JP2015535596A5 - - Google Patents

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Publication number
JP2015535596A5
JP2015535596A5 JP2015541241A JP2015541241A JP2015535596A5 JP 2015535596 A5 JP2015535596 A5 JP 2015535596A5 JP 2015541241 A JP2015541241 A JP 2015541241A JP 2015541241 A JP2015541241 A JP 2015541241A JP 2015535596 A5 JP2015535596 A5 JP 2015535596A5
Authority
JP
Japan
Prior art keywords
blade
output field
beam profiler
optical axis
blades
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2015541241A
Other languages
English (en)
Japanese (ja)
Other versions
JP2015535596A (ja
Filing date
Publication date
Priority claimed from GB1220416.0A external-priority patent/GB2507819B/en
Application filed filed Critical
Publication of JP2015535596A publication Critical patent/JP2015535596A/ja
Publication of JP2015535596A5 publication Critical patent/JP2015535596A5/ja
Pending legal-status Critical Current

Links

JP2015541241A 2012-11-13 2013-11-13 ビームプロファイラー Pending JP2015535596A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB1220416.0 2012-11-13
GB1220416.0A GB2507819B (en) 2012-11-13 2012-11-13 M-squared value beam profiler
PCT/GB2013/052991 WO2014076473A1 (en) 2012-11-13 2013-11-13 Beam profiler

Publications (2)

Publication Number Publication Date
JP2015535596A JP2015535596A (ja) 2015-12-14
JP2015535596A5 true JP2015535596A5 (enExample) 2016-12-28

Family

ID=47470530

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015541241A Pending JP2015535596A (ja) 2012-11-13 2013-11-13 ビームプロファイラー

Country Status (6)

Country Link
US (1) US9709438B2 (enExample)
EP (1) EP2920560A1 (enExample)
JP (1) JP2015535596A (enExample)
CA (1) CA2890938A1 (enExample)
GB (1) GB2507819B (enExample)
WO (1) WO2014076473A1 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6899524B2 (ja) * 2016-06-25 2021-07-07 株式会社ウェイブサイバー 光ビームプロファイル測定装置
DE102016011568B4 (de) 2016-09-26 2019-03-07 Primes GmbH Meßtechnik für die Produktion mit Laserstrahlung Vorrichtung und Verfahren zur Bestimmung von räumlichen Abmessungen eines Lichtstrahls
EP3450936A1 (en) * 2017-09-05 2019-03-06 Renishaw PLC Optical apparatus and method for assessing the beam profile of a non-contact tool setting apparatus
US10520360B1 (en) * 2018-07-31 2019-12-31 Northrop Grumman Systems Corporation Automated power-in-the-bucket measurement apparatus for large aperture laser systems
US11609176B2 (en) * 2020-07-24 2023-03-21 Becton, Dickinson And Company Methods and devices for evaluating performance of a diode laser
US12153208B2 (en) * 2020-11-23 2024-11-26 Coherent Lasersystems Gmbh & Co. Kg Laser beam wavefront correction with adaptive optics and mid-field monitoring
JP7280459B1 (ja) 2022-01-11 2023-05-24 株式会社ウェイブサイバー リアルタイム小型光ビームプロファイル測定装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3617755A (en) * 1969-12-10 1971-11-02 Bell Telephone Labor Inc Apparatus for locating and measuring the beam-waist radius of a gaussian laser beam
JPS5332781U (enExample) * 1976-08-26 1978-03-22
JPS6426119A (en) * 1987-07-22 1989-01-27 Nec Corp Light beam shape measuring instrument
US5214485A (en) 1989-04-27 1993-05-25 Coherent, Inc. Apparatus for measuring the mode quality of a laser beam
US5064284A (en) * 1990-04-26 1991-11-12 Coherent, Inc. Apparatus for measuring the mode quality of a laser beam
JPH05296829A (ja) * 1992-04-17 1993-11-12 Nippei Toyama Corp ビーム計測装置
IT1290575B1 (it) * 1997-03-07 1998-12-10 Cise Spa Dispositivo per la caratterizzazione di fasci laser
US6313910B1 (en) * 1998-09-11 2001-11-06 Dataray, Inc. Apparatus for measurement of optical beams
US7405815B1 (en) * 2003-11-04 2008-07-29 The Boeing Company Systems and methods for characterizing laser beam quality
US9291825B2 (en) * 2013-03-22 2016-03-22 Applied Materials Israel, Ltd. Calibratable beam shaping system and method

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