JP2015519567A5 - - Google Patents

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Publication number
JP2015519567A5
JP2015519567A5 JP2015512193A JP2015512193A JP2015519567A5 JP 2015519567 A5 JP2015519567 A5 JP 2015519567A5 JP 2015512193 A JP2015512193 A JP 2015512193A JP 2015512193 A JP2015512193 A JP 2015512193A JP 2015519567 A5 JP2015519567 A5 JP 2015519567A5
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JP
Japan
Prior art keywords
image
detector
detector array
fill factor
image scene
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JP2015512193A
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English (en)
Japanese (ja)
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JP6083833B2 (ja
JP2015519567A (ja
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Priority claimed from IL219773A external-priority patent/IL219773A/en
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Publication of JP2015519567A5 publication Critical patent/JP2015519567A5/ja
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Publication of JP6083833B2 publication Critical patent/JP6083833B2/ja
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JP2015512193A 2012-05-13 2013-05-05 画像解像度が向上した赤外線検出器 Active JP6083833B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
IL219773A IL219773A (en) 2012-05-13 2012-05-13 Device and method for increasing the resolution of vacuum-based infrared imaging detectors and cryogenic coolers
IL219773 2012-05-13
PCT/IL2013/050380 WO2013171738A1 (en) 2012-05-13 2013-05-05 Infrared detector with increased image resolution

Publications (3)

Publication Number Publication Date
JP2015519567A JP2015519567A (ja) 2015-07-09
JP2015519567A5 true JP2015519567A5 (enExample) 2016-06-16
JP6083833B2 JP6083833B2 (ja) 2017-02-22

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Application Number Title Priority Date Filing Date
JP2015512193A Active JP6083833B2 (ja) 2012-05-13 2013-05-05 画像解像度が向上した赤外線検出器

Country Status (11)

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US (2) US9894292B2 (enExample)
EP (1) EP2837173B1 (enExample)
JP (1) JP6083833B2 (enExample)
KR (1) KR102043325B1 (enExample)
BR (1) BR112014028169B1 (enExample)
CA (1) CA2873196C (enExample)
ES (1) ES2626070T3 (enExample)
IL (1) IL219773A (enExample)
PL (1) PL2837173T3 (enExample)
SG (1) SG11201407311RA (enExample)
WO (1) WO2013171738A1 (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IL219773A (en) * 2012-05-13 2015-09-24 Elbit Sys Electro Optics Elop Device and method for increasing the resolution of vacuum-based infrared imaging detectors and cryogenic coolers
JP6361965B2 (ja) * 2013-10-24 2018-07-25 パナソニックIpマネジメント株式会社 撮像システム、撮像装置、符号化装置、および撮像方法
KR102357965B1 (ko) * 2015-01-12 2022-02-03 삼성전자주식회사 객체 인식 방법 및 장치
CN105547490B (zh) * 2015-12-08 2019-01-25 中国科学院上海技术物理研究所 一种数字tdi红外探测器的实时盲元检测方法
EP4111179A4 (en) * 2020-02-27 2023-11-15 Shenzhen Xpectvision Technology Co., Ltd. IMAGING SYSTEM
IL274418B (en) * 2020-05-03 2021-12-01 Elbit Systems Electro Optics Elop Ltd Systems and methods for enhanced motion detection, objective tracking, situational awareness and super-resolution video using microscanning images
US11651474B2 (en) 2020-11-04 2023-05-16 Bae Systems Information And Electronic Systems Integration Inc. Real-time super resolution at long standoff ranges
CN115546486A (zh) * 2022-10-17 2022-12-30 深圳市元视芯智能科技有限公司 仿生视觉传感器、成像方法以及无人机图传系统
US12483804B2 (en) * 2023-12-08 2025-11-25 Varjo Technologies Oy Subsampling and wobulation in colour filter arrays having smallest repeating units with different sub-units

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Publication number Priority date Publication date Assignee Title
JPS61264874A (ja) * 1985-05-20 1986-11-22 Fujitsu General Ltd 固体撮像装置
JPH0682305A (ja) 1992-08-31 1994-03-22 Shimadzu Corp 2次元検出器
US5371369A (en) * 1993-10-13 1994-12-06 Litton Systems, Inc. Conformal cold baffle for optical imaging systems
CA2135676A1 (en) 1994-11-14 1996-05-15 Jean Dumas Device to enhance imaging resolution
US6005682A (en) 1995-06-07 1999-12-21 Xerox Corporation Resolution enhancement by multiple scanning with a low-resolution, two-dimensional sensor array
AUPO615297A0 (en) 1997-04-10 1997-05-08 Commonwealth Scientific And Industrial Research Organisation Imaging system and method
JPH11331857A (ja) * 1998-05-13 1999-11-30 Mitsubishi Electric Corp 撮像装置
EP1198119A3 (en) 2000-10-11 2004-05-26 Charles E. Parsons Improved resolution for an electric image sensor array
US7283231B2 (en) * 2004-07-20 2007-10-16 Duke University Compressive sampling and signal inference
JP5000395B2 (ja) * 2007-06-26 2012-08-15 オリンパス株式会社 撮像表示方法および撮像表示装置
GB2462137B (en) * 2008-06-25 2013-01-23 Thales Holdings Uk Plc Imaging apparatus and method
JP4494505B1 (ja) * 2009-02-13 2010-06-30 シャープ株式会社 画像処理装置、撮像装置、画像処理方法、画像処理プログラムおよび記録媒体
US9291506B2 (en) * 2010-01-27 2016-03-22 Ci Systems Ltd. Room-temperature filtering for passive infrared imaging
JP5341010B2 (ja) * 2010-04-15 2013-11-13 オリンパス株式会社 画像処理装置、撮像装置、プログラム及び画像処理方法
US8866951B2 (en) * 2011-08-24 2014-10-21 Aptina Imaging Corporation Super-resolution imaging systems
US10110834B2 (en) * 2011-11-07 2018-10-23 Raytheon Company Hadamard enhanced sensors
IL219773A (en) * 2012-05-13 2015-09-24 Elbit Sys Electro Optics Elop Device and method for increasing the resolution of vacuum-based infrared imaging detectors and cryogenic coolers

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