JP2017034083A - Substrate unit, adhesive substrate unit, and conductive unit - Google Patents

Substrate unit, adhesive substrate unit, and conductive unit Download PDF

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JP2017034083A
JP2017034083A JP2015152543A JP2015152543A JP2017034083A JP 2017034083 A JP2017034083 A JP 2017034083A JP 2015152543 A JP2015152543 A JP 2015152543A JP 2015152543 A JP2015152543 A JP 2015152543A JP 2017034083 A JP2017034083 A JP 2017034083A
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substrate
substrate unit
terminal
terminals
portions
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中 佳 子 田
Yoshiko Tanaka
中 佳 子 田
口 雅 也 江
Masaya Eguchi
口 雅 也 江
真 史 榊
Masashi Sakaki
真 史 榊
屋 誠 治 俵
Seiji Tawaraya
屋 誠 治 俵
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Dai Nippon Printing Co Ltd
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Dai Nippon Printing Co Ltd
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Abstract

PROBLEM TO BE SOLVED: To provide a substrate unit, an adhesive substrate unit, and a conductive unit, which can electrically and physically join the substrate unit and a conductive device while preventing damages.SOLUTION: A substrate unit is equipped with base portions 35 and 36; a plurality of supporting portions 12 provided on the base portions 35 and 36; and a plurality of substrate terminals 33 provided on the plurality of supporting portions 12. Each of the plurality of supporting portions 12 has a flat-shaped top portion 13, and the top portions 13 of the plurality of supporting portions 12 have the same height from the base portion 35 and 36. The substrate terminals 33 provided on such top portions 13 are accurately formed in flat shapes. Therefore, even if device terminals 34 are disposed on the substrate terminals 33 and crimp force F is applied on the substrate terminals 33 and the device terminals 34, the force is not locally concentrated, and the substrate terminals 33 and the device terminals 34 can be electrically and physically properly joined while preventing damages.SELECTED DRAWING: Figure 1

Description

本発明は基板ユニット、接着基板ユニット及び導電ユニットに係り、特に、基板ユニットと導電デバイスとを物理的に接合しつつ、基板ユニットの端子と導電デバイスの端子とを電気的に接合する技術に関する。   The present invention relates to a substrate unit, an adhesive substrate unit, and a conductive unit, and more particularly to a technique for electrically bonding a terminal of a substrate unit and a terminal of a conductive device while physically bonding the substrate unit and the conductive device.

半導体などの導電デバイスを基板ユニットに装着するために異方性導電膜(ACF:Anisotropic Conductive Film)が広く利用されている。ACFは、圧着加工後に圧着方向には導電性を示すが、圧着方向とは垂直を成す方向には絶縁性を示す性質があるため、微細ピッチの電気的な接合に使われることが多く、液晶パネルなどの分野でファインピッチ接合に用いられている。   Anisotropic conductive film (ACF) is widely used for mounting a conductive device such as a semiconductor on a substrate unit. ACF exhibits conductivity in the crimping direction after crimping, but has an insulating property in a direction perpendicular to the crimping direction. Therefore, ACF is often used for electrical bonding with a fine pitch. It is used for fine pitch bonding in fields such as panels.

例えば特許文献1は、ACFテープを使って、FPC(Flexible Printed Circuits)に設けられた不透明導電膜の不透明電極部をITO(Indium Tin Oxide)膜の透明電極部に圧着接合する電子部品実装方法を開示する。   For example, Patent Document 1 discloses an electronic component mounting method in which an opaque electrode portion of an opaque conductive film provided in an FPC (Flexible Printed Circuits) is bonded to a transparent electrode portion of an ITO (Indium Tin Oxide) film using an ACF tape. Disclose.

一方、ACFを用いずに導電デバイスを基板ユニットに装着することも可能であり、例えば特許文献2は、熱硬化性樹脂からなる封止樹脂を介して基板張出部上に電子部品を実装する実装方法を開示する。この実装構造において、基板張出部は、電子部品のバンプ電極に接合する上面の高さが相互に異なる複数の端子を含み、バンプ電極の内部樹脂の弾性変形によって当該端子の高さのばらつきが吸収されて、電子部品のバンプ電極と基板張出部の端子とが接合される。   On the other hand, it is also possible to attach the conductive device to the substrate unit without using the ACF. For example, in Patent Document 2, an electronic component is mounted on the substrate overhanging portion via a sealing resin made of a thermosetting resin. An implementation method is disclosed. In this mounting structure, the board extension includes a plurality of terminals having different heights on the upper surface bonded to the bump electrode of the electronic component, and variations in the height of the terminal due to elastic deformation of the internal resin of the bump electrode. By being absorbed, the bump electrode of the electronic component and the terminal of the substrate overhanging portion are joined.

特開2006−040978号公報JP 2006-040978 A 特開2009−099764号公報JP 2009-099764 A

上述のACFは、導電性を持つ微細な導電性粒子を熱硬化性樹脂に混ぜ合わせることで作られており、導電性粒子は、絶縁性を有する最外層と最外層の内側に設けられる導電部とを有する。ACFに部分的に圧力が加えられると、圧力がかかった箇所では圧力方向に関して導電性粒子の導電部同士が引っ付きあって導電経路が形成されるが、圧力がかからなかった箇所では導電性粒子の最外層の絶縁層によって絶縁性が保持される。   The above-mentioned ACF is made by mixing fine conductive particles having conductivity with a thermosetting resin. The conductive particles are an outermost layer having insulating properties and a conductive portion provided inside the outermost layer. And have. When pressure is partially applied to the ACF, conductive portions of the conductive particles are attracted to each other in the pressure direction in the portion where the pressure is applied, and a conductive path is formed. However, in the portion where no pressure is applied, the conductive particles are formed. The insulating property is maintained by the outermost insulating layer.

このようなACFに含まれる導電性粒子は、必ずしも同じ粒径を有してはおらず、様々な粒径を有するのが一般的である。また導電性粒子はACF中でランダムに散らばっているが、導電性粒子の密度はACF全体にわたって必ずしも均一ではなく、局所的に導電性粒子の密度が周囲よりも高い箇所も存在しうる。そのため、ACFを介在させた状態で基板ユニット及び導電デバイスに圧着力を加えると、粒径が相対的に大きい導電性粒子が存在する箇所や導電性粒子の密度が局所的に高い箇所には相対的に大きな力が作用し、基板ユニットや導電デバイスの端子等を破損してしまうおそれがある。   The conductive particles contained in such an ACF do not necessarily have the same particle size, but generally have various particle sizes. Further, although the conductive particles are randomly scattered in the ACF, the density of the conductive particles is not necessarily uniform throughout the ACF, and there may be a place where the density of the conductive particles is locally higher than the surroundings. For this reason, when a pressing force is applied to the substrate unit and the conductive device with the ACF interposed, it is relatively unaffected at locations where conductive particles having a relatively large particle size exist or where the density of the conductive particles is locally high. Large force may be applied to the board unit or the terminals of the conductive device.

図4は、相互に圧着される基板ユニット30、ACF31及び導電デバイス32の斜視図である。図5は、基板ユニット30の基板端子33の一例を示す平面図である。図6は、図4に示す基板ユニット30、ACF31及び導電デバイス32の圧着部の断面の一例を示す概念図である。一般に、基板ユニット30と導電デバイス32との間にACF31を配置し、基板端子33及びデバイス端子34が配置されている箇所に圧着力Fを加えることで、基板端子33及びデバイス端子34がパッドP単位で接合される。この接合時に、相対的に大きな粒径を有する導電性粒子37が配置されている箇所や導電性粒子37の密度が高い箇所には力が局所的に集中してしまい、導電デバイス32のデバイス端子34、及び基板ユニット30の基板端子33や基部(下地層36及び基材層35)が損傷してしまうことがある(図6の「損傷箇所D」参照)。   FIG. 4 is a perspective view of the substrate unit 30, the ACF 31, and the conductive device 32 that are pressure-bonded to each other. FIG. 5 is a plan view illustrating an example of the board terminal 33 of the board unit 30. FIG. 6 is a conceptual diagram illustrating an example of a cross section of the crimping portion of the substrate unit 30, the ACF 31, and the conductive device 32 illustrated in FIG. In general, the ACF 31 is disposed between the substrate unit 30 and the conductive device 32, and the substrate terminal 33 and the device terminal 34 are connected to the pad P by applying a crimping force F to the portion where the substrate terminal 33 and the device terminal 34 are disposed. Joined in units. At the time of joining, the force is locally concentrated at a place where the conductive particles 37 having a relatively large particle diameter are disposed or a place where the density of the conductive particles 37 is high, and the device terminal of the conductive device 32 34 and the substrate terminal 33 and the base (the base layer 36 and the base material layer 35) of the substrate unit 30 may be damaged (see “damaged portion D” in FIG. 6).

このようにACFを使って基板ユニット及び導電デバイスを接合する場合には、ACFに含まれる導電性粒子の粒径や密度のばらつきに起因して基板ユニット及び導電デバイスが損傷してしまうことがある。このような基板ユニット及び導電デバイスの損傷は、導電不良を誘因するおそれがあり、また製品としての品質を損なうため、歩留まりの低下を招く。したがって、基板ユニット及び導電デバイスの損傷を防ぎつつ、基板ユニット及び導電デバイスを電気的及び物理的に所望の態様で接合可能な新たな手法の提案が望まれている。   When the substrate unit and the conductive device are joined using the ACF as described above, the substrate unit and the conductive device may be damaged due to variations in the particle size and density of the conductive particles contained in the ACF. . Such damage to the substrate unit and the conductive device may cause poor conductivity, and deteriorate the quality of the product, leading to a decrease in yield. Therefore, it is desired to propose a new technique capable of joining the substrate unit and the conductive device in a desired manner electrically and physically while preventing damage to the substrate unit and the conductive device.

本発明は上述の事情に鑑みてなされたものであり、基板ユニット及び導電デバイスを、損傷を防ぎつつ、電気的及び物理的に接合可能な技術を提供することを目的とする。   The present invention has been made in view of the above-described circumstances, and an object thereof is to provide a technique capable of electrically and physically joining a substrate unit and a conductive device while preventing damage.

本発明の一態様は、基部と、基部上に設けられる複数の支持部と、複数の支持部上に設けられる複数の基板端子と、を備え、複数の支持部の各々は平坦状の頂部を有し、複数の基板端子は、複数の支持部の頂部上に設けられ、複数の支持部の頂部は、基部からの高さが相互に同じである基板ユニットに関する。   One embodiment of the present invention includes a base, a plurality of support portions provided on the base portion, and a plurality of substrate terminals provided on the plurality of support portions, and each of the plurality of support portions has a flat top portion. The plurality of board terminals are provided on tops of the plurality of support parts, and the top parts of the plurality of support parts relate to a board unit having the same height from the base part.

本態様によれば、基部からの高さが相互に同じである複数の支持部の平坦状の頂部上に基板端子が設けられるため、基板端子を精度良く平坦に形成できる。したがって導電デバイスのデバイス端子を基板端子上に重ねた状態でデバイス端子及び基板端子を押圧しても、デバイス端子は頂部上の基板端子の全面にわたって接触するため、デバイス端子及び基板端子において力が局所的に集中してしまうことを防ぐことができる。そのため基板ユニット(基板端子)及び導電デバイス(デバイス端子)を、損傷を防ぎつつ、電気的及び物理的に適切に接合することが可能である。   According to this aspect, since the substrate terminal is provided on the flat top portions of the plurality of support portions having the same height from the base portion, the substrate terminal can be formed flat with high accuracy. Therefore, even if the device terminal and the substrate terminal are pressed while the device terminal of the conductive device is overlaid on the substrate terminal, the device terminal contacts over the entire surface of the substrate terminal on the top, so that the force is locally applied to the device terminal and the substrate terminal. Can be avoided. Therefore, the substrate unit (substrate terminal) and the conductive device (device terminal) can be appropriately joined electrically and physically while preventing damage.

複数の支持部の頂部は、同一平面上に配置されてもよい。   The top portions of the plurality of support portions may be arranged on the same plane.

本態様によれば、各頂部上において基板端子を精度良く平坦に形成できる。   According to this aspect, the substrate terminal can be formed accurately and flat on each top.

複数の基板端子の各々は、複数の頂部にわたって設けられてもよい。   Each of the plurality of substrate terminals may be provided over a plurality of top portions.

本態様によれば、個々の基板端子が複数の頂部にわたって設けられるため、これらの複数の頂部間にスペースが形成され、当該スペースを接着剤の配置スペース等に有効活用できる。   According to this aspect, since each board | substrate terminal is provided over several top parts, a space is formed between these several top parts, and the said space can be effectively utilized for the arrangement | positioning space etc. of an adhesive agent.

複数の基板端子の各々が設けられる複数の頂部は、一方向に相互に離間して配置されてもよい。   The plurality of top portions on which each of the plurality of substrate terminals is provided may be spaced apart from each other in one direction.

複数の基板端子の各々が設けられる複数の頂部は、複数方向に相互に離間して配置されてもよい。   The plurality of top portions on which each of the plurality of substrate terminals is provided may be spaced apart from each other in a plurality of directions.

これらの態様によれば、頂部の離間方向に関してスペースを形成でき、当該スペースを接着剤の配置スペース等に有効活用できる。   According to these aspects, a space can be formed with respect to the separation direction of the top portion, and the space can be effectively used as an adhesive placement space or the like.

複数の基板端子の各々は、2以上の支持部の頂部にわたって設けられてもよい。   Each of the plurality of substrate terminals may be provided over the tops of the two or more support portions.

本態様によれば、各基板端子が2以上の支持部の頂部にわたって設けられるため、各基板端子に割り当てられる頂部間においてスペースを形成でき、当該スペースを接着剤の配置スペース等に有効活用できる。   According to this aspect, since each board terminal is provided over the top part of two or more support parts, a space can be formed between the top parts allocated to each board terminal, and the space can be effectively used as an arrangement space for the adhesive.

複数の基板端子の各々が設けられる複数の頂部は、単一の支持部によって形成されてもよい。   The plurality of top portions on which each of the plurality of substrate terminals is provided may be formed by a single support portion.

本態様によれば、各基板端子に割り当てられる複数の頂部が単一の支持部によって形成され、各基板端子を支持部によって的確に支持できる。   According to this aspect, the plurality of top portions assigned to each substrate terminal are formed by the single support portion, and each substrate terminal can be accurately supported by the support portion.

単一の支持部によって形成される複数の頂部間の切欠部の断面は、当該切欠部と単一の支持部との境界において曲線部を含んでもよい。   The cross section of the notch between the tops formed by a single support may include a curved portion at the boundary between the notch and the single support.

単一の支持部によって形成される複数の頂部間の切欠部の断面は、当該切欠部と単一の支持部との境界において複数の直線部を含んでもよい。   The cross section of the notch between the plurality of top portions formed by the single support portion may include a plurality of linear portions at the boundary between the notch portion and the single support portion.

これらの態様によれば、導電デバイスに対する基板ユニットの所望の物理的な接着態様と、導電デバイスのデバイス端子に対する基板端子の所望の電気的な接続態様とに応じて、適切な形状の切欠部を支持部の頂部間に形成できる。   According to these aspects, depending on the desired physical adhesion of the substrate unit to the conductive device and the desired electrical connection of the substrate terminal to the device terminal of the conductive device, a notch having an appropriate shape is provided. It can be formed between the tops of the supports.

複数の支持部の各々は、四角形状の断面形状を有してもよい。   Each of the plurality of support portions may have a quadrangular cross-sectional shape.

本態様によれば、支持部の平坦状の頂部を精度良く形成できる。   According to this aspect, the flat top portion of the support portion can be formed with high accuracy.

基部は、基材層と、当該基材層と支持部との間に設けられる下地層とを含んでもよい。   The base part may include a base material layer and a base layer provided between the base material layer and the support part.

本態様によれば、基材層の損傷だけではなく下地層の損傷も防ぎつつ、基板ユニット及び導電デバイスを電気的及び物理的に接合可能である。   According to this aspect, the substrate unit and the conductive device can be electrically and physically bonded while preventing not only the base material layer but also the underlying layer from being damaged.

本発明の他の態様は、上記の基板ユニットと、基板ユニットの基部、複数の支持部及び複数の基板端子のうちの少なくともいずれかの上に設けられた接着部と、を備える接着基板ユニットに関する。   Another aspect of the present invention relates to an adhesive substrate unit comprising the above substrate unit and an adhesive portion provided on at least one of a base portion of the substrate unit, a plurality of support portions, and a plurality of substrate terminals. .

本発明の他の態様は、上記の基板ユニットと、基板ユニットの複数の基板端子の各々と電気的に接続する複数のデバイス端子を有する導電デバイスと、基板ユニットと導電デバイスとを接着する接着部と、を備える導電ユニットに関する。   Another aspect of the present invention is the above-described substrate unit, a conductive device having a plurality of device terminals electrically connected to each of the plurality of substrate terminals of the substrate unit, and an adhesive portion for bonding the substrate unit and the conductive device And a conductive unit.

本発明によれば、基部からの高さが相互に同じである複数の支持部の平坦状の頂部上に基板端子が設けられ、基板端子を精度良く平坦に形成できる。したがって導電デバイスのデバイス端子を基板端子上に重ねた状態でデバイス端子及び基板端子が押圧されても、デバイス端子は頂部上の基板端子の全面にわたって接触するため、デバイス端子及び基板端子において力が局所的に集中してしまうことを防ぐことができる。このように本発明によれば、基板ユニット及び導電デバイスを、損傷を防ぎつつ、電気的及び物理的に適切に接合することが可能である。   According to the present invention, the substrate terminal is provided on the flat top portions of the plurality of support portions having the same height from the base portion, and the substrate terminal can be formed flat with high accuracy. Therefore, even if the device terminal and the substrate terminal are pressed while the device terminal of the conductive device is overlaid on the substrate terminal, the device terminal contacts over the entire surface of the substrate terminal on the top, so that the force is locally applied to the device terminal and the substrate terminal. Can be avoided. As described above, according to the present invention, the board unit and the conductive device can be appropriately joined electrically and physically while preventing damage.

図1は、本発明の一実施形態に係る基板ユニット及び導電デバイスの圧着部の断面の一例を示す図である。FIG. 1 is a view showing an example of a cross section of a crimping portion of a substrate unit and a conductive device according to an embodiment of the present invention. 図2は、パッド単位での支持部の配置形態例を示す図である。FIG. 2 is a diagram illustrating an example of an arrangement form of support portions in units of pads. 図3は、パッド単位での支持部の断面形状例を示す図である。FIG. 3 is a diagram illustrating an example of a cross-sectional shape of the support portion in units of pads. 図4は、相互に圧着される基板ユニット、ACF及び導電デバイスの斜視図である。FIG. 4 is a perspective view of the substrate unit, the ACF, and the conductive device to be bonded to each other. 図5は、基板ユニットの基板端子の一例を示す平面図である。FIG. 5 is a plan view illustrating an example of a substrate terminal of the substrate unit. 図6は、図4に示す基板ユニット、ACF及び導電デバイスの圧着部の断面の一例を示す概念図である。FIG. 6 is a conceptual diagram illustrating an example of a cross section of the crimping portion of the substrate unit, the ACF, and the conductive device illustrated in FIG. 4.

以下、図面を参照して本発明の一実施の形態について説明する。   Hereinafter, an embodiment of the present invention will be described with reference to the drawings.

図1は、本発明の一実施形態に係る基板ユニット30及び導電デバイス32の圧着部の断面の一例を示す図である。   FIG. 1 is a diagram illustrating an example of a cross section of a crimping portion of a substrate unit 30 and a conductive device 32 according to an embodiment of the present invention.

本実施形態では、基板ユニット30において設けられる支持部12の平坦な頂部13上に基板端子33を形成し、この基板端子33とデバイス端子34とを接触させることで基板ユニット30と導電デバイス32との電気的な接合が実現される。一方、基板ユニット30と導電デバイス32との間に介在する粘着剤等の接着剤10によって、基板ユニット30と導電デバイス32との物理的な接合が実現される。なお、本件明細書において、「接着」との用語は、「粘着」を含む概念として用いる。   In the present embodiment, the substrate terminal 33 is formed on the flat top portion 13 of the support portion 12 provided in the substrate unit 30, and the substrate terminal 30 and the conductive device 32 are brought into contact with each other by contacting the substrate terminal 33 and the device terminal 34. The electrical connection is realized. On the other hand, physical bonding between the substrate unit 30 and the conductive device 32 is realized by the adhesive 10 such as an adhesive interposed between the substrate unit 30 and the conductive device 32. In the present specification, the term “adhesion” is used as a concept including “adhesion”.

すなわち本実施形態の基板ユニット30は、基材層35と、当該基材層35上に積層される下地層36と、下地層36上に設けられる複数の支持部12とを備え、基材層35と支持部12との間には下地層36が設けられている。基材層35及び下地層36の構成部材は特に限定されず、基材層35は例えばガラスや樹脂などのフィルムによって構成可能であり、下地層36は例えばPI(ポリイミド)や他のオーバーコート剤によって構成可能である。下地層36は、基材層35上における支持部12や基板端子33の保持性能の向上や、屈折率の調整等の任意の機能を発揮する部材として設置され、必要に応じた機能層を下地層36として設けることができる。本例では支持部12を支える基部が基材層35及び下地層36によって構成されるが、当該基部は他の層を含んでいてもよいし、基材層35のみによって基部が構成されてもよい。   That is, the substrate unit 30 of this embodiment includes a base material layer 35, a base layer 36 stacked on the base material layer 35, and a plurality of support portions 12 provided on the base layer 36. An underlayer 36 is provided between 35 and the support portion 12. The constituent members of the base material layer 35 and the base layer 36 are not particularly limited, and the base material layer 35 can be made of a film such as glass or resin, and the base layer 36 is made of, for example, PI (polyimide) or other overcoat agent. Can be configured. The underlayer 36 is installed as a member that exhibits an arbitrary function such as improvement of the holding performance of the support portion 12 and the substrate terminal 33 on the base material layer 35 and adjustment of the refractive index. The formation 36 can be provided. In this example, the base portion that supports the support portion 12 is configured by the base material layer 35 and the base layer 36, but the base portion may include other layers, or the base portion may be configured only by the base material layer 35. Good.

複数の支持部12の各々は、基板端子33を載置するための平坦状の頂部13を有する。これらの複数の支持部12の頂部13は、下地層36(基部)からの高さが相互に同じであり、同一平面上に配置される。これらの複数の支持部12の頂部13には、複数の基板端子33が載置される。基板端子33の構成部材は特に限定されず、例えばITO、銀ペースト、或いは他の金属配線によって基板端子33を構成できる。   Each of the plurality of support portions 12 has a flat top portion 13 on which the substrate terminal 33 is placed. The top portions 13 of the plurality of support portions 12 have the same height from the base layer 36 (base portion) and are arranged on the same plane. A plurality of substrate terminals 33 are placed on the top portions 13 of the plurality of support portions 12. The constituent member of the substrate terminal 33 is not particularly limited, and the substrate terminal 33 can be configured by, for example, ITO, silver paste, or other metal wiring.

ここでいう「平坦状の頂部13」は、各頂部13の下地層36(基部)からの高さが完全に同じであることが理想的ではあるが、本発明においては、必ずしもそのような厳密な同一性は求められない。すなわち、各頂部13内の任意の箇所の下地層36(基部)からの高さを「h」で表し、各頂部13内における下地層36(基部)からの高さの平均値を「have」で表し、各頂部13の下地層36(基部)からの高さの代表値(例えば平均値(have))を「H」で表し、各頂部13の代表値の平均値を「Have」で表した場合、「平坦状の頂部13」は下記関係式1を満たし、下地層36(基部)からの高さが相互に同じである複数の支持部12の頂部13は下記関係式2を満たすことが、製品(例えばフォトリソグラフィによって作られる製品)の信頼性を向上させる観点から好ましい。 The “flat top portion 13” here is ideally the same in height from the base layer 36 (base portion) of each top portion 13. The same identity is not required. That is, the height from the base layer 36 (base) at an arbitrary position in each top portion 13 is represented by “h”, and the average height from the base layer 36 (base portion) in each top portion 13 is represented by “h ave. , The representative value of the height of each top 13 from the base layer 36 (base) (for example, the average value (h ave )) is represented by “H”, and the average value of the representative values of each top 13 is represented by “H ave ”. "The flat top 13" satisfies the following relational expression 1, and the tops 13 of the plurality of support parts 12 having the same height from the base layer 36 (base) are represented by the following relational expression 2. It is preferable from the viewpoint of improving the reliability of a product (for example, a product made by photolithography).

<関係式1>
0μm≦|(h−have)|≦3μm
<Relational expression 1>
0 μm ≦ | (h−h ave ) | ≦ 3 μm

<関係式2>
0μm≦|(H−Have)|≦3μm
<Relational expression 2>
0 μm ≦ | (H−H ave ) | ≦ 3 μm

複数の基板端子33の各々は複数の頂部13にわたって設けられており、各基板端子33は、相互に離間した位置に設けられる2以上の頂部13上に設けられる。特に本例では、複数の基板端子33の各々が、2以上の支持部12の頂部13にわたって設けられており、各基板端子33は「これらの2以上の支持部12全体」及び「これらの2以上の支持部12の間」において延在する。   Each of the plurality of substrate terminals 33 is provided over the plurality of top portions 13, and each substrate terminal 33 is provided on two or more top portions 13 provided at positions separated from each other. In particular, in this example, each of the plurality of substrate terminals 33 is provided over the top portions 13 of the two or more support portions 12, and each substrate terminal 33 includes “the whole of these two or more support portions 12” and “these two”. It extends in “between the support parts 12”.

複数の支持部12の各々は、図1に示す例では台形形状の断面形状を有するが、頂部13において平坦状の部分を有するのであれば特に形状は限定されず、他の四角形状の断面形状を有していてもよいし、後述のような他の断面形状を有していてもよい(図3(a)及び(b)参照)。   In the example shown in FIG. 1, each of the plurality of support portions 12 has a trapezoidal cross-sectional shape, but the shape is not particularly limited as long as it has a flat portion at the top portion 13, and other quadrilateral cross-sectional shapes. Or may have other cross-sectional shapes as described later (see FIGS. 3A and 3B).

このように本実施形態の基板ユニット30は、基部(基材層35及び下地層36)、複数の支持部12、及び複数の支持部12の頂部13に載置される複数の基板端子33を備える。そして、この基板ユニット30には、接着部として機能する接着剤10を介して導電デバイス32が接着される。   As described above, the substrate unit 30 according to the present embodiment includes the base portion (base material layer 35 and base layer 36), the plurality of support portions 12, and the plurality of substrate terminals 33 placed on the top portions 13 of the plurality of support portions 12. Prepare. The conductive device 32 is bonded to the substrate unit 30 via the adhesive 10 that functions as an adhesive portion.

導電デバイス32は、デバイス本体38と、デバイス本体38に支持されるデバイス端子34と有する。各デバイス端子34は対応の基板端子33上に載せられ、デバイス端子34(導電デバイス32)と基板端子33(基板ユニット30)との間で電気的な接合が確立される。   The conductive device 32 has a device body 38 and device terminals 34 supported by the device body 38. Each device terminal 34 is placed on a corresponding substrate terminal 33, and electrical connection is established between the device terminal 34 (conductive device 32) and the substrate terminal 33 (substrate unit 30).

導電デバイス32と基板ユニット30との間は接着剤10によって満たされ、デバイス端子34と基板端子33との間の当接部以外の箇所において、導電デバイス32(デバイス本体38及びデバイス端子34)と基板ユニット30(基部(下地層36)及び基板端子33)とが接着剤10によって物理的に接合される。   The space between the conductive device 32 and the substrate unit 30 is filled with the adhesive 10, and the conductive device 32 (the device main body 38 and the device terminal 34) is located at a place other than the contact portion between the device terminal 34 and the substrate terminal 33. The substrate unit 30 (base (base layer 36) and substrate terminal 33) is physically bonded by the adhesive 10.

導電デバイス32と基板ユニット30との間における接着剤10の配置手法は、特に限定されない。例えば、ディスペンサーやインクジェットデバイスなどの任意のデバイスによって基板ユニット30(基板端子33及び下地層36)上に接着剤10を配置してもよいし、フォトリソグラフィ等の手法によって基板ユニット30(基板端子33及び下地層36)上に接着剤10を配置してもよい。   The arrangement | positioning method of the adhesive agent 10 between the electroconductive device 32 and the board | substrate unit 30 is not specifically limited. For example, the adhesive 10 may be disposed on the substrate unit 30 (the substrate terminal 33 and the base layer 36) by an arbitrary device such as a dispenser or an inkjet device, or the substrate unit 30 (the substrate terminal 33) by a technique such as photolithography. And the adhesive 10 may be disposed on the underlying layer 36).

接着剤10の組成や接着態様も特に限定されず、例えば熱硬化性樹脂、熱可塑性樹脂、UV(Ultraviolet)硬化性樹脂或いはEB(Electron Beam)硬化性樹脂によって接着剤10を構成してもよい。例えば、基板ユニット30上の所定箇所に接着剤10を配置し、接着剤10が載せられた基板ユニット30に対して導電デバイス32が押し当てられた状態で、加熱、冷却、UV照射或いはEB照射等によって接着剤10を硬化させることで、図1に示す導電ユニット20を製造できる。なお、基板ユニット30の所定箇所(基部(下地層36)、複数の支持部12及び複数の基板端子33のうちの少なくともいずれか)の上に接着剤10が設けられたものを接着基板ユニットとして扱うことができる。この場合、接着基板ユニット上に導電デバイス32を配置した状態で、加熱、冷却、UV照射或いはEB照射等によって接着剤10を硬化させるだけで、導電ユニット20を簡便に製造することができる。   There are no particular limitations on the composition and bonding mode of the adhesive 10, and the adhesive 10 may be composed of, for example, a thermosetting resin, a thermoplastic resin, a UV (Ultraviolet) curable resin, or an EB (Electron Beam) curable resin. . For example, the adhesive 10 is disposed at a predetermined location on the substrate unit 30, and heating, cooling, UV irradiation, or EB irradiation is performed in a state where the conductive device 32 is pressed against the substrate unit 30 on which the adhesive 10 is placed. The conductive unit 20 shown in FIG. 1 can be manufactured by curing the adhesive 10 by, for example. In addition, what provided the adhesive agent 10 on the predetermined location (at least one of the base part (underlayer 36), the some support part 12, and the some board terminal 33) of the board | substrate unit 30 is used as an adhesion board unit. Can be handled. In this case, the conductive unit 20 can be simply manufactured by simply curing the adhesive 10 by heating, cooling, UV irradiation, EB irradiation, or the like in a state where the conductive device 32 is disposed on the adhesive substrate unit.

なお基板ユニット30上に配置される接着剤10は、頂部13上に設けられる基板端子33よりも高さ方向に突出するように配置されることが好ましい。この場合、導電デバイス32を基板ユニット30(接着基板ユニット)に押し当てた際に接着剤10を導電デバイス32に対して確実に接触させることができ、接着剤10によって基板ユニット30及び導電デバイス32を適切に接着することができる。なお、導電デバイス32を基板ユニット30(接着基板ユニット)に押し当てる際に導電デバイス32により押し退けられる接着剤10の部分を考慮し、基板ユニット30上全体における接着剤10の配置態様及び配置量を決めることが好ましい。特に、導電デバイス32により押し退けられた接着剤10がデバイス端子34と基板端子33との間の当接部に侵入してデバイス端子34と基板端子33との間の電気的な接触不良を引き起こさないように、基部(下地層36)及び基板端子33上に配置する接着剤10の配置態様及び配置量を決定することが求められる。   The adhesive 10 disposed on the substrate unit 30 is preferably disposed so as to protrude in the height direction from the substrate terminal 33 provided on the top portion 13. In this case, the adhesive 10 can be reliably brought into contact with the conductive device 32 when the conductive device 32 is pressed against the substrate unit 30 (adhesive substrate unit), and the adhesive unit 10 allows the substrate unit 30 and the conductive device 32 to be brought into contact with each other. Can be properly bonded. In consideration of the portion of the adhesive 10 that is pushed away by the conductive device 32 when the conductive device 32 is pressed against the substrate unit 30 (adhesive substrate unit), the arrangement mode and the arrangement amount of the adhesive 10 on the entire substrate unit 30 are determined. It is preferable to decide. In particular, the adhesive 10 pushed away by the conductive device 32 does not enter the contact portion between the device terminal 34 and the board terminal 33 and cause an electrical contact failure between the device terminal 34 and the board terminal 33. As described above, it is required to determine the arrangement mode and the arrangement amount of the adhesive 10 arranged on the base (base layer 36) and the substrate terminal 33.

このように本実施形態に係る導電ユニット20は、基板ユニット30と、基板ユニット30の複数の基板端子33の各々と電気的に接続する複数のデバイス端子34を有する導電デバイス32と、基板ユニット30と導電デバイス32とを接着する接着剤10とを備える。   As described above, the conductive unit 20 according to the present embodiment includes the substrate unit 30, the conductive device 32 having the plurality of device terminals 34 electrically connected to each of the plurality of substrate terminals 33 of the substrate unit 30, and the substrate unit 30. And an adhesive 10 for bonding the conductive device 32 to each other.

<支持部12の平面形状>
支持部12の頂部13上に設けられる基板端子33とデバイス端子34との間で適切に電気的な接続が確立されるのであれば、各デバイス端子34に接続される基板端子33及び支持部12の配置形態や、各基板端子33及び各支持部12の平面形状は特に限定されない。
<Planar shape of the support part 12>
If an appropriate electrical connection is established between the substrate terminal 33 provided on the top portion 13 of the support portion 12 and the device terminal 34, the substrate terminal 33 and the support portion 12 connected to each device terminal 34. There is no particular limitation on the arrangement form and the planar shapes of the substrate terminals 33 and the support portions 12.

図2は、パッドP単位での支持部12の配置形態例を示す図であり、説明の便宜上、支持部12の頂部13の平面形状のみが図示されている。なお、ここでいうパッドPは、それぞれ単一のデバイス端子34と、当該単一のデバイス端子34と電気的に接続される基板端子33及び当該基板端子33を支える支持部12とを含む。   FIG. 2 is a diagram showing an example of the arrangement form of the support portions 12 in units of pads P. For convenience of explanation, only the planar shape of the top portion 13 of the support portion 12 is shown. Each pad P includes a single device terminal 34, a substrate terminal 33 electrically connected to the single device terminal 34, and a support portion 12 that supports the substrate terminal 33.

複数の基板端子33の各々が設けられる複数の頂部13は、例えば図2(a)及び(b)に示すように一方向に相互に離間して配置されてもよく、その数及びその離間方向は特に限定されない。例えば、各パッドPにおいて、複数(例えば3つ)の細長状の頂部13がその延在方向と垂直を成す方向に相互に離間して配置されてもよいし(図2(a)参照)、各パッドPの中央部において頂部13が分断されるように2つの頂部13が離間して配置されてもよい(図2(b)参照)。   The plurality of top portions 13 provided with each of the plurality of substrate terminals 33 may be spaced apart from each other in one direction, for example, as shown in FIGS. Is not particularly limited. For example, in each pad P, a plurality of (for example, three) elongated top portions 13 may be arranged apart from each other in a direction perpendicular to the extending direction (see FIG. 2A). The two top portions 13 may be spaced apart so that the top portion 13 is divided at the center portion of each pad P (see FIG. 2B).

また複数の基板端子33の各々が設けられる複数の頂部13は、図2(c)に示すように複数方向に相互に離間して配置されてもよい。例えば、各パッドPにおいて、互いに垂直を形成するパッドPの縦方向及び横方向の各々に関して、複数(例えば縦方向に3つ及び横方向に3つ(計9つ))の頂部13が相互に離間して配置されてもよい(図2(c)参照)。   Further, the plurality of top portions 13 provided with each of the plurality of substrate terminals 33 may be arranged to be separated from each other in a plurality of directions as shown in FIG. For example, in each pad P, a plurality (for example, three in the vertical direction and three in the horizontal direction (a total of nine)) of the top portions 13 are mutually connected with respect to each of the vertical direction and the horizontal direction of the pads P that are perpendicular to each other. They may be spaced apart (see FIG. 2C).

また複数の基板端子33の各々が単一の頂部13上に設けられてもよく、例えば図2(d)に示すように、各パッドPの周縁部以外の箇所(中央部)に単一の頂部13が配置されてもよい。   Each of the plurality of substrate terminals 33 may be provided on a single top portion 13. For example, as shown in FIG. 2 (d), a single portion is provided at a location (central portion) other than the peripheral portion of each pad P. A top 13 may be arranged.

なお、複数の頂部13間には接着剤10が配置され、基板ユニット30と導電デバイス32との間の物理的な接着性を優先させる観点からは、接着剤10の占める割合を大きくすることが好ましい。また、基板ユニット30(基板端子33)と導電デバイス32(デバイス端子34)との間の電気的な接続性を優先させる観点からは、基板端子33が載置される頂部13の占める割合を大きくすることが好ましい。また、各パッドPの全体にわたって基板ユニット30と導電デバイス32とを物理的に適切に接着するには、接着剤10が各パッドPの全体にわたって配置されることが好ましい。また、各パッドPの全体にわたって基板ユニット30と導電デバイス32とを電気的に適切に接続するには、基板端子33が載置される頂部13が各パッドPの全体にわたって配置されることが好ましい。   In addition, the adhesive 10 is arrange | positioned between the some top parts 13, and the ratio for which the adhesive 10 occupies can be enlarged from a viewpoint of giving priority to the physical adhesiveness between the board | substrate unit 30 and the electrically-conductive device 32. FIG. preferable. Further, from the viewpoint of giving priority to the electrical connectivity between the substrate unit 30 (substrate terminal 33) and the conductive device 32 (device terminal 34), the proportion of the top portion 13 on which the substrate terminal 33 is placed is increased. It is preferable to do. Moreover, in order to adhere | attach the board | substrate unit 30 and the electrically conductive device 32 over the whole of each pad P physically appropriately, it is preferable that the adhesive agent 10 is arrange | positioned over the whole of each pad P. Further, in order to electrically connect the board unit 30 and the conductive device 32 over the entire pad P, it is preferable that the top portion 13 on which the board terminal 33 is placed is arranged over the entire pad P. .

<支持部12の断面形状>
各支持部12に平坦状の頂部13が形成され、各頂部13上の基板端子33とデバイス端子34との間で適切に電気的な接続が確立されるのであれば、各デバイス端子34に接続される基板端子33及び支持部12の断面形状は特に限定されない。
<Cross-sectional shape of the support part 12>
If each support portion 12 is formed with a flat top portion 13 and an appropriate electrical connection is established between the substrate terminal 33 and the device terminal 34 on each top portion 13, it is connected to each device terminal 34. The cross-sectional shapes of the substrate terminal 33 and the support portion 12 to be used are not particularly limited.

図3は、パッドP単位での支持部12の断面形状例を示す図である。例えば、複数の基板端子33の各々が複数の頂部13上に設けられる場合、各基板端子33が設けられる「複数の頂部13」は、複数の支持部12によって形成されてもよいし(図1参照)、単一の支持部12によって形成されてもよい(図3(a)及び(b)参照)。図1に示す例では、各デバイス端子34は、複数の支持部12の頂部13上に設けられる基板端子33と電気的に接続し、各支持部12は平坦状の頂部13を一つ有している。一方、図3(a)及び(b)に示す例では、各デバイス端子34は、単一の支持部12が有する複数の頂部13上に設けられる基板端子33と電気的に接続される。なお、各デバイス端子34は、複数の支持部12にわたって設けられる基板端子33であって、各支持部12が有する複数の頂部13上に設けられる基板端子33と電気的に接続されてもよい。   FIG. 3 is a diagram showing an example of a cross-sectional shape of the support portion 12 in the pad P unit. For example, when each of the plurality of substrate terminals 33 is provided on the plurality of top portions 13, the “plurality of top portions 13” on which each substrate terminal 33 is provided may be formed by the plurality of support portions 12 (FIG. 1). (See FIG. 3 (a) and (b)). In the example shown in FIG. 1, each device terminal 34 is electrically connected to a substrate terminal 33 provided on the top portions 13 of the plurality of support portions 12, and each support portion 12 has one flat top portion 13. ing. On the other hand, in the example shown in FIGS. 3A and 3B, each device terminal 34 is electrically connected to the substrate terminal 33 provided on the plurality of top portions 13 included in the single support portion 12. Each device terminal 34 is a board terminal 33 provided over the plurality of support parts 12, and may be electrically connected to the board terminal 33 provided on the plurality of top parts 13 included in each support part 12.

また各基板端子33が設けられる複数の頂部13が単一の支持部12によって形成される場合、当該単一の支持部12によって形成される複数の頂部13間の切欠部14の断面形状も特に限定されない。例えば、各切欠部14の断面は、切欠部14と支持部12との境界において、図3(a)に示すように円弧状の曲線部を含んでいてもよいし、図3(b)に示すように複数の直線部を含んでいてもよい。この切欠部14の形状及びサイズは、支持部12の加工性、支持部12上における基板端子33の形成の簡便性、基板端子33とデバイス端子34との間の電気的接続性能、接着剤10の配置性、及び基板端子33とデバイス端子34との間の物理的接着性能等の種々の観点に基づいて、適宜定めることが可能である。   In addition, when the plurality of top portions 13 provided with the respective substrate terminals 33 are formed by the single support portion 12, the cross-sectional shape of the notch portions 14 between the plurality of top portions 13 formed by the single support portion 12 is also particularly great. It is not limited. For example, the cross section of each notch portion 14 may include an arcuate curved portion as shown in FIG. 3 (a) at the boundary between the notch portion 14 and the support portion 12, or FIG. 3 (b). As shown, a plurality of straight portions may be included. The shape and size of the notch 14 are such that the workability of the support 12, the ease of forming the substrate terminal 33 on the support 12, the electrical connection performance between the substrate terminal 33 and the device terminal 34, and the adhesive 10 Can be determined as appropriate based on various viewpoints such as the disposition of the substrate and the physical adhesion performance between the substrate terminal 33 and the device terminal 34.

<製造方法>
上述の導電ユニット20(基板ユニット30、接着剤10及び導電デバイス32)は任意の方法によって製造可能である。典型的には、「基材層35、下地層36、支持部12及び基板端子33を含む基板ユニット30」と「デバイス本体38及びデバイス端子34を含む導電デバイス32」との間に接着剤10を配置し、当該接着剤10を硬化して基板ユニット30と導電デバイス32と接着剤10を介して接合することで導電ユニット20を製造できる。或いは、「基板ユニット30及び接着剤10を含む接着基板ユニット」と「デバイス本体38及びデバイス端子34を含む導電デバイス32」とを重ねて配置し、接着剤10を硬化して基板ユニット30と導電デバイス32とを接着剤10を介して接合することで導電ユニット20を製造できる。
<Manufacturing method>
The conductive unit 20 (the substrate unit 30, the adhesive 10, and the conductive device 32) can be manufactured by any method. Typically, the adhesive 10 is interposed between the “substrate unit 30 including the base layer 35, the base layer 36, the support 12, and the substrate terminal 33” and the “conductive device 32 including the device body 38 and the device terminal 34”. The conductive unit 20 can be manufactured by arranging the substrate 10, curing the adhesive 10, and bonding the substrate unit 30, the conductive device 32, and the adhesive 10. Alternatively, the “adhesive substrate unit including the substrate unit 30 and the adhesive 10” and the “conductive device 32 including the device main body 38 and the device terminal 34” are arranged in an overlapping manner, and the adhesive 10 is cured to be conductive with the substrate unit 30. The conductive unit 20 can be manufactured by joining the device 32 via the adhesive 10.

基板ユニット30及び導電デバイス32を構成する個々の部材を製造する方法も特に限定されず、例えば任意の塗布技術(コーティング技術)を使って所望の基板ユニット30及び導電デバイス32を形成可能である。   A method for manufacturing individual members constituting the substrate unit 30 and the conductive device 32 is not particularly limited, and the desired substrate unit 30 and the conductive device 32 can be formed by using, for example, an arbitrary coating technique (coating technique).

特に「平坦状の頂部13を有する支持部12」はフォトリソグラフィによって好適に製造可能であり、支持部12は光硬化型の感光性樹脂(例えばアクリル系樹脂)によって好適に構成可能である。フォトリソグラフィは、一般に、基部上へのレジストのコーティング工程、マスクを用いたレジストの露光工程、及び不要なレジストを除去する現像工程を含み、必要に応じてレジストの固化を促すプリベーク工程や現像液の除去を促すポストベーク工程等の他の工程が行われる。例えばフォトリソグラフィで用いられるネガ型のレジストにより支持部12を構成することによって、支持部12の頂部13を精度良く平坦に形成することができ、頂部13上に設けられる基板端子33とデバイス端子34との圧着時の損傷を効果的に防げる。例えば、導電ユニット20がタッチパネルセンサに適用される場合、基板端子33は、導電ユニット20に設けられた検出電極に接続される。   In particular, the “support portion 12 having the flat top portion 13” can be preferably manufactured by photolithography, and the support portion 12 can be preferably configured by a photo-curing type photosensitive resin (for example, acrylic resin). Photolithography generally includes a resist coating process on a base, a resist exposure process using a mask, and a development process for removing unnecessary resist, and a pre-bake process and a developer for promoting solidification of the resist as necessary. Other processes such as a post-bake process for urging the removal are performed. For example, by forming the support portion 12 with a negative resist used in photolithography, the top portion 13 of the support portion 12 can be formed accurately and flatly, and a substrate terminal 33 and a device terminal 34 provided on the top portion 13 are formed. Effectively prevent damage during crimping. For example, when the conductive unit 20 is applied to a touch panel sensor, the substrate terminal 33 is connected to a detection electrode provided in the conductive unit 20.

<具体的な適用例>
なお、基板ユニット30及び導電デバイス32の具体的な構成や適用分野は、特に限定されない。基板ユニット30は、典型的には、ガラス基板、FPC、TCP(Tape Carrier Package)、IC(Integrated Circuit)、及び/又はPCB(Printed Circuit Board)によって構成可能である。また基板ユニット30及び導電デバイス32を具備する導電ユニット20は、タッチセンサ等の分野において好適に用いられ、OGS(One Glass Solution)方式、インセル方式及びオンセル方式等の各種方式に応用可能である。
<Specific application examples>
The specific configurations and application fields of the substrate unit 30 and the conductive device 32 are not particularly limited. The substrate unit 30 can typically be configured by a glass substrate, FPC, TCP (Tape Carrier Package), IC (Integrated Circuit), and / or PCB (Printed Circuit Board). The conductive unit 20 including the substrate unit 30 and the conductive device 32 is preferably used in the field of touch sensors and the like, and can be applied to various methods such as an OGS (One Glass Solution) method, an in-cell method, and an on-cell method.

以上説明したように本実施形態によれば、基部(下地層36)からの高さが相互に同じである複数の支持部12の平坦状の頂部13上に基板端子33が設けられ、基板端子33を精度良く平坦に形成できる。したがって導電デバイス32のデバイス端子34を基板端子33上に重ねた状態でデバイス端子34及び基板端子33を押圧しても、デバイス端子34は頂部13上の基板端子33の全面にわたって接触するため、デバイス端子34及び基板端子33において力が局所的に集中してしまうことを防げる。このように本実施形態によれば、基板ユニット30(基板端子33)及び導電デバイス32(デバイス端子34)を、損傷を防ぎつつ、電気的及び物理的に適切に接合することができる。   As described above, according to the present embodiment, the substrate terminal 33 is provided on the flat top portions 13 of the plurality of support portions 12 having the same height from the base portion (the base layer 36), and the substrate terminal 33 can be formed flat with high accuracy. Therefore, even if the device terminal 34 and the substrate terminal 33 are pressed in a state where the device terminal 34 of the conductive device 32 is superimposed on the substrate terminal 33, the device terminal 34 contacts the entire surface of the substrate terminal 33 on the top portion 13. It is possible to prevent the force from being concentrated locally at the terminal 34 and the board terminal 33. Thus, according to the present embodiment, the substrate unit 30 (substrate terminal 33) and the conductive device 32 (device terminal 34) can be appropriately joined electrically and physically while preventing damage.

また特に、図1に示す上述の実施形態のように基部が下地層36を含んでいても、平坦状の頂部13を有する支持部12上に基板端子33を形成することで、そのような下地層36の膜破れを防ぎつつ、基板ユニット30(基板端子33)及び導電デバイス32(デバイス端子34)を電気的及び物理的に適切に接合することができる。   In particular, even if the base portion includes the base layer 36 as in the above-described embodiment shown in FIG. 1, by forming the substrate terminal 33 on the support portion 12 having the flat top portion 13, The substrate unit 30 (substrate terminal 33) and the conductive device 32 (device terminal 34) can be appropriately electrically and physically bonded while preventing the film breakage of the formation 36.

本発明は、上述した個々の実施形態に限定されるものではなく、当業者が想到しうる種々の変形が加えられた形態も含みうるものであり、本発明の効果も上述した内容に限定されない。すなわち、特許請求の範囲に規定された内容及びその均等物から導き出される本発明の概念的な思想及び趣旨を逸脱しない範囲で、種々の追加、変更及び部分的削除が可能である。   The present invention is not limited to the above-described individual embodiments, but may include forms with various modifications that can be conceived by those skilled in the art, and the effects of the present invention are not limited to the above-described contents. . That is, various additions, changes, and partial deletions can be made without departing from the concept and spirit of the present invention derived from the contents defined in the claims and equivalents thereof.

10 接着剤
12 支持部
13 頂部
14 切欠部
20 導電ユニット
30 基板ユニット
32 導電デバイス
33 基板端子
34 デバイス端子
35 基材層
36 下地層
37 導電性粒子
38 デバイス本体
F 圧着力
D 損傷箇所
P パッド
DESCRIPTION OF SYMBOLS 10 Adhesive 12 Support part 13 Top part 14 Notch part 20 Conductive unit 30 Substrate unit 32 Conductive device 33 Substrate terminal 34 Device terminal 35 Base material layer 36 Underlayer 37 Conductive particle 38 Device main body F Crimping force D Damaged part P Pad

Claims (13)

基部と、
前記基部上に設けられる複数の支持部と、
前記複数の支持部上に設けられる複数の基板端子と、を備え、
前記複数の支持部の各々は平坦状の頂部を有し、
前記複数の基板端子は、前記複数の支持部の前記頂部上に設けられ、
前記複数の支持部の前記頂部は、前記基部からの高さが相互に同じである基板ユニット。
The base,
A plurality of support portions provided on the base;
A plurality of substrate terminals provided on the plurality of support parts,
Each of the plurality of support portions has a flat top portion,
The plurality of substrate terminals are provided on the tops of the plurality of support portions,
The top portions of the plurality of support portions are substrate units having the same height from the base portion.
前記複数の支持部の前記頂部は、同一平面上に配置される請求項1に記載の基板ユニット。   The substrate unit according to claim 1, wherein the top portions of the plurality of support portions are arranged on the same plane. 前記複数の基板端子の各々は、複数の前記頂部にわたって設けられる請求項1又は2に記載の基板ユニット。   The substrate unit according to claim 1, wherein each of the plurality of substrate terminals is provided over the plurality of top portions. 前記複数の基板端子の各々が設けられる前記複数の頂部は、一方向に相互に離間して配置される請求項3に記載の基板ユニット。   The board unit according to claim 3, wherein the plurality of top portions on which each of the plurality of board terminals is provided are spaced apart from each other in one direction. 前記複数の基板端子の各々が設けられる前記複数の頂部は、複数方向に相互に離間して配置される請求項3に記載の基板ユニット。   The board unit according to claim 3, wherein the plurality of top portions on which each of the plurality of board terminals is provided are spaced apart from each other in a plurality of directions. 前記複数の基板端子の各々は、2以上の前記支持部の前記頂部にわたって設けられる請求項3〜5のいずれか一項に記載の基板ユニット。   6. The board unit according to claim 3, wherein each of the plurality of board terminals is provided over the top parts of the two or more support parts. 前記複数の基板端子の各々が設けられる前記複数の頂部は、単一の前記支持部によって形成される請求項3〜5のいずれか一項に記載の基板ユニット。   The substrate unit according to claim 3, wherein the plurality of top portions on which the plurality of substrate terminals are provided are formed by a single support portion. 前記単一の支持部によって形成される前記複数の頂部間の切欠部の断面は、当該切欠部と前記単一の支持部との境界において曲線部を含む請求項7に記載の基板ユニット。   8. The substrate unit according to claim 7, wherein a cross section of the cutout portion between the plurality of top portions formed by the single support portion includes a curved portion at a boundary between the cutout portion and the single support portion. 前記単一の支持部によって形成される前記複数の頂部間の切欠部の断面は、当該切欠部と前記単一の支持部との境界において複数の直線部を含む請求項7に記載の基板ユニット。   The substrate unit according to claim 7, wherein a cross section of the notch portion between the plurality of top portions formed by the single support portion includes a plurality of linear portions at a boundary between the notch portion and the single support portion. . 前記複数の支持部の各々は、四角形状の断面形状を有する請求項1〜9のいずれか一項に記載の基板ユニット。   Each of these support parts is a board | substrate unit as described in any one of Claims 1-9 which has square-shaped cross-sectional shape. 前記基部は、基材層と、当該基材層と前記支持部との間に設けられる下地層とを含む請求項1〜10のいずれか一項に記載の基板ユニット。   The said base part is a board | substrate unit as described in any one of Claims 1-10 containing a base material layer and the base layer provided between the said base material layer and the said support part. 請求項1〜11のいずれか一項に記載の基板ユニットと、
前記基板ユニットの前記基部、前記複数の支持部及び前記複数の基板端子のうちの少なくともいずれかの上に設けられた接着部と、を備える接着基板ユニット。
The substrate unit according to any one of claims 1 to 11,
An adhesive substrate unit comprising: an adhesive portion provided on at least one of the base portion, the plurality of support portions, and the plurality of substrate terminals of the substrate unit.
請求項1〜11のいずれか一項に記載の基板ユニットと、
前記基板ユニットの前記複数の基板端子の各々と電気的に接続する複数のデバイス端子を有する導電デバイスと、
前記基板ユニットと前記導電デバイスとを接着する接着部と、を備える導電ユニット。
The substrate unit according to any one of claims 1 to 11,
A conductive device having a plurality of device terminals electrically connected to each of the plurality of substrate terminals of the substrate unit;
A conductive unit comprising: an adhesive portion that bonds the substrate unit and the conductive device.
JP2015152543A 2015-07-31 2015-07-31 Substrate unit, adhesive substrate unit, and conductive unit Pending JP2017034083A (en)

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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002280487A (en) * 2001-03-19 2002-09-27 Fujikura Ltd Semiconductor package
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JP2008277647A (en) * 2007-05-02 2008-11-13 Epson Imaging Devices Corp Mounting structure and electronic equipment
JP2012186329A (en) * 2011-03-07 2012-09-27 Seiko Epson Corp Semiconductor device and semiconductor device manufacturing method

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002280487A (en) * 2001-03-19 2002-09-27 Fujikura Ltd Semiconductor package
JP2008109024A (en) * 2006-10-27 2008-05-08 Seiko Epson Corp Semiconductor, electronic device, and method for manufacturing electronic device
JP2008277647A (en) * 2007-05-02 2008-11-13 Epson Imaging Devices Corp Mounting structure and electronic equipment
JP2012186329A (en) * 2011-03-07 2012-09-27 Seiko Epson Corp Semiconductor device and semiconductor device manufacturing method

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