debris of blood cell components may float on the surface of the upper serum component. In order to prevent measurement errors due to blood cell component debris, the sample rack 31 or the sample container 11 is given movement (swing) in an arbitrary direction, and the blood cell component debris is sampled from the center of the serum surface to the sample dispensing probe. It is necessary to move to a position where the 19 probe tips do not contact. By moving the blood cell component debris from the center of the liquid surface of the serum component, a situation where a large amount of suspended matter is inhaled into the sample dispensing probe 19 is prevented. Therefore, the support arm 571 holds the sample rack 11 while holding the sample rack 31 between the lower stop position BP and the center position HP and between the upper stop position UP and the center position HP. In order to apply a vertical force to the body, it moves up and down. By moving up and down, a force toward the bottom of the sample container 11 can be applied, and the debris of the lower layer sample component floating on the upper layer sample from the suction position of the sample dispensing probe 19 is moved toward the bottom of the sample container 11. You can keep away. By the movement different from the movement by the conveyance as represented by the above vertical movement,
The force which removes the debris of the lower layer sample component which floated on the upper layer sample can be loaded. Hereinafter, the movement different from the movement by the transport is defined as the debris removal movement.

In addition, when the sample rack 31 is moved up and down, it moves upward while holding the sample rack 31 for the purpose of precipitating the lower layer sample components suspended in the upper layer sample, for example, debris of blood cell components, in the lower layer. Up and down movement may be performed so that the vertical upward acceleration at the time is larger than the vertical downward acceleration during the downward movement.

FIG. 6 is a block diagram illustrating a configuration of the automatic analyzer 100 according to the embodiment. The automatic analyzer 100 includes a measuring device 10, a transport device 40, a drive circuit 50, and a moving mechanism 51. The measuring device 10 dispenses a standard sample, a sample, and a reagent for each inspection item, and measures a mixed solution of the sample and the reagent. The transport device 40 transports the sample to a position where it can be dispensed in the measurement device 10.

The drive circuit 50 drives a sample table (not shown) of the measurement apparatus 10 and the sample container 1
Move 1 The drive circuit 50 drives each reagent rack 14 to rotate the reagent container 13. Further, the reaction table 18 is driven, and the reaction container 17 is driven to rotate. The drive circuit 50 includes the sample dispensing arm 20, the first reagent dispensing arm 22, the second reagent dispensing arm 26, and the first.
The stirring arm 24 is rotated and moved up and down, respectively, and the sample dispensing probe 19, the first reagent dispensing probe 21, the second reagent dispensing probe 25, and the stirring device 23 are rotated and moved up and down. Further, the cleaning nozzle 30 is moved up and down.

The moving mechanism 51 includes a vertical moving mechanism 57, a rotational moving mechanism 58, and a linear moving mechanism 59. The moving mechanism 51 performs the movement of the sample to a predetermined position and the debris removal movement to the sample by the vertical moving mechanism 57, the rotational moving mechanism 58, and the linear moving mechanism 59. Automatic analyzer 1
00 includes a data storage circuit 60, an output circuit 70, an operating device 80, and a processing circuit 90.

The data storage circuit 60 stores standard data and analysis data. In addition, a table in which sample information and inspection type information to be subjected to the debris removal motion is stored.

The output circuit 70 prints out or displays the calibration data and analysis data generated after each examination. Standard data indicates the absorbance of a standard sample having a known concentration. Calibration data is linear approximation data showing the correlation between absorbance and concentration, calculated from two measurement data obtained from a standard sample with known absorbance and zero concentration and a standard sample with known absorbance and concentration. is there. Also,
The test data is the absorbance of the sample to be inspected measured by the photometry circuit. The analytical data is calculated from the absorbance of the calibration data and the test data, and indicates the concentration of the target substance contained in the sample.

For example, the operation device 80 performs input for setting analysis data parameters for generating analysis data of each inspection item. By the way, if the analysis data generated by the measurement of the dispensed sample and the reagent mixture of the test item set for this sample is outside the range set in advance as the retest parameter, the sample is separated again. A re-inspection is performed. Therefore, the operating device 8
0 is an input for setting a re-inspection parameter for an inspection item to be re-inspected that may be re-inspected. The operation device 80 also inputs a sample ID for identifying a sample to be dispensed and measured by the measuring device 10 and inputs for setting an inspection item for the sample. However, this is not the case.

The processing circuit 90 includes an arithmetic function 910, a swing control function 920, an analysis control function 930, and a system control function 940, and executes various processes related to the automatic analyzer 100.

The system control function 940 controls the data storage circuit 60, the output circuit 70, the calculation function 910, the swing control function 920, and the analysis control function 930 in an integrated manner. The system control function 940 identifies the type of sample contained in the sample container 11 placed on the sample rack 31 from information such as the sample ID.

The calculation function 910 calculates the analysis data by reading the standard data and test data generated by the measuring apparatus 10 and comparing them with the calibration data of each test item.

The swing control function 920 performs control related to the debris removal motion given to the sample rack 31. In this embodiment, a case where the moving mechanism 51 moves the sample rack 31 up and down will be described as an example. The processing circuit 90 in a state where the swing control function 920 has been read is an example of a control circuit that causes the debris removal movement to be performed on at least a portion of the moving mechanism 51 that holds the sample rack 31. The swing control function 920 reads, for example, a table that records specimen information and examination type information to be applied with the debris removal motion stored in the data storage circuit 60. Next, the swing control function 920 compares the identified sample type with the table, and determines whether or not to give a debris removal motion to the sample placed on the sample rack 31. For example, when the type of sample is centrifuged whole blood, suspended matter such as erythrocyte debris may float on the liquid surface, so that a debris removal motion is given.
On the other hand, if the sample type is a sample type that is less affected by suspended matter, such as urine or saliva, no debris removal movement is given. The necessity of the debris removal movement for each sample is recorded in the data storage circuit 60 as a table. The swing control function 920 selectively applies a load to the specimen in which the influence of the suspended matter occurs by comparing the necessity of the debris removal motion recorded in the table with the type of the target sample.

The analysis control function 930 includes input information such as an analysis parameter, a re-inspection parameter, a sample ID, and an inspection item set for the sample identified by the sample ID input from the operation device 80, the transport device 40. The rack ID and sample ID output from the reader 45 and the position information of the sample rack 31 output from the detector 46 of the transfer device 40 are read, and the drive circuit 5 is read.
0 and the moving mechanism 51 are controlled.

Further, each processing function performed by the components of the processing circuit 90, the calculation function 910, the swing control function 920, the analysis control function 930, and the system control function 940 is recorded in the storage circuit in the form of a program executable by a computer. Has been. The processing circuit 90 is a processor that realizes a function corresponding to each program by reading the program from the storage circuit and executing the program. In other words, the processing circuit 90 in a state where each program is read out is the processing circuit 9 in FIG.
Each function shown in 0 will be provided. In FIG. 1, the arithmetic function 910, the swing control function 920, the analysis control function 930, and the system control function 940 are performed by a single processing circuit 90.
However, it is also possible to configure the processing circuit 90 by combining a plurality of independent processors, and to realize the functions by each processor executing a program.

FIG. 7 is a cross-sectional view showing the sample dispensing probe 19 that sucks the sample in the sample container 11 at the dispensing position. The sample dispensing probe 19 is composed of a tube extending in the vertical direction. The sample is sucked and discharged from the opening at the lower end, and the upper end is a tube filled with a sample dispensing pump 19b and a pressure transmission medium such as pure water. 191 communicates. The sample dispensing probe 19 sucks and discharges the sample from the lower end by the pressure transmitted through the tube 191 by the suction and discharge operation of the sample dispensing pump 19b. The sample dispensing probe 19 is held at the sample dispensing arm 20 at the upper end, moves horizontally in the circumferential direction by the turning operation of the sample dispensing arm 20, and moves up and down by the up-and-down operation. Then, the tip of the sample dispensing probe 19 is moved into the arbitrary sample container 11 and the reaction container 17. In addition, any sample in the sample rack 31 can be dispensed into any reaction container 17 by combining movement, suction, and discharge of the sample dispensing probe 19.

FIG. 8 is a flowchart showing an example of the operation process of the moving mechanism 51. As described above, in the case where the centrifuged blood is used as a sample to be examined, a measurement error may occur due to the debris of blood cell components floating in the upper layer. Therefore, in the operation process of FIG.
20 detects a sample that may cause a measurement error due to the debris of the blood cell component, and controls the moving mechanism 51 to give the debris removal movement to the sample before dispensing. This flowchart shows steps S1 from the process in which the moving mechanism 51 holds the sample rack 31 on the input lane 41 to the process in which the sample rack 31 is returned to the dispensing lane 42 after giving the sample rack 31 a debris removal motion.
1 to S16.

First, the sample rack 31 transported from the loading lane 41 on the transporting device 40 is loaded into the loading lane 4.
It moves in the direction of arrow L1 by driving the belt on 1. The sample rack 31 arranged at the input position Ta on the input lane 41 is held by the moving mechanism 51 (step S11).

The moving mechanism 51 conveys the sample rack 31 to the position of the reader 45 and causes the rack ID and the sample ID to be read. The read result is transferred to the processing circuit 90, and the system control function 940 of the processing circuit 90 identifies which type of sample is held in which sample rack 31. (Step S12)

After reading the rack ID and the sample ID, the moving mechanism 51 transports the sample rack 31 to the dispensing lane 42 after passing through the standby lane 43. Although the example in which the sample rack 31 is held at the loading position Ta has been described in S11, the sample rack 31 disposed in the standby lane 43 may be held instead of the loading position Ta. (Step S13)

The swing control function 920 reads the sample type and the inspection item identified in step S12, and determines whether the sample is to be subjected to the debris removal motion. When the swing control function 920 determines that the debris removal motion should be given, the swing control function 920 drives the moving mechanism 51,
The sample rack 31 located at Tx is held. The swing control function 920 instructs the moving mechanism 51 to cause the sample rack 31 held by the moving mechanism 51 to perform a debris removal motion. That is, when the moving mechanism 51 holds the sample rack 31, the sample dispensing probe 19 is not sucked from the held sample container 11 among the sample racks 31 placed on the dispensing lane 42. This is the case when there is something. Further, the position information of the sample rack 31 is detected by the detector 46 and transmitted to the processing circuit 90. The moving mechanism 51 receives the position information of the sample rack 31 from the processing circuit 90 and moves to hold the sample rack 31. The swing control function 920 causes the part of the moving mechanism 51 that holds the sample rack 31 to perform the debris removal movement because the moving mechanism 51 moves the sample rack 31 from the loading lane 41 to the placement section of the dispensing lane 42. It may be in the middle of movement for conveyance, or may be in the middle of movement for conveyance from the standby lane 43 for temporarily placing the sample rack 31 to the placement portion of the dispensing lane 42 after the inspection. (Step
S14)

The moving mechanism 51 gives a debris removal movement to the sample container 11 by moving up and down while holding the sample rack 31 on the support arm 571. (Step S15)

After giving the debris removal movement to the sample rack 31, the moving mechanism 51 returns the sample rack 31 to Tx in the dispensing lane 42 again. (Step S16)

With the above operation, the moving mechanism 51 swings the sample rack 31 at the position Tx. Thereby, the debris removal movement can be given to the sample rack 31 immediately before the dispensing of the sample, and the debris of the blood cell component can be moved from the center of the liquid surface.

In this flowchart, an example of the operation process of the moving mechanism 51 is shown. By the way, there is a case where retesting is performed on the sample rack 31 having a sample whose test result is incomplete. When the moving mechanism 51 holds the sample rack 31 that holds the sample container 11 at the time of retesting, the swinging is performed. The control function 920 may provide a debris removal motion. For example, the processing circuit 90 has the sample container 11 when the analysis data of the first inspection is read and the analysis data exceeds the reference value recorded in the data storage circuit 60, or when the analysis data falls below the reference value depending on the inspection item. The sample rack 31 is detected as a candidate for reinspection. Until the inspection result is known, the sample rack 31
Is placed on the waiting lane 43. The sample rack 31 including the sample to be reinspected may give a debris removal motion in the process of being transported by the moving mechanism 51 from the standby lane 43 to the dispensing lane 42. In addition, after transporting onto the dispensing lane 42 for the second inspection,
The sample rack 31 may be held from above the dispensing lane 42 to give a debris removal motion.

Further, whether or not to give a debris removal movement at the time of re-inspection may be determined based on a specific condition. For example, the swing control function 920 estimates the time until the sample contained in the sample rack 31 that has undergone the debris removal motion at the first inspection is sucked by the sample dispensing probe 19 at the second inspection. When the estimated time exceeds a predetermined time, the swing control function 920 may cause the moving mechanism 51 to hold the sample rack 31 and perform the debris removal movement during the second inspection. Alternatively, the swing control function 920 causes the debris removal motion to be performed on the portion of the moving mechanism 51 that has performed the debris removal motion that holds the sample rack 31.
It may be a case where a predetermined time has elapsed since 1 is placed in either the dispensing lane 42 or the standby lane 43. When the elapsed time from the first debris removal movement is short, it is considered that the possibility that the lower layer sample component floats on the upper layer sample is low. Therefore, the elapsed time from the first debris removal movement is measured, and the inspection time can be shortened by discriminating between the sample rack 31 that gives the debris removal movement and the sample rack 31 that does not give the debris removal movement.

(Modification 1)
Next, a modified example of the above embodiment will be described with reference to FIG. In the previous embodiment, the debris removal motion in which the vertical movement mechanism 57 moves up and down while holding the sample rack 31 to load the force toward the bottom of the sample container 11 has been described. In this modification, instead of this vertical movement, the tilting mechanism 57b applies a tilting motion that repeatedly tilts the sample rack 31 held by the transport device 40 in a predetermined direction at a predetermined angle. Thus, a case will be described in which a force toward the bottom of the sample container 11 is applied and a debris removal motion is performed. In the present modification, a support arm tilting shaft 59 for tilting the support arm 571 provided in the moving mechanism 51 is provided.
0 has been added. In a state where the sample rack 31 is held by the support arm 571, the support arm 571 moves the sample rack 31 so as to tilt. By this operation, a load can be applied to the sample. In this case, the moving mechanism 51 in FIG. 6 may be replaced with the moving mechanism 51b.

FIG. 9 is a side view showing the configuration of the tilting mechanism 57b of the present modification. As shown in FIG. 9, the sample rack holding portion 571 b of the support arm 571 can be tilted by adding a tilt shaft 590 to the support arm 571. In order to incline the sample rack holding part 571b, for example, the support arm 571 and the sample rack holding part 571b from the driving part in the moving mechanism 51b.
The tilting shafts 590 provided between them may be connected by a belt conveyor, and the support arm 571 may be rotated about the tilting shaft 590. In addition, a motor for reciprocating the pin connected to the support arm 571 is added to the moving mechanism 51b, and the tilting shaft 59 is moved along with the reciprocating motion of the pin.
A configuration in which the support arm 571 is rotated around 0 may be provided.

In this modification, a force is applied to the sample in the side wall direction and the bottom direction of the sample container by performing a tilting motion while the support arm 571 holds the sample rack 31. Thereby, the debris of the lower layer sample component suspended in the upper layer sample can be dispersed in the side wall direction and the bottom direction of the liquid surface, and can be kept away from the suction position by the sample dispensing probe 19.

(Modification 2)
Next, another modification of the above embodiment will be described with reference to FIG. In this modification, the sample rack 3 held by the moving mechanism 51 is used instead of applying the force in the bottom direction described above.
The case where the debris of the lower layer sample is moved from the center of the liquid surface of the upper layer sample by applying a force toward the side wall of the sample container 11 held by 1 will be described. In this modification, as a force directed toward the side wall of the sample container 11, a portion of the moving mechanism 51 that holds the sample rack 31 is rotated on a transport path in a predetermined direction with the rotation axis 581 of the moving mechanism 51 as a central axis. ,
The case of performing the debris removal movement will be described.

FIG. 10 is a top view showing an example of the configuration of the rotational movement mechanism 58. This rotational movement mechanism 58
Includes a motor 583, a pulley 584, a pulley 585, a belt 586, and a frame 587. The motor 583 drives the moving mechanism 51 to rotate. The pulley 584 is fixed to the motor 583. The pulley 585 is fixed to the rotating shaft 581 of the moving mechanism 51. The belt 586 is wound around the pulley 584 and the pulley 585. The frame 587 holds the belt 586 and the motor 583 and also holds the rotating shaft 581 of the moving mechanism 51 in a freely rotatable manner.

When the motor 583 drives the pulley 584 to rotate, the moving mechanism 51 is driven to rotate about the rotating shaft 581. Then, the sample rack 31 moved to the vertical stop position by the vertical movement mechanism 57 is rotated 180 degrees in the R1 direction and the R2 direction opposite to the R1 direction.

In this modification, the R1 direction and the R direction are maintained in a state where the support arm 571 holds the sample rack 31.
By performing the reversal motion in two directions in multiple directions, a load is applied to the sample in the direction of the side wall of the sample container 11, and the remnants of the lower layer sample components suspended in the upper layer sample are dispersed in the side wall direction. Thereby, the debris of the lower layer sample component attracted | sucked by the sample dispensing probe 19 reduces.

(Modification 3)
Further, the structure may be such that the debris removal movement is given to the sample by repeatedly sliding in the transfer device 40 in either the horizontal or vertical direction while the moving mechanism 51 holds the sample rack 31. For example, the moving mechanism 51 is slid in a pulse shape.
In other words, by repeating the movement and stop in a short time, the sample may be subjected to a debris removal movement in the horizontal direction with respect to the slide movement direction.

In this modification, the moving mechanism 51 performs a pulse-like slide movement, so that the sample container 11
The debris of the lower layer sample in the inside receives a force toward the side wall of the sample container 11, and the sample dispensing probe 19
Move away from the suction position. Thereby, the remains of the lower layer sample sucked by the sample dispensing probe 19 are reduced.

(Modification 4)
Further, the tilting operation of Modification 1 may be performed in combination with the vertical movement of the embodiment or the rotation movement of Modification 2. For example, the sample rack 31 held by the moving mechanism 51 may be tilted while repeatedly moving up and down, or may be tilted while repeatedly rotating the sample rack 31. Specifically, the sample rack 31 may be held by the support arm 571, and the moving mechanism 51 may be moved up and down while tilting the support arm 571 around the tilt shaft 590. The tilting operation during the up-and-down movement may be performed up and down while the sample rack 31 is tilted, or the tilting operation may be activated during the up-and-down movement. Also,
The sample rack 31 is held by the support arm 571, and the support arm 5 is centered on the tilting shaft 590.
The moving mechanism 51 may be rotated while the tilting operation is performed at 71. The tilting operation at the time of rotation may be performed while the sample rack 31 is tilted, or may be operated during the rotation. Further, when the sample rack 31 is moved up and down, the lower sample component suspended in the upper layer sample, for example, the debris of blood cell components, etc., is moved upward while the sample rack 31 is held for the purpose of causing the lower layer sample to settle to the lower layer. The vertical movement may be performed so that the vertical upward acceleration at the time becomes larger than the vertical downward acceleration during the downward movement.

In this modification, the vertical and / or tilting motion or the rotational and tilting motion is performed while the support arm 571 holds the sample rack 31, so that the force on the side wall direction and the bottom direction is applied to the remnant of the lower layer sample in the sample container 11 To load. Thereby, the debris of the lower layer sample component suspended in the upper layer sample can be dispersed in the side wall direction and the bottom direction of the liquid surface, and can be kept away from the suction position by the sample dispensing probe 19.

According to at least one embodiment described above, in the process of transporting the sample rack 31,
By applying a force in the horizontal direction or the bottom direction, the suspended matter from the lower layer sample can be moved away from the suction position by the sample dispensing probe 19 of the upper layer sample. Thereby, since the debris of the lower layer sample attracted | sucked by the sample dispensing probe 19 reduces, a measurement error can be reduced. In addition, it is not necessary to have a separate configuration for applying a separate load to the sample container 11, and it is possible to apply a load while the sample rack 31 is being transported, so that the time required for dispensing can be shortened. .

In each embodiment, the measuring device 10, the transport device 40, the drive circuit 50, the moving mechanism 51, the data storage circuit 60, the output circuit 70, the printing device 710, the display device 720, the operation device 80, the processing circuit 90, the arithmetic function 910, the oscillation function The motion control function 920, the analysis control function 930, and the system control function 940 respectively correspond to the measurement unit 10, the transport unit 40, the drive unit 50, the movement mechanism unit 51,
Data storage unit 60, output unit 70, printing unit 710, display unit 720, operation unit 80, processing unit 90
The calculation unit 910, the swing control unit 920, the analysis control unit 930, and the system control unit 940 may be used. Note that the components described as “units” in this embodiment may be realized by hardware, software, or hardware and software. It may be realized by a combination.

Although several embodiments of the present invention have been described, these embodiments are presented by way of example and are not intended to limit the scope of the invention. These novel embodiments can be implemented in various other forms, and various omissions, replacements, and changes can be made without departing from the scope of the invention. These embodiments and modifications thereof are included in the scope and gist of the invention, and are included in the invention described in the claims and the equivalents thereof.

DESCRIPTION OF SYMBOLS 10 ... Measuring apparatus, 11 ... Sample container, 13 ... Reagent container, 14 ... Reagent rack, 15 ... 1st reagent storage, 16 ... 2nd reagent storage, 17 ... Reaction container, 18 ... Reaction table, 19 ... Sample dispensing probe , 19a ... Liquid level detector, 19b ... Sample dispensing pump, 191 ... Tube, 20 ... Sample dispensing arm, 21 ... First reagent dispensing probe, 22 ... First reagent dispensing arm, 23 ... Stirring device, 2
DESCRIPTION OF SYMBOLS 5 ... 2nd reagent dispensing probe, 26 ... 2nd reagent dispensing arm, 29 ... Photometry apparatus, 30 ... Washing nozzle, 31 ... Sample rack, 311 ... Opening, 312 ... Through-hole, 40 ... Conveying device, 41 ... Input lane, 42 ... Dispensing lane, 43 ... Standby lane, 44 ... Collection lane, 45 ... Leader, 4
6 ... Detector, 51 ... Movement mechanism, 51b ... Movement mechanism, 57 ... Vertical movement mechanism, 57b ... Tilt operation mechanism, 58 ... Rotation movement mechanism, 59 ... Linear movement mechanism, 571 ... Support arm, 571b ... Sample rack holder 572 ... first holder 573 ... second holder 574 ... rail 57
5 ... shaft 576 ... roller 577 ... plate 578 ... drive arm 579 ... motor 5
80 ... Frame, 581 ... Rotating shaft, 583 ... Motor, 584 ... Pulley, 585 ... Pulley,
586 ... Belt, 587 ... Frame, 590 ... Tilt axis, 60 ... Data storage circuit, 70 ... Output circuit, 710 ... Printing device, 720 ... Display device, 80 ... Operation device, 90 ... Processing circuit, 91
0 ... Calculation function, 920 ... Oscillation control function, 930 ... Analysis control function, 940 ... System control function, 100 ... Automatic analyzer

Claims (16)

A first placement unit on which a holder capable of holding a plurality of containers containing samples to be inspected is placed;
A sample probe for aspirating a predetermined amount of the sample from the container;
Provided at a position spatially separated from the first placement section, a plurality of the holders are placed at arbitrary positions, and the holder is moved to a position where the sample probe sucks the sample in units of the containers. A second placement section to send;
The holder is held, moved with the holder between the first placement portion and the second placement portion, and the holder is moved from the first placement portion to the second placement portion. A transport unit for transporting to an arbitrary position of the mounting unit;
A control circuit that causes the portion of the transport unit that holds the holder to perform a motion different from the motion due to the transport;
The automatic analyzer characterized by having. The movement different from the movement by the conveyance is to load a force in at least one of the bottom direction and the side wall direction of the container held by the holding tool held by the conveyance unit. The automatic analyzer according to claim 1. 2. The automatic analyzer according to claim 1, wherein the motion different from the motion due to the conveyance is to apply a vertical force to the sample of the container held by the holder. 3. 4. The automatic movement according to claim 1, wherein the movement different from the movement by the movement is to rotate a portion holding the holder in a predetermined direction on the conveyance path. 5. Analysis equipment. 3. The automatic analyzer according to claim 1, wherein the movement different from the movement caused by the conveyance is to repeatedly tilt and hold the holding tool in a predetermined direction at a predetermined angle. The movement different from the movement by the conveyance is to repeatedly slide the holding tool to be held in either one of a horizontal direction and a vertical direction. Automatic analyzer. 3. The automatic analyzer according to claim 1, wherein the movement different from the movement caused by the conveyance is to repeatedly tilt and tilt the holding tool to be held. 3. The movement that the control circuit causes the portion of the transport unit that holds the holding tool repeatedly rotates and tilts the holding tool that is held. 3. The automatic analyzer described. The transport unit holds the holder mounted on the second mounting unit,
The control circuit causes the holding portion of the transfer unit that holds the holder mounted on the second mounting unit to perform a motion different from the motion due to the transport. 8. The automatic analyzer according to any one of 8. The holding tool held by the transport unit is one in which the sample probe is not sucked from a holding container among the holding tools placed on the second placement unit. The automatic analyzer according to claim 9. 9. The control circuit according to claim 1, wherein when the transport unit holds the holder that holds a sample container to be retested, the control circuit causes a motion different from the motion due to the transport. The automatic analyzer as described in one. When the sample probe does not suck the sample within a predetermined time from the container held by the holder of the transfer unit that has been moved differently from the movement by the transfer, the control circuit The automatic analyzer according to any one of claims 1 to 8, wherein the holder is held to cause a movement different from the movement by the conveyance. The control circuit causes at least a portion of the transport unit that holds the holder to perform a motion different from the motion due to the transport, for a predetermined time after the holder is placed on any of the placement units. The automatic analyzer according to any one of claims 1 to 8, wherein a time has elapsed. The control circuit causes at least a portion of the transport unit that holds the holder to perform a motion different from the motion due to the transport because the transport unit moves the holder from the first placement unit to the second.
The automatic analyzer according to claim 1, wherein the automatic analyzer is in the middle of movement for conveyance to the placement unit. The control circuit causes at least a portion of the transport unit that holds the holder to perform a motion different from the motion by the transport from a third placement unit that temporarily places the holder after the inspection. The automatic analyzer according to claim 1, wherein the automatic analyzer is in the middle of movement for conveyance to the second placement unit. The plurality of holders are placed on the second placement portion in a state where the longitudinal direction of the plurality of holders is located on a single line,
The automatic analyzer according to claim 1, wherein the transport unit moves along a longitudinal direction of the holder placed on the second placement unit.

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