JP6791690B2 - Automatic analyzer - Google Patents

Description

Embodiments of the present invention relate to an automatic analyzer.

The automatic analyzer measures the components contained in the sample. The components to be measured are related to various test items such as biochemical tests and immunological tests. The components contained in the sample are measured based on the reaction state between the predetermined reagent and the sample. The reagent to be reacted with the sample for measurement is determined by the components to be measured, the inspection items, and the like.

In a general automatic analyzer, each measurement of a plurality of different samples is performed in parallel. In addition, the measurements related to a plurality of different inspection items requested for each sample are performed in parallel. The sample measured by such an automatic analyzer is generally housed in a sample container. The sample contained in one sample container is derived from a sample collected from one subject. Generally, a sample contained in a single sample container is used to measure a plurality of different test items.

In order to perform the above measurement, a general automatic analyzer includes a sample dispensing probe, a reagent dispensing probe, a reaction tube, and the like.

The sample dispensing probe dispenses the sample contained in the sample container into the reaction tube. Normally, the samples contained in one sample container are dispensed into the same number of reaction tubes as the number of test items measured in the sample. That is, in a general automatic analyzer, when a measurement related to any one inspection item is performed on a certain sample, one reaction tube is provided for the measurement. For convenience, a reaction tube provided when performing a measurement related to any one test item in a sample contained in a certain sample container is referred to as a "reaction tube related to the measurement of the test item". ..

Then, the sample dispensing probe provided in a general automatic analyzer is an item of the inspection item that measures the operation of dispensing the sample from a certain sample container to the reaction tube related to the measurement of the inspection item. Repeat as many times as the number. That is, the sample dispensing probe provided in a general automatic analyzer performs the sample dispensing operation for the reaction tube related to the measurement of the inspection item for each sample container.

The sample dispensed into each of the reaction tubes related to the measurement of the test item by the sample dispensing probe is subjected to the measurement of one test item to which the measurement in the reaction tube is assigned. For convenience, the sample discharged into the reaction tube used for the measurement of one test item or the sample used for the measurement of one test item is referred to as "sample related to the test item" or "test item sample". It is called.

The amount of sample discharged into the reaction tube for the measurement of the test item is determined by the test item to which the measurement in the reaction tube is assigned. Therefore, the amount of the sample that the sample dispensing probe sucks from the sample container and dispenses into the reaction tube related to the measurement of the test item is also determined by the test item for which the measurement is performed on the sample contained in each sample container.

As described above, the sample dispensing probe provided in the general automatic analyzer measures the dispensing from one sample container to the reaction tube related to the measurement of the inspection item with the sample contained in the sample container. Perform for each inspection item.

In addition, the reagent dispensing probe provided in a general automatic analyzer sucks the reagent used for the measurement of each test item related to each sample from the reagent container, and the sucked reagent is the reaction assigned to the measurement of the corresponding test item. Discharge to the tube. Then, in a general automatic analyzer, the change in color tone and / or turbidity caused by the reaction of the mixed solution of the sample and the reagent dispensed into each reaction tube is optically measured by the photometric unit.

Further, one end of each dispensing probe provided in a general automatic analyzer is connected to a syringe pump or the like. The syringe pump can flow a very small amount of liquid in and out with high accuracy without pulsating flow. Such a syringe pump and one end of the dispensing probe are generally made of an elastic soft member, and are connected by an elongated tube having a hollow inside. The inside of the tube acts as a flow path for the liquid, which is filled with purified water. Purified water is also filled in the cylinder of the syringe pump and in the flow path in the dispensing probe.

The purified water filled in the cylinder, tube, and flow path in the dispensing probe of the syringe pump in this way transmits the pressure in the cylinder of the syringe pump to the flow path in the tube and dispensing probe. It plays the role of a medium. Therefore, the syringe pump only allows the purified water in the cylinder to flow in and out of the flow path in the tube, and the dispensing probe can dispense the sample and the reagent with high accuracy.

However, the sample sucked by the sample dispensing probe moves in the flow path of the purified water filled in the flow path in the sample dispensing probe, and thus moves in the flow path. Increased opportunity and frequency of contact with water. When the contact between the sample sucked into the sample dispensing probe and the purified water increases in this way, the sample sucked into the sample dispensing probe is diluted with the purified water before being discharged to the outside of the probe. The fear increases.

When the sample is diluted with purified water in the sample dispensing probe, for example, when the sample moves in the flow path following the movement in the flow path of the purified water, the sample moving in the flow path is the wall surface of the flow path. It occurs when the purified water left behind is taken in, or the liquid surfaces of each other come into contact with each other, and the sample dissolves in the purified water and diffuses. Dilution of such a sample causes a decrease in measurement accuracy.

In particular, in recent years, the miniaturization of the sample used for the measurement of one test item has progressed, and it is required not to dilute the sample in the sample dispensing probe.

Therefore, it has been proposed to hold a sample that is not used for the measurement of the inspection item, a so-called "dummy sample", between the sample that is used for the measurement of the inspection item and the purified water. For example, the sample contained in each sample container is sucked into the sample dispensing probe as a dummy sample of the sample to be used for measuring the inspection item.

In such a case, the sample dispensing probe does not react with the reagent related to the inspection item requested to be measured with the sample contained in the sample container when the sample is first sucked from each sample container ( A sample that is not discharged into the reaction tube that is used for the inspection item of the sample, a sample that is not used for the measurement of the inspection item of the sample, a sample that is not related to the inspection item of the sample, and a dummy sample) is sucked.

Then, the sample dispensing probe is a sample that reacts with the reagent related to the inspection item requested to be measured in the sample contained in the sample container while holding the dummy sample (subject to the inspection item in the sample). The sample to be discharged into the reaction tube, the sample used for measuring the inspection item in the sample, the sample related to the inspection item in the sample, the sample for measuring the inspection item) are sucked.

Normally, the inspection item measurement sample sucked next to the dummy sample is only the amount used for the measurement of one inspection item even when a plurality of inspection items are measured with the sample. That is, the inspection item of the sample sucked as the first inspection item measurement sample from the sample container next to the dummy sample is usually assigned to the reaction tube from which the sample contained in the sample container is discharged for the first time. It is one inspection item (hereinafter referred to as "first inspection item"). For convenience, the sample that is discharged from each sample container to one reaction tube related to the measurement of the inspection item and is used for the measurement of one inspection item assigned to the reaction tube is referred to as "the first inspection item" for convenience. It is referred to as "a sample used for the measurement of" or "a sample related to the first inspection item".

Prior to the suction of the sample related to the first inspection item, the dummy sample sucked into the sample dispensing probe is discharged when the sample related to the first inspection item is discharged into one reaction tube related to the measurement of the first inspection item. However, it does not discharge from the sample dispensing probe and stays in the sample dispensing probe as it is. Therefore, the sample dispensing probe that sucks the sample related to the next inspection item of the first inspection item after discharging the sample related to the first inspection item into one reaction tube related to the measurement of the inspection item is the inspection. When sucking the sample according to the item, it is not necessary to suck the dummy sample separately. The inspection item next to the first inspection item is an inspection item in which the measurement is performed in the reaction tube in which the sample is first dispensed from the sample container, and then in the reaction tube in which the sample is dispensed.

Therefore, the sample dispensing probe that sucks the sample related to the inspection item after the first inspection item from the sample container that sucked the dummy sample sucks the dummy sample again when sucking the sample related to each inspection item. There is no need to do it.

The sample dispensing probe that sucked the dummy sample puts the sample related to all the test items measured in the sample container that sucked the dummy sample into all the predetermined reaction tubes related to the measurement of the test item. Continue to hold the dummy sample until the dispensing is complete. Then, when the samples related to all the test items measured in the sample contained in the sample container in which the dummy sample is sucked are dispensed into all the predetermined reaction tubes related to the measurement of the test items, the dummy sample is dispensed. Discharge. The discharge destination of the dummy sample is not a reaction tube, but usually a washing tank for washing the sample dispensing probe.

However, when the sample dispensing probe that sucks the dummy sample sucks the test item measurement sample, even if the same test item is measured, the suction of the sample related to the test item sucks the dummy sample. The measurement result may differ between the time when the test is performed subsequently and the time when the sample is dispensed for other test items.

JP-A-2009-57767 Japanese Unexamined Patent Publication No. 2012-0833369

An object of the present invention is to provide an automatic analyzer capable of suppressing the influence of sample suction for a dummy by a sample dispensing probe on the measurement result of a sample according to an inspection item.

According to the embodiment, the automatic analyzer has a dispensing probe and a dispensing control unit. The dispensing probe sucks the sample contained in the sample container for each inspection item set for the sample and discharges the sample into the reaction vessel corresponding to each inspection item. The dispensing control unit moves the dispensing probe to the sample container, sucks the dummy sample from the sample container, and moves the dispensing probe to a predetermined position while holding the dummy sample.

FIG. 1 is a block diagram showing a functional configuration of the automatic analyzer according to the embodiment. FIG. 2 is a diagram showing a configuration of the analysis mechanism shown in FIG. FIG. 3 is a diagram showing a configuration of the analysis mechanism shown in FIG. FIG. 4 is a block diagram showing the configuration of the sample dispensing unit shown in FIG. FIG. 5 is an example of a flowchart showing a series of operations for sample dispensing executed within one cycle time for a sample to be measured by the automatic analyzer according to the embodiment or modification. FIG. 6 is a timing chart showing the start and end of each operation related to sample dispensing executed within one cycle time for the first inspection item in the automatic analyzer according to the embodiment or modification. FIG. 7 is a timing chart showing the start and end of each operation related to sample dispensing executed within one cycle time for the second inspection item in the automatic analyzer according to the embodiment. FIG. 8 is a timing chart showing the start and end of each operation related to sample dispensing executed within one cycle time for the last inspection item in the automatic analyzer according to the embodiment. FIG. 9 is a timing chart showing the start and end of each operation related to sample dispensing executed within one cycle time for the second inspection item in the automatic analyzer according to the modified example. FIG. 10 is a timing chart showing the start and end of each operation related to sample dispensing executed within one cycle time for the last inspection item in the automatic analyzer according to the modified example. FIG. 11 is a timing chart showing the start and end of each operation when only the operation related to the suction of the dummy sample is executed within the first one cycle time in the automatic analyzer according to the other embodiment.

Hereinafter, embodiments will be described with reference to the drawings.

FIG. 1 is a block diagram showing a functional configuration of the automatic analyzer 1 according to the present embodiment. The automatic analyzer 1 shown in FIG. 1 includes an analysis mechanism 2, an analysis circuit 3, a drive mechanism 4, an input interface circuit 5, an output interface circuit 6, a storage circuit 7, and a control circuit 8.

The analysis mechanism 2 mixes a sample such as a standard sample or a test sample with the reagent used in each test item set for this sample. The analytical mechanism 2 measures the mixed solution of the sample and the reagent, and generates, for example, standard data represented by absorbance and test data.

The analysis circuit 3 is a processor that analyzes calibration data, analysis data, and the like based on the standard data and test data generated by the analysis mechanism 2. The analysis circuit 3 reads an operation program from the storage circuit 7 and generates calibration data, analysis data, and the like according to the operation program. For example, the analysis circuit 3 generates calibration data showing the relationship between the standard data and the standard value preset in the standard sample. Further, the analysis circuit 3 generates analysis data represented as a concentration value and an enzyme activity value based on the test data and the calibration data of the test items corresponding to the test data. The analysis circuit 3 outputs the generated calibration data, analysis data, and the like to the storage circuit 7 and the control circuit 8.

The drive mechanism 4 is realized by a gear, a stepping motor, a belt conveyor, a lead screw, and the like. The drive mechanism 4 drives the analysis mechanism 2 under the control of the control circuit 8.

The input interface circuit 5 is realized by, for example, a mouse, a keyboard, a touch pad on which instructions are input by touching an operation surface, and the like. The input interface circuit 5 receives, for example, a sample ID for identifying a sample to be inspected from an operator, inspection items for the sample ID, analysis parameters of each inspection item, and the like. The input interface circuit 5 is connected to the control circuit 8, converts an operation instruction input from the operator into an electric signal, and outputs the electric signal to the control circuit 8. In this specification, the input interface circuit 5 is not limited to the one provided with physical operating parts such as a mouse and a keyboard. For example, an electric signal processing circuit that receives an electric signal corresponding to an operation instruction input from an external input device provided separately from the automatic analyzer 1 and outputs the electric signal to the control circuit 8 is also an input interface. It is included in the example of the circuit 5.

The output interface circuit 6 includes display circuits such as a CRT display, a liquid crystal display, an organic EL display, and a plasma display. The display circuit included in the output interface circuit 6 displays, for example, calibration data and analysis data supplied from the control circuit 8.

The storage circuit 7 includes a recording medium that can be read by a processor, such as a magnetic or optical recording medium or a semiconductor memory. The storage circuit 7 stores an operation program executed by the analysis circuit 3 and an operation program executed by the control circuit 8. The storage circuit 7 stores the calibration data generated by the analysis circuit 3 for each inspection item. The storage circuit 7 stores the analysis data generated by the analysis circuit 3 for each test sample. The storage circuit 7 stores order information in advance. The order information includes the sample ID, the inspection items required for the sample to be measured, and the measurement order thereof. The storage circuit 7 stores various set values for executing a series of operations of each unit of the automatic analyzer 1 within one cycle time.

The control circuit 8 is a processor that functions as the center of the automatic analyzer 1. The control circuit 8 realizes a function corresponding to this operation program by executing the operation program stored in the storage circuit 7.

2 and 3 are schematic views showing an example of the configuration of the analysis mechanism 2 shown in FIG. The analytical mechanism 2 shown in FIGS. 2 and 3 includes a reaction disk 201 and a reagent storage 202.

The reaction disk 201 holds a plurality of reaction tubes 2011 arranged in a ring. The reaction disk 201 is alternately rotated and stopped by the drive mechanism 4. The reaction tube 2011 is formed of, for example, glass.

The reagent storage 202 is an example of a reagent storage that holds a plurality of reagent containers for accommodating reagents, and is arranged adjacent to the reaction disk 201. The reagent storage 202 holds a plurality of reagent containers in a circumferential shape by the reagent container rack. The outer circle 2021 in the reagent storage 202 shown in FIGS. 2 and 3 is the position of the opening of the reagent container arranged on the outer circumference of the reagent containers arranged in a circumferential shape in the reagent storage 202. Represents. The inner circle 2022 in the reagent storage 202 represents the position of the opening of the reagent container arranged in the inner circumference among the reagent containers arranged in a circumferential shape in the reagent storage 202. The reagent container held in the reagent storage 202 contains the reagent to be dispensed into the reaction tube 2011. The reagent container in which the opening is arranged along the outer circle 2021 contains the first reagent. A reagent container in which the opening is arranged along the inner circle 2022 houses the second reagent. As the first and second reagents, those used for each test item are determined. The reagent container rack is rotated around the center of the reagent storage 202 by the drive mechanism 4.

Further, the analysis mechanism 2 shown in FIGS. 2 and 3 includes a rack loading lane 220 and a rack moving unit 230. In the rack loading lane 220, a sample rack 102 holding a plurality of sample containers 100 is loaded. The sample rack 102 has a shape that can be picked up by a transfer arm 231 provided in the rack moving unit 230. The sample container 100 contains samples such as a standard sample and a test sample. The sample container 100 is provided with an optical mark on which identification information and the like of the sample contained in the sample container 100 are described. Here, the sample identification information includes, for example, a sample ID and the like. The optical mark is a mark that encodes identification information or the like of a sample contained in the sample container 100, for example, a bar code, a one-dimensional code, a two-dimensional code, or the like.

The rack moving unit 230 includes a transfer arm 231 and a transfer rail 232, a sampling lane 233, and a reader 234.

The transport arm 231 is driven by the drive mechanism 4 to transport the sample rack 102. For example, the transport arm 231 transports the sample rack 102 mounted at a predetermined loading position in the rack loading lane 220 from the rack loading lane 220 to the sampling lane 233 along the transport rail 232.

The sampling lane 233 moves the carried-in sample rack 102 by the drive mechanism 4. For example, the sampling lane 233 moves the openings of each of the sample containers 100 held in the sample rack 102 to a predetermined position for sucking the sample. The movement of the sample rack 102 in the sampling lane 233 is realized by, for example, a belt conveyor, a lead screw, or the like.

The reader 234 is provided at a position where the optical mark attached to the sample container 100 moving in the sampling lane 233 can be read, for example. The reader 234 reads the optical mark attached to the sample container 100. The reader 234 outputs the sample identification information based on the read optical mark to the control circuit 8. The reader 234 may be replaced with another sensor using RFID (Radio Frequency IDentification) or the like.

Further, the analysis mechanism 2 shown in FIGS. 2 and 3 includes a sample dispensing arm 203, a sample dispensing probe 204, a sample dispensing unit 205, a liquid level detector 2051, a first reagent dispensing arm 206, and a first reagent. It includes a dispensing probe 207, a second reagent dispensing arm 208, a second reagent dispensing probe 209, and a stirring unit 210.

The sample dispensing arm 203 supports the sample dispensing probe 204 so as to be vertically movable at one end. The sample dispensing arm 203 is rotated by the drive mechanism 4. By rotating the sample dispensing arm 203, the sample dispensing probe 204 is rotated along an arcuate rotation trajectory. A sample probe cleaning position P1, a sample suction position P2, and a sample discharge position P3 are preset on the rotation trajectory. The sample probe cleaning position P1 is a position where a cleaning pool in which a predetermined cleaning liquid for cleaning the sample dispensing probe 204 is stored is provided. For example, the rotation of the sample dispensing probe 204 by the sample dispensing arm 203. Set as the home position of the hour. The home position may be an arbitrary position different from the sample probe cleaning position P1. The sample suction position P2 is a position for sucking the sample, and is set so as to be located on the sampling lane 233. The sample discharge position P3 is a position for discharging the sucked sample at the sample suction position P2, and is set to be located on the rotation orbit of the reaction tube 2011 held by the reaction disk 201.

The sample dispensing unit 205 sucks the sample contained in the sample container 100 at the sample suction position P2 by the sample dispensing probe 204 under the control of the control circuit 8. Further, the sample dispensing unit 205 discharges the sample sucked by the sample dispensing probe 204 to the reaction tube 2011 located at the sample discharge position P3 under the control of the control circuit 8. Further, the sample dispensing unit 205 supplies a cleaning liquid to the sample dispensing probe 204 at the sample probe cleaning position P1 to clean the inner wall of the sample dispensing probe 204.

FIG. 4 is a schematic view showing a configuration example of the sample dispensing unit 205. The sample dispensing unit 205 shown in FIG. 4 has a tube 2053, which is an elastic body whose one end is connected to the sample dispensing probe 204, a syringe 2054 connected to the other end of the tube 2053, and a lower end of the syringe 2054. A plunger 2055 that fits into the opening provided is provided. Further, the sample dispensing unit 205 includes a tank 2056 for storing the pressure transfer medium filled inside each of the first A sample dispensing probe 204, the tube 2053, and the syringe 2054.

Further, the sample dispensing unit 205 sucks the pressure transmission medium stored in the tank 2056, and supplies the sucked pressure transmission medium as a cleaning liquid into the sample dispensing probe 204 via the syringe 2054 and the tube 2053. It is equipped with a pump 2057. Further, the sample dispensing unit 205 includes an on-off valve 2058 that opens and closes a flow path that communicates between the syringe 2054 and the cleaning pump 2057. The on-off valve 2058 is, for example, a solenoid valve.

When dispensing the sample, the flow path between the syringe 2054 and the wash pump 2057 is closed by the on-off valve 2058 controlled by the control circuit 8. The drive mechanism 4 sucks and drives the plunger 2055 in the direction of arrow L1, so that the sample dispensing probe 204 sucks the sample in the sample container 100 at the sample suction position P2. Further, the drive mechanism 4 discharges and drives the plunger 2055 in the direction of arrow L2, so that the sample dispensing probe 204 discharges the sample into the reaction tube 2011 located at the sample discharge position P3.

When the dispensing of the same sample is completed, or when it is determined that the dispensing of the sample is abnormal, the flow path between the syringe 2054 and the cleaning pump 2057 is operated by the on-off valve 2058 controlled by the control circuit 8. Be released. The cleaning pump 2057 is driven by the drive mechanism 4 to supply the cleaning liquid into the sample dispensing probe 204.

One end of the liquid level detector 2051 is electrically connected to the sample dispensing probe 204. The liquid level detector 2051 includes an oscillation circuit, a bridge circuit, a differential amplifier, a synchronous detection circuit, an integrator circuit, an amplifier circuit, and the like. The liquid level detector 2051 detects the contact of the sample dispensing probe 204 with the sample, for example, by the change in capacitance when the sample dispensing probe 204 comes into contact with the sample in the sample container 100. The liquid level detector 2051 outputs a detection signal regarding the contact of the sample dispensing probe 204 to the control circuit 8.

The first reagent dispensing arm 206 supports the first reagent dispensing probe 207 so as to be vertically movable at one end. The first reagent dispensing arm 206 is rotated by the drive mechanism 4. By rotating the first reagent dispensing arm 206, the first reagent dispensing probe 207 is rotated along an arcuate rotation trajectory. On this rotation orbit, a reagent suction position for sucking the first reagent from the reagent container in the outer circle 2021 of the reagent storage 202 and a first reagent discharge position T1 for discharging the sucked reagent are set. The first reagent dispensing probe 207 sucks the reagent from the reagent container located at the reagent suction position in the outer circle 2021 of the reagent storage 202 under the control of the control circuit 8. Further, the first reagent dispensing probe 207 discharges the sucked reagent to the reaction tube 2011 located at the first reagent discharge position T1 on the reaction disk 201 under the control of the control circuit 8.

The second reagent dispensing arm 208 supports the second reagent dispensing probe 209 so as to be vertically movable at one end. The second reagent dispensing arm 208 is rotated by the drive mechanism 4. By rotating the second reagent dispensing arm 208, the second reagent dispensing probe 209 is rotated along an arcuate rotation trajectory. On this rotating trajectory, a reagent suction position for sucking the reagent from the reagent container in the inner circle 2022 of the reagent storage 202 and a second reagent discharge position T2 for discharging the sucked reagent are set. The second reagent dispensing probe 209 sucks the reagent from the reagent container located at the reagent suction position in the inner circle 2022 of the reagent storage 202 under the control of the control circuit 8. Further, the second reagent dispensing probe 209 discharges the sucked reagent to the reaction tube 2011 located at the second reagent discharge position T2 on the reaction disk 201 under the control of the control circuit 8.

The stirring unit 210 has a stirring arm and a stirrer. The stirring arm supports the stirrer in the vicinity of the tip so as to be rotatable and vertically movable. The stirring unit 210 moves the stirrer to the reaction tube 2011 located at the stirring position on the reaction disk 201 under the control of the control circuit 8, and the stirrer moves the stirrer to the mixed solution of the sample and the first reagent in the reaction tube 2011 or The mixture of the sample, the first reagent, and the second reagent is stirred.

Further, the analysis mechanism 2 shown in FIGS. 2 and 3 includes a photometric unit 211, a cleaning unit 212, and an electrolyte measurement unit 213.
The photometric unit 211 includes a light source and a photodetector. The photometric unit 211 irradiates the reaction tube 2011 with light from the light source according to the control of the control circuit 8. The photodetector detects the light that has passed through the mixed solution of the standard sample and the reagent in the reaction tube 2011 or the mixed solution of the test sample and the reagent. The photodetector produces standard data or test data, for example represented by absorbance, based on the intensity of the detected light. The photometric unit 211 outputs the generated standard data and test data to the analysis circuit 3.

The cleaning unit 212 includes a waste liquid nozzle, a cleaning nozzle, and a drying nozzle. The cleaning unit 212 sucks the mixed liquid in the reaction tube 2011 located at the reaction tube cleaning position as a waste liquid by the waste liquid nozzle. The cleaning unit 212 uses a cleaning nozzle to discharge pure water to the reaction tube 2011 located at the reaction tube cleaning position to clean the reaction tube 2011. The cleaning unit 218 dries the reaction tube 2011 washed with pure water by supplying dry air to the reaction tube 2011 with a drying nozzle.

The electrolyte measurement unit 213 measures the specific electrolyte present in the mixed solution in the reaction tube 2011. The electrolyte measurement unit 213 measures, for example, the ion concentration generated from a specific electrolyte.

The control circuit 8 according to the present embodiment realizes various functions shown in FIG. 1 by executing an operation program read from the storage circuit 7. That is, the control circuit 8 includes a system control function 81 and a dispensing control function 82. In this embodiment, the case where the system control function 81 and the dispensing control function 82 are realized by a single processor will be described, but the present invention is not limited to this. For example, a control circuit may be formed by combining a plurality of independent processors, and the system control function 81 and the dispensing control function 82 may be realized by each processor executing an operation program.

The system control function 81 is a function that controls each part of the automatic analyzer 1 in an integrated manner based on the input information input from the input interface circuit 5.

The dispensing control function 82 is a function of controlling a series of operations related to sample dispensing of a sample to be measured within a predetermined cycle time. The cycle time is set based on, for example, the longest time required for a series of operations related to sample dispensing, reagent dispensing, stirring, photometry, washing, and the like in each unit of the automatic analyzer 1. When the dispensing control function 82 is executed, the control circuit 8 reads various set values stored in the storage circuit 7. The control circuit 8 controls the drive mechanism 4 based on the various set values read, sucks the sample from the sample container 100 located at the sample suction position P2 within one cycle time, and sucks the sucked sample to the sample discharge position P3. Discharge to the reaction tube 2011 located at.

Next, the operation when the sample to be measured of the automatic analyzer 1 configured as described above is dispensed will be described. FIG. 5 is an example of a flowchart showing a series of operations for sample dispensing executed within one cycle time for the sample to be measured by the automatic analyzer 1 according to the present embodiment. As shown in FIG. 5, when the number of inspection items requested for the sample contained in the sample container 100 is 2 or more, the automatic analyzer 1 inspects the first inspection item and the second and subsequent inspection items. For the sample dispensing of the sample according to the item, the common operation from step S7 to step S15 is performed. For example, the sample related to the first inspection item is discharged from each sample container 100 to one reaction tube 2011 related to the measurement of the inspection item for the first time, and the inspection requested to measure the sample contained in the sample container 100 is requested. It is a sample to be reacted with the reagent according to the item (a sample used for measurement of one test item assigned to the reaction tube 2011). The sample related to the second and subsequent inspection items is, for example, a sample for which multiple inspection items have been requested, and the sample containing the sample related to the other inspection item after dispensing the sample related to the other inspection item. A sample that is sucked from the container 100, discharged into one reaction tube 2011 related to the measurement of the next test item of the other test item, and reacted with the reagent of the next test item of the other test item (the other). The sample used for the measurement of the next inspection item of the inspection item). Hereinafter, in the description of FIG. 5, for the sake of simplicity, the case where the number of inspection items requested for the sample contained in the sample container 100 is three will be described as an example. In addition, the number of inspection items requested for the sample may be two or four or more. Further, before the measurement is started, order information is input via, for example, the input interface circuit 5, and is stored in the storage circuit 7.

When the predetermined sample container 100 reaches the sample suction position P2, a series of operations for sample dispensing shown in FIG. 5 is started.

The control circuit 8 acquires order information corresponding to the sample ID read by the reader 234 (step S1). The control circuit 8 dispenses a sample of the first inspection item included in the acquired order information according to the timing chart shown in FIG.

FIG. 6 is a timing chart showing the start and end of each operation related to sample dispensing executed within one cycle time for the first inspection item in the automatic analyzer 1 according to the present embodiment. In the timing chart shown in FIG. 6, the horizontal axis is the time point t, the start time point of the cycle time is 0, and the end time point is T. Further, the timing chart shown in FIG. 6 has a dummy suction phase and a sample dispensing phase. The dummy suction phase is a phase in which only suction of the dummy sample is executed, and is set between t = 0 and τ. The dummy sample is, for example, a sample that does not react with the reagent related to the inspection item requested to be measured in the sample contained in the sample container 100 when the sample is first sucked from each sample container 100 (in the sample). A sample that is not used for the measurement of the inspection item of (a sample that is not related to the inspection item of the sample). The dummy sample is not discharged into the reaction tube 2011 provided for the inspection item in the sample after being first sucked. The dummy sample separates the sample related to the inspection item used for the measurement from the pressure transfer medium filled in the sample dispensing probe 204, and the pressure transfer medium is mixed in the sample according to the inspection item or the pressure transfer medium. Reduce the dilution of the sample by diffusion into. The time point τ is determined based on, for example, the time required for the operation related to the suction of the dummy sample. Further, the time point τ may be determined based on, for example, the time required for the operation related to the dispensing of the sample according to the inspection item. The sample dispensing phase is a phase in which suction and discharge of the sample related to the inspection item are executed, and is set between t = τ and T. The timing chart shown in FIG. 6 represents the start and end points of each operation relating to the reaction disk, the rotation of the sample dispensing arm, the vertical movement of the sample dispensing arm, and the sample dispensing probe. Specifically, in FIG. 6, the rising edge of the rectangle represents the start of the operation, and the falling edge represents the end of the operation.

The control circuit 8 controls the drive mechanism 4 by starting the supply of the drive pulse at the time point t ₁ shown in FIG. 6, and starts the rotation of the sample dispensing arm 203. The control circuit 8 stops the supply of the drive pulse after supplying the drive pulse a predetermined number of times. As a result, the sample dispensing probe 204 is moved from the sample probe cleaning position P1 to the sample suction position P2 (step S2).

The control circuit 8 controls the drive mechanism 4 by starting the supply of the drive pulse at the time point t ₂ shown in FIG. 6, and moves the sample dispensing arm 203 downward at the sample suction position P2. To start. At this time, the control circuit 8 supplies a drive pulse to the drive mechanism 4 so that the moving speed becomes a predetermined speed V1. Further, the control circuit 8 detects the liquid level of the sample contained in the sample container 100 located at the sample suction position P2. The liquid level detection is performed as follows. That is, when the control circuit 8 outputs a detection signal regarding the contact of the sample dispensing probe 204 from the liquid level detector 2051, the control circuit 8 of the sample is based on the number of drive pulses supplied during the descent of the sample dispensing probe 204. Acquire the position information of the liquid level. The position information of the liquid level of the sample is, for example, information representing the distance from the tip of the sample dispensing probe 204 located at the top dead center to the liquid level of the sample. The acquired position information is stored in, for example, the storage circuit 7. The position information stored in the storage circuit 7 is overwritten with, for example, the position information acquired at the time of dispensing the next inspection item.

After detecting the liquid level, the control circuit 8 lowers the sample dispensing probe 204 by a preset amount of movement to stop the supply of the drive pulse. Thus, the sample dispensing probe 204 begins to move in the downward direction from the time t ₂ shown in FIG. 6, the lower the sample to attractable stop position from the top dead center is a home position of the vertical movement (Step S3).

The control circuit 8, after the sample dispensing probe 204 reaches the sample suction possible stopping position, at a time point t ₃ when shown in FIG. 6, by starting the supply of the drive pulse, controls the drive mechanism 4 , The suction drive in the direction of arrow L1 with respect to the plunger 2055 shown in FIG. 4 is started. The control circuit 8 stops the supply of the drive pulse after supplying the drive pulse a predetermined number of times. As a result, the sample dispensing probe 204 sucks a predetermined amount of the sample corresponding to the dummy sample housed in the sample container 100 at the sample suction position P2 (step S4).

The control circuit 8 is configured to aspirate the dummy sample, at a time t ₄ when depicted in FIG. 6, by starting the supply of the drive pulse, controls the drive mechanism 4, the sample aspiration position P2, the sample dispensing The upward movement of the arm 203 is started. The control circuit 8 stops the supply of the drive pulse after supplying the drive pulse a predetermined number of times. As a result, the sample dispensing probe 204 is raised from the stop position where the sample can be sucked to the top dead center (step S5).

The control circuit 8, at a time point t ₅ shown in FIG. 6, by starting the supply of the drive pulse, controls the drive mechanism 4 to start the rotation of the sample dispensing arm 203. The control circuit 8 stops the supply of the drive pulse after supplying the drive pulse a predetermined number of times. As a result, the sample dispensing probe 204 is moved from the sample suction position P2 to the sample probe cleaning position P1 (step S6).

The control circuit 8, after step S6, becomes a time point t ₆ shown in FIG. 6, by starting the supply of the drive pulse, controls the drive mechanism 4 to start the rotation of the sample dispensing arm 203. The control circuit 8 stops the supply of the drive pulse after supplying the drive pulse a predetermined number of times. As a result, the sample dispensing probe 204 is moved from the sample probe cleaning position P1 to the sample suction position P2 (step S7).

The control circuit 8, at a time point t ₇ shown in FIG. 6, by starting the supply of the drive pulse, controls the drive mechanism 4, the sample aspiration position P2, downward movement of the sample dispensing arm 203 To start. The position information stored in the storage circuit 7 is read out. The control circuit 8 moves the sample dispensing arm 203 from the top dead center to a position above the sample liquid level, for example, a distance of several pulses above the sample liquid level, based on the read position information. Let me. At this time, the control circuit 8 supplies a drive pulse to the drive mechanism 4 so that the moving speed becomes a predetermined speed V2 faster than the speed V1. Further, in the control circuit 8, when the tip of the sample dispensing probe 204 reaches the upper vicinity of the liquid level of the sample contained in the sample container 100 located at the sample suction position P2, the moving speed becomes V1. Change the drive pulse supply interval. When the control circuit 8 outputs a detection signal regarding the contact of the sample dispensing probe 204 from the liquid level detector 2052, the control circuit 8 determines the liquid level of the sample based on the number of drive pulses supplied during the descent of the sample dispensing probe 204. Get the location information of. The acquired position information is stored in, for example, the storage circuit 7. After the movement speed is changed to V1, the control circuit 8 lowers the sample dispensing probe 204 by a preset amount of movement and stops the supply of the drive pulse. Thus, the sample dispensing probe 204 begins to move in the downward direction from the time t ₇ shown in FIG. 6, is lowered from the top dead center of the sample to the stop position can be sucked (step S8).

The control circuit 8, after the tip of the sample dispensing probe 204 reaches the sample suction possible stopping position, at a time t ₈ as shown in FIG. 6, by starting the supply of the driving pulses, the driving mechanism 4 It controls and starts the suction drive in the direction of arrow L1 with respect to the plunger 2055 shown in FIG. The control circuit 8 stops the supply of the drive pulse after supplying the drive pulse a predetermined number of times. As a result, the sample dispensing probe 204 sucks a predetermined amount of sample corresponding to the sample according to the inspection item contained in the sample container 100 at the sample suction position P2 (step S9).

The control circuit 8 controls the drive mechanism 4 by starting the supply of the drive pulse at the time point t ₉ shown in FIG. 6 after sucking the sample according to the inspection item, and controls the drive mechanism 4 at the sample suction position P2. The upward movement of the dispensing arm 203 is started. The control circuit 8 stops the supply of the drive pulse after supplying the drive pulse a predetermined number of times. As a result, the sample dispensing probe 204 is raised from the stop position where the sample can be sucked to the top dead center (step S10).

The control circuit 8 controls the drive mechanism 4 by starting the supply of the drive pulse at the time point t ₁₀ shown in FIG. 6, and starts the rotation of the sample dispensing arm 203. The control circuit 8 stops the supply of the drive pulse after supplying the drive pulse a predetermined number of times. As a result, the sample dispensing probe 204 is moved from the sample suction position P2 to the sample discharge position P3 (step S11).

The control circuit 8 controls the drive mechanism 4 by starting the supply of the drive pulse at the time point t ₁₁ shown in FIG. 6, and moves the sample dispensing arm 203 downward at the sample discharge position P3. To start. The control circuit 8 stops the supply of the drive pulse after supplying the drive pulse a predetermined number of times. As a result, the sample dispensing probe 204 is lowered from the top dead center to a stop position where the sample can be discharged (step S12).

The control circuit 8, after the tip of the sample dispensing probe 204 has reached the position capable of discharging the sample, at a time point t ₁₂ as shown in FIG. 6, by starting the supply of the driving pulses, the driving mechanism 4 Controlled and starts the discharge drive in the direction of arrow L2 with respect to the plunger 2055 shown in FIG. The control circuit 8 stops the supply of the drive pulse after supplying the drive pulse a predetermined number of times. As a result, the sample dispensing probe 204 discharges a predetermined amount of the sample corresponding to the sample according to the inspection item to the reaction tube 2011 at the sample discharge position P3 (step S13). At this time, as shown in FIG. 6, the reaction disk 201 is stopped in order to accommodate the sample discharged at the sample discharge position P3 by the reaction tube 2011. In the reaction disk 201, after the discharged sample is contained in the reaction tube 2011, until the reaction tube 2011 for accommodating the sample according to the next inspection item reaches the sample discharge position P3 at a predetermined timing. It is rotated by the drive mechanism 4.

The control circuit 8, in step S13, after discharging the sample according to the test item, at a time point t ₁₃ as shown in FIG. 6, by starting the supply of the drive pulse, controls the drive mechanism 4, a sample discharge position At P3, the upward movement of the sample dispensing arm 203 is started. The control circuit 8 stops the supply of the drive pulse after supplying the drive pulse a predetermined number of times. As a result, the sample dispensing probe 204 is raised from the stop position where the sample can be sucked to the top dead center (step S14).

The control circuit 8 controls the drive mechanism 4 by starting the supply of the drive pulse at the time point t ₁₄ shown in FIG. 6, and starts the rotation of the sample dispensing arm 203. The control circuit 8 stops the supply of the drive pulse after supplying the drive pulse a predetermined number of times. As a result, the sample dispensing probe 204 is moved from the sample discharge position P3 to the sample probe cleaning position P1 (step S15).

The control circuit 8 refers to the measurement order of the inspection items related to the sample to be measured included in the order information acquired in step S1, and whether or not the inspection item related to the sample to be measured is the last inspection item. Determine (step S16).

The control circuit 8 determines that the inspection item related to the sample to be measured is not the last inspection item (No in step S16), and the timing chart shown in FIG. 7 for the second inspection item, which is the next inspection item. According to this, the operation for sample dispensing of the sample according to the inspection item is started from step S7.

FIG. 7 is a timing chart showing the start and end of each operation related to sample dispensing executed within one cycle time for the second inspection item in the automatic analyzer 1 according to the present embodiment. In the timing chart shown in FIG. 7, the horizontal axis is the time point t, the start time point of the cycle time is 0, and the end time point is T. The timing chart shown in FIG. 7 also has a sample dispensing phase. The sample dispensing phase is a phase in which suction and discharge of the sample related to the inspection item are executed, and is set between t = τ and T. The timing chart shown in FIG. 7 represents the start and end points of each operation relating to the reaction disk, the rotation of the sample dispensing arm, the vertical movement of the sample dispensing arm, and the sample dispensing probe.

Further, in FIG. 5, when the operations related to steps S2 to S15 for the first inspection item are completed, the operations related to steps S7 to S15 for the second inspection item are executed within one cycle time. The start time of each operation according to steps S7 to S15 for the second inspection item is different from the start time of each operation according to steps S7 to S15 for the first inspection item.

The control circuit 8, the inspection item of the sample to be measured is determined not to be the last test item (No of step S16), and becomes a time t ₆ ', shown in FIG. 7, and controls the drive mechanism 4, driving By starting the supply of the pulse, the rotation of the sample dispensing arm 203 is started. The control circuit 8 stops the supply of the drive pulse after supplying the drive pulse a predetermined number of times. As a result, the sample dispensing probe 204 is moved from the sample probe cleaning position P1 to the sample suction position P2 (step S7).

The control circuit 8, at a time t _{7 'shown} in FIG. 6, by starting the supply of the drive pulse, controls the drive mechanism 4, the sample aspiration position P2, in the downward direction of the sample dispensing arm 203 Start the move. The position information stored in the storage circuit 7 is read out. The control circuit 8 moves the sample dispensing arm 203 from the top dead center to a position above the sample liquid level, for example, a distance of several pulses above the sample liquid level, based on the read position information. Let me. At this time, the control circuit 8 supplies a drive pulse to the drive mechanism 4 so that the moving speed becomes a predetermined speed V2 faster than the speed V1. Further, in the control circuit 8, when the tip of the sample dispensing probe 204 reaches the upper vicinity of the liquid level of the sample contained in the sample container 100 located at the sample suction position P2, the moving speed becomes V1. Change the drive pulse supply interval. When the control circuit 8 outputs a detection signal regarding the contact of the sample dispensing probe 204 from the liquid level detector 2052, the control circuit 8 determines the liquid level of the sample based on the number of drive pulses supplied during the descent of the sample dispensing probe 204. Get the location information of. The acquired position information is stored in, for example, the storage circuit 7. After the movement speed is changed to V1, the control circuit 8 lowers the sample dispensing probe 204 by a preset amount of movement and stops the supply of the drive pulse. Thus, the sample dispensing probe 204 is moved downward is started from the time t _{7 'shown} in FIG. 6, is lowered from the top dead center of the sample to the stop position can be sucked (step S8).

The control circuit 8, after the tip of the sample dispensing probe 204 reaches the sample suction possible stopping position, at a time point t _{8 'shown} in FIG. 7, by starting the supply of the driving pulses, the driving mechanism 4 Is controlled, and the suction drive in the direction of arrow L1 with respect to the plunger 2055 shown in FIG. 4 is started. The control circuit 8 stops the supply of the drive pulse after supplying the drive pulse a predetermined number of times. As a result, the sample dispensing probe 204 sucks a predetermined amount of sample corresponding to the sample according to the inspection item contained in the sample container 100 at the sample suction position P2 (step S9).

The control circuit 8 is configured to aspirate the sample of the test item, at a time t _{9 'shown} in FIG. 7, by starting the supply of the drive pulse, controls the drive mechanism 4, the sample aspiration position P2, The upward movement of the sample dispensing arm 203 is started. The control circuit 8 stops the supply of the drive pulse after supplying the drive pulse a predetermined number of times. As a result, the sample dispensing probe 204 is raised from the stop position where the sample can be sucked to the top dead center (step S10).

The control circuit 8, at a time point t _{10 'shown} in FIG. 7, by starting the supply of the drive pulse, controls the drive mechanism 4 to start the rotation of the sample dispensing arm 203. The control circuit 8 stops the supply of the drive pulse after supplying the drive pulse a predetermined number of times. As a result, the sample dispensing probe 204 is moved from the sample suction position P2 to the sample discharge position P3 (step S11).

The control circuit 8, at a time point t _{11 'shown} in FIG. 7, by starting the supply of the drive pulse, controls the drive mechanism 4, the sample discharge position P3, in the downward direction of the sample dispensing arm 203 Start moving. The control circuit 8 stops the supply of the drive pulse after supplying the drive pulse a predetermined number of times. As a result, the sample dispensing probe 204 is lowered from the top dead center to a stop position where the sample can be discharged (step S12).

The control circuit 8, after the tip of the sample dispensing probe 204 has reached the possible ejection of the sample position, at a time point t _{12 'shown} in FIG. 7, by starting the supply of the driving pulses, the driving mechanism 4 Is controlled, and the discharge drive in the direction of arrow L2 with respect to the plunger 2055 shown in FIG. 4 is started. The control circuit 8 stops the supply of the drive pulse after supplying the drive pulse a predetermined number of times. As a result, the sample dispensing probe 204 discharges a predetermined amount of the sample corresponding to the sample according to the inspection item to the reaction tube 2011 at the sample discharge position P3 (step S13). At this time, as shown in FIG. 7, the reaction disk 201 is stopped in order to accommodate the sample discharged at the sample discharge position P3 by the reaction tube 2011.

The control circuit 8, in step S13, after discharging the sample according to the test item, at a time point t _{13 'shown} in FIG. 7, by starting the supply of the drive pulse, controls the drive mechanism 4, a sample ejection At position P3, the upward movement of the sample dispensing arm 203 is started. The control circuit 8 stops the supply of the drive pulse after supplying the drive pulse a predetermined number of times. As a result, the sample dispensing probe 204 is raised from the stop position where the sample can be sucked to the top dead center (step S14).

The control circuit 8, at a time point t _{14 'shown} in FIG. 7, by starting the supply of the drive pulse, controls the drive mechanism 4 to start the rotation of the sample dispensing arm 203. The control circuit 8 stops the supply of the drive pulse after supplying the drive pulse a predetermined number of times. As a result, the sample dispensing probe 204 is moved from the sample discharge position P3 to the sample probe cleaning position P1 (step S15).

The control circuit 8 refers to the measurement order of the inspection items related to the sample to be measured included in the order information acquired in step S1, and whether or not the inspection item related to the sample to be measured is the last inspection item. Determine (step S16).

The control circuit 8 determines that the inspection item related to the sample to be measured is not the last inspection item (No in step S16), and the last (third) inspection item, which is the next inspection item, is shown in FIG. According to the timing chart, the operation for sample dispensing of the sample according to the inspection item is started from step S7.

FIG. 8 is a timing chart showing the start and end of each operation related to sample dispensing executed within one cycle time for the last inspection item in the automatic analyzer 1 according to the present embodiment. In the timing chart shown in FIG. 8, the horizontal axis is the time point t, the start time point of the cycle time is 0, and the end time point is T. The timing chart shown in FIG. 8 also has a sample dispensing phase. The sample dispensing phase is a phase in which suction and discharge of the sample related to the inspection item are executed, and is set between t = τ and T. The timing chart shown in FIG. 8 shows the start and end points of each operation related to the reaction disk, the rotation of the sample dispensing arm, the vertical movement of the sample dispensing arm, and the sample dispensing probe.

As shown in FIG. 8, in the final inspection item, the operation related to the probe cleaning in step S17 shown in FIG. 5 is added to the operation related to steps S7 to S15 executed in the second inspection item. It is executed within one cycle time. The start time of each operation according to steps S7 to S15 for the last inspection item is the same as the start time of each operation according to steps S7 to S15 for the second inspection item.

The control circuit 8, the inspection item of the sample to be measured is determined not to be the last test item (No of step S16), and becomes a time t ₆ ', shown in FIG. 8, to initiate the supply of the drive pulse Then, the drive mechanism 4 is controlled to start the rotation of the sample dispensing arm 203. The control circuit 8 stops the supply of the drive pulse after supplying the drive pulse a predetermined number of times. As a result, the sample dispensing probe 204 is moved from the sample probe cleaning position P1 to the sample suction position P2 (step S7).

The content, start time and end time of the operation according to steps S8 to S15 are the same as the content, start time and end time of the operation according to steps S8 to S15 for the second inspection item in the present embodiment. ..

The control circuit 8 refers to the measurement order of the inspection items related to the sample to be measured included in the order information acquired in step S1, and whether or not the inspection item related to the sample to be measured is the last inspection item. Determine (step S16).

The control circuit 8, the inspection item of the sample to be measured is determined to be the last test item (Yes in step S16), and becomes a time point t _{15 'shown} in FIG. 8 starts supplying the driving pulse As a result, the drive mechanism 4 is controlled to start the downward movement of the sample dispensing arm 203 at the sample probe cleaning position P1. The control circuit 8 stops the supply of the drive pulse after supplying the drive pulse a predetermined number of times. As a result, the sample dispensing probe 204 is lowered from the top dead center to a stop position where the outer wall of the sample dispensing probe 204 can be washed. Then, the outer wall of the sample dispensing probe 204 is cleaned by the cleaning liquid stored in the cleaning pool provided at the sample probe cleaning position P1. Further, the control circuit 8 controls the drive mechanism 4 by starting the supply of the drive pulse, and opens the flow path between the syringe 2054 and the cleaning pump 2057 by the on-off valve 2058. The control circuit 8 controls the drive mechanism 4 by starting the supply of the drive pulse, and supplies the pressure transmission medium stored in the tank 2056 as a cleaning liquid into the sample dispensing probe 204. As a result, the inner wall of the sample dispensing probe 204 is washed (step S17).

As described above, in the present embodiment, the control circuit 8 provided in the automatic analyzer 1 moves the sample dispensing probe 204 to the sample container 100. The control circuit 8 sucks a predetermined amount of dummy sample by the sample dispensing probe 204. After sucking the dummy sample, the control circuit 8 moves the sample dispensing probe 204 to the sample probe washing position o position P1 while holding the sample in the amount corresponding to the dummy sample in the sample dispensing probe 204. .. As a result, the automatic analyzer 1 sucks the sample related to the first inspection item independently of the suction of the dummy sample. Therefore, in the automatic analyzer 1, the operating conditions of the sample dispensing probe are the same for the first suction and the second and subsequent suctions for each inspection item of the sample requested to be measured.

Therefore, it is possible to prevent the suction of the dummy sample by the sample dispensing probe from affecting the measurement result of the sample according to the inspection item.

Further, in the present embodiment, the control circuit 8 uses the sample probe cleaning position P1 as the operation start position of the sample dispensing in the sample dispensing of the sample related to the first inspection item and the second and subsequent inspection items. Start sample dispensing of the sample related to the inspection item. As the sample dispensing arm 203 rotates, a couple having a moment of force acts on the tube 2053 shown in FIG. 4 in the axial direction thereof. Due to this couple, the tube 2053 is twisted. When the tube 2053 is twisted, the suction pressure supplied from the syringe 2054 changes, which affects the accuracy of the measurement result. In the present embodiment, even in the rotation of the sample dispensing arm 203 related to the first inspection item after sucking the dummy sample, the rotation of the sample dispensing arm 203 related to the first inspection item from the sample probe cleaning position P1 The degree of twist of the tube can be aligned between the rotation of the sample dispensing arm 203 related to the first inspection item and the rotation of the sample dispensing arm 203 related to the second and subsequent inspection items. it can.

Further, due to the vertical movement of the sample dispensing arm 203 between the top dead center at the sample suction position P2 and the stop position where the sample can be sucked, the tube 2053 shown in FIG. 4 is moved in the direction perpendicular to the axial direction thereof. Deformation, that is, deflection occurs. When the tube 2053 is bent, the suction pressure supplied from the syringe 2054 changes, which affects the accuracy of the measurement result. In the present embodiment, even in the vertical movement of the sample dispensing arm 203 related to the first inspection item after sucking the dummy sample, the sample dispensing arm related to the first inspection item from the top dead center at the sample suction position P2. In order to start the descent of 203, the degree of deflection of the tube 2053 due to the vertical movement of the sample dispensing arm 203 related to the first inspection item and the tube 2053 due to the vertical movement of the sample dispensing arm 203 related to the second and subsequent inspection items. The degree of deflection can be matched. As a result, the operating conditions of the sample dispensing probe can be matched between the first suction and the second and subsequent suctions for each inspection item of the sample requested to be measured.

Further, in the present embodiment, the control circuit 8 lowers the sample dispensing probe 204 from the top dead center to the liquid level of the sample at a predetermined speed V1 when sucking the dummy sample. The control circuit 8 lowers the sample dispensing probe 204 at a predetermined speed V2, which is faster than the speed V1, when sucking the sample according to the first inspection item and the second and subsequent inspection items. As a result, for each inspection item of the sample requested to be measured, the conditions for entering the sample housed in the sample container 100 located at the sample suction position P2 of the sample dispensing probe 204 are set to the first suction and the second and subsequent tests. It is possible to align with the suction of.

[Modification example]
In the above embodiment, the start time of dispensing of the sample according to the second and subsequent inspection items is different from the start time of dispensing of the sample according to the first inspection item. In the modified example, a case where the start time of sample dispensing of the sample related to the second and subsequent inspection items is the same as the start time of sample dispensing of the sample related to the first inspection item will be described.

The automatic analyzer 1A according to the modified example includes an analysis mechanism 2, an analysis circuit 3, a drive mechanism 4, an input interface circuit 5, an output interface circuit 6, a storage circuit 7, and a control circuit 8A.

The configurations and functions of the analysis mechanism 2, the analysis circuit 3, the drive mechanism 4, the input interface circuit 5, the output interface circuit 6, and the storage circuit 7 are the same as those in the above embodiment.

The control circuit 8A according to the modified example includes a system control function 81 and a dispensing control function 82A by executing an operation program read from the storage circuit 7. The system control function 81 is the same as that of the above embodiment.

The dispensing control function 82A has the same function as the dispensing control function 82. When the dispensing control function 82A is executed, the control circuit 8A reads various set values stored in the storage circuit 7. The control circuit 8A controls the drive mechanism 4 based on the various set values read, sucks the sample from the sample container 100 located at the sample suction position P2 within one cycle time, and sucks the sucked sample to the sample discharge position P3. Discharge to the reaction tube 2011 located at. Further, the control circuit 8A starts the movement of the sample dispensing probe 204 from the sample probe cleaning position P1 to the stop position where the sample can be sucked from the same start time within one cycle time for each inspection item.

Next, the operation when the sample to be measured of the automatic analyzer 1A according to the modified example configured as described above is dispensed will be described. A series of operations for sample dispensing executed within one cycle time for the sample to be measured by the automatic analyzer 1 according to the modified example is the same as that of the above embodiment, and is shown in FIG. Hereinafter, in the description of FIG. 5, for the sake of simplicity, the case where the number of inspection items requested for the sample contained in the sample container 100 is three will be described as an example. Further, before the measurement is started, order information is input via, for example, the input interface circuit 5, and is stored in the storage circuit 7.

When the predetermined sample container 100 reaches the sample suction position P2, a series of operations for sample dispensing shown in FIG. 5 is started.

The control circuit 8A acquires the order information corresponding to the sample ID read by the reader 234 (step S1). The control circuit 8 dispenses a sample of the first inspection item included in the acquired order information according to the timing chart shown in FIG. 6, as in the above embodiment.

The contents, start time, and end time of the operation after step S2 shown in FIG. 5 relating to sample dispensing for the first inspection item are the same as those in the above embodiment.

Next, the control circuit 8A dispenses the sample for the second inspection item included in the acquired order information according to the timing chart shown in FIG.

FIG. 9 is a timing chart showing the start and end of each operation related to sample dispensing executed within one cycle time for the second inspection item in the automatic analyzer 1A according to the modified example. In the timing chart shown in FIG. 9, the horizontal axis is the time point t, the start time point of the cycle time is 0, and the end time point is T. The timing chart shown in FIG. 9 also has a sample dispensing phase. The sample dispensing phase is a phase in which suction and discharge of the sample related to the inspection item are executed, and is set between t = τ and T. The timing chart shown in FIG. 9 represents the start and end points of each operation related to the reaction disk, the rotation of the sample dispensing arm, the vertical movement of the sample dispensing arm, and the sample dispensing probe.

Further, in FIG. 5, when the operations related to steps S2 to S15 for the first inspection item are completed, the operations related to steps S7 to S15 for the second inspection item are executed within one cycle time. The start time of each operation according to steps S7 to S15 for the second inspection item is the same as the start time of each operation according to steps S7 to S15 for the first inspection item.

The control circuit 8A determines that the inspection item related to the sample to be measured is not the last inspection item (No in step S16), and at the time point t ₆ shown in FIG. 9, controls the drive mechanism 4 and drives the drive pulse. The rotation of the sample dispensing arm 203 is started by starting the supply of the sample. The control circuit 8A stops the supply of the drive pulse after supplying the drive pulse a predetermined number of times. As a result, the sample dispensing probe 204 is moved from the sample probe cleaning position P1 to the sample suction position P2 (step S7).

Control circuit 8A, when At time t ₇ shown in FIG. 9, by starting the supply of the drive pulse, controls the drive mechanism 4, the sample aspiration position P2, downward movement of the sample dispensing arm 203 To start. The position information stored in the storage circuit 7 is read out. The control circuit 8A moves the sample dispensing arm 203 from the top dead center to a position above the sample liquid level, for example, a distance of several pulses above the sample liquid level, based on the read position information. Let me. At this time, the control circuit 8A supplies a drive pulse to the drive mechanism 4 so that the moving speed becomes a predetermined speed V2 faster than the speed V1. Further, in the control circuit 8A, when the tip of the sample dispensing probe 204 reaches the upper vicinity of the liquid level of the sample contained in the sample container 100 located at the sample suction position P2, the moving speed becomes V1. Change the drive pulse supply interval. When the control circuit 8A outputs a detection signal regarding the contact of the sample dispensing probe 204 from the liquid level detector 2052, the control circuit 8A determines the liquid level of the sample based on the number of drive pulses supplied during the descent of the sample dispensing probe 204. Get the location information of. The acquired position information is stored in, for example, the storage circuit 7. After the movement speed is changed to V1, the control circuit 8A lowers the sample dispensing probe 204 by a preset amount of movement and stops the supply of the drive pulse. Thus, the sample dispensing probe 204 is moved downward starts when t ₇ shown in FIG. 9, is lowered from the top dead center of the sample to the stop position can be sucked (step S8).

Control circuit 8A, after the tip of the sample dispensing probe 204 reaches the sample suction possible stopping position, at a time t ₈ as shown in FIG. 9, by starting the supply of the driving pulses, the driving mechanism 4 It controls and starts the suction drive in the direction of arrow L1 with respect to the plunger 2055 shown in FIG. The control circuit 8A stops the supply of the drive pulse after supplying the drive pulse a predetermined number of times. As a result, the sample dispensing probe 204 sucks a predetermined amount of sample corresponding to the sample according to the inspection item contained in the sample container 100 at the sample suction position P2 (step S9).

The control circuit 8A controls the drive mechanism 4 by starting the supply of the drive pulse at the time point t ₉ shown in FIG. 9 after sucking the sample according to the inspection item, and controls the drive mechanism 4 at the sample suction position P2. The upward movement of the dispensing arm 203 is started. The control circuit 8A stops the supply of the drive pulse after supplying the drive pulse a predetermined number of times. As a result, the sample dispensing probe 204 is raised from the stop position where the sample can be sucked to the top dead center (step S10).

Control circuit 8A it comes to the time t ₁₀ shown in FIG. 9, by starting the supply of the drive pulse, controls the drive mechanism 4 to start the rotation of the sample dispensing arm 203. The control circuit 8A stops the supply of the drive pulse after supplying the drive pulse a predetermined number of times. As a result, the sample dispensing probe 204 is moved from the sample suction position P2 to the sample discharge position P3 (step S11).

Control circuit 8A it comes to the time t ₁₁ shown in FIG. 9, by starting the supply of the drive pulse, controls the drive mechanism 4, the movement of the sample discharge position P3, downward of the sample dispensing arm 203 To start. The control circuit 8A stops the supply of the drive pulse after supplying the drive pulse a predetermined number of times. As a result, the sample dispensing probe 204 is lowered from the top dead center to a stop position where the sample can be discharged (step S12).

Control circuit 8A, after the tip of the sample dispensing probe 204 has reached the position capable of discharging the sample, at a time point t ₁₂ as shown in FIG. 9, by starting the supply of the driving pulses, the driving mechanism 4 Controlled and starts the discharge drive in the direction of arrow L2 with respect to the plunger 2055 shown in FIG. The control circuit 8A stops the supply of the drive pulse after supplying the drive pulse a predetermined number of times. As a result, the sample dispensing probe 204 discharges a predetermined amount of the sample corresponding to the sample according to the inspection item to the reaction tube 2011 at the sample discharge position P3 (step S13). At this time, as shown in FIG. 9, the reaction disk 201 is stopped in order to accommodate the sample discharged at the sample discharge position P3 by the reaction tube 2011.

Control circuit 8A, in step S13, after discharging the sample according to the test item, at a time point t ₁₃ as shown in FIG. 9, by starting the supply of the drive pulse, controls the drive mechanism 4, a sample discharge position At P3, the upward movement of the sample dispensing arm 203 is started. The control circuit 8A stops the supply of the drive pulse after supplying the drive pulse a predetermined number of times. As a result, the sample dispensing probe 204 is raised from the stop position where the sample can be sucked to the top dead center (step S14).

The control circuit 8A controls the drive mechanism 4 by starting the supply of the drive pulse at the time point t ₁₄ shown in FIG. 9, and starts the rotation of the sample dispensing arm 203. The control circuit 8A stops the supply of the drive pulse after supplying the drive pulse a predetermined number of times. As a result, the sample dispensing probe 204 is moved from the sample discharge position P3 to the sample probe cleaning position P1 (step S15).

The control circuit 8A refers to the measurement order of the inspection items related to the sample to be measured included in the order information acquired in step S1, and whether or not the inspection item related to the sample to be measured is the last inspection item. Determine (step S16).

The control circuit 8A determines that the inspection item related to the sample to be measured is not the last inspection item (No in step S16), and the last (third) inspection item, which is the next inspection item, is shown in FIG. According to the timing chart, the operation for sample dispensing of the sample according to the inspection item is started from step S7.

FIG. 10 is a timing chart showing the start and end of each operation related to sample dispensing executed within one cycle time for the last inspection item in the automatic analyzer 1A according to the modified example. In the timing chart shown in FIG. 10, the horizontal axis is the time point t, the start time point of the cycle time is 0, and the end time point is T. The timing chart shown in FIG. 10 also has a sample dispensing phase. The sample dispensing phase is a phase in which suction and discharge of the sample related to the inspection item are executed, and is set between t = τ and T. The timing chart shown in FIG. 10 represents the start and end points of each operation relating to the reaction disk, the rotation of the sample dispensing arm, the vertical movement of the sample dispensing arm, and the sample dispensing probe.

As shown in FIG. 10, in the final inspection item, a series of operations related to the probe cleaning of step S17 shown in FIG. 5 are added to the operations related to steps S7 to S15 executed in the second inspection item. The operation is executed within one cycle time. The start time of each operation according to steps S7 to S15 for the last inspection item is the same as the start time of each operation according to steps S7 to S15 for the second inspection item.

The control circuit 8A determines that the inspection item related to the sample to be measured is not the last inspection item (No in step S16), and starts supplying the drive pulse at the time point t ₆ shown in FIG. , The drive mechanism 4 is controlled to start the rotation of the sample dispensing arm 203. The control circuit 8A stops the supply of the drive pulse after supplying the drive pulse a predetermined number of times. As a result, the sample dispensing probe 204 is moved from the sample probe cleaning position P1 to the sample suction position P2 (step S7).

The content, start time and end time of the operation according to steps S8 to S15 are the same as the content, start time and end time of the operation according to steps S8 to S15 for the second inspection item in the present embodiment. ..

The control circuit 8A refers to the measurement order of the inspection items related to the sample to be measured included in the order information acquired in step S1, and whether or not the inspection item related to the sample to be measured is the last inspection item. Determine (step S16).

Control circuit 8A, the inspection item of the sample to be measured is determined to be the last test item (Yes in step S16), and becomes a time point t ₁₅ as shown in FIG. 10, to start the supply of the drive pulse Then, the drive mechanism 4 is controlled to start the downward movement of the sample dispensing arm 203 at the sample probe cleaning position P1. The control circuit 8A stops the supply of the drive pulse after supplying the drive pulse a predetermined number of times. As a result, the sample dispensing probe 204 is lowered from the top dead center to a stop position where the outer wall of the sample dispensing probe 204 can be washed. Then, the outer wall of the sample dispensing probe 204 is cleaned by the cleaning liquid stored in the cleaning pool provided at the sample probe cleaning position P1. Further, the control circuit 8A controls the drive mechanism 4 by starting the supply of the drive pulse, and opens the flow path between the syringe 2054 and the cleaning pump 2057 by the on-off valve 2058. The control circuit 8A controls the drive mechanism 4 by starting the supply of the drive pulse, and supplies the pressure transmission medium stored in the tank 2056 as a cleaning liquid into the sample dispensing probe 204. As a result, the inner wall of the sample dispensing probe 204 is washed (step S17).

In the modified example, the control circuit 8A provided in the automatic analyzer 1A moves the sample dispensing probe 204 from the sample probe cleaning position P1 to the stop position where the sample can be sucked within one cycle time for each inspection item. Start from the same start point. As a result, the start time points of a series of operations related to suction and discharge of the sample according to each inspection item are aligned. Therefore, for each inspection item of the sample requested to be measured, the operating conditions of the sample dispensing probe are the same for the first suction and the second and subsequent suctions.

[Other Embodiments]
The present invention is not limited to the above embodiment. In the above embodiment, the control circuit 8 is designed to suck the dummy sample and dispense the sample according to the first inspection item within one cycle time, but the present invention is not limited to this. For example, when the settable cycle time value is not sufficient for the operation related to the suction of the dummy sample and the operation related to the sample dispensing of the sample related to the first inspection item, the control circuit 8 is shown in FIG. As shown, only the operation related to the suction of the dummy sample is executed from the start time points t ₁ ', t ₂ ', t ₃ ', t ₄ ', and t ₅ ', respectively, within the first cycle time. , The operation related to sample dispensing of the sample related to the first inspection item may be executed within the next one cycle time.

Further, in the above embodiment, the control circuit 8 performs a series of operations for sample dispensing of the sample related to the inspection item between the first inspection item and the second and subsequent inspection items in one cycle time. It was controlled to align, but it is not limited to this. For example, the control circuit 8 aligns a series of operations for reagent dispensing of reagents between the first test item and the second and subsequent test items, as in the case of sample dispensing of the sample related to the test item. You may control it.

Further, in the automatic analyzer according to the above embodiment, the sample is sucked from the sample container 100 held in the sample rack 102, but the present invention is not limited to this. For example, the automatic analyzer may use a sample disk instead of the sample rack 102 to hold the sample container 100. At this time, the sample is sucked from the sample container 100 held on the sample disk by the sample dispensing probe 204.

Further, the automatic analyzer according to the above embodiment is provided with one system required for sample dispensing, and is designed to execute a series of operations related to sample dispensing within one cycle time, but the present invention is not limited to this. .. For example, the automatic analyzer may be provided with a plurality of systems required for sample dispensing and may execute a series of operations related to sample dispensing within one cycle time.

The word "processor" used in the above description means, for example, a CPU (central processing unit), a GPU (Graphics Processing Unit), or an application specific integrated circuit (ASIC), or a programmable logic device (for example, an application specific integrated circuit (ASIC)). , Simple Programmable Logic Device (SPLD), Complex Programmable Logic Device (CPLD), and Field Programmable Gate Array (FPGA). The processor realizes the function by reading and executing the program stored in the storage circuit. It should be noted that each processor of the present embodiment is not limited to the case where each processor is configured as a single circuit, and a plurality of independent circuits may be combined to form one processor to realize its function. Good. Further, the plurality of components in FIG. 1 may be integrated into one processor to realize the function.

Although some embodiments of the present invention have been described, these embodiments are presented as examples and are not intended to limit the scope of the invention. These embodiments can be implemented in various other forms, and various omissions, replacements, and changes can be made without departing from the gist of the invention. These embodiments and modifications thereof are included in the scope and gist of the invention, as well as in the scope of the invention described in the claims and the equivalent scope thereof.

1, 1A ... Automatic analyzer, 2 ... Analysis mechanism, 3 ... Analysis circuit, 4 ... Drive mechanism, 5 ... Input interface circuit, 6 ... Output interface circuit, 7 ... Storage circuit, 8, 8A ... Control circuit, 13 ... 1 reagent rack, 16 ... second reagent rack, 23 ... first reagent dispensing probe, 81 ... system control function, 82, 82A ... dispensing control function, 100 ... sample container, 102 ... sample rack, 201 ... reaction disk, 202 ... Reagent storage, 203 ... Sample dispensing arm, 204 ... Sample dispensing probe, 205 ... Sample dispensing unit, 206 ... First reagent dispensing arm, 207 ... First reagent dispensing probe, 208 ... Second reagent Note arm, 209 ... Second reagent dispensing probe, 210 ... Stirring unit, 211 ... Photometric unit, 212 ... Cleaning unit, 213 ... Electrolyte measurement unit, 218 ... Cleaning unit, 220 ... Rack loading lane, 230 ... Rack moving unit, 231 ... Conveying arm, 232 ... Conveying rail, 233 ... Sampling lane, 234 ... Leader, 244 ... Sampling lane, 2011 ... Reaction tube, 2021 ... Outer circle, 2022 ... Inner circle, 2051 ... Liquid level detector, 2053 ... Tube, 2054 ... Reagent, 2055 ... Plunger, 2056 ... Tank, 2057 ... Cleaning pump, 2058 ... On-off valve.

Claims (10)

A dispensing probe that sucks the sample contained in the sample container for each inspection item set for the sample and discharges it to the reaction vessel corresponding to each inspection item.
By lowering the dispensing probe from the sample aspiration position, the dispensing while the the specimen container by moving the dispensing probe, the dummy sample is aspirated from the sample container, and holding the dummy sample The probe is raised , the dispensing probe is moved to a predetermined position, the dispensing probe is moved from the predetermined position to the sample suction position, and the dispensing probe is lowered to relate to the inspection item from the sample container. An automatic analyzer provided with a dispensing control unit that sucks a predetermined amount of sample corresponding to the sample and discharges the sucked predetermined amount of sample into the reaction vessel . The automatic analyzer according to claim 1, wherein the predetermined position is an arbitrary position on the rotation trajectory of the dispensing probe. The automatic analyzer according to claim 1, wherein the predetermined position is a descent start position where the descent starts toward the liquid level of the sample. The automatic analyzer according to claim 1, wherein the predetermined position is a position where a washing pool for washing the dispensing probe is provided. The automatic analyzer according to any one of claims 1 to 4 , wherein the dispensing control unit starts moving the dispensing probe from the predetermined position when sucking a sample according to an inspection item. The fifth aspect of claim 5 , wherein the dispensing control unit starts the movement of the dispensing probe from the predetermined position to the sample container from the same start time within a preset cycle time for each inspection item. Automatic analyzer. The automatic analyzer according to claim 6 , wherein the dispensing control unit causes the dispensing probe to suck the dummy sample and the sample related to the first inspection item within the same cycle time. The automatic analyzer according to claim 6 , wherein the dispensing control unit causes the dispensing probe to suck the dummy sample and the sample related to the first inspection item within different cycle times. When sucking the dummy sample, the dispensing control unit lowers the dispensing probe from the descending start position toward the liquid surface of the sample at a predetermined descending speed, and the first and second and subsequent dispensers The automatic analyzer according to claim 3, wherein when the sample according to the inspection item is sucked, the dispensing probe is lowered to the liquid surface at a lowering speed faster than the lowering speed. A dispensing probe that sucks the sample contained in the sample container for each inspection item set for the sample and discharges it to the reaction vessel corresponding to each inspection item.
With a dispensing control unit that moves the dispensing probe to the sample container, sucks a dummy sample from the sample container, and moves the dispensing probe to a predetermined position while holding the dummy sample.
Equipped with
The predetermined position is an arbitrary position on the rotation orbit of the dispensing probe, and is a descent start position at which the descent starts toward the liquid level of the sample.
When sucking the dummy sample, the dispensing control unit lowers the dispensing probe from the descending start position toward the liquid level of the sample at a predetermined descending speed, and the first and second and subsequent dispensers An automatic analyzer that lowers the dispensing probe to the liquid surface at a lowering speed faster than the lowering speed when sucking the sample according to the inspection item.