PL2837173T3 - Detektor podczerwieni ze zwiększoną rozdzielczością obrazu - Google Patents

Detektor podczerwieni ze zwiększoną rozdzielczością obrazu

Info

Publication number
PL2837173T3
PL2837173T3 PL13729475T PL13729475T PL2837173T3 PL 2837173 T3 PL2837173 T3 PL 2837173T3 PL 13729475 T PL13729475 T PL 13729475T PL 13729475 T PL13729475 T PL 13729475T PL 2837173 T3 PL2837173 T3 PL 2837173T3
Authority
PL
Poland
Prior art keywords
infrared detector
image resolution
increased image
increased
resolution
Prior art date
Application number
PL13729475T
Other languages
English (en)
Polish (pl)
Inventor
Avishay Nachum
Shalom Binder
Dov Freiman
Original Assignee
Elbit Systems Electro-Optics Elop Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Elbit Systems Electro-Optics Elop Ltd. filed Critical Elbit Systems Electro-Optics Elop Ltd.
Publication of PL2837173T3 publication Critical patent/PL2837173T3/pl

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/20—Circuitry of solid-state image sensors [SSIS]; Control thereof for transforming only infrared radiation into image signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/06—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
    • G01J5/061—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity by controlling the temperature of the apparatus or parts thereof, e.g. using cooling means or thermostats
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/08—Optical arrangements
    • G01J5/0831—Masks; Aperture plates; Spatial light modulators
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/20—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from infrared radiation only
    • H04N23/23—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from infrared radiation only from thermal infrared radiation
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/48—Increasing resolution by shifting the sensor relative to the scene
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J2005/0077—Imaging

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Studio Devices (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
PL13729475T 2012-05-13 2013-05-05 Detektor podczerwieni ze zwiększoną rozdzielczością obrazu PL2837173T3 (pl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
IL219773A IL219773A (en) 2012-05-13 2012-05-13 Device and method for increasing the resolution of vacuum-based infrared imaging detectors and cryogenic coolers
EP13729475.7A EP2837173B1 (en) 2012-05-13 2013-05-05 Infrared detector with increased image resolution

Publications (1)

Publication Number Publication Date
PL2837173T3 true PL2837173T3 (pl) 2017-08-31

Family

ID=48628762

Family Applications (1)

Application Number Title Priority Date Filing Date
PL13729475T PL2837173T3 (pl) 2012-05-13 2013-05-05 Detektor podczerwieni ze zwiększoną rozdzielczością obrazu

Country Status (11)

Country Link
US (2) US9894292B2 (enExample)
EP (1) EP2837173B1 (enExample)
JP (1) JP6083833B2 (enExample)
KR (1) KR102043325B1 (enExample)
BR (1) BR112014028169B1 (enExample)
CA (1) CA2873196C (enExample)
ES (1) ES2626070T3 (enExample)
IL (1) IL219773A (enExample)
PL (1) PL2837173T3 (enExample)
SG (1) SG11201407311RA (enExample)
WO (1) WO2013171738A1 (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IL219773A (en) * 2012-05-13 2015-09-24 Elbit Sys Electro Optics Elop Device and method for increasing the resolution of vacuum-based infrared imaging detectors and cryogenic coolers
JP6361965B2 (ja) * 2013-10-24 2018-07-25 パナソニックＩｐマネジメント株式会社 撮像システム、撮像装置、符号化装置、および撮像方法
KR102357965B1 (ko) * 2015-01-12 2022-02-03 삼성전자주식회사 객체 인식 방법 및 장치
CN105547490B (zh) * 2015-12-08 2019-01-25 中国科学院上海技术物理研究所 一种数字tdi红外探测器的实时盲元检测方法
EP4111179A4 (en) * 2020-02-27 2023-11-15 Shenzhen Xpectvision Technology Co., Ltd. IMAGING SYSTEM
IL274418B (en) * 2020-05-03 2021-12-01 Elbit Systems Electro Optics Elop Ltd Systems and methods for enhanced motion detection, objective tracking, situational awareness and super-resolution video using microscanning images
US11651474B2 (en) 2020-11-04 2023-05-16 Bae Systems Information And Electronic Systems Integration Inc. Real-time super resolution at long standoff ranges
CN115546486A (zh) * 2022-10-17 2022-12-30 深圳市元视芯智能科技有限公司 仿生视觉传感器、成像方法以及无人机图传系统
US12483804B2 (en) * 2023-12-08 2025-11-25 Varjo Technologies Oy Subsampling and wobulation in colour filter arrays having smallest repeating units with different sub-units

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61264874A (ja) * 1985-05-20 1986-11-22 Fujitsu General Ltd 固体撮像装置
JPH0682305A (ja) 1992-08-31 1994-03-22 Shimadzu Corp ２次元検出器
US5371369A (en) * 1993-10-13 1994-12-06 Litton Systems, Inc. Conformal cold baffle for optical imaging systems
CA2135676A1 (en) 1994-11-14 1996-05-15 Jean Dumas Device to enhance imaging resolution
US6005682A (en) 1995-06-07 1999-12-21 Xerox Corporation Resolution enhancement by multiple scanning with a low-resolution, two-dimensional sensor array
AUPO615297A0 (en) 1997-04-10 1997-05-08 Commonwealth Scientific And Industrial Research Organisation Imaging system and method
JPH11331857A (ja) * 1998-05-13 1999-11-30 Mitsubishi Electric Corp 撮像装置
EP1198119A3 (en) 2000-10-11 2004-05-26 Charles E. Parsons Improved resolution for an electric image sensor array
US7283231B2 (en) * 2004-07-20 2007-10-16 Duke University Compressive sampling and signal inference
JP5000395B2 (ja) * 2007-06-26 2012-08-15 オリンパス株式会社 撮像表示方法および撮像表示装置
GB2462137B (en) * 2008-06-25 2013-01-23 Thales Holdings Uk Plc Imaging apparatus and method
JP4494505B1 (ja) * 2009-02-13 2010-06-30 シャープ株式会社 画像処理装置、撮像装置、画像処理方法、画像処理プログラムおよび記録媒体
US9291506B2 (en) * 2010-01-27 2016-03-22 Ci Systems Ltd. Room-temperature filtering for passive infrared imaging
JP5341010B2 (ja) * 2010-04-15 2013-11-13 オリンパス株式会社 画像処理装置、撮像装置、プログラム及び画像処理方法
US8866951B2 (en) * 2011-08-24 2014-10-21 Aptina Imaging Corporation Super-resolution imaging systems
US10110834B2 (en) * 2011-11-07 2018-10-23 Raytheon Company Hadamard enhanced sensors
IL219773A (en) * 2012-05-13 2015-09-24 Elbit Sys Electro Optics Elop Device and method for increasing the resolution of vacuum-based infrared imaging detectors and cryogenic coolers

Also Published As

Publication number Publication date
IL219773A (en) 2015-09-24
WO2013171738A1 (en) 2013-11-21
SG11201407311RA (en) 2014-12-30
JP6083833B2 (ja) 2017-02-22
US20180160056A1 (en) 2018-06-07
KR20150013795A (ko) 2015-02-05
ES2626070T3 (es) 2017-07-21
BR112014028169B1 (pt) 2023-04-04
CA2873196C (en) 2019-02-19
KR102043325B1 (ko) 2019-12-02
EP2837173A1 (en) 2015-02-18
US9894292B2 (en) 2018-02-13
CA2873196A1 (en) 2013-11-21
JP2015519567A (ja) 2015-07-09
BR112014028169A2 (pt) 2020-05-05
EP2837173B1 (en) 2017-03-22
AU2013261047A1 (en) 2014-12-04
US20140139684A1 (en) 2014-05-22
US10547799B2 (en) 2020-01-28

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