JP2016537641A5 - - Google Patents

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Publication number
JP2016537641A5
JP2016537641A5 JP2016539630A JP2016539630A JP2016537641A5 JP 2016537641 A5 JP2016537641 A5 JP 2016537641A5 JP 2016539630 A JP2016539630 A JP 2016539630A JP 2016539630 A JP2016539630 A JP 2016539630A JP 2016537641 A5 JP2016537641 A5 JP 2016537641A5
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JP
Japan
Prior art keywords
semiconductor wafer
weight
mass
reference mass
weighing device
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Application number
JP2016539630A
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English (en)
Japanese (ja)
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JP6449889B2 (ja
JP2016537641A (ja
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Priority claimed from GBGB1315715.1A external-priority patent/GB201315715D0/en
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Publication of JP2016537641A publication Critical patent/JP2016537641A/ja
Publication of JP2016537641A5 publication Critical patent/JP2016537641A5/ja
Application granted granted Critical
Publication of JP6449889B2 publication Critical patent/JP6449889B2/ja
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JP2016539630A 2013-09-04 2014-08-21 半導体ウェハの質量に関する情報を判定するための方法および装置 Active JP6449889B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB1315715.1 2013-09-04
GBGB1315715.1A GB201315715D0 (en) 2013-09-04 2013-09-04 Method and device for determining information relating to the mass of a semiconductor wafer
PCT/GB2014/052573 WO2015033108A1 (en) 2013-09-04 2014-08-21 Method and device for determining information relating to the mass of a semiconductor wafer

Publications (3)

Publication Number Publication Date
JP2016537641A JP2016537641A (ja) 2016-12-01
JP2016537641A5 true JP2016537641A5 (cg-RX-API-DMAC7.html) 2017-03-23
JP6449889B2 JP6449889B2 (ja) 2019-01-09

Family

ID=49397261

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016539630A Active JP6449889B2 (ja) 2013-09-04 2014-08-21 半導体ウェハの質量に関する情報を判定するための方法および装置

Country Status (7)

Country Link
US (1) US9903750B2 (cg-RX-API-DMAC7.html)
EP (1) EP3042164B1 (cg-RX-API-DMAC7.html)
JP (1) JP6449889B2 (cg-RX-API-DMAC7.html)
GB (1) GB201315715D0 (cg-RX-API-DMAC7.html)
SG (1) SG11201601091PA (cg-RX-API-DMAC7.html)
TW (2) TWI688021B (cg-RX-API-DMAC7.html)
WO (1) WO2015033108A1 (cg-RX-API-DMAC7.html)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB201315715D0 (en) * 2013-09-04 2013-10-16 Metryx Ltd Method and device for determining information relating to the mass of a semiconductor wafer
GB201405926D0 (en) * 2014-04-02 2014-05-14 Metryx Ltd Semiconductor wafer weighing apparatus and methods
JP6953242B2 (ja) * 2017-09-06 2021-10-27 株式会社ディスコ 高さ検出装置、及びレーザー加工装置
GB201806377D0 (en) * 2018-04-19 2018-06-06 Metryx Ltd Semiconductor wafer mass metrology apparatus and semiconductor wafer mass metrology method
CN113029070B (zh) * 2019-12-25 2023-04-18 中国科学院微电子研究所 一种监测原子层沉积薄膜生长厚度的方法

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2601165C3 (de) 1976-01-14 1979-06-28 Sartorius Gmbh, 3400 Goettingen Eichfähige, elektromagnetisch kompensierende Waage
JP2913962B2 (ja) * 1991-11-27 1999-06-28 株式会社島津製作所 板状試料測定用天びん
JP2576338B2 (ja) * 1992-07-31 1997-01-29 株式会社島津製作所 ウエハ自動秤量システム
US5625170A (en) 1994-01-18 1997-04-29 Nanometrics Incorporated Precision weighing to monitor the thickness and uniformity of deposited or etched thin film
JP3652021B2 (ja) * 1996-07-23 2005-05-25 三洋機工株式会社 重量測定方法
JP4420646B2 (ja) * 2003-10-09 2010-02-24 花王株式会社 荷重測定装置
US7256866B2 (en) * 2004-10-12 2007-08-14 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7804582B2 (en) * 2006-07-28 2010-09-28 Asml Netherlands B.V. Lithographic apparatus, method of calibrating a lithographic apparatus and device manufacturing method
GB0620196D0 (en) * 2006-10-11 2006-11-22 Metryx Ltd Measuring apparatus
GB0719460D0 (en) * 2007-10-04 2007-11-14 Metryx Ltd Measurement apparatus and method
GB0719469D0 (en) * 2007-10-04 2007-11-14 Metryx Ltd Measurement apparatus and method
US7989714B2 (en) * 2007-10-05 2011-08-02 Neopost Technologies High capacity and high resolution scale
GB0800227D0 (en) * 2008-01-07 2008-02-13 Metryx Ltd Method of controlling semiconductor device fabrication
JP2010129729A (ja) * 2008-11-27 2010-06-10 Kyocera Corp センサ保持用基板およびこれを用いたセンサ付き基板、センサ保持用基板の製造方法。
JP5289918B2 (ja) * 2008-12-10 2013-09-11 アンリツ産機システム株式会社 重量選別装置
US20100242831A1 (en) * 2009-03-31 2010-09-30 Memc Electronic Materials, Inc. Methods for weighing a pulled object having a changing weight
JP2013088393A (ja) * 2011-10-21 2013-05-13 Daihatsu Motor Co Ltd 重量差測定装置
PL2690415T5 (pl) * 2012-07-23 2022-10-10 Mettler-Toledo Gmbh Siłomierz z ciężarkiem przesuwnym
GB201315715D0 (en) * 2013-09-04 2013-10-16 Metryx Ltd Method and device for determining information relating to the mass of a semiconductor wafer

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