JP2016211038A5 - - Google Patents

Download PDF

Info

Publication number
JP2016211038A5
JP2016211038A5 JP2015096023A JP2015096023A JP2016211038A5 JP 2016211038 A5 JP2016211038 A5 JP 2016211038A5 JP 2015096023 A JP2015096023 A JP 2015096023A JP 2015096023 A JP2015096023 A JP 2015096023A JP 2016211038 A5 JP2016211038 A5 JP 2016211038A5
Authority
JP
Japan
Prior art keywords
transition metal
gas
source gas
silicon
silicide film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2015096023A
Other languages
English (en)
Japanese (ja)
Other versions
JP2016211038A (ja
JP6503543B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2015096023A priority Critical patent/JP6503543B2/ja
Priority claimed from JP2015096023A external-priority patent/JP6503543B2/ja
Publication of JP2016211038A publication Critical patent/JP2016211038A/ja
Publication of JP2016211038A5 publication Critical patent/JP2016211038A5/ja
Application granted granted Critical
Publication of JP6503543B2 publication Critical patent/JP6503543B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2015096023A 2015-05-08 2015-05-08 遷移金属シリサイド膜、その製造方法及び製造装置並びに半導体装置 Active JP6503543B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2015096023A JP6503543B2 (ja) 2015-05-08 2015-05-08 遷移金属シリサイド膜、その製造方法及び製造装置並びに半導体装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015096023A JP6503543B2 (ja) 2015-05-08 2015-05-08 遷移金属シリサイド膜、その製造方法及び製造装置並びに半導体装置

Publications (3)

Publication Number Publication Date
JP2016211038A JP2016211038A (ja) 2016-12-15
JP2016211038A5 true JP2016211038A5 (enExample) 2018-06-21
JP6503543B2 JP6503543B2 (ja) 2019-04-24

Family

ID=57549394

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015096023A Active JP6503543B2 (ja) 2015-05-08 2015-05-08 遷移金属シリサイド膜、その製造方法及び製造装置並びに半導体装置

Country Status (1)

Country Link
JP (1) JP6503543B2 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6601365B2 (ja) 2016-07-27 2019-11-06 株式会社デンソー 制御システム
JP6893372B2 (ja) * 2017-11-09 2021-06-23 国立研究開発法人産業技術総合研究所 導電性積層体及び電子素子
CN111902912A (zh) * 2018-03-26 2020-11-06 朗姆研究公司 用于金属互连层的中间层
CN113718227B (zh) * 2020-05-25 2022-07-26 中国科学院金属研究所 一类二维层状三元化合物及其制备方法
CN116040636B (zh) * 2023-01-18 2025-02-14 湖南大学 一种Cr5Si3非层状二维材料及其制备和应用

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60178622A (ja) * 1984-02-27 1985-09-12 Fujitsu Ltd 半導体装置の製造方法
US4696834A (en) * 1986-02-28 1987-09-29 Dow Corning Corporation Silicon-containing coatings and a method for their preparation
US4684542A (en) * 1986-08-11 1987-08-04 International Business Machines Corporation Low pressure chemical vapor deposition of tungsten silicide
US4966869A (en) * 1990-05-04 1990-10-30 Spectrum Cvd, Inc. Tungsten disilicide CVD
JP3154145B2 (ja) * 1992-10-28 2001-04-09 ソニー株式会社 Cvd装置及びその装置を使用する成膜方法

Similar Documents

Publication Publication Date Title
JP2016211038A5 (enExample)
Ju et al. Tunable photocatalytic water splitting by the ferroelectric switch in a 2D AgBiP2Se6 monolayer
Vikraman et al. Improved hydrogen evolution reaction performance using MoS2–WS2 heterostructures by physicochemical process
Harb et al. Anionic or cationic S-doping in bulk anatase TiO2: insights on optical absorption from first principles calculations
Zhang et al. The role of intrinsic defects in electrocatalytic activity of monolayer VS2 basal planes for the hydrogen evolution reaction
Xu et al. Interfacial interactions of semiconductor with graphene and reduced graphene oxide: CeO2 as a case study
Li et al. Unraveling the formation mechanism of graphitic nitrogen-doping in thermally treated graphene with ammonia
Xie et al. Selective etching of graphene edges by hydrogen plasma
Yu et al. Long-range ordered and atomic-scale control of graphene hybridization by photocycloaddition
Bronneberg et al. Probing the interfacial chemistry of ultrathin ALD-grown TiO2 films: an in-line XPS study
Pham et al. Low damage pre-doping on CVD graphene/Cu using a chlorine inductively coupled plasma
Sarkar et al. Oxygen-deficient titania with adjustable band positions and defects; molecular layer deposition of hybrid organic–inorganic thin films as precursors for enhanced photocatalysis
JP2015510502A5 (enExample)
Ling et al. In situ construction of fuzzy sea‐urchin ZnIn2S4/W18O49: leveraging interfacial Z‐scheme redox sites toward cooperative electron–hole utilization in photocatalysis
MX2015010461A (es) Proceso de fluoracion y reactor.
Ngoc Van et al. Role of cyclopentadienyl ligands of group 4 precursors toward high-temperature atomic layer deposition
CN109336181A (zh) 一种二维过渡金属硫族化合物的制备方法
Liu et al. Formaldehyde adsorption and decomposition on rutile (110): A first-principles study
Romanov et al. Radical-enhanced atomic layer deposition of a tungsten oxide film with the tunable oxygen vacancy concentration
Chen et al. An ab initio study of the nickel-catalyzed transformation of amorphous carbon into graphene in rapid thermal processing
CN104651802A (zh) 一种简单使用固体氮源直接合成掺氮石墨烯的方法
Sun et al. Graphene nucleation preference at CuO defects rather than Cu2O on Cu (111): A combination of DFT calculation and experiment
JP2013035744A5 (ja) シリコン膜の作製方法及び蓄電装置の負極の作製方法
JP2015044715A5 (enExample)
KR101597585B1 (ko) 광활성 티타늄산화물의 제조방법