JP2015534134A - 標識を伴わない高コントラスト細胞撮像のための定量位相顕微鏡検査 - Google Patents

標識を伴わない高コントラスト細胞撮像のための定量位相顕微鏡検査 Download PDF

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Publication number
JP2015534134A
JP2015534134A JP2015539558A JP2015539558A JP2015534134A JP 2015534134 A JP2015534134 A JP 2015534134A JP 2015539558 A JP2015539558 A JP 2015539558A JP 2015539558 A JP2015539558 A JP 2015539558A JP 2015534134 A JP2015534134 A JP 2015534134A
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JP
Japan
Prior art keywords
light
phase
sample
image
diffracted
Prior art date
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Pending
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JP2015539558A
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English (en)
Japanese (ja)
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JP2015534134A5 (fr
Inventor
キム，エフジニア・ミハイロブナ
ヤズダンファー，シアヴァッシュ
ディロフ，ドミトリー・ウラジミロヴィッチ
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General Electric Co
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General Electric Co
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Publication date
Priority claimed from US13/663,069 external-priority patent/US8934103B2/en
Application filed by General Electric Co filed Critical General Electric Co
Publication of JP2015534134A publication Critical patent/JP2015534134A/ja
Publication of JP2015534134A5 publication Critical patent/JP2015534134A5/ja
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/14—Condensers affording illumination for phase-contrast observation
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0056—Optical details of the image generation based on optical coherence, e.g. phase-contrast arrangements, interference arrangements

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2015539558A 2012-10-29 2013-10-29 標識を伴わない高コントラスト細胞撮像のための定量位相顕微鏡検査 Pending JP2015534134A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/663,069 2012-10-29
US13/663,069 US8934103B2 (en) 2011-12-22 2012-10-29 Quantitative phase microscopy for label-free high-contrast cell imaging
PCT/SE2013/051257 WO2014070082A1 (fr) 2012-10-29 2013-10-29 Microscopie à phase quantitative pour l'imagerie cellulaire à contraste élevé sans marqueur

Publications (2)

Publication Number Publication Date
JP2015534134A true JP2015534134A (ja) 2015-11-26
JP2015534134A5 JP2015534134A5 (fr) 2016-12-15

Family

ID=50627810

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015539558A Pending JP2015534134A (ja) 2012-10-29 2013-10-29 標識を伴わない高コントラスト細胞撮像のための定量位相顕微鏡検査

Country Status (3)

Country Link
EP (1) EP2912512A4 (fr)
JP (1) JP2015534134A (fr)
WO (1) WO2014070082A1 (fr)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018139532A (ja) * 2017-02-28 2018-09-13 株式会社島津製作所 細胞観察装置
JP2019196947A (ja) * 2018-05-08 2019-11-14 株式会社ミツトヨ 光学装置及び形状測定方法
JP2020516953A (ja) * 2017-04-11 2020-06-11 カリコ ライフ サイエンシーズ エルエルシー 刺激された放出に基づく蛍光顕微鏡法システムおよび方法

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR3050038B1 (fr) * 2016-04-06 2018-05-18 Lltech Management Procede et dispositif de microscopie interferentielle plein champ en lumiere incoherente
CN109375358B (zh) * 2018-11-28 2020-07-24 南京理工大学 一种基于最优照明模式设计下的差分相衬定量相位显微成像方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1123372A (ja) * 1997-07-02 1999-01-29 Res Dev Corp Of Japan 光波コヒーレンス映像方法及びその装置
US6806963B1 (en) * 1999-11-24 2004-10-19 Haag-Streit Ag Method and device for measuring the optical properties of at least two regions located at a distance from one another in a transparent and/or diffuse object
JP2005283471A (ja) * 2004-03-30 2005-10-13 Topcon Corp 光画像計測装置
JP2008534929A (ja) * 2005-03-25 2008-08-28 マサチユセツツ・インスチチユート・オブ・テクノロジイ Ｈｉｌｂｅｒｔ位相画像処理のためのシステムと方法
US20090134310A1 (en) * 2007-11-27 2009-05-28 Gregory Douglas Goodno System and Method for Coherent Beam Combination

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Publication number Priority date Publication date Assignee Title
US5241364A (en) * 1990-10-19 1993-08-31 Fuji Photo Film Co., Ltd. Confocal scanning type of phase contrast microscope and scanning microscope
US6304330B1 (en) * 1999-10-06 2001-10-16 Metrolaser, Inc. Methods and apparatus for splitting, imaging, and measuring wavefronts in interferometry
EP2420822B1 (fr) * 2001-06-29 2020-09-02 Universite Libre De Bruxelles Dispositif destiné à l'obtention par microscopie d'images en trois dimensions d'un échantillon
WO2006003867A2 (fr) * 2004-06-30 2006-01-12 Nikon Corporation Procédé d’observation au microscope, microscope, microscope interférentiel différentiel, microscope de déphasage, microscope interférentiel, procédé de traitement de l’image, et dispositif de traitement de l’image
TWI326354B (en) * 2007-05-18 2010-06-21 Univ Nat Taipei Technology Method and apparatus for simultaneously acquiring interferograms and method for solving the phase
US8537461B2 (en) * 2007-11-26 2013-09-17 Carl Zeiss Microimaging Gmbh Method and configuration for the optical detection of an illuminated specimen
US8264694B2 (en) * 2009-03-16 2012-09-11 Ut-Battelle, Llc Quantitative phase-contrast and excitation-emission systems
EP2668465A1 (fr) * 2011-01-25 2013-12-04 Massachusetts Institute Of Technology Microscopie plein champ à phase de réflexion à prise unique
US8693000B2 (en) * 2011-12-22 2014-04-08 General Electric Company Quantitative phase microscopy for label-free high-contrast cell imaging
US9097900B2 (en) * 2012-06-14 2015-08-04 General Electric Company Quantitative phase microscopy for high-contrast cell imaging using frequency domain phase shift

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1123372A (ja) * 1997-07-02 1999-01-29 Res Dev Corp Of Japan 光波コヒーレンス映像方法及びその装置
US6806963B1 (en) * 1999-11-24 2004-10-19 Haag-Streit Ag Method and device for measuring the optical properties of at least two regions located at a distance from one another in a transparent and/or diffuse object
JP2005283471A (ja) * 2004-03-30 2005-10-13 Topcon Corp 光画像計測装置
JP2008534929A (ja) * 2005-03-25 2008-08-28 マサチユセツツ・インスチチユート・オブ・テクノロジイ Ｈｉｌｂｅｒｔ位相画像処理のためのシステムと方法
US20090134310A1 (en) * 2007-11-27 2009-05-28 Gregory Douglas Goodno System and Method for Coherent Beam Combination

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018139532A (ja) * 2017-02-28 2018-09-13 株式会社島津製作所 細胞観察装置
JP2020516953A (ja) * 2017-04-11 2020-06-11 カリコ ライフ サイエンシーズ エルエルシー 刺激された放出に基づく蛍光顕微鏡法システムおよび方法
JP7066740B2 (ja) 2017-04-11 2022-05-13 カリコ ライフ サイエンシーズ エルエルシー 刺激された放出に基づく蛍光顕微鏡法システムおよび方法
JP2019196947A (ja) * 2018-05-08 2019-11-14 株式会社ミツトヨ 光学装置及び形状測定方法
JP7080718B2 (ja) 2018-05-08 2022-06-06 株式会社ミツトヨ 光学装置及び形状測定方法

Also Published As

Publication number Publication date
EP2912512A1 (fr) 2015-09-02
EP2912512A4 (fr) 2016-07-13
WO2014070082A1 (fr) 2014-05-08

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