JP2015215327A5

JP2015215327A5 -

Info

Publication number: JP2015215327A5
Application number: JP2014195894A
Authority: JP
Filing date: 2014-09-25
Publication date: 2017-11-02
Anticipated expiration: 2034-09-25

Claims

A movable member having one end of an electrode contact portion for contacting a measurement target electrode which is an electrode attached to the measurement target and an auxiliary substrate contact portion for contacting a wiring board of the measurement device;
An auxiliary movable member having the other of the electrode contact portion and the auxiliary substrate contact portion at one end;
Close contact winding in which a wire rod is wound in a vicinity of one end so as to be compressible with a gap, and the wire rod is wound in close contact with the first coarse winding portion without a gap. A probe pin comprising: a coil spring having a portion;
The movable member is
It is a plate-like body having two first arm portions that are opposed to each other across the first slit having the other end opened and elastically deformable in the direction of narrowing the first slit,
In a state where the first arm portion is not elastically deformed, the distance between the outer surfaces in the vicinity of the two end portions of the first arm portion is formed larger than the inner diameter of the tightly wound portion of the coil spring,
In the vicinity of the one end, a first locking portion that locks to the end of the coil spring on the first rough winding portion side,
In a state where the two first arm portions are elastically deformed in the direction of narrowing the first slit, the end portion of the coil spring on the inner diameter side of the coil spring from the end portion on the first coarse winding portion side of the coil spring. Until the first locking portion is locked to the end of the coil spring on the first coarse winding side,
The auxiliary movable member is locked to an end portion of the coil spring opposite to the first rough winding portion side,
The probe pin, wherein an outer surface near the end of the first arm portion and an inner surface of the coil spring can change a relative position while maintaining electrical contact.

The movable member includes a protrusion that protrudes in the width direction of the plate from the outer surface in the vicinity of the first locking portion, and presses the protrusion into the end of the coil spring on the first rough winding portion side. The probe pin according to claim 1, wherein the probe pin is fixed to the coil spring.

The movable member and the coil spring elastically deform the first arm portion of the movable member in the plate width direction, close the first slit, and move the movable member from the end on the first slit side. The coil spring is inserted into the inner diameter of the end portion on the first rough winding portion side, and is assembled so that a portion from the end portion on the first slit side of the movable member to the first locking portion is included in the coil spring. The probe pin according to claim 1, wherein the probe pin is characterized in that

The auxiliary movable member includes a second locking portion that protrudes in a direction perpendicular to the insertion direction into the coil spring and that locks at an end opposite to the first coarse winding portion of the coil spring. The probe pin according to any one of claims 1 to 3.

The probe pin according to any one of claims 1 to 4, wherein the auxiliary movable member is a plate-like body.

The probe pin according to any one of claims 1 to 4, wherein the auxiliary movable member is a cylindrical body.

The coil spring has a second coarsely wound portion in which a wire is wound in a compressible manner with a gap in the vicinity of the other end,
The auxiliary movable member is a plate-like body having an arm portion having a structure common to the first arm portion, and a slit having a structure common to the first slit,
The auxiliary movable member is inserted into an inner diameter side of the coil spring from an end portion of the second coarsely wound portion side of the coil spring in a state where the two arm portions are elastically deformed in a direction of narrowing the slit,
2. The relative position of the outer side surface near the end of the arm portion of the auxiliary movable member and the inner side surface of the coil spring can be changed while maintaining electrical contact. 6. The probe pin according to any one of 1 to 5.

The movable member has an electrode contact portion at one end for contacting a measurement target electrode that is an electrode attached to the measurement target;
The probe pin according to any one of claims 1 to 7, wherein the auxiliary movable member has an auxiliary substrate contact portion at one end for contacting an inspection substrate that is a wiring substrate of the measuring apparatus. .

The movable member has an auxiliary substrate contact portion at one end for contacting an inspection substrate which is a wiring substrate of the measuring device,
The said auxiliary | assistant movable member has an electrode contact part for contacting the measuring object electrode which is an electrode attached to a measuring object in one end, The any one of Claim 1 to 7 characterized by the above-mentioned. Probe pin.