JP2016148520A5 - - Google Patents
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- Publication number
- JP2016148520A5 JP2016148520A5 JP2015023846A JP2015023846A JP2016148520A5 JP 2016148520 A5 JP2016148520 A5 JP 2016148520A5 JP 2015023846 A JP2015023846 A JP 2015023846A JP 2015023846 A JP2015023846 A JP 2015023846A JP 2016148520 A5 JP2016148520 A5 JP 2016148520A5
- Authority
- JP
- Japan
- Prior art keywords
- sheet
- defect
- light
- inspection apparatus
- scratch
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000007547 defect Effects 0.000 claims 29
- 238000007689 inspection Methods 0.000 claims 9
- 230000001678 irradiating effect Effects 0.000 claims 8
- 238000000034 method Methods 0.000 claims 1
- 238000000611 regression analysis Methods 0.000 claims 1
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2015023846A JP6409606B2 (ja) | 2015-02-10 | 2015-02-10 | キズ欠点検査装置およびキズ欠点検査方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2015023846A JP6409606B2 (ja) | 2015-02-10 | 2015-02-10 | キズ欠点検査装置およびキズ欠点検査方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2016148520A JP2016148520A (ja) | 2016-08-18 |
| JP2016148520A5 true JP2016148520A5 (enExample) | 2017-04-13 |
| JP6409606B2 JP6409606B2 (ja) | 2018-10-24 |
Family
ID=56691678
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2015023846A Active JP6409606B2 (ja) | 2015-02-10 | 2015-02-10 | キズ欠点検査装置およびキズ欠点検査方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP6409606B2 (enExample) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115628954A (zh) * | 2022-10-26 | 2023-01-20 | 青岛融合智能科技有限公司 | 显示光学玻璃表面划伤等级判定标样的制备方法及其应用 |
| CN116678895B (zh) * | 2023-06-13 | 2024-03-08 | 深圳市圆周检测技术有限公司 | 一种屏幕划痕检测方法、系统及存储介质 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0629864B2 (ja) * | 1988-09-08 | 1994-04-20 | 川崎製鉄株式会社 | 表面欠陥検査方法 |
| JP2004309287A (ja) * | 2003-04-07 | 2004-11-04 | Nippon Sheet Glass Co Ltd | 欠陥検出装置、および欠陥検出方法 |
| US7551274B1 (en) * | 2007-02-28 | 2009-06-23 | Lite Sentry Corporation | Defect detection lighting system and methods for large glass sheets |
-
2015
- 2015-02-10 JP JP2015023846A patent/JP6409606B2/ja active Active
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