JP2016540208A5 - - Google Patents
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- JP2016540208A5 JP2016540208A5 JP2016533694A JP2016533694A JP2016540208A5 JP 2016540208 A5 JP2016540208 A5 JP 2016540208A5 JP 2016533694 A JP2016533694 A JP 2016533694A JP 2016533694 A JP2016533694 A JP 2016533694A JP 2016540208 A5 JP2016540208 A5 JP 2016540208A5
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- detection device
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- circuit
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- 238000001514 detection method Methods 0.000 claims description 24
- 230000008929 regeneration Effects 0.000 claims 12
- 238000011069 regeneration method Methods 0.000 claims 12
- 230000010287 polarization Effects 0.000 claims 5
- 238000007493 shaping process Methods 0.000 claims 5
- 238000000465 moulding Methods 0.000 claims 3
- 238000006243 chemical reaction Methods 0.000 claims 2
- 230000010354 integration Effects 0.000 claims 2
- 230000005855 radiation Effects 0.000 claims 2
- 238000011084 recovery Methods 0.000 claims 1
- 230000001419 dependent effect Effects 0.000 description 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP13194618 | 2013-11-27 | ||
| EP13194618.8 | 2013-11-27 | ||
| PCT/EP2014/075065 WO2015078753A1 (en) | 2013-11-27 | 2014-11-20 | Detection device for detecting photons and method therefore |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2016540208A JP2016540208A (ja) | 2016-12-22 |
| JP2016540208A5 true JP2016540208A5 (enExample) | 2017-08-24 |
| JP6209683B2 JP6209683B2 (ja) | 2017-10-04 |
Family
ID=49639803
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2016533694A Active JP6209683B2 (ja) | 2013-11-27 | 2014-11-20 | 光子を検出する検出デバイス及びそのための方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US9759822B2 (enExample) |
| EP (1) | EP3074791B1 (enExample) |
| JP (1) | JP6209683B2 (enExample) |
| CN (1) | CN105793734B (enExample) |
| WO (1) | WO2015078753A1 (enExample) |
Families Citing this family (45)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104812305B (zh) * | 2012-12-27 | 2018-03-30 | 东芝医疗系统株式会社 | X射线ct装置以及控制方法 |
| EP2989486A1 (en) * | 2013-04-24 | 2016-03-02 | Koninklijke Philips N.V. | Pulse processing circuit with correction means |
| EP2871496B1 (en) * | 2013-11-12 | 2020-01-01 | Samsung Electronics Co., Ltd | Radiation detector and computed tomography apparatus using the same |
| JP2015180859A (ja) * | 2014-03-05 | 2015-10-15 | 株式会社東芝 | フォトンカウンティングct装置 |
| US10159450B2 (en) * | 2014-10-01 | 2018-12-25 | Toshiba Medical Systems Corporation | X-ray CT apparatus including a photon-counting detector, and an image processing apparatus and an image processing method for correcting detection signals detected by the photon-counting detector |
| KR101725099B1 (ko) * | 2014-12-05 | 2017-04-26 | 삼성전자주식회사 | 컴퓨터 단층 촬영장치 및 그 제어방법 |
| BR112017002916A2 (pt) * | 2014-12-05 | 2017-12-05 | Koninklijke Philips Nv | dispositivo detector de raios x para detecção de radiação de raio x a um ângulo inclinado em relação à radiação de raio x, sistema e método de imageamento por raios x, elemento de programa de computador para controlar um dispositivo ou um sistema, e mídia legível por computador |
| RU2699307C2 (ru) * | 2014-12-16 | 2019-09-04 | Конинклейке Филипс Н.В. | Определение смещения базовой линии детектора фотонов |
| US9757085B2 (en) * | 2015-02-25 | 2017-09-12 | Toshiba Medical Systems Corporation | Method for identifying and processing detector polarization in photon-counting spectral X-ray detectors |
| US10098595B2 (en) * | 2015-08-06 | 2018-10-16 | Texas Instruments Incorporated | Low power photon counting system |
| EP3350623B1 (en) | 2015-09-18 | 2020-12-16 | Koninklijke Philips N.V. | Processing of a corrected x-ray detector signal |
| US10281596B2 (en) | 2015-09-18 | 2019-05-07 | Koninklijke Philips N.V. | Correcting photon counts in a photon counting X-ray radiation detection system |
| US10117626B2 (en) * | 2015-09-29 | 2018-11-06 | General Electric Company | Apparatus and method for pile-up correction in photon-counting detector |
| CN109844568B (zh) * | 2016-08-31 | 2023-05-16 | 棱镜传感器公司 | 用于估计转换器的相对增益和偏移的方法和系统 |
| CN109716165B (zh) * | 2016-10-27 | 2022-09-30 | 深圳帧观德芯科技有限公司 | 辐射检测器中的暗噪音补偿 |
| CN106656390B (zh) * | 2016-11-15 | 2018-10-30 | 武汉中派科技有限责任公司 | 用于测量光子时间信息的装置及方法 |
| EP3547665B1 (en) * | 2016-11-25 | 2026-01-21 | Hamamatsu Photonics K.K. | Photon detector |
| US10162066B2 (en) * | 2017-02-06 | 2018-12-25 | General Electric Company | Coincidence-enabling photon-counting detector |
| EP3385756A1 (en) * | 2017-04-06 | 2018-10-10 | Koninklijke Philips N.V. | Pulse shaper |
| US10151845B1 (en) | 2017-08-02 | 2018-12-11 | Texas Instruments Incorporated | Configurable analog-to-digital converter and processing for photon counting |
| US10024979B1 (en) | 2017-11-01 | 2018-07-17 | Texas Instruments Incorporated | Photon counting with coincidence detection |
| US20190154852A1 (en) * | 2017-11-16 | 2019-05-23 | NueVue Solutions, Inc. | Analog Direct Digital X-Ray Photon Counting Detector For Resolving Photon Energy In Spectral X-Ray CT |
| EP3567405A1 (en) * | 2018-05-08 | 2019-11-13 | Koninklijke Philips N.V. | Photon counting spectral ct |
| EP3605151A1 (en) * | 2018-08-01 | 2020-02-05 | Koninklijke Philips N.V. | Photon counting detector |
| CN109283569B (zh) * | 2018-11-20 | 2022-05-17 | 中派科技(深圳)有限责任公司 | 用于测量光子信息的装置和光子测量设备 |
| EP4628943A3 (en) * | 2018-11-29 | 2025-11-19 | Oy Varex Imaging Finland Ltd. | Detector circuit |
| US10890674B2 (en) | 2019-01-15 | 2021-01-12 | Texas Instruments Incorporated | Dynamic noise shaping in a photon counting system |
| EP3754368A1 (en) * | 2019-06-19 | 2020-12-23 | Integrated Device Technology, Inc. | Amplifier system and method for operating an amplifier system, particularly for an optical receiver system of a light detection and ranging system |
| EP3832323B1 (en) * | 2019-12-04 | 2024-03-20 | Nxp B.V. | A leakage compensation circuit for a capacitive or resistive measurement device |
| EP3842839A1 (en) * | 2019-12-27 | 2021-06-30 | Koninklijke Philips N.V. | Compensation of polarization effects in photon counting detectors |
| US12468050B2 (en) * | 2020-01-27 | 2025-11-11 | The Johns Hopkins University | Direct energy windowing for photon counting detectors |
| DE102020114906B4 (de) * | 2020-06-04 | 2023-06-29 | Bender Gmbh & Co. Kg | Schutzkontaktsteckdose und Verfahren zur Isolationsfehlerlokalisierung in einem ungeerdeten Stromversorgungssystem mit Isolationsüberwachung |
| JP2021194354A (ja) * | 2020-06-17 | 2021-12-27 | 株式会社日立製作所 | 放射線撮像装置 |
| WO2022060483A1 (en) * | 2020-09-18 | 2022-03-24 | Analog Devices, Inc. | Delta modulated baseline restoration for photon counting computed tomography |
| CN116710811A (zh) * | 2020-12-09 | 2023-09-05 | ams国际有限公司 | 光子计数系统中用于基线提取的电路系统 |
| CN114822616B (zh) * | 2021-01-18 | 2025-10-28 | 中芯国际集成电路制造(天津)有限公司 | 灵敏放大器、存储器以及存储器的工作方法 |
| GB202105196D0 (en) * | 2021-04-12 | 2021-05-26 | Ams Int Ag | Baseline restorer circuit |
| WO2022233699A1 (en) * | 2021-05-03 | 2022-11-10 | Ams International Ag | Front-end electronic circuitry for an electromagnetic radiation sensor application |
| US12161498B2 (en) | 2021-05-11 | 2024-12-10 | Analog Devices, Inc. | Baseline restoration technique for photon counting computed tomography using active reference |
| US12287437B2 (en) | 2022-01-19 | 2025-04-29 | Analog Devices, Inc. | Quantitative pulse selection for photon-counting computed tomography scanning systems |
| US12411253B1 (en) * | 2022-11-14 | 2025-09-09 | Ut-Battelle, Llc | Pulse shape discrimination system for high density imaging |
| US12571923B2 (en) | 2022-12-13 | 2026-03-10 | Analog Devices, Inc. | Timer-based amplitude correction method for photon counting computed tomography |
| EP4564063A1 (en) * | 2023-11-30 | 2025-06-04 | Teledyne Dalsa B.V. | Detector pixel and energy-resolving photon counting detector |
| CN117854750B (zh) * | 2023-12-13 | 2026-04-21 | 深圳大学 | 一种高时间分辨x光辐射流诊断系统 |
| CN118944607B (zh) * | 2024-10-12 | 2024-12-10 | 南京大学 | 复位式电荷灵敏放大电路、数据信号的放大及复位方法 |
Family Cites Families (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6028313A (en) * | 1997-12-31 | 2000-02-22 | Mcdaniel; David L. | Direct conversion photon detector |
| US6609075B1 (en) | 2001-06-04 | 2003-08-19 | William K. Warburton | Method and apparatus for baseline correction in x-ray and nuclear spectroscopy systems |
| US6822506B2 (en) | 2003-04-17 | 2004-11-23 | Concorde Microsystems, Inc. | Amplitude and rise-time sensitive timing-shaping filters with built-in pulse-tail cancellation for high count-rate operation |
| CN101228437A (zh) | 2005-07-22 | 2008-07-23 | 皇家飞利浦电子股份有限公司 | 采用多色光谱的x射线探测器成像 |
| JP2007089922A (ja) * | 2005-09-29 | 2007-04-12 | Toshiba Corp | X線画像診断装置、x線検出装置、及びx線投影データの補正方法 |
| JP5337047B2 (ja) * | 2006-12-13 | 2013-11-06 | コーニンクレッカ フィリップス エヌ ヴェ | X線光子を計数する装置、撮像デバイス及び方法 |
| EP2156218A2 (en) * | 2007-06-01 | 2010-02-24 | Koninklijke Philips Electronics N.V. | Spectral photon counting detector |
| US9335424B2 (en) * | 2007-06-19 | 2016-05-10 | Koninklijke Philips N.V. | Spectral photon counting detector |
| US8338791B2 (en) * | 2007-06-19 | 2012-12-25 | Koninklijke Philips Electronics N.V. | Digital pulse processing for multi-spectral photon counting readout circuits |
| US8350221B2 (en) | 2007-08-03 | 2013-01-08 | Koninklijke Philips Electronics N.V. | Apparatus and method for generating countable pulses from impinging X-ray photons; and corresponding imaging device |
| CN102016637A (zh) * | 2008-04-30 | 2011-04-13 | 皇家飞利浦电子股份有限公司 | 计数探测器 |
| WO2011002452A1 (en) | 2009-06-30 | 2011-01-06 | Analogic Corporation | Enhanced photon detection for scanner |
| FR2956216B1 (fr) * | 2010-02-08 | 2012-04-20 | Commissariat Energie Atomique | Dispositif de detection de rayonnements photoniques, et procedes de dimensionnement et de fonctionnement d'un tel dispositif |
| EP2663879B1 (en) | 2011-01-10 | 2017-08-02 | Koninklijke Philips N.V. | Detection device for detecting photons emitted by a radiation source |
| JP5875790B2 (ja) * | 2011-07-07 | 2016-03-02 | 株式会社東芝 | 光子計数型画像検出器、x線診断装置、及びx線コンピュータ断層装置 |
| US9301378B2 (en) | 2011-10-19 | 2016-03-29 | Koninklijke Philips N.V. | Photon counting detector |
| JP2013128698A (ja) * | 2011-12-22 | 2013-07-04 | Shimadzu Corp | 二次元アレイx線検出器におけるゲイン補正方法およびx線撮影装置 |
| US8907290B2 (en) * | 2012-06-08 | 2014-12-09 | General Electric Company | Methods and systems for gain calibration of gamma ray detectors |
| CN104662444B (zh) * | 2012-09-18 | 2017-12-12 | 皇家飞利浦有限公司 | 直接转换光子计数探测器 |
| US9746566B2 (en) | 2012-12-04 | 2017-08-29 | Koninklijke Philips N.V. | Method and apparatus for image correction of X-ray image information |
| BR112015013392A2 (pt) | 2012-12-12 | 2017-07-11 | Koninklijke Philips Nv | sistema de imagem, e método |
-
2014
- 2014-11-20 WO PCT/EP2014/075065 patent/WO2015078753A1/en not_active Ceased
- 2014-11-20 JP JP2016533694A patent/JP6209683B2/ja active Active
- 2014-11-20 CN CN201480064601.7A patent/CN105793734B/zh active Active
- 2014-11-20 US US15/038,768 patent/US9759822B2/en active Active
- 2014-11-20 EP EP14802623.0A patent/EP3074791B1/en active Active
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