JP2015520855A5 - - Google Patents
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- Publication number
- JP2015520855A5 JP2015520855A5 JP2015513263A JP2015513263A JP2015520855A5 JP 2015520855 A5 JP2015520855 A5 JP 2015520855A5 JP 2015513263 A JP2015513263 A JP 2015513263A JP 2015513263 A JP2015513263 A JP 2015513263A JP 2015520855 A5 JP2015520855 A5 JP 2015520855A5
- Authority
- JP
- Japan
- Prior art keywords
- data
- radiation
- detector
- spectrum
- processing module
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000005855 radiation Effects 0.000 claims 37
- 238000012545 processing Methods 0.000 claims 26
- 238000001514 detection method Methods 0.000 claims 24
- 238000000034 method Methods 0.000 claims 22
- 238000001228 spectrum Methods 0.000 claims 18
- 238000013480 data collection Methods 0.000 claims 7
- 230000001186 cumulative effect Effects 0.000 claims 6
- 238000005259 measurement Methods 0.000 claims 5
- 238000004458 analytical method Methods 0.000 claims 4
- 238000004891 communication Methods 0.000 claims 4
- 239000000463 material Substances 0.000 claims 4
- 239000004065 semiconductor Substances 0.000 claims 3
- QWUZMTJBRUASOW-UHFFFAOYSA-N cadmium tellanylidenezinc Chemical compound [Zn].[Cd].[Te] QWUZMTJBRUASOW-UHFFFAOYSA-N 0.000 claims 2
- 238000004364 calculation method Methods 0.000 claims 2
- 238000004590 computer program Methods 0.000 claims 2
- 238000000295 emission spectrum Methods 0.000 claims 2
- 238000012360 testing method Methods 0.000 claims 2
- MARUHZGHZWCEQU-UHFFFAOYSA-N 5-phenyl-2h-tetrazole Chemical compound C1=CC=CC=C1C1=NNN=N1 MARUHZGHZWCEQU-UHFFFAOYSA-N 0.000 claims 1
- QDOSJNSYIUHXQG-UHFFFAOYSA-N [Mn].[Cd] Chemical compound [Mn].[Cd] QDOSJNSYIUHXQG-UHFFFAOYSA-N 0.000 claims 1
- 229910045601 alloy Inorganic materials 0.000 claims 1
- 239000000956 alloy Substances 0.000 claims 1
- 230000005670 electromagnetic radiation Effects 0.000 claims 1
- 230000014509 gene expression Effects 0.000 claims 1
- 239000012535 impurity Substances 0.000 claims 1
- 238000010348 incorporation Methods 0.000 claims 1
- 239000011572 manganese Substances 0.000 claims 1
- 239000002245 particle Substances 0.000 claims 1
- 238000003672 processing method Methods 0.000 claims 1
- 238000011002 quantification Methods 0.000 claims 1
- 230000000007 visual effect Effects 0.000 claims 1
- 239000011701 zinc Substances 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB1209036.1 | 2012-05-22 | ||
| GB1209036.1A GB2502307A (en) | 2012-05-22 | 2012-05-22 | Radiation Detection |
| PCT/GB2013/051315 WO2013175191A2 (en) | 2012-05-22 | 2013-05-21 | Radiation detector device and method |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2015520855A JP2015520855A (ja) | 2015-07-23 |
| JP2015520855A5 true JP2015520855A5 (enExample) | 2016-07-07 |
| JP6228972B2 JP6228972B2 (ja) | 2017-11-08 |
Family
ID=46546509
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2015513263A Active JP6228972B2 (ja) | 2012-05-22 | 2013-05-21 | 放射線検出装置および放射線検出方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20150142383A1 (enExample) |
| EP (1) | EP2852852A2 (enExample) |
| JP (1) | JP6228972B2 (enExample) |
| GB (1) | GB2502307A (enExample) |
| WO (1) | WO2013175191A2 (enExample) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB201120165D0 (en) * | 2011-11-23 | 2012-01-04 | Kromek Ltd | Detector apparatus and method |
| JP6133231B2 (ja) * | 2014-04-18 | 2017-05-24 | 株式会社日立製作所 | Ｘ線エネルギースペクトル測定方法およびｘ線エネルギースペクトル測定装置およびｘ線ｃｔ装置 |
| FR3045168B1 (fr) * | 2015-12-14 | 2018-05-18 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Procede et dispositif de detection et d'identification de corpuscules |
| CN105929440A (zh) * | 2016-04-19 | 2016-09-07 | 成都新核泰科科技有限公司 | 一种水体放射性探测系统 |
| CN109413375A (zh) * | 2018-06-13 | 2019-03-01 | 中核第四研究设计工程有限公司 | 一种放射性场所的智能巡检和应急装置 |
Family Cites Families (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB1596581A (en) * | 1978-03-20 | 1981-08-26 | Datron Electronics Ltd | Determining the uncertainty value of electrical measurements |
| US4550381A (en) * | 1981-11-03 | 1985-10-29 | The United States Of America As Represented By The United States Department Of Energy | Spectrometer gun |
| US4864512A (en) * | 1986-08-20 | 1989-09-05 | John Fluke Mfg. Co., Inc. | Measurement apparatus with plural displays of measured parameter and selectable function thereof |
| GB9709817D0 (en) * | 1997-05-15 | 1997-07-09 | British Nuclear Fuels Plc | Improvements in and relating to monitoring |
| DE19902842C1 (de) * | 1999-01-20 | 2000-08-10 | Sartorius Gmbh | Elektronische Waage mit Zusatzanzeige |
| SG99872A1 (en) * | 1999-10-26 | 2003-11-27 | Mitsubishi Heavy Ind Ltd | Method and apparatus for laser analysis of dioxins |
| JP3907890B2 (ja) * | 1999-11-02 | 2007-04-18 | 日本電子株式会社 | Ｘ線元素分析装置 |
| US6771802B1 (en) * | 2000-04-13 | 2004-08-03 | Photon Imaging, Inc. | Method and apparatus for imaging and localizing radiation |
| US7576332B2 (en) * | 2003-08-01 | 2009-08-18 | St. George's Healthcare Nhs Trust | Imaging system |
| US7229845B1 (en) * | 2004-01-26 | 2007-06-12 | Si Glaz | Automated sourcing of substrate microfabrication defects using defects signatures |
| WO2005106440A1 (ja) * | 2004-04-28 | 2005-11-10 | Matsushita Electric Industrial Co., Ltd. | 蛍光ｘ線分析方法および蛍光ｘ線分析装置 |
| US7462837B2 (en) * | 2004-08-26 | 2008-12-09 | Canberra Industries, Inc. | Nuclide identifier system |
| US20060292650A1 (en) * | 2005-05-23 | 2006-12-28 | Braig James R | Spectroscopic analysis of a biological fluid reacted with an enzyme |
| JP2006329845A (ja) * | 2005-05-27 | 2006-12-07 | Yokogawa Electric Corp | 測定装置および測定システム |
| GB0512945D0 (en) * | 2005-06-24 | 2005-08-03 | Oxford Instr Analytical Ltd | Method and apparatus for material identification |
| CN201589865U (zh) * | 2009-09-24 | 2010-09-22 | 北京紫方启研科技有限公司 | 便携式NaI(TI)γ能谱仪 |
| JP5431866B2 (ja) * | 2009-10-22 | 2014-03-05 | 住友重機械工業株式会社 | 検出結果補正方法、その検出結果補正方法を用いた放射線検出装置、その検出結果補正方法を実行するためのプログラム、及びそのプログラムを記録する記録媒体 |
| US8260566B2 (en) * | 2010-05-25 | 2012-09-04 | The United States of America, as represented by the United States Deparment of Energy | Apparatus and method for radioactive waste screening |
| JP2012063333A (ja) * | 2010-09-20 | 2012-03-29 | Osaka Univ | 光学特性値計測装置、光学特性値計測方法及び光学特性値計測プログラム |
| GB201019521D0 (en) * | 2010-11-18 | 2010-12-29 | Durham Scient Crystals Ltd | Radiation detection |
| KR101065671B1 (ko) * | 2011-06-10 | 2011-09-19 | (주)에스에프테크놀로지 | 스마트폰 결합형 환경방사능 측정장치 |
| CN102445704A (zh) * | 2011-10-10 | 2012-05-09 | 武汉旧邦科技有限公司 | 一种辐射剂量测定显示装置及测定方法 |
-
2012
- 2012-05-22 GB GB1209036.1A patent/GB2502307A/en not_active Withdrawn
-
2013
- 2013-05-21 WO PCT/GB2013/051315 patent/WO2013175191A2/en not_active Ceased
- 2013-05-21 US US14/401,309 patent/US20150142383A1/en not_active Abandoned
- 2013-05-21 JP JP2015513263A patent/JP6228972B2/ja active Active
- 2013-05-21 EP EP13723946.3A patent/EP2852852A2/en not_active Withdrawn
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