CN105793734B - 用于探测光子的探测设备以及其方法 - Google Patents
用于探测光子的探测设备以及其方法 Download PDFInfo
- Publication number
- CN105793734B CN105793734B CN201480064601.7A CN201480064601A CN105793734B CN 105793734 B CN105793734 B CN 105793734B CN 201480064601 A CN201480064601 A CN 201480064601A CN 105793734 B CN105793734 B CN 105793734B
- Authority
- CN
- China
- Prior art keywords
- sensor
- blr
- current
- detecting devices
- base line
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/247—Detector read-out circuitry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/17—Circuit arrangements not adapted to a particular type of detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/249—Measuring radiation intensity with semiconductor detectors specially adapted for use in SPECT or PET
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Measurement Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP13194618.8 | 2013-11-27 | ||
| EP13194618 | 2013-11-27 | ||
| PCT/EP2014/075065 WO2015078753A1 (en) | 2013-11-27 | 2014-11-20 | Detection device for detecting photons and method therefore |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105793734A CN105793734A (zh) | 2016-07-20 |
| CN105793734B true CN105793734B (zh) | 2019-05-07 |
Family
ID=49639803
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201480064601.7A Active CN105793734B (zh) | 2013-11-27 | 2014-11-20 | 用于探测光子的探测设备以及其方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US9759822B2 (enExample) |
| EP (1) | EP3074791B1 (enExample) |
| JP (1) | JP6209683B2 (enExample) |
| CN (1) | CN105793734B (enExample) |
| WO (1) | WO2015078753A1 (enExample) |
Families Citing this family (43)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104812305B (zh) * | 2012-12-27 | 2018-03-30 | 东芝医疗系统株式会社 | X射线ct装置以及控制方法 |
| CN105143918A (zh) * | 2013-04-24 | 2015-12-09 | 皇家飞利浦有限公司 | 具有校正单元的脉冲处理电路 |
| EP2871496B1 (en) | 2013-11-12 | 2020-01-01 | Samsung Electronics Co., Ltd | Radiation detector and computed tomography apparatus using the same |
| JP2015180859A (ja) * | 2014-03-05 | 2015-10-15 | 株式会社東芝 | フォトンカウンティングct装置 |
| US10159450B2 (en) * | 2014-10-01 | 2018-12-25 | Toshiba Medical Systems Corporation | X-ray CT apparatus including a photon-counting detector, and an image processing apparatus and an image processing method for correcting detection signals detected by the photon-counting detector |
| EP3161522B1 (en) * | 2014-12-05 | 2018-02-28 | Koninklijke Philips N.V. | X-ray detector device for inclined angle x-ray radiation |
| KR101725099B1 (ko) * | 2014-12-05 | 2017-04-26 | 삼성전자주식회사 | 컴퓨터 단층 촬영장치 및 그 제어방법 |
| US10660589B2 (en) * | 2014-12-16 | 2020-05-26 | Koninklijke Philips N.V. | Baseline shift determination for a photon detector |
| US9757085B2 (en) * | 2015-02-25 | 2017-09-12 | Toshiba Medical Systems Corporation | Method for identifying and processing detector polarization in photon-counting spectral X-ray detectors |
| US10098595B2 (en) * | 2015-08-06 | 2018-10-16 | Texas Instruments Incorporated | Low power photon counting system |
| EP3350624B1 (en) | 2015-09-18 | 2019-11-06 | Koninklijke Philips N.V. | Correcting photon counts in a photon counting x-ray radiation detection system |
| US11099279B2 (en) | 2015-09-18 | 2021-08-24 | Koninklijke Philips N.V. | Processing of a corrected X-ray detector signal |
| US10117626B2 (en) * | 2015-09-29 | 2018-11-06 | General Electric Company | Apparatus and method for pile-up correction in photon-counting detector |
| KR102605320B1 (ko) * | 2016-08-31 | 2023-11-23 | 프리스매틱 센서즈 에이비 | 컨버터의 상대적인 이득 및 오프셋 추정을 위한 방법 및 시스템 |
| EP3532873B1 (en) * | 2016-10-27 | 2021-06-23 | Shenzhen Xpectvision Technology Co., Ltd. | Dark noise compensation in a radiation detector |
| CN106656390B (zh) * | 2016-11-15 | 2018-10-30 | 武汉中派科技有限责任公司 | 用于测量光子时间信息的装置及方法 |
| WO2018097025A1 (ja) * | 2016-11-25 | 2018-05-31 | 浜松ホトニクス株式会社 | フォトン検出器 |
| US10162066B2 (en) * | 2017-02-06 | 2018-12-25 | General Electric Company | Coincidence-enabling photon-counting detector |
| EP3385756A1 (en) * | 2017-04-06 | 2018-10-10 | Koninklijke Philips N.V. | Pulse shaper |
| US10151845B1 (en) | 2017-08-02 | 2018-12-11 | Texas Instruments Incorporated | Configurable analog-to-digital converter and processing for photon counting |
| US10024979B1 (en) | 2017-11-01 | 2018-07-17 | Texas Instruments Incorporated | Photon counting with coincidence detection |
| US20190154852A1 (en) * | 2017-11-16 | 2019-05-23 | NueVue Solutions, Inc. | Analog Direct Digital X-Ray Photon Counting Detector For Resolving Photon Energy In Spectral X-Ray CT |
| EP3567405A1 (en) * | 2018-05-08 | 2019-11-13 | Koninklijke Philips N.V. | Photon counting spectral ct |
| EP3605151A1 (en) * | 2018-08-01 | 2020-02-05 | Koninklijke Philips N.V. | Photon counting detector |
| CN109283569B (zh) * | 2018-11-20 | 2022-05-17 | 中派科技(深圳)有限责任公司 | 用于测量光子信息的装置和光子测量设备 |
| CN113614576B (zh) * | 2018-11-29 | 2024-09-06 | Oy直接转换有限公司 | 检测器电路 |
| US10890674B2 (en) | 2019-01-15 | 2021-01-12 | Texas Instruments Incorporated | Dynamic noise shaping in a photon counting system |
| EP3754368A1 (en) * | 2019-06-19 | 2020-12-23 | Integrated Device Technology, Inc. | Amplifier system and method for operating an amplifier system, particularly for an optical receiver system of a light detection and ranging system |
| EP3832323B1 (en) * | 2019-12-04 | 2024-03-20 | Nxp B.V. | A leakage compensation circuit for a capacitive or resistive measurement device |
| EP3842839A1 (en) * | 2019-12-27 | 2021-06-30 | Koninklijke Philips N.V. | Compensation of polarization effects in photon counting detectors |
| US12468050B2 (en) * | 2020-01-27 | 2025-11-11 | The Johns Hopkins University | Direct energy windowing for photon counting detectors |
| DE102020114906B4 (de) * | 2020-06-04 | 2023-06-29 | Bender Gmbh & Co. Kg | Schutzkontaktsteckdose und Verfahren zur Isolationsfehlerlokalisierung in einem ungeerdeten Stromversorgungssystem mit Isolationsüberwachung |
| JP2021194354A (ja) * | 2020-06-17 | 2021-12-27 | 株式会社日立製作所 | 放射線撮像装置 |
| CN116507283A (zh) * | 2020-09-18 | 2023-07-28 | 美国亚德诺半导体公司 | 用于光子计数计算机断层扫描的δ调制基线恢复 |
| WO2022122545A1 (en) * | 2020-12-09 | 2022-06-16 | Ams International Ag | Electric circuitry for baseline extraction in a photon counting system |
| CN114822616B (zh) * | 2021-01-18 | 2025-10-28 | 中芯国际集成电路制造(天津)有限公司 | 灵敏放大器、存储器以及存储器的工作方法 |
| GB202105196D0 (en) * | 2021-04-12 | 2021-05-26 | Ams Int Ag | Baseline restorer circuit |
| JP7703045B2 (ja) * | 2021-05-03 | 2025-07-04 | アーエムエス インターナショナル アーゲー | 電磁放射センサ応用例のためのフロントエンド電子回路 |
| US12161498B2 (en) * | 2021-05-11 | 2024-12-10 | Analog Devices, Inc. | Baseline restoration technique for photon counting computed tomography using active reference |
| US12287437B2 (en) | 2022-01-19 | 2025-04-29 | Analog Devices, Inc. | Quantitative pulse selection for photon-counting computed tomography scanning systems |
| US12411253B1 (en) * | 2022-11-14 | 2025-09-09 | Ut-Battelle, Llc | Pulse shape discrimination system for high density imaging |
| EP4564063A1 (en) * | 2023-11-30 | 2025-06-04 | Teledyne Dalsa B.V. | Detector pixel and energy-resolving photon counting detector |
| CN118944607B (zh) * | 2024-10-12 | 2024-12-10 | 南京大学 | 复位式电荷灵敏放大电路、数据信号的放大及复位方法 |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6028313A (en) * | 1997-12-31 | 2000-02-22 | Mcdaniel; David L. | Direct conversion photon detector |
| US20040027183A1 (en) * | 2003-04-17 | 2004-02-12 | Concorde Microsystems, Inc. | Amplitude and rise-time sensitive timing-shaping filters with built-in pulse-tail cancellation for high count-rate operation |
| CN101558325A (zh) * | 2006-12-13 | 2009-10-14 | 皇家飞利浦电子股份有限公司 | 用于对x射线光子进行计数的装置、成像设备和方法 |
| CN101680954A (zh) * | 2007-06-01 | 2010-03-24 | 皇家飞利浦电子股份有限公司 | 谱光子计数探测器 |
| CN101680955A (zh) * | 2007-06-19 | 2010-03-24 | 皇家飞利浦电子股份有限公司 | 谱光子计数探测器 |
| CN101680956A (zh) * | 2007-06-19 | 2010-03-24 | 皇家飞利浦电子股份有限公司 | 用于多谱光子计数读出电路的数字脉冲处理 |
| US20100172467A1 (en) * | 2007-08-03 | 2010-07-08 | Koninklijke Philips Electronics N.V. | Apparatus and method for generating countable pulses from impinging x-ray photons; and corresponding imaging device |
| CN102016637A (zh) * | 2008-04-30 | 2011-04-13 | 皇家飞利浦电子股份有限公司 | 计数探测器 |
| WO2013057645A2 (en) * | 2011-10-19 | 2013-04-25 | Koninklijke Philips Electronics N.V. | Photon counting detector |
| CN103109205A (zh) * | 2011-07-07 | 2013-05-15 | 株式会社东芝 | 光子计数型图像检测器、x射线诊断装置、以及x射线计算机断层装置 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6609075B1 (en) | 2001-06-04 | 2003-08-19 | William K. Warburton | Method and apparatus for baseline correction in x-ray and nuclear spectroscopy systems |
| CN101228437A (zh) * | 2005-07-22 | 2008-07-23 | 皇家飞利浦电子股份有限公司 | 采用多色光谱的x射线探测器成像 |
| JP2007089922A (ja) * | 2005-09-29 | 2007-04-12 | Toshiba Corp | X線画像診断装置、x線検出装置、及びx線投影データの補正方法 |
| WO2011002452A1 (en) | 2009-06-30 | 2011-01-06 | Analogic Corporation | Enhanced photon detection for scanner |
| FR2956216B1 (fr) * | 2010-02-08 | 2012-04-20 | Commissariat Energie Atomique | Dispositif de detection de rayonnements photoniques, et procedes de dimensionnement et de fonctionnement d'un tel dispositif |
| CN103314307B (zh) | 2011-01-10 | 2016-04-13 | 皇家飞利浦电子股份有限公司 | 用于探测由辐射源发射的光子的探测装置 |
| JP2013128698A (ja) * | 2011-12-22 | 2013-07-04 | Shimadzu Corp | 二次元アレイx線検出器におけるゲイン補正方法およびx線撮影装置 |
| US8907290B2 (en) * | 2012-06-08 | 2014-12-09 | General Electric Company | Methods and systems for gain calibration of gamma ray detectors |
| EP2898349B1 (en) * | 2012-09-18 | 2019-09-04 | Koninklijke Philips N.V. | Direct conversion photon counting detector |
| BR112015012779A2 (pt) * | 2012-12-04 | 2017-07-11 | Koninklijke Philips Nv | método de correção de imagem das informações de imagens de raios x, aparelho para correção de imagem das informações de imagens de raios x, sistema de raios x, uso de um aparelho, meio legível por computador, e elemento de programa para correção de imagem das informações de imagens de raios x |
| CN104838287B (zh) | 2012-12-12 | 2018-08-17 | 皇家飞利浦有限公司 | 用于光子计数探测器的自适应持续电流补偿 |
-
2014
- 2014-11-20 WO PCT/EP2014/075065 patent/WO2015078753A1/en not_active Ceased
- 2014-11-20 EP EP14802623.0A patent/EP3074791B1/en active Active
- 2014-11-20 JP JP2016533694A patent/JP6209683B2/ja active Active
- 2014-11-20 US US15/038,768 patent/US9759822B2/en active Active
- 2014-11-20 CN CN201480064601.7A patent/CN105793734B/zh active Active
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6028313A (en) * | 1997-12-31 | 2000-02-22 | Mcdaniel; David L. | Direct conversion photon detector |
| US20040027183A1 (en) * | 2003-04-17 | 2004-02-12 | Concorde Microsystems, Inc. | Amplitude and rise-time sensitive timing-shaping filters with built-in pulse-tail cancellation for high count-rate operation |
| CN101558325A (zh) * | 2006-12-13 | 2009-10-14 | 皇家飞利浦电子股份有限公司 | 用于对x射线光子进行计数的装置、成像设备和方法 |
| CN101680954A (zh) * | 2007-06-01 | 2010-03-24 | 皇家飞利浦电子股份有限公司 | 谱光子计数探测器 |
| CN101680955A (zh) * | 2007-06-19 | 2010-03-24 | 皇家飞利浦电子股份有限公司 | 谱光子计数探测器 |
| CN101680956A (zh) * | 2007-06-19 | 2010-03-24 | 皇家飞利浦电子股份有限公司 | 用于多谱光子计数读出电路的数字脉冲处理 |
| US20100172467A1 (en) * | 2007-08-03 | 2010-07-08 | Koninklijke Philips Electronics N.V. | Apparatus and method for generating countable pulses from impinging x-ray photons; and corresponding imaging device |
| CN102016637A (zh) * | 2008-04-30 | 2011-04-13 | 皇家飞利浦电子股份有限公司 | 计数探测器 |
| CN103109205A (zh) * | 2011-07-07 | 2013-05-15 | 株式会社东芝 | 光子计数型图像检测器、x射线诊断装置、以及x射线计算机断层装置 |
| WO2013057645A2 (en) * | 2011-10-19 | 2013-04-25 | Koninklijke Philips Electronics N.V. | Photon counting detector |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2016540208A (ja) | 2016-12-22 |
| JP6209683B2 (ja) | 2017-10-04 |
| US9759822B2 (en) | 2017-09-12 |
| EP3074791B1 (en) | 2019-06-19 |
| US20160377745A1 (en) | 2016-12-29 |
| WO2015078753A1 (en) | 2015-06-04 |
| CN105793734A (zh) | 2016-07-20 |
| EP3074791A1 (en) | 2016-10-05 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN105793734B (zh) | 用于探测光子的探测设备以及其方法 | |
| EP2929372B1 (en) | Method and apparatus for image correction of x-ray image information | |
| CN104854475B (zh) | 具有脉冲整形器的探测器 | |
| CN105765405B (zh) | 用于探测光子的探测设备和其方法 | |
| US6509565B2 (en) | Discriminator circuit for a charge detector | |
| Fischer et al. | A photon counting pixel chip with energy windowing | |
| CN109477903B (zh) | 光谱辐射探测器中的改进的光子计数 | |
| Ogawa et al. | Development of an energy-binned photon-counting detector for X-ray and gamma-ray imaging | |
| EP2176684A2 (en) | Apparatus and method for generating countable pulses from impinging x-ray photons, and corresponding imaging device | |
| JP5427655B2 (ja) | 放射線計測装置,核医学診断装置 | |
| US6586743B1 (en) | X-ray detector having sensors and evaluation units | |
| US6420710B1 (en) | Device for spectrometric measurement in the field of gamma photon detection | |
| US20040094720A1 (en) | Direct detection of high-energy single photons | |
| US7576326B2 (en) | Devices and methods for detecting and analyzing radiation | |
| Vernon et al. | ASIC for high rate 3D position sensitive detectors | |
| Lau et al. | Signal conditioning technique for position sensitive photodetectors to manipulate pixelated crystal identification capabilities | |
| US12360258B2 (en) | Radiation image sensor | |
| Fink et al. | Comparison of pixelated CdZnTe, CdTe and Si sensors with the simultaneously counting and integrating CIX chip | |
| KR100871615B1 (ko) | 반도체 검출장치 및 검출방법 | |
| Eames | Pulse deficit correction trigger for planar CdTe based gamma-ray spectrometer | |
| Wang et al. | Signal Pile-Up Mechanisms and Suppression Methods in SiPM Array Gamma Spectroscopy Detectors | |
| Jones | A Readout ASIC for CZT Detectors |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |