WO2016013278A8 - Ｘ線検出信号処理装置およびそれを用いたｘ線分析装置 - Google Patents

Ｘ線検出信号処理装置およびそれを用いたｘ線分析装置 Download PDF

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Publication number
WO2016013278A8
WO2016013278A8 PCT/JP2015/063893 JP2015063893W WO2016013278A8 WO 2016013278 A8 WO2016013278 A8 WO 2016013278A8 JP 2015063893 W JP2015063893 W JP 2015063893W WO 2016013278 A8 WO2016013278 A8 WO 2016013278A8
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WO
WIPO (PCT)
Prior art keywords
signal
ray
processing device
signal processing
detection signal
Prior art date
Application number
PCT/JP2015/063893
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English (en)
French (fr)
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WO2016013278A1 (ja
Inventor
幸雄 迫
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株式会社リガク
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社リガク filed Critical 株式会社リガク
Priority to US15/325,787 priority Critical patent/US9791393B2/en
Priority to CN201580039683.4A priority patent/CN106537188B/zh
Publication of WO2016013278A1 publication Critical patent/WO2016013278A1/ja
Publication of WO2016013278A8 publication Critical patent/WO2016013278A8/ja

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/02—Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form
    • G01R13/0218—Circuits therefor
    • G01R13/0272—Circuits therefor for sampling
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/17—Circuit arrangements not adapted to a particular type of detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/36—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/24—Tubes wherein the point of impact of the cathode ray on the anode or anticathode is movable relative to the surface thereof
    • H01J35/30—Tubes wherein the point of impact of the cathode ray on the anode or anticathode is movable relative to the surface thereof by deflection of the cathode ray
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/304—Accessories, mechanical or electrical features electric circuits, signal processing

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Measurement Of Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)

Abstract

本発明のＸ線検出信号処理装置（１０）等は、ＣＲ回路（１３ａ）を有する連続リセットタイプのプリアンプ（１３）からの信号のレベルについて、所定の上限値を超えていない場合にはハイの信号を発し、所定の上限値を超えている場合にはローの信号を発するコンパレーター（１７）と、コンパレーター（１７）からの信号がローからハイになるのを所定の時間遅延させてクロック発振器（１５）へ出力し、ローの信号をクロック発振器（１５）へ出力して発振を停止させることにより、高速ＡＤコンバーター（１４）での高速ＡＤ変換を停止させて出力値を維持させる制御部（１８）とを備える。
PCT/JP2015/063893 2014-07-23 2015-05-14 Ｘ線検出信号処理装置およびそれを用いたｘ線分析装置 WO2016013278A1 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
US15/325,787 US9791393B2 (en) 2014-07-23 2015-05-14 X-ray detection signal processing device and X-ray analyzing apparatus using same
CN201580039683.4A CN106537188B (zh) 2014-07-23 2015-05-14 X射线检测信号处理器和采用它的x射线分析装置

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2014149421A JP5874109B2 (ja) 2014-07-23 2014-07-23 Ｘ線検出信号処理装置およびそれを用いたｘ線分析装置
JP2014-149421 2014-07-23

Publications (2)

Publication Number Publication Date
WO2016013278A1 WO2016013278A1 (ja) 2016-01-28
WO2016013278A8 true WO2016013278A8 (ja) 2017-01-19

Family

ID=55162817

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2015/063893 WO2016013278A1 (ja) 2014-07-23 2015-05-14 Ｘ線検出信号処理装置およびそれを用いたｘ線分析装置

Country Status (4)

Country Link
US (1) US9791393B2 (ja)
JP (1) JP5874109B2 (ja)
CN (1) CN106537188B (ja)
WO (1) WO2016013278A1 (ja)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9933375B2 (en) * 2015-09-25 2018-04-03 Olympus Scientific Solutions Americas, Inc. XRF/XRD system with dynamic management of multiple data processing units
JP7020357B2 (ja) * 2018-09-27 2022-02-16 株式会社島津製作所 Ｘ線分析用信号処理装置

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4288692A (en) * 1979-08-06 1981-09-08 Tracor Northern, Inc. Beam current normalization in an X-ray microanalysis instrument
JP2639903B2 (ja) * 1992-10-11 1997-08-13 株式会社堀場製作所 放射線検出装置
JPH07239385A (ja) * 1994-02-28 1995-09-12 Shimadzu Corp 放射線量測定装置
US6486808B1 (en) * 2001-10-16 2002-11-26 Varian Medical Systems Data signal amplifier with automatically controllable dynamic signal range
DE602004022229D1 (de) 2003-09-12 2009-09-10 Canon Kk Bildlesegerät und Bilderzeugungssystem mittels Röntgenstrahlen
JP5425071B2 (ja) 2007-08-03 2014-02-26 パルセータ，エルエルシー パルスプロセッサのエネルギー測定フィルタの応答を調整する方法およびこの方法を実行するパルスプロセッサ、エネルギー分散型放射線分光分析システム
US8477291B2 (en) * 2009-12-16 2013-07-02 Raytheon Company System and method for ranging of targets
JP5755116B2 (ja) * 2011-11-28 2015-07-29 三菱電機株式会社 放射線測定装置
JP6081084B2 (ja) * 2012-05-28 2017-02-15 シャープ株式会社 線量計

Also Published As

Publication number Publication date
WO2016013278A1 (ja) 2016-01-28
US20170153190A1 (en) 2017-06-01
US9791393B2 (en) 2017-10-17
JP2016024102A (ja) 2016-02-08
CN106537188A (zh) 2017-03-22
CN106537188B (zh) 2018-06-01
JP5874109B2 (ja) 2016-03-02

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WO2016013278A8 (ja) Ｘ線検出信号処理装置およびそれを用いたｘ線分析装置

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