JP2016053516A5 - - Google Patents

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JP2016053516A5
JP2016053516A5 JP2014179391A JP2014179391A JP2016053516A5 JP 2016053516 A5 JP2016053516 A5 JP 2016053516A5 JP 2014179391 A JP2014179391 A JP 2014179391A JP 2014179391 A JP2014179391 A JP 2014179391A JP 2016053516 A5 JP2016053516 A5 JP 2016053516A5
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JP
Japan
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signal
time
input
digital
trigger
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JP2014179391A
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Japanese (ja)
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JP2016053516A (ja
JP5978266B2 (ja
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Priority claimed from JP2014179391A external-priority patent/JP5978266B2/ja
Priority to JP2014179391A priority Critical patent/JP5978266B2/ja
Priority to KR1020177007596A priority patent/KR102299156B1/ko
Priority to US15/508,195 priority patent/US10962932B2/en
Priority to EP15838064.2A priority patent/EP3190468B1/en
Priority to PCT/JP2015/070858 priority patent/WO2016035469A1/ja
Priority to CN201580047263.0A priority patent/CN106716266B/zh
Priority to TW104125680A priority patent/TWI660253B/zh
Publication of JP2016053516A publication Critical patent/JP2016053516A/ja
Publication of JP2016053516A5 publication Critical patent/JP2016053516A5/ja
Publication of JP5978266B2 publication Critical patent/JP5978266B2/ja
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JP2014179391A 2014-09-03 2014-09-03 時間計測装置、時間計測方法、発光寿命計測装置、及び発光寿命計測方法 Active JP5978266B2 (ja)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP2014179391A JP5978266B2 (ja) 2014-09-03 2014-09-03 時間計測装置、時間計測方法、発光寿命計測装置、及び発光寿命計測方法
PCT/JP2015/070858 WO2016035469A1 (ja) 2014-09-03 2015-07-22 時間計測装置、時間計測方法、発光寿命計測装置、及び発光寿命計測方法
US15/508,195 US10962932B2 (en) 2014-09-03 2015-07-22 Time measurement device, time measurement method, light-emission-lifetime measurement device, and light-emission-lifetime measurement method
EP15838064.2A EP3190468B1 (en) 2014-09-03 2015-07-22 Time measurement device, time measurement method, light-emission-lifetime measurement device, and light-emission-lifetime measurement method
KR1020177007596A KR102299156B1 (ko) 2014-09-03 2015-07-22 시간 계측 장치, 시간 계측 방법, 발광 수명 계측 장치, 및 발광 수명 계측 방법
CN201580047263.0A CN106716266B (zh) 2014-09-03 2015-07-22 时间测量装置、时间测量方法、发光寿命测量装置及发光寿命测量方法
TW104125680A TWI660253B (zh) 2014-09-03 2015-08-06 時間測量裝置、時間測量方法、發光壽命測量裝置及發光壽命測量方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014179391A JP5978266B2 (ja) 2014-09-03 2014-09-03 時間計測装置、時間計測方法、発光寿命計測装置、及び発光寿命計測方法

Publications (3)

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JP2016053516A JP2016053516A (ja) 2016-04-14
JP2016053516A5 true JP2016053516A5 (enExample) 2016-06-02
JP5978266B2 JP5978266B2 (ja) 2016-08-24

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JP2014179391A Active JP5978266B2 (ja) 2014-09-03 2014-09-03 時間計測装置、時間計測方法、発光寿命計測装置、及び発光寿命計測方法

Country Status (7)

Country Link
US (1) US10962932B2 (enExample)
EP (1) EP3190468B1 (enExample)
JP (1) JP5978266B2 (enExample)
KR (1) KR102299156B1 (enExample)
CN (1) CN106716266B (enExample)
TW (1) TWI660253B (enExample)
WO (1) WO2016035469A1 (enExample)

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EP3239788B1 (en) 2016-04-25 2021-02-24 ams AG Method of operating a time-to-digital converter and time-to-digital converter circuit
KR102030457B1 (ko) * 2017-10-30 2019-10-10 현대오트론 주식회사 거리 검출 센서 시간 변이 보상 장치 및 방법
JP7221759B2 (ja) * 2019-03-28 2023-02-14 アズビル株式会社 時間計測回路
CN110208228B (zh) * 2019-05-15 2023-05-09 杭州柔谷科技有限公司 荧光寿命检测方法、装置、计算机设备和存储介质
CN110174381B (zh) * 2019-05-15 2023-05-02 杭州柔谷科技有限公司 氧浓度检测方法、装置、计算机设备和存储介质
US20220291342A1 (en) * 2019-08-28 2022-09-15 Sony Semiconductor Solutions Corporation Ranging system and driver of light emitting element
US11868094B2 (en) 2020-03-17 2024-01-09 Telefonaktiebolaget Lm Ericsson (Publ) Time-to-digital converter circuitry
JP6946599B1 (ja) * 2020-08-06 2021-10-06 浜松ホトニクス株式会社 時間計測装置、蛍光寿命計測装置、及び時間計測方法
WO2022030063A1 (ja) * 2020-08-06 2022-02-10 浜松ホトニクス株式会社 時間計測装置、蛍光寿命計測装置、及び時間計測方法
US11976546B2 (en) * 2020-12-08 2024-05-07 Halliburton Energy Services, Inc. Deep learning methods for wellbore pipe inspection
KR102507274B1 (ko) * 2020-12-16 2023-03-07 현대모비스 주식회사 라이다 장치 및 그 거리 측정 방법
KR102567575B1 (ko) * 2021-03-16 2023-08-16 이화여자대학교 산학협력단 시간 디지털 변환기 및 이를 포함하는 라이다
KR102773773B1 (ko) * 2023-04-21 2025-02-27 에스디티 주식회사 입력신호를 재구성하는 멀티플렉서를 포함하는 tdc 및 이를 포함하는 fpga

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JPS5576919A (en) * 1978-12-06 1980-06-10 Japan Spectroscopic Co Measuring method for rapid time division spectroscopic analysis
JPS5997077A (ja) * 1982-11-25 1984-06-04 Horiba Ltd 時間電圧変換器
US5202744A (en) * 1988-07-29 1993-04-13 Louis Thomas A Electro-optical measuring instruments
US6522395B1 (en) * 1999-04-30 2003-02-18 Canesta, Inc. Noise reduction techniques suitable for three-dimensional information acquirable with CMOS-compatible image sensor ICS
US6501706B1 (en) 2000-08-22 2002-12-31 Burnell G. West Time-to-digital converter
WO2005017643A2 (en) * 2003-08-18 2005-02-24 Speedark Ltd. Data conversion methods and systems
RU2442189C2 (ru) * 2006-07-28 2012-02-10 Конинклейке Филипс Электроникс, Н.В. Времяпролетные измерения в позитронной эмиссионной томографии
US8487600B2 (en) * 2007-04-10 2013-07-16 Aleksandar Prodic Continuous-time digital controller for high-frequency DC-DC converters
JPWO2010013385A1 (ja) * 2008-08-01 2012-01-05 株式会社アドバンテスト 時間測定回路、時間測定方法、それらを用いた時間デジタル変換器および試験装置
DE102009040749A1 (de) * 2009-09-08 2011-03-10 Becker & Hickl Gmbh Verfahren und Anordnung zur Verarbeitung von Einzelphotonen-Daten in optischen Meßsystemen zur Bestimmung von Struktur und Eigenschaften von biologischem Gewebe
DE102011055330B4 (de) 2011-11-14 2024-10-31 Leica Microsystems Cms Gmbh Verfahren zum Messen der Lebensdauer eines angeregten Zustandes in einer Probe
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