JP2015513223A5 - - Google Patents

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Publication number
JP2015513223A5
JP2015513223A5 JP2015502109A JP2015502109A JP2015513223A5 JP 2015513223 A5 JP2015513223 A5 JP 2015513223A5 JP 2015502109 A JP2015502109 A JP 2015502109A JP 2015502109 A JP2015502109 A JP 2015502109A JP 2015513223 A5 JP2015513223 A5 JP 2015513223A5
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JP
Japan
Prior art keywords
objective
laser beam
optical element
pulsed laser
focus spot
Prior art date
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Granted
Application number
JP2015502109A
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English (en)
Japanese (ja)
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JP2015513223A (ja
JP6049043B2 (ja
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Priority claimed from PCT/EP2012/055621 external-priority patent/WO2013143594A1/en
Publication of JP2015513223A publication Critical patent/JP2015513223A/ja
Publication of JP2015513223A5 publication Critical patent/JP2015513223A5/ja
Application granted granted Critical
Publication of JP6049043B2 publication Critical patent/JP6049043B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2015502109A 2012-03-29 2012-03-29 マイクロリソグラフィ投影露光系のチャネルの欠陥を補償するための装置及び方法 Expired - Fee Related JP6049043B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/EP2012/055621 WO2013143594A1 (en) 2012-03-29 2012-03-29 Apparatus and method for compensating a defect of a channel of a microlithographic projection exposure system

Publications (3)

Publication Number Publication Date
JP2015513223A JP2015513223A (ja) 2015-04-30
JP2015513223A5 true JP2015513223A5 (https=) 2016-02-25
JP6049043B2 JP6049043B2 (ja) 2016-12-21

Family

ID=45894483

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015502109A Expired - Fee Related JP6049043B2 (ja) 2012-03-29 2012-03-29 マイクロリソグラフィ投影露光系のチャネルの欠陥を補償するための装置及び方法

Country Status (6)

Country Link
US (1) US9632413B2 (https=)
JP (1) JP6049043B2 (https=)
KR (1) KR101968796B1 (https=)
CN (1) CN104220931B (https=)
TW (1) TWI603157B (https=)
WO (1) WO2013143594A1 (https=)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102012205045A1 (de) 2012-03-29 2013-10-02 Carl Zeiss Smt Gmbh Optisches System einer mikrolithographischen Projektionsbelichtungsanlage
DE102012206287A1 (de) 2012-04-17 2013-10-17 Carl Zeiss Smt Gmbh Optisches System, insbesondere einer mikrolithographischen Projektionsbelichtungsanlage
DE102013201133A1 (de) 2013-01-24 2014-07-24 Carl Zeiss Smt Gmbh Optisches System einer mikrolithographischen Projektionsbelichtungsanlage
CN106933060B (zh) * 2015-12-30 2018-10-16 上海微电子装备(集团)股份有限公司 一种棱镜旋转调节机构和光刻机曝光系统及光刻机
WO2020016626A1 (en) * 2018-07-17 2020-01-23 Carl Zeiss Sms Ltd. Method and apparatus for determining an effect of one or more pixels to be introduced into a substrate of a photolithographic mask
DE102019201497B3 (de) * 2019-02-06 2020-06-18 Carl Zeiss Smt Gmbh Vorrichtung und Verfahren zum Bestimmen von Platzierungen von Pattern-Elementen einer reflektiven fotolithographischen Maske in deren Betriebsumgebung
FR3098710B1 (fr) * 2019-07-19 2021-12-31 Keranova Appareil de decoupe a coupleur optique incluant un correcteur de polarisation
US11366382B2 (en) * 2020-02-24 2022-06-21 Carl Zeiss Smt Gmbh Method and apparatus for performing an aerial image simulation of a photolithographic mask

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19535392A1 (de) 1995-09-23 1997-03-27 Zeiss Carl Fa Radial polarisationsdrehende optische Anordnung und Mikrolithographie-Projektionsbelichtungsanlage damit
JP2000331927A (ja) * 1999-03-12 2000-11-30 Canon Inc 投影光学系及びそれを用いた投影露光装置
US20050094268A1 (en) * 2002-03-14 2005-05-05 Carl Zeiss Smt Ag Optical system with birefringent optical elements
US20040108167A1 (en) 2002-12-05 2004-06-10 Elliott Christopher M. Variable resistance control of a gear train oil pump
EP1467253A1 (en) * 2003-04-07 2004-10-13 ASML Netherlands B.V. Lithographic apparatus and device manufacturing method
US7911584B2 (en) * 2003-07-30 2011-03-22 Carl Zeiss Smt Gmbh Illumination system for microlithography
US7714983B2 (en) 2003-09-12 2010-05-11 Carl Zeiss Smt Ag Illumination system for a microlithography projection exposure installation
ATE396428T1 (de) 2003-09-26 2008-06-15 Zeiss Carl Smt Ag Belichtungsverfahren sowie projektions- belichtungssystem zur ausführung des verfahrens
US7408616B2 (en) * 2003-09-26 2008-08-05 Carl Zeiss Smt Ag Microlithographic exposure method as well as a projection exposure system for carrying out the method
CN101793993B (zh) 2004-01-16 2013-04-03 卡尔蔡司Smt有限责任公司 光学元件、光学布置及系统
CN101078888B (zh) * 2004-02-06 2012-08-22 株式会社尼康 偏光变换元件、光学照明装置、曝光装置以及曝光方法
DE102004011733A1 (de) 2004-03-04 2005-09-22 Carl Zeiss Smt Ag Transmissionsfiltervorrichtung
JP2006173305A (ja) * 2004-12-15 2006-06-29 Canon Inc 露光装置及び方法、並びに、デバイス製造方法
US7345740B2 (en) * 2004-12-28 2008-03-18 Asml Netherlands B.V. Polarized radiation in lithographic apparatus and device manufacturing method
TWI453796B (zh) 2005-01-21 2014-09-21 尼康股份有限公司 偏光變更單元以及元件製造方法
WO2007096250A1 (de) * 2006-02-21 2007-08-30 Carl Zeiss Smt Ag Beleuchtungseinrichtung einer mikrolithographischen projektionsbelichtungsanlage
DE102006032810A1 (de) 2006-07-14 2008-01-17 Carl Zeiss Smt Ag Beleuchtungsoptik für eine Mikrolithografie-Projektionsbelichtungsanlage, Beleuchtungssystem mit einer derartigen Beleuchtungsoptik, mikrolithografie-Projektionsbelichtungsanlage mit einem derartigen Beleuchtungssystem, mikrolithografisches Herstellungsverfahren für Bauelemente sowie mit diesem Verfahren hergestelltes Bauelement
DE102006038643B4 (de) 2006-08-17 2009-06-10 Carl Zeiss Smt Ag Mikrolithographische Projektionsbelichtungsanlage sowie mikrolithographisches Belichtungsverfahren
DE102008003916A1 (de) 2007-01-23 2008-07-24 Carl Zeiss Smt Ag Projektionsbelichtungsanlage für die Mikrolithographie mit Messvorrichtung sowie Verfahren zum Messen einer Bestrahlungsstärkeverteilung
DE102007043958B4 (de) * 2007-09-14 2011-08-25 Carl Zeiss SMT GmbH, 73447 Beleuchtungseinrichtung einer mikrolithographischen Projektionsbelichtungsanlage
DE102008054582A1 (de) 2007-12-21 2009-07-09 Carl Zeiss Smt Ag Mikrolithographische Projektionsbelichtungsanlage
DE102008009601A1 (de) 2008-02-15 2009-08-20 Carl Zeiss Smt Ag Optisches System für eine mikrolithographische Projektionsbelichtungsanlage sowie mikrolithographisches Belichtungsverfahren
JP5319766B2 (ja) * 2008-06-20 2013-10-16 カール・ツァイス・エスエムティー・ゲーエムベーハー マイクロリソグラフィ投影露光装置の光学系及びマイクロリソグラフィ露光方法
JP2010016317A (ja) * 2008-07-07 2010-01-21 Canon Inc 露光装置及びデバイス製造方法
EP2369413B1 (en) * 2010-03-22 2021-04-07 ASML Netherlands BV Illumination system and lithographic apparatus

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