CN105793734B - 用于探测光子的探测设备以及其方法 - Google Patents

用于探测光子的探测设备以及其方法 Download PDF

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CN105793734B
CN105793734B CN201480064601.7A CN201480064601A CN105793734B CN 105793734 B CN105793734 B CN 105793734B CN 201480064601 A CN201480064601 A CN 201480064601A CN 105793734 B CN105793734 B CN 105793734B
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CN105793734A (zh
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H·德尔
C·赫尔曼
F·贝格纳
R·斯特德曼布克
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Koninklijke Philips NV
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/24Measuring radiation intensity with semiconductor detectors
    • G01T1/247Detector read-out circuitry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/17Circuit arrangements not adapted to a particular type of detector
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/24Measuring radiation intensity with semiconductor detectors
    • G01T1/249Measuring radiation intensity with semiconductor detectors specially adapted for use in SPECT or PET

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
CN201480064601.7A 2013-11-27 2014-11-20 用于探测光子的探测设备以及其方法 Active CN105793734B (zh)

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EP13194618.8 2013-11-27
EP13194618 2013-11-27
PCT/EP2014/075065 WO2015078753A1 (en) 2013-11-27 2014-11-20 Detection device for detecting photons and method therefore

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CN105793734B true CN105793734B (zh) 2019-05-07

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EP (1) EP3074791B1 (enExample)
JP (1) JP6209683B2 (enExample)
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WO (1) WO2015078753A1 (enExample)

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CN116507283A (zh) * 2020-09-18 2023-07-28 美国亚德诺半导体公司 用于光子计数计算机断层扫描的δ调制基线恢复
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JP2016540208A (ja) 2016-12-22
JP6209683B2 (ja) 2017-10-04
US9759822B2 (en) 2017-09-12
EP3074791B1 (en) 2019-06-19
US20160377745A1 (en) 2016-12-29
WO2015078753A1 (en) 2015-06-04
CN105793734A (zh) 2016-07-20
EP3074791A1 (en) 2016-10-05

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