JP2016532099A - 画像化の同期 - Google Patents

画像化の同期 Download PDF

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Publication number
JP2016532099A
JP2016532099A JP2016522686A JP2016522686A JP2016532099A JP 2016532099 A JP2016532099 A JP 2016532099A JP 2016522686 A JP2016522686 A JP 2016522686A JP 2016522686 A JP2016522686 A JP 2016522686A JP 2016532099 A JP2016532099 A JP 2016532099A
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JP
Japan
Prior art keywords
image
image frame
area
data processing
processing device
Prior art date
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Pending
Application number
JP2016522686A
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English (en)
Japanese (ja)
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JP2016532099A5 (enExample
Inventor
リトニエミ ジャリ
リトニエミ ジャリ
Original Assignee
プロセメク オーワイ
プロセメク オーワイ
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Application filed by プロセメク オーワイ, プロセメク オーワイ filed Critical プロセメク オーワイ
Publication of JP2016532099A publication Critical patent/JP2016532099A/ja
Publication of JP2016532099A5 publication Critical patent/JP2016532099A5/ja
Pending legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N7/00—Television systems
    • H04N7/18—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast
    • H04N7/183—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast for receiving images from a single remote source
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • D—TEXTILES; PAPER
    • D21—PAPER-MAKING; PRODUCTION OF CELLULOSE
    • D21G—CALENDERS; ACCESSORIES FOR PAPER-MAKING MACHINES
    • D21G9/00—Other accessories for paper-making machines
    • D21G9/0009—Paper-making control systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/34—Paper
    • G01N33/346—Paper sheets
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/40—Analysis of texture
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N1/00—Scanning, transmission or reproduction of documents or the like, e.g. facsimile transmission; Details thereof
    • H04N1/00002—Diagnosis, testing or measuring; Detecting, analysing or monitoring not otherwise provided for
    • H04N1/00005—Diagnosis, testing or measuring; Detecting, analysing or monitoring not otherwise provided for relating to image data
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N1/00—Scanning, transmission or reproduction of documents or the like, e.g. facsimile transmission; Details thereof
    • H04N1/00127—Connection or combination of a still picture apparatus with another apparatus, e.g. for storage, processing or transmission of still picture signals or of information associated with a still picture
    • H04N1/00249—Connection or combination of a still picture apparatus with another apparatus, e.g. for storage, processing or transmission of still picture signals or of information associated with a still picture with a photographic apparatus, e.g. a photographic printer or a projector
    • H04N1/00251—Connection or combination of a still picture apparatus with another apparatus, e.g. for storage, processing or transmission of still picture signals or of information associated with a still picture with a photographic apparatus, e.g. a photographic printer or a projector with an apparatus for taking photographic images, e.g. a camera
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/70—Circuitry for compensating brightness variation in the scene
    • H04N23/73—Circuitry for compensating brightness variation in the scene by influencing the exposure time
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G01N2021/889—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques providing a bare video image, i.e. without visual measurement aids
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30124—Fabrics; Textile; Paper

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Theoretical Computer Science (AREA)
  • Multimedia (AREA)
  • Textile Engineering (AREA)
  • Quality & Reliability (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Biomedical Technology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Studio Devices (AREA)
  • Image Analysis (AREA)
  • General Factory Administration (AREA)
  • Image Processing (AREA)
  • Closed-Circuit Television Systems (AREA)
JP2016522686A 2013-07-05 2014-07-07 画像化の同期 Pending JP2016532099A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FI20135749 2013-07-05
FI20135749A FI128403B (en) 2013-07-05 2013-07-05 Synchronizing image capture
PCT/FI2014/050564 WO2015001196A1 (en) 2013-07-05 2014-07-07 Synchronization of imaging

Publications (2)

Publication Number Publication Date
JP2016532099A true JP2016532099A (ja) 2016-10-13
JP2016532099A5 JP2016532099A5 (enExample) 2017-08-17

Family

ID=52143169

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016522686A Pending JP2016532099A (ja) 2013-07-05 2014-07-07 画像化の同期

Country Status (7)

Country Link
US (1) US9532015B2 (enExample)
EP (1) EP3017425B1 (enExample)
JP (1) JP2016532099A (enExample)
KR (1) KR102038181B1 (enExample)
CN (1) CN105917379B (enExample)
FI (1) FI128403B (enExample)
WO (1) WO2015001196A1 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20160364525A1 (en) * 2015-06-09 2016-12-15 Toshiba Medical Systems Corporation Medical image processing apparatus and medical image transfer system
FI20155643A (fi) 2015-09-08 2017-03-09 Procemex Oy Ltd Fluoresoivan nesteen optinen havainnointi puukuiturainasta
FI128850B (en) 2016-05-06 2021-01-29 Procemex Oy Ltd A machine vision method and system for monitoring manufacturing processes
FI128735B (en) * 2016-05-06 2020-11-13 Procemex Oy Ltd Procedure and system for computer vision
US11920299B2 (en) 2020-03-06 2024-03-05 Ibs Of America Formation detection system and a process of controlling
FI129971B (en) 2020-06-24 2022-11-30 Procemex Oy Ltd The intelligent synchronization method of the web monitoring system
CN113445201B (zh) * 2021-07-20 2022-09-27 大易智慧信息科技(苏州)有限公司 基于相机阵列的双针床经编机断丝在线检测系统及其方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05240805A (ja) * 1992-02-27 1993-09-21 Kawasaki Steel Corp 表面欠陥検査装置
JPH1065940A (ja) * 1996-06-13 1998-03-06 Olympus Optical Co Ltd 撮像装置
JPH1194760A (ja) * 1997-09-24 1999-04-09 Olympus Optical Co Ltd 欠陥検出用顕微鏡
JP2014197762A (ja) * 2013-03-29 2014-10-16 オムロン株式会社 画像処理システムおよび画像処理プログラム

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JP3015325B2 (ja) * 1996-06-26 2000-03-06 東芝エンジニアリング株式会社 スジキズ検査方法及びその装置
US5935285A (en) * 1997-12-30 1999-08-10 Coors Brewing Company Method for inspecting manufactured articles
US6947587B1 (en) * 1998-04-21 2005-09-20 Hitachi, Ltd. Defect inspection method and apparatus
EP0979995A1 (en) 1998-08-12 2000-02-16 Hildeco OY Ltd. Method and system for monitoring a paper web, a paper pulp or a wire travelling in a paper machine
FI990159L (fi) * 1999-01-28 2000-07-29 Valmet Automation Inc Menetelmä kuiturainan laadun valvomiseksi
FI114741B (fi) * 2001-05-11 2004-12-15 Metso Automation Oy Lämpökuvaukseen perustuva laadun- ja kunnonvalvontamenetelmä
DE10260464A1 (de) * 2002-12-21 2004-07-01 Voith Paper Patent Gmbh Verfahren und Vorrichtung zum Betreiben einer Maschine zum Herstellen und/oder Veredeln einer Materialbahn
US7027934B2 (en) * 2003-09-24 2006-04-11 3M Innovative Properties Company Apparatus and method for automated web inspection
US20050117017A1 (en) 2003-12-01 2005-06-02 Baer Richard L. System and method for imaging regions of interest
JP2005308464A (ja) * 2004-04-20 2005-11-04 Dainippon Screen Mfg Co Ltd 欠陥検出装置および欠陥検出方法
EP1630550A1 (en) * 2004-08-27 2006-03-01 Moller & Devicon A/S Methods and apparatuses of detecting foreign particles or faults in a plurality of filled containers
WO2006067547A1 (en) * 2004-12-23 2006-06-29 Nokia Corporation Method for extracting of multiple sub-windows of a scanning area by means of a digital video camera
CN101208042B (zh) * 2005-06-28 2010-11-17 柯尼卡美能达医疗印刷器材株式会社 异常阴影候选检测方法、异常阴影候选检测装置
JP2007049673A (ja) * 2005-07-13 2007-02-22 Ricoh Co Ltd 画像読み取り装置、画像形成装置、画像検査装置及び画像形成システム
JP2007240432A (ja) * 2006-03-10 2007-09-20 Omron Corp 欠陥検査装置および欠陥検査方法
US8014586B2 (en) * 2007-05-24 2011-09-06 Applied Vision Corporation Apparatus and methods for container inspection
WO2009003702A1 (de) * 2007-07-04 2009-01-08 Thermosensorik Gmbh Verfahren zur automatischen inspektion einer schweissnaht mittels wärmefluss-thermograhpie
JP5344492B2 (ja) * 2008-07-18 2013-11-20 国立大学法人東北大学 構造物欠陥の映像化方法、構造物欠陥の映像化装置、気泡の映像化方法および気泡や病変部の映像化装置
AT508159B1 (de) 2009-06-05 2010-11-15 Starlinger & Co Gmbh Fehlerstellenerkennung
US20110141269A1 (en) 2009-12-16 2011-06-16 Stephen Michael Varga Systems And Methods For Monitoring On-Line Webs Using Line Scan Cameras
US8345949B2 (en) * 2010-03-09 2013-01-01 General Electric Company Sequential approach for automatic defect recognition
FR2978831A1 (fr) * 2011-08-05 2013-02-08 St Microelectronics Sa Detection de defauts par imagerie thermique frequentielle.
US20120293623A1 (en) * 2011-05-17 2012-11-22 Gii Acquisition, Llc Dba General Inspection, Llc Method and system for inspecting small manufactured objects at a plurality of inspection stations and sorting the inspected objects
JP2013190309A (ja) * 2012-03-13 2013-09-26 Toshiba Corp 欠陥検査装置
JP5944189B2 (ja) * 2012-03-15 2016-07-05 株式会社東芝 マスク基板の欠陥検査方法及び欠陥検査装置、フォトマスクの製造方法及び半導体装置の製造方法
US9390491B2 (en) * 2013-01-30 2016-07-12 Taiwan Semiconductor Manufacturing Co., Ltd. System and method for automatic quality control for assembly line processes

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05240805A (ja) * 1992-02-27 1993-09-21 Kawasaki Steel Corp 表面欠陥検査装置
JPH1065940A (ja) * 1996-06-13 1998-03-06 Olympus Optical Co Ltd 撮像装置
JPH1194760A (ja) * 1997-09-24 1999-04-09 Olympus Optical Co Ltd 欠陥検出用顕微鏡
JP2014197762A (ja) * 2013-03-29 2014-10-16 オムロン株式会社 画像処理システムおよび画像処理プログラム

Also Published As

Publication number Publication date
FI20135749L (fi) 2015-01-06
CN105917379A (zh) 2016-08-31
FI20135749A7 (fi) 2015-01-06
CN105917379B (zh) 2019-10-11
EP3017425B1 (en) 2024-03-20
FI128403B (en) 2020-04-30
WO2015001196A1 (en) 2015-01-08
EP3017425C0 (en) 2024-03-20
KR102038181B1 (ko) 2019-10-30
US20160142682A1 (en) 2016-05-19
US9532015B2 (en) 2016-12-27
KR20160030116A (ko) 2016-03-16
EP3017425A1 (en) 2016-05-11
EP3017425A4 (en) 2018-08-15

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