JP2015534134A5 - - Google Patents

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Publication number
JP2015534134A5
JP2015534134A5 JP2015539558A JP2015539558A JP2015534134A5 JP 2015534134 A5 JP2015534134 A5 JP 2015534134A5 JP 2015539558 A JP2015539558 A JP 2015539558A JP 2015539558 A JP2015539558 A JP 2015539558A JP 2015534134 A5 JP2015534134 A5 JP 2015534134A5
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JP
Japan
Prior art keywords
light
sample
light beam
devices
phase
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2015539558A
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English (en)
Japanese (ja)
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JP2015534134A (ja
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Publication date
Priority claimed from US13/663,069 external-priority patent/US8934103B2/en
Application filed filed Critical
Priority claimed from PCT/SE2013/051257 external-priority patent/WO2014070082A1/en
Publication of JP2015534134A publication Critical patent/JP2015534134A/ja
Publication of JP2015534134A5 publication Critical patent/JP2015534134A5/ja
Pending legal-status Critical Current

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JP2015539558A 2012-10-29 2013-10-29 標識を伴わない高コントラスト細胞撮像のための定量位相顕微鏡検査 Pending JP2015534134A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/663,069 US8934103B2 (en) 2011-12-22 2012-10-29 Quantitative phase microscopy for label-free high-contrast cell imaging
US13/663,069 2012-10-29
PCT/SE2013/051257 WO2014070082A1 (en) 2012-10-29 2013-10-29 Quantitative phase microscopy for label-free high-contrast cell imaging

Publications (2)

Publication Number Publication Date
JP2015534134A JP2015534134A (ja) 2015-11-26
JP2015534134A5 true JP2015534134A5 (enExample) 2016-12-15

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015539558A Pending JP2015534134A (ja) 2012-10-29 2013-10-29 標識を伴わない高コントラスト細胞撮像のための定量位相顕微鏡検査

Country Status (3)

Country Link
EP (1) EP2912512A4 (enExample)
JP (1) JP2015534134A (enExample)
WO (1) WO2014070082A1 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR3050038B1 (fr) * 2016-04-06 2018-05-18 Lltech Management Procede et dispositif de microscopie interferentielle plein champ en lumiere incoherente
JP2018139532A (ja) * 2017-02-28 2018-09-13 株式会社島津製作所 細胞観察装置
EP3610313B1 (en) * 2017-04-11 2022-03-02 Calico Life Sciences LLC Fluorescence microscopy system and methods based on stimulated emission
JP7080718B2 (ja) * 2018-05-08 2022-06-06 株式会社ミツトヨ 光学装置及び形状測定方法
CN109375358B (zh) * 2018-11-28 2020-07-24 南京理工大学 一种基于最优照明模式设计下的差分相衬定量相位显微成像方法

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5241364A (en) * 1990-10-19 1993-08-31 Fuji Photo Film Co., Ltd. Confocal scanning type of phase contrast microscope and scanning microscope
JPH1123372A (ja) * 1997-07-02 1999-01-29 Res Dev Corp Of Japan 光波コヒーレンス映像方法及びその装置
US6304330B1 (en) * 1999-10-06 2001-10-16 Metrolaser, Inc. Methods and apparatus for splitting, imaging, and measuring wavefronts in interferometry
EP1232377B1 (de) * 1999-11-24 2004-03-31 Haag-Streit Ag Verfahren und vorrichtung zur messung optischer eigenschaften wenigstens zweier voneinander distanzierter bereiche in einem transparenten und/oder diffusiven gegenstand
WO2003002972A2 (fr) * 2001-06-29 2003-01-09 Universite Libre De Bruxelles Procede et dispositif destines a l'obtention par microscopie d'images en trois dimensions d'un echantillon
JP4409331B2 (ja) * 2004-03-30 2010-02-03 株式会社トプコン 光画像計測装置
US20070242133A1 (en) * 2004-06-30 2007-10-18 Nikon Corporation Microscope Observation Method, Microscope, Differentiation Interference Microscope, Phase Difference Microscope, Interference Microscope, Image Processing Method, and Image Processing Device
CN101147052B (zh) * 2005-03-25 2012-01-11 麻省理工学院 用于希耳伯特相位成像的系统和方法
TWI326354B (en) * 2007-05-18 2010-06-21 Univ Nat Taipei Technology Method and apparatus for simultaneously acquiring interferograms and method for solving the phase
US8537461B2 (en) * 2007-11-26 2013-09-17 Carl Zeiss Microimaging Gmbh Method and configuration for the optical detection of an illuminated specimen
US7884997B2 (en) * 2007-11-27 2011-02-08 Northrop Grumman Systems Corporation System and method for coherent beam combination
US8264694B2 (en) * 2009-03-16 2012-09-11 Ut-Battelle, Llc Quantitative phase-contrast and excitation-emission systems
US10451402B2 (en) * 2011-01-25 2019-10-22 Massachusetts Institute Of Technology Single shot full-field reflection phase microscopy
US8693000B2 (en) * 2011-12-22 2014-04-08 General Electric Company Quantitative phase microscopy for label-free high-contrast cell imaging
US9097900B2 (en) * 2012-06-14 2015-08-04 General Electric Company Quantitative phase microscopy for high-contrast cell imaging using frequency domain phase shift

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