JP2015173069A - 三連四重極型質量分析装置及びプログラム - Google Patents

三連四重極型質量分析装置及びプログラム Download PDF

Info

Publication number
JP2015173069A
JP2015173069A JP2014049043A JP2014049043A JP2015173069A JP 2015173069 A JP2015173069 A JP 2015173069A JP 2014049043 A JP2014049043 A JP 2014049043A JP 2014049043 A JP2014049043 A JP 2014049043A JP 2015173069 A JP2015173069 A JP 2015173069A
Authority
JP
Japan
Prior art keywords
mass
quadrupole
charge ratio
calibration
ions
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2014049043A
Other languages
English (en)
Japanese (ja)
Other versions
JP2015173069A5 (cg-RX-API-DMAC7.html
Inventor
博史 菅原
Hiroshi Sugawara
博史 菅原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP2014049043A priority Critical patent/JP2015173069A/ja
Priority to US14/644,430 priority patent/US9355827B2/en
Publication of JP2015173069A publication Critical patent/JP2015173069A/ja
Publication of JP2015173069A5 publication Critical patent/JP2015173069A5/ja
Pending legal-status Critical Current

Links

Images

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0009—Calibration of the apparatus
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0031—Step by step routines describing the use of the apparatus
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
    • H01J49/005—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction by collision with gas, e.g. by introducing gas or by accelerating ions with an electric field
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/421—Mass filters, i.e. deviating unwanted ions without trapping
    • H01J49/4215—Quadrupole mass filters

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP2014049043A 2014-03-12 2014-03-12 三連四重極型質量分析装置及びプログラム Pending JP2015173069A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2014049043A JP2015173069A (ja) 2014-03-12 2014-03-12 三連四重極型質量分析装置及びプログラム
US14/644,430 US9355827B2 (en) 2014-03-12 2015-03-11 Triple quadrupole mass spectrometer and non-transitory computer-readable medium recording a program for triple quadrupole mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014049043A JP2015173069A (ja) 2014-03-12 2014-03-12 三連四重極型質量分析装置及びプログラム

Publications (2)

Publication Number Publication Date
JP2015173069A true JP2015173069A (ja) 2015-10-01
JP2015173069A5 JP2015173069A5 (cg-RX-API-DMAC7.html) 2016-08-18

Family

ID=54069622

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2014049043A Pending JP2015173069A (ja) 2014-03-12 2014-03-12 三連四重極型質量分析装置及びプログラム

Country Status (2)

Country Link
US (1) US9355827B2 (cg-RX-API-DMAC7.html)
JP (1) JP2015173069A (cg-RX-API-DMAC7.html)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018045999A (ja) * 2016-08-12 2018-03-22 サーモ フィッシャー サイエンティフィック （ブレーメン） ゲーエムベーハー 質量分析計を較正する方法

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015173069A (ja) * 2014-03-12 2015-10-01 株式会社島津製作所 三連四重極型質量分析装置及びプログラム
US10878944B2 (en) * 2018-03-23 2020-12-29 Thermo Finnigan Llc Methods for combining predicted and observed mass spectral fragmentation data
EP4019957A4 (en) * 2019-05-31 2023-12-20 Shin Nippon Biomedical Laboratories, Ltd. MASS SPECTROMETRIC METHOD USING CHROMATOGRAPHY MASS SPECTROMETER
CN114910544B (zh) * 2022-05-12 2025-09-12 南京品生医疗科技有限公司 一种三重四极杆质谱仪的控制系统与方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010089798A1 (ja) * 2009-02-05 2010-08-12 株式会社島津製作所 Ｍｓ／ｍｓ型質量分析装置
JP2012159336A (ja) * 2011-01-31 2012-08-23 Shimadzu Corp 三連四重極型質量分析装置

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3404849B2 (ja) 1993-12-29 2003-05-12 株式会社島津製作所 Ｍｓ／ｍｓ型質量分析装置
JPH11183439A (ja) 1997-12-24 1999-07-09 Shimadzu Corp 液体クロマトグラフ質量分析装置
US7365317B2 (en) * 2004-05-21 2008-04-29 Analytica Of Branford, Inc. RF surfaces and RF ion guides
US20060255261A1 (en) * 2005-04-04 2006-11-16 Craig Whitehouse Atmospheric pressure ion source for mass spectrometry
US8748811B2 (en) * 2009-02-05 2014-06-10 Shimadzu Corporation MS/MS mass spectrometer
JP5327138B2 (ja) 2010-05-26 2013-10-30 株式会社島津製作所 タンデム四重極型質量分析装置
JP5370312B2 (ja) 2010-08-23 2013-12-18 株式会社島津製作所 質量分析装置
CN104781659B (zh) * 2012-11-09 2017-12-08 株式会社岛津制作所 质量分析装置和质量校正方法
JP2015173069A (ja) * 2014-03-12 2015-10-01 株式会社島津製作所 三連四重極型質量分析装置及びプログラム

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010089798A1 (ja) * 2009-02-05 2010-08-12 株式会社島津製作所 Ｍｓ／ｍｓ型質量分析装置
JP2012159336A (ja) * 2011-01-31 2012-08-23 Shimadzu Corp 三連四重極型質量分析装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018045999A (ja) * 2016-08-12 2018-03-22 サーモ フィッシャー サイエンティフィック （ブレーメン） ゲーエムベーハー 質量分析計を較正する方法

Also Published As

Publication number Publication date
US9355827B2 (en) 2016-05-31
US20150262800A1 (en) 2015-09-17

Similar Documents

Publication Publication Date Title
JP5454484B2 (ja) 三連四重極型質量分析装置
US9384957B2 (en) Mass analysis device and mass calibration method
CN102308361B (zh) Ms/ms型质谱分析装置
JP6176334B2 (ja) 質量分析方法、質量分析装置、及び質量分析データ処理プログラム
JP6004002B2 (ja) タンデム四重極型質量分析装置
JP2015173069A (ja) 三連四重極型質量分析装置及びプログラム
JP6745538B2 (ja) 分析装置及びその制御方法
CN104769425B (zh) 串联四极型质量分析装置
WO2018109895A1 (ja) 質量分析装置
WO2015118681A1 (ja) 質量分析装置及び質量分析方法
WO2015092862A1 (ja) 質量分析装置及び質量分析方法
US20110101221A1 (en) Quadrupole Mass Spectrometer
US8410436B2 (en) Quadrupole mass spectrometer
US10564135B2 (en) Chromatograph mass spectrometer
JP2015173069A5 (cg-RX-API-DMAC7.html)
JP6418337B2 (ja) 四重極マスフィルタ及び四重極型質量分析装置
WO2022049744A1 (ja) 質量分析装置及び質量分析方法
WO2020031703A1 (ja) 質量分析装置および質量分析方法
JP6004041B2 (ja) タンデム四重極型質量分析装置
US11201047B2 (en) Time-of-flight mass spectrometer
JPWO2018138838A1 (ja) 質量分析方法及び質量分析装置
JP2017026586A (ja) 質量分析方法、質量分析装置、及び質量分析用プログラム

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20160705

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20160705

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20170623

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20170704

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20180109