JP2016529397A5 - - Google Patents

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Publication number
JP2016529397A5
JP2016529397A5 JP2016527066A JP2016527066A JP2016529397A5 JP 2016529397 A5 JP2016529397 A5 JP 2016529397A5 JP 2016527066 A JP2016527066 A JP 2016527066A JP 2016527066 A JP2016527066 A JP 2016527066A JP 2016529397 A5 JP2016529397 A5 JP 2016529397A5
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JP
Japan
Prior art keywords
fluid
gaps
gap
sheet
coating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
JP2016527066A
Other languages
English (en)
Japanese (ja)
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JP2016529397A (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/US2014/046828 external-priority patent/WO2015009811A1/en
Publication of JP2016529397A publication Critical patent/JP2016529397A/ja
Publication of JP2016529397A5 publication Critical patent/JP2016529397A5/ja
Ceased legal-status Critical Current

Links

JP2016527066A 2013-07-16 2014-07-16 シートのコーティング方法 Ceased JP2016529397A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201361846675P 2013-07-16 2013-07-16
US61/846,675 2013-07-16
PCT/US2014/046828 WO2015009811A1 (en) 2013-07-16 2014-07-16 Sheet coating method

Publications (2)

Publication Number Publication Date
JP2016529397A JP2016529397A (ja) 2016-09-23
JP2016529397A5 true JP2016529397A5 (enExample) 2017-08-31

Family

ID=52346697

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016527066A Ceased JP2016529397A (ja) 2013-07-16 2014-07-16 シートのコーティング方法

Country Status (6)

Country Link
US (1) US10072333B2 (enExample)
EP (1) EP3022329A4 (enExample)
JP (1) JP2016529397A (enExample)
KR (1) KR20160031517A (enExample)
CN (1) CN105392919B (enExample)
WO (1) WO2015009811A1 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10741735B2 (en) 2014-06-02 2020-08-11 3M Innovative Properties Company LED with remote phosphor and shell reflector
CN212460103U (zh) 2017-10-18 2021-02-02 3M创新有限公司 光纤连接系统
CN212255779U (zh) 2017-10-18 2020-12-29 3M创新有限公司 光纤连接系统

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3103186B2 (ja) * 1992-03-19 2000-10-23 富士通株式会社 原子層エピタキシー装置および原子層エピタキシー法
US20030049372A1 (en) 1997-08-11 2003-03-13 Cook Robert C. High rate deposition at low pressures in a small batch reactor
US6812157B1 (en) * 1999-06-24 2004-11-02 Prasad Narhar Gadgil Apparatus for atomic layer chemical vapor deposition
TW496907B (en) * 2000-04-14 2002-08-01 Asm Microchemistry Oy Method and apparatus of growing a thin film onto a substrate
JP3670628B2 (ja) * 2002-06-20 2005-07-13 株式会社東芝 成膜方法、成膜装置、および半導体装置の製造方法
US20040157047A1 (en) 2003-02-06 2004-08-12 Ali Mehrabi Continuous process for manufacturing electrostatically self-assembled coatings
US20050268848A1 (en) 2004-04-28 2005-12-08 Nanodynamics, Inc Atomic layer deposition apparatus and process
JP4595702B2 (ja) * 2004-07-15 2010-12-08 東京エレクトロン株式会社 成膜方法、成膜装置及び記憶媒体
DE102004056170A1 (de) * 2004-08-06 2006-03-16 Aixtron Ag Vorrichtung und Verfahren zur chemischen Gasphasenabscheidung mit hohem Durchsatz
US7407892B2 (en) * 2005-05-11 2008-08-05 Micron Technology, Inc. Deposition methods
JP2009500857A (ja) * 2005-07-08 2009-01-08 アヴィザ テクノロジー インコーポレイテッド シリコン含有膜の堆積方法
TWI267994B (en) * 2005-08-24 2006-12-01 Advanced Semiconductor Eng Package structure and manufacturing process thereof
US20070065578A1 (en) * 2005-09-21 2007-03-22 Applied Materials, Inc. Treatment processes for a batch ALD reactor
US8993055B2 (en) * 2005-10-27 2015-03-31 Asm International N.V. Enhanced thin film deposition
US7863198B2 (en) * 2006-05-18 2011-01-04 Micron Technology, Inc. Method and device to vary growth rate of thin films over semiconductor structures
JP4228008B2 (ja) * 2006-08-23 2009-02-25 エルピーダメモリ株式会社 半導体装置の製造方法
EP2082075B1 (en) 2006-09-08 2017-05-17 Massachusetts Institute of Technology Automated layer by layer spray technology
US7816278B2 (en) 2008-03-28 2010-10-19 Tokyo Electron Limited In-situ hybrid deposition of high dielectric constant films using atomic layer deposition and chemical vapor deposition
US9328417B2 (en) * 2008-11-01 2016-05-03 Ultratech, Inc. System and method for thin film deposition
EP2281921A1 (en) * 2009-07-30 2011-02-09 Nederlandse Organisatie voor toegepast -natuurwetenschappelijk onderzoek TNO Apparatus and method for atomic layer deposition.
US8348390B2 (en) * 2011-05-18 2013-01-08 Xerox Corporation Enhancing superoleophobicity and reducing adhesion through multi-scale roughness by ALD/CVD technique in inkjet application
US20130129922A1 (en) * 2011-11-21 2013-05-23 Qualcomm Mems Technologies, Inc. Batch processing for electromechanical systems and equipment for same

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