KR102299156B1 - 시간 계측 장치, 시간 계측 방법, 발광 수명 계측 장치, 및 발광 수명 계측 방법 - Google Patents

시간 계측 장치, 시간 계측 방법, 발광 수명 계측 장치, 및 발광 수명 계측 방법 Download PDF

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KR102299156B1
KR102299156B1 KR1020177007596A KR20177007596A KR102299156B1 KR 102299156 B1 KR102299156 B1 KR 102299156B1 KR 1020177007596 A KR1020177007596 A KR 1020177007596A KR 20177007596 A KR20177007596 A KR 20177007596A KR 102299156 B1 KR102299156 B1 KR 102299156B1
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signal
time
input
delay
digital
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KR20170048412A (ko
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겐 기타자와
미츠노리 니시자와
다카시 이토
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하마마츠 포토닉스 가부시키가이샤
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    • G—PHYSICS
    • G04—HOROLOGY
    • G04F—TIME-INTERVAL MEASURING
    • G04F10/00—Apparatus for measuring unknown time intervals by electric means
    • G04F10/005—Time-to-digital converters [TDC]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Optical investigation techniques, e.g. flow cytometry
    • G01N15/1429—Signal processing
    • G01N15/1431—Signal processing the electronics being integrated with the analyser, e.g. hand-held devices for on-site investigation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6408—Fluorescence; Phosphorescence with measurement of decay time, time resolved fluorescence
    • G—PHYSICS
    • G04—HOROLOGY
    • G04F—TIME-INTERVAL MEASURING
    • G04F10/00—Apparatus for measuring unknown time intervals by electric means
    • G04F10/06—Apparatus for measuring unknown time intervals by electric means by measuring phase
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
    • H03L7/00—Automatic control of frequency or phase; Synchronisation
    • H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
    • H03L7/08—Details of the phase-locked loop
    • H03L7/081—Details of the phase-locked loop provided with an additional controlled phase shifter
    • H03L7/0812—Details of the phase-locked loop provided with an additional controlled phase shifter and where no voltage or current controlled oscillator is used
    • H03L7/0818—Details of the phase-locked loop provided with an additional controlled phase shifter and where no voltage or current controlled oscillator is used the controlled phase shifter comprising coarse and fine delay or phase-shifting means

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  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Signal Processing (AREA)
  • Dispersion Chemistry (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Measurement Of Unknown Time Intervals (AREA)
KR1020177007596A 2014-09-03 2015-07-22 시간 계측 장치, 시간 계측 방법, 발광 수명 계측 장치, 및 발광 수명 계측 방법 Active KR102299156B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JPJP-P-2014-179391 2014-09-03
JP2014179391A JP5978266B2 (ja) 2014-09-03 2014-09-03 時間計測装置、時間計測方法、発光寿命計測装置、及び発光寿命計測方法
PCT/JP2015/070858 WO2016035469A1 (ja) 2014-09-03 2015-07-22 時間計測装置、時間計測方法、発光寿命計測装置、及び発光寿命計測方法

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KR20170048412A KR20170048412A (ko) 2017-05-08
KR102299156B1 true KR102299156B1 (ko) 2021-09-08

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US (1) US10962932B2 (enExample)
EP (1) EP3190468B1 (enExample)
JP (1) JP5978266B2 (enExample)
KR (1) KR102299156B1 (enExample)
CN (1) CN106716266B (enExample)
TW (1) TWI660253B (enExample)
WO (1) WO2016035469A1 (enExample)

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EP3239788B1 (en) 2016-04-25 2021-02-24 ams AG Method of operating a time-to-digital converter and time-to-digital converter circuit
KR102030457B1 (ko) * 2017-10-30 2019-10-10 현대오트론 주식회사 거리 검출 센서 시간 변이 보상 장치 및 방법
JP7221759B2 (ja) * 2019-03-28 2023-02-14 アズビル株式会社 時間計測回路
CN110208228B (zh) * 2019-05-15 2023-05-09 杭州柔谷科技有限公司 荧光寿命检测方法、装置、计算机设备和存储介质
CN110174381B (zh) * 2019-05-15 2023-05-02 杭州柔谷科技有限公司 氧浓度检测方法、装置、计算机设备和存储介质
US20220291342A1 (en) * 2019-08-28 2022-09-15 Sony Semiconductor Solutions Corporation Ranging system and driver of light emitting element
US11868094B2 (en) 2020-03-17 2024-01-09 Telefonaktiebolaget Lm Ericsson (Publ) Time-to-digital converter circuitry
JP6946599B1 (ja) * 2020-08-06 2021-10-06 浜松ホトニクス株式会社 時間計測装置、蛍光寿命計測装置、及び時間計測方法
WO2022030063A1 (ja) * 2020-08-06 2022-02-10 浜松ホトニクス株式会社 時間計測装置、蛍光寿命計測装置、及び時間計測方法
US11976546B2 (en) * 2020-12-08 2024-05-07 Halliburton Energy Services, Inc. Deep learning methods for wellbore pipe inspection
KR102507274B1 (ko) * 2020-12-16 2023-03-07 현대모비스 주식회사 라이다 장치 및 그 거리 측정 방법
KR102567575B1 (ko) * 2021-03-16 2023-08-16 이화여자대학교 산학협력단 시간 디지털 변환기 및 이를 포함하는 라이다
KR102773773B1 (ko) * 2023-04-21 2025-02-27 에스디티 주식회사 입력신호를 재구성하는 멀티플렉서를 포함하는 tdc 및 이를 포함하는 fpga

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US20080252280A1 (en) 2007-04-10 2008-10-16 Aleksandar Prodic Continuous-time digital controller for high-frequency dc-dc converters
JP2013104876A (ja) 2011-11-14 2013-05-30 Leica Microsystems Cms Gmbh 試料における励起状態の寿命を測定するための方法
JP2013188466A (ja) 2012-02-16 2013-09-26 Olympus Corp 内視鏡システムおよびａ／ｄ変換器
JP2016519281A (ja) 2013-03-15 2016-06-30 株式会社東芝 遅延を挿入する装置、核医学イメージング装置、遅延を挿入する方法および較正する方法

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JPS5576919A (en) * 1978-12-06 1980-06-10 Japan Spectroscopic Co Measuring method for rapid time division spectroscopic analysis
JPS5997077A (ja) * 1982-11-25 1984-06-04 Horiba Ltd 時間電圧変換器
US5202744A (en) * 1988-07-29 1993-04-13 Louis Thomas A Electro-optical measuring instruments
US6522395B1 (en) * 1999-04-30 2003-02-18 Canesta, Inc. Noise reduction techniques suitable for three-dimensional information acquirable with CMOS-compatible image sensor ICS
US6501706B1 (en) 2000-08-22 2002-12-31 Burnell G. West Time-to-digital converter
WO2005017643A2 (en) * 2003-08-18 2005-02-24 Speedark Ltd. Data conversion methods and systems
RU2442189C2 (ru) * 2006-07-28 2012-02-10 Конинклейке Филипс Электроникс, Н.В. Времяпролетные измерения в позитронной эмиссионной томографии
JPWO2010013385A1 (ja) * 2008-08-01 2012-01-05 株式会社アドバンテスト 時間測定回路、時間測定方法、それらを用いた時間デジタル変換器および試験装置
DE102009040749A1 (de) * 2009-09-08 2011-03-10 Becker & Hickl Gmbh Verfahren und Anordnung zur Verarbeitung von Einzelphotonen-Daten in optischen Meßsystemen zur Bestimmung von Struktur und Eigenschaften von biologischem Gewebe
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US20080252280A1 (en) 2007-04-10 2008-10-16 Aleksandar Prodic Continuous-time digital controller for high-frequency dc-dc converters
JP2013104876A (ja) 2011-11-14 2013-05-30 Leica Microsystems Cms Gmbh 試料における励起状態の寿命を測定するための方法
JP2013188466A (ja) 2012-02-16 2013-09-26 Olympus Corp 内視鏡システムおよびａ／ｄ変換器
JP2016519281A (ja) 2013-03-15 2016-06-30 株式会社東芝 遅延を挿入する装置、核医学イメージング装置、遅延を挿入する方法および較正する方法

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TW201610622A (zh) 2016-03-16
US10962932B2 (en) 2021-03-30
CN106716266A (zh) 2017-05-24
WO2016035469A1 (ja) 2016-03-10
US20170285579A1 (en) 2017-10-05
CN106716266B (zh) 2019-11-26
JP2016053516A (ja) 2016-04-14
JP5978266B2 (ja) 2016-08-24
EP3190468A1 (en) 2017-07-12
EP3190468A4 (en) 2018-03-07
TWI660253B (zh) 2019-05-21
KR20170048412A (ko) 2017-05-08
EP3190468B1 (en) 2019-08-21

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